JPH0361722U - - Google Patents

Info

Publication number
JPH0361722U
JPH0361722U JP12208389U JP12208389U JPH0361722U JP H0361722 U JPH0361722 U JP H0361722U JP 12208389 U JP12208389 U JP 12208389U JP 12208389 U JP12208389 U JP 12208389U JP H0361722 U JPH0361722 U JP H0361722U
Authority
JP
Japan
Prior art keywords
circuit
comparator
expected value
reference voltage
comparison
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12208389U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0756514Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12208389U priority Critical patent/JPH0756514Y2/ja
Publication of JPH0361722U publication Critical patent/JPH0361722U/ja
Application granted granted Critical
Publication of JPH0756514Y2 publication Critical patent/JPH0756514Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Manipulation Of Pulses (AREA)
JP12208389U 1989-10-18 1989-10-18 Ｌｓｉテストシステム Expired - Lifetime JPH0756514Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12208389U JPH0756514Y2 (ja) 1989-10-18 1989-10-18 Ｌｓｉテストシステム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12208389U JPH0756514Y2 (ja) 1989-10-18 1989-10-18 Ｌｓｉテストシステム

Publications (2)

Publication Number Publication Date
JPH0361722U true JPH0361722U (enExample) 1991-06-17
JPH0756514Y2 JPH0756514Y2 (ja) 1995-12-25

Family

ID=31670099

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12208389U Expired - Lifetime JPH0756514Y2 (ja) 1989-10-18 1989-10-18 Ｌｓｉテストシステム

Country Status (1)

Country Link
JP (1) JPH0756514Y2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000304818A (ja) * 1999-04-21 2000-11-02 Advantest Corp 半導体試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000304818A (ja) * 1999-04-21 2000-11-02 Advantest Corp 半導体試験装置

Also Published As

Publication number Publication date
JPH0756514Y2 (ja) 1995-12-25

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