JPH0348442B2 - - Google Patents
Info
- Publication number
- JPH0348442B2 JPH0348442B2 JP16262880A JP16262880A JPH0348442B2 JP H0348442 B2 JPH0348442 B2 JP H0348442B2 JP 16262880 A JP16262880 A JP 16262880A JP 16262880 A JP16262880 A JP 16262880A JP H0348442 B2 JPH0348442 B2 JP H0348442B2
- Authority
- JP
- Japan
- Prior art keywords
- ice
- layer thickness
- electrode rod
- frozen
- rod
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007710 freezing Methods 0.000 claims description 18
- 230000008014 freezing Effects 0.000 claims description 18
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 13
- 230000003247 decreasing effect Effects 0.000 claims description 4
- 238000005338 heat storage Methods 0.000 claims description 2
- 239000010409 thin film Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 7
- 238000001816 cooling Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000003507 refrigerant Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/08—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means
- G01B7/085—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means for measuring thickness of coating
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16262880A JPS5786705A (en) | 1980-11-20 | 1980-11-20 | Device for measuring thickness of frozen layer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16262880A JPS5786705A (en) | 1980-11-20 | 1980-11-20 | Device for measuring thickness of frozen layer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5786705A JPS5786705A (en) | 1982-05-29 |
JPH0348442B2 true JPH0348442B2 (enrdf_load_stackoverflow) | 1991-07-24 |
Family
ID=15758219
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16262880A Granted JPS5786705A (en) | 1980-11-20 | 1980-11-20 | Device for measuring thickness of frozen layer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5786705A (enrdf_load_stackoverflow) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60189844U (ja) * | 1984-05-26 | 1985-12-16 | トヨタ自動車株式会社 | 排気ガス中のパテイキユレ−ト堆積量検知センサ |
CN108195281B (zh) * | 2017-12-22 | 2020-11-13 | 太原理工大学 | 一种基于压磁材料的冰层厚度测量装置 |
CN109990743A (zh) * | 2019-05-07 | 2019-07-09 | 辽宁科技大学 | 高寒富含水露天铜矿矿区岩层冷冻深度测量装置及方法 |
-
1980
- 1980-11-20 JP JP16262880A patent/JPS5786705A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5786705A (en) | 1982-05-29 |
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