JPH0352686U - - Google Patents
Info
- Publication number
- JPH0352686U JPH0352686U JP11438789U JP11438789U JPH0352686U JP H0352686 U JPH0352686 U JP H0352686U JP 11438789 U JP11438789 U JP 11438789U JP 11438789 U JP11438789 U JP 11438789U JP H0352686 U JPH0352686 U JP H0352686U
- Authority
- JP
- Japan
- Prior art keywords
- relay
- turned
- driver
- analog switch
- control signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11438789U JPH0352686U (fr) | 1989-09-29 | 1989-09-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11438789U JPH0352686U (fr) | 1989-09-29 | 1989-09-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0352686U true JPH0352686U (fr) | 1991-05-22 |
Family
ID=31662758
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11438789U Pending JPH0352686U (fr) | 1989-09-29 | 1989-09-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0352686U (fr) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007018020A1 (fr) * | 2005-08-09 | 2007-02-15 | Advantest Corporation | Appareil de test de semiconducteurs |
| JPWO2010001440A1 (ja) * | 2008-07-03 | 2011-12-15 | 株式会社アドバンテスト | 試験装置およびソケットボード |
-
1989
- 1989-09-29 JP JP11438789U patent/JPH0352686U/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007018020A1 (fr) * | 2005-08-09 | 2007-02-15 | Advantest Corporation | Appareil de test de semiconducteurs |
| JP5038137B2 (ja) * | 2005-08-09 | 2012-10-03 | 株式会社アドバンテスト | 半導体試験装置 |
| JPWO2010001440A1 (ja) * | 2008-07-03 | 2011-12-15 | 株式会社アドバンテスト | 試験装置およびソケットボード |