JPH0365932U - - Google Patents

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Publication number
JPH0365932U
JPH0365932U JP12630489U JP12630489U JPH0365932U JP H0365932 U JPH0365932 U JP H0365932U JP 12630489 U JP12630489 U JP 12630489U JP 12630489 U JP12630489 U JP 12630489U JP H0365932 U JPH0365932 U JP H0365932U
Authority
JP
Japan
Prior art keywords
lever
piezoelectric ceramic
spindle
rotation
beam interferometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12630489U
Other languages
Japanese (ja)
Other versions
JPH088426Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989126304U priority Critical patent/JPH088426Y2/en
Priority to US07/602,858 priority patent/US5159405A/en
Priority to EP90120497A priority patent/EP0426011B1/en
Priority to DE69016576T priority patent/DE69016576T2/en
Publication of JPH0365932U publication Critical patent/JPH0365932U/ja
Application granted granted Critical
Publication of JPH088426Y2 publication Critical patent/JPH088426Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Spectrometry And Color Measurement (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1〜7図は本考案の実施例を示し、第1図は
第1実施例の平面図、第2図は第2実施例の平面
図、第3図は第3実施例の平面図、第4図は第4
実施例の平面図、第5図は第5実施例の平面図、
第6図は第6実施例の平面図、第7図は第7実施
例の平面図、第8図と第9図はそれぞれ異なつた
従来例の二光束干渉計の平面図である。 1……レバー、1a……第1レバー、2……支
軸、3……圧電体セラミツクス、6……ばね、1
1……第2レバー、12……支軸、15……板状
連結片、15a……第1板状連結片、16……第
2板状連結片。
1 to 7 show embodiments of the present invention, FIG. 1 is a plan view of the first embodiment, FIG. 2 is a plan view of the second embodiment, FIG. 3 is a plan view of the third embodiment, Figure 4 is the fourth
A plan view of the embodiment, FIG. 5 is a plan view of the fifth embodiment,
FIG. 6 is a plan view of the sixth embodiment, FIG. 7 is a plan view of the seventh embodiment, and FIGS. 8 and 9 are plan views of different conventional two-beam interferometers. DESCRIPTION OF SYMBOLS 1... Lever, 1a... First lever, 2... Support shaft, 3... Piezoelectric ceramics, 6... Spring, 1
DESCRIPTION OF SYMBOLS 1... Second lever, 12... Support shaft, 15... Plate-shaped connecting piece, 15a... First plate-shaped connecting piece, 16... Second plate-shaped connecting piece.

Claims (1)

【実用新案登録請求の範囲】 (1) 支軸と共に回動するレバーと、支軸から離
れた位置で、レバーをその回動方向側で支持した
圧電体セラミツクスと、レバーを圧電体セラミツ
クスの方に付勢する付勢手段とからなり、前記圧
電体セラミツクスの伸縮による支軸の回動で、二
光束干渉計の可動体を駆動する二光束干渉計の駆
動装置。 (2) 端部が支軸で支持された第1レバーと、支
軸から離れた位置で、第1レバーをその回動方向
側で支持した圧電体セラミツクスと、支軸と共に
回動可能で、その支軸から離れた位置が前記第1
レバーの作用点で支持された第2レバーと、この
第2レバーを圧電体セラミツクスの収縮方向に付
勢する付勢手段とからなり、前記圧電体セラミツ
クスの伸縮による第2レバーの支軸の回動で、二
光束干渉計の可動体を駆動する二光束干渉計の駆
動装置。 (3) 支軸と共に回動するレバーと、このレバー
の回動方向側で、支軸から離れた位置に配置され
た圧電体セラミツクスと、レバーと圧電体セラミ
ツクスとを連結するために、これらに各端部が固
着された弾性変形が可能な板状連結片とからなり
、かつ前記板状連結片が、その面を支持の軸線と
平行にして固着され、前記圧電体セラミツクスの
伸縮による支軸の回動で、二光束干渉計の可動体
を駆動する二光束干渉計の駆動装置。 (4) 端部が支軸で支持された第1レバーと、こ
の第1レバーの回動方向側で、支軸から離れた位
置に配置された圧電体セラミツクスと、第1レバ
ーと同方向に支軸と共に回動する第2レバーと、
第1レバーと圧電体セラミツクスを連結するため
に、これらに各端部が固着された弾性変形が可能
な第1板状連結片と第1レバーの作用点と第2レ
バーを連結するために、これらに各端部が固着さ
れた弾性変形が可能な第2板状連結片とからなり
、かつ前記第1、第2の各板状連結片が、その面
を支軸の軸線と平行にして固着され、前記第2レ
バーの支軸の回動で、二光束干渉計の可動体を駆
動する二光束干渉計の駆動装置。 (5) 基部が支軸で支持されたレバーと、支軸か
ら離れた位置で、レバーをその回動方向側で支持
した圧電体セラミツクスと、レバーを圧電体セラ
ミツクスの方に付勢する付勢手段とからなり、前
記圧電体セラミツクスの伸縮によるレバーの回動
で二光束干渉計の可動体を駆動する二光束干渉計
の駆動装置。 (6) 基部が支軸で支持されたレバーと、このレ
バーの回動方向側で、支軸から離れた位置に配置
された圧電体セラミツクスと、レバーと圧電体セ
ラミツクスとを連結するために、それらに各端部
が固着された弾性変形可能な板状連結片とからな
り、かつ前記板状連結片が、その面を支軸の軸線
と平行にして固着され、圧電体セラミツクスの伸
縮によるレバーの回動で、二光束干渉計の可動体
を駆動する二光束干渉計の駆動装置。
[Claims for Utility Model Registration] (1) A lever that rotates together with a spindle, a piezoelectric ceramic that supports the lever in the direction of rotation at a position away from the spindle, and a piezoelectric ceramic that supports the lever in the direction of rotation. A driving device for a two-beam interferometer, comprising a biasing means for biasing the piezoelectric ceramic, and driving a movable body of the two-beam interferometer by rotation of a support shaft caused by expansion and contraction of the piezoelectric ceramic. (2) a first lever whose end is supported by a spindle; a piezoelectric ceramic that supports the first lever in the rotation direction at a position away from the spindle; and a piezoelectric ceramic that is rotatable together with the spindle; The position away from the spindle is the first
It consists of a second lever supported at the point of action of the lever, and a biasing means for biasing the second lever in the direction of contraction of the piezoelectric ceramic. A two-beam interferometer drive device that dynamically drives the movable body of the two-beam interferometer. (3) A lever that rotates together with the spindle, a piezoelectric ceramic placed at a position away from the spindle on the side in the rotation direction of the lever, and a piezoelectric ceramic that connects the lever and the piezoelectric ceramic. It consists of a plate-like connecting piece that is elastically deformable and fixed at each end, and the plate-like connecting piece is fixed with its surface parallel to the axis of the support, and the support shaft is formed by expansion and contraction of the piezoelectric ceramic. A driving device for a two-beam interferometer that drives the movable body of the two-beam interferometer by rotation. (4) A first lever whose end is supported by a support shaft, a piezoelectric ceramic placed at a position away from the support shaft on the rotation direction side of the first lever, and a piezoelectric ceramic placed in the same direction as the first lever. a second lever that rotates together with the support shaft;
In order to connect the first lever and the piezoelectric ceramic, a first plate-shaped connection piece that is elastically deformable and has each end fixed thereto, and in order to connect the point of action of the first lever and the second lever, and a second elastically deformable plate-like connecting piece having each end fixed to the plate-like connecting piece, and each of the first and second plate-like connecting pieces has its surface parallel to the axis of the spindle. A drive device for a two-beam interferometer that is fixed to the second lever and drives a movable body of the two-beam interferometer by rotation of a support shaft of the second lever. (5) A lever whose base is supported by a spindle, a piezoelectric ceramic that supports the lever in the direction of rotation at a position away from the spindle, and an urging force that urges the lever toward the piezoelectric ceramic. A drive device for a two-beam interferometer, comprising means for driving a movable body of the two-beam interferometer by rotation of a lever due to expansion and contraction of the piezoelectric ceramic. (6) In order to connect a lever whose base is supported by a support shaft, a piezoelectric ceramic placed at a position away from the support shaft on the rotation direction side of the lever, and the lever and the piezoelectric ceramic, It consists of an elastically deformable plate-like connecting piece fixed at each end thereof, and the plate-like connecting piece is fixed with its surface parallel to the axis of the support shaft, and the lever is formed by the expansion and contraction of piezoelectric ceramics. A driving device for a two-beam interferometer that drives the movable body of the two-beam interferometer by rotation.
JP1989126304U 1989-10-28 1989-10-28 Driving device for two-beam interferometer Expired - Lifetime JPH088426Y2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP1989126304U JPH088426Y2 (en) 1989-10-28 1989-10-28 Driving device for two-beam interferometer
US07/602,858 US5159405A (en) 1989-10-28 1990-10-24 Multibeam interferometer for use in a fourier transform spectrometer and a driving device for moving the mirrors used therein
EP90120497A EP0426011B1 (en) 1989-10-28 1990-10-25 Two-beam interferometer for use in fourier transform spectrometer and driving device for movable flat mirror of same
DE69016576T DE69016576T2 (en) 1989-10-28 1990-10-25 Two-beam interferometer for a Fourier spectrometer and drive device for a movable plane mirror therefor.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989126304U JPH088426Y2 (en) 1989-10-28 1989-10-28 Driving device for two-beam interferometer

Publications (2)

Publication Number Publication Date
JPH0365932U true JPH0365932U (en) 1991-06-26
JPH088426Y2 JPH088426Y2 (en) 1996-03-06

Family

ID=31674120

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989126304U Expired - Lifetime JPH088426Y2 (en) 1989-10-28 1989-10-28 Driving device for two-beam interferometer

Country Status (1)

Country Link
JP (1) JPH088426Y2 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01238759A (en) * 1988-03-16 1989-09-22 Nec Corp Precisely fine movement base with six degrees of freedom

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01238759A (en) * 1988-03-16 1989-09-22 Nec Corp Precisely fine movement base with six degrees of freedom

Also Published As

Publication number Publication date
JPH088426Y2 (en) 1996-03-06

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