JPH0366300U - - Google Patents

Info

Publication number
JPH0366300U
JPH0366300U JP12355589U JP12355589U JPH0366300U JP H0366300 U JPH0366300 U JP H0366300U JP 12355589 U JP12355589 U JP 12355589U JP 12355589 U JP12355589 U JP 12355589U JP H0366300 U JPH0366300 U JP H0366300U
Authority
JP
Japan
Prior art keywords
speaker
adjustment mechanism
position adjustment
electrode pins
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12355589U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12355589U priority Critical patent/JPH0366300U/ja
Publication of JPH0366300U publication Critical patent/JPH0366300U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP12355589U 1989-10-24 1989-10-24 Pending JPH0366300U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12355589U JPH0366300U (enExample) 1989-10-24 1989-10-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12355589U JPH0366300U (enExample) 1989-10-24 1989-10-24

Publications (1)

Publication Number Publication Date
JPH0366300U true JPH0366300U (enExample) 1991-06-27

Family

ID=31671524

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12355589U Pending JPH0366300U (enExample) 1989-10-24 1989-10-24

Country Status (1)

Country Link
JP (1) JPH0366300U (enExample)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62276847A (ja) * 1986-05-26 1987-12-01 Hitachi Ltd プロ−ブ装置
JPS6471141A (en) * 1987-09-11 1989-03-16 Hitachi Ltd Inspection device for semiconductor element

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62276847A (ja) * 1986-05-26 1987-12-01 Hitachi Ltd プロ−ブ装置
JPS6471141A (en) * 1987-09-11 1989-03-16 Hitachi Ltd Inspection device for semiconductor element

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