JPH0344754Y2 - - Google Patents

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Publication number
JPH0344754Y2
JPH0344754Y2 JP9281885U JP9281885U JPH0344754Y2 JP H0344754 Y2 JPH0344754 Y2 JP H0344754Y2 JP 9281885 U JP9281885 U JP 9281885U JP 9281885 U JP9281885 U JP 9281885U JP H0344754 Y2 JPH0344754 Y2 JP H0344754Y2
Authority
JP
Japan
Prior art keywords
wafers
wafer
advancing
suction pad
suction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9281885U
Other languages
Japanese (ja)
Other versions
JPS622537U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9281885U priority Critical patent/JPH0344754Y2/ja
Publication of JPS622537U publication Critical patent/JPS622537U/ja
Application granted granted Critical
Publication of JPH0344754Y2 publication Critical patent/JPH0344754Y2/ja
Expired legal-status Critical Current

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Description

【考案の詳細な説明】[Detailed explanation of the idea] 【考案の属する技術分野】[Technical field to which the idea belongs]

この考案は、厚さが数百μと薄く、材質が脆
く、かつ表面が平面状に滑らかであつて積み重ね
たときに密着しやすいウエハを無瑕(きず)に1
枚づつ分離するウエハ分離装置に関する。
This idea allows wafers that are thin (a few hundred microns thick), made of brittle material, and have a flat, smooth surface that easily adheres to each other when stacked to be easily stacked into one wafer to be wafer-free.
This invention relates to a wafer separation device that separates wafers one by one.

【従来技術とその問題点】[Prior art and its problems]

本考案が対象とする半導体ウエハは厚さが通常
数百μと薄く、材質的に脆く、かつ表面がラツピ
ング処理をされていて平面状に滑らかであるた
め、これを積み重ねたとき、互いに密着しやすい
性質がある。従来は、複数枚スタツク状に積み重
ねられたウエハを1枚づつ分離する作業は手作業
によつており、この手作業をより容易に行なうた
め、ウエハ表面にラツピング処理を行なつた後、
ウエハ相互間に紙などを入れて密着しないように
するなどの工夫がなされている。しかし、この作
業を機械装置により行なう方法に関しては、まだ
公表された文献が見当たらない。
Semiconductor wafers, which are the subject of this invention, are thin, usually several hundred microns thick, are made of brittle material, and have smooth, flat surfaces that have been wrapped, so that when stacked, they do not stick together. It has an easy nature. Conventionally, the work of separating multiple wafers stacked one by one was done manually.In order to make this manual work easier, after wrapping the wafer surface,
Efforts have been made to prevent wafers from coming into close contact by placing paper or the like between them. However, no published literature has yet been found regarding a method for performing this work using a mechanical device.

【考案の目的】[Purpose of invention]

この考案は、前述のように厚さが薄く、材質が
脆く、かつ表面が滑らかに処理されて密着しやす
くなつているウエハを、表面に瑕をつけることな
く1枚づつ取り出すことができるウエハ分離装置
を提供することを目的とする。
As mentioned above, this wafer separation technology allows wafers that are thin, made of brittle materials, and whose surfaces have been treated to be smooth so that they adhere easily to each other to be taken out one by one without damaging the surface. The purpose is to provide equipment.

【考案の要点】[Key points of the idea]

この考案は、前記目的の分離装置が、前記積み
重ねられたウエハが載置されこの積重ね方向に進
退する進退機構と、前記積み重ねられたウエハの
反進退機構側が開放された開放端面を有し該ウエ
ハを取り囲み前記進退機構の進退時に該ウエハを
この進退方向に案内するマガジンと、真空源と接
続され前記マガジンの前記開放端面との間のギヤ
ツプが前記ウエハの1枚分より大きく2枚分より
小さい吸着面を備えて前記ウエハの積重ね方向と
直角の方向に移動可能に構成された吸着パツドと
を備え、前記ウエハの分離時に、前記進退機構が
前進してウエハを前記吸着パツドに押し着けると
ともに前記真空源を作動させてウエハを吸着させ
た後前記進退機構を後退させ、吸着パツドに吸着
された最上部のウエハと密着された状態に残つて
いるウエハが自重にて落下する際の落下しろを形
成するようにして、吸着パツドに吸着されたウエ
ハには面に垂直方向の外力がかからないようにし
ておき、しかる後前記吸着パツドをウエハの積重
ね方向と直角の方向に移動させることによりウエ
ハを無瑕に分離して取り出すようにして、前記の
目的を達成しようとするものである。
In this invention, the target separation device has an advancing/retracting mechanism on which the stacked wafers are placed and advances and retreats in the stacking direction, and an open end surface in which the opposite side of the advancing/retracting mechanism of the stacked wafers is open. A gap between a magazine that surrounds the wafer and guides the wafer in the advancing and retreating direction when the advancing and retreating mechanism advances and retreats, and the open end surface of the magazine that is connected to a vacuum source is larger than one wafer and smaller than two wafers. A suction pad is provided with a suction surface and is configured to be movable in a direction perpendicular to the stacking direction of the wafers, and when the wafers are separated, the advancing/retracting mechanism moves forward to press the wafer onto the suction pad and the After activating the vacuum source and adsorbing the wafer, the advancing/retracting mechanism is retracted and the remaining wafer, which is in close contact with the top wafer adsorbed to the suction pad, falls due to its own weight. The wafer is adsorbed to the suction pad in such a way that no external force is applied to the surface in a direction perpendicular to the surface, and then the suction pad is moved in a direction perpendicular to the stacking direction of the wafers to ensure that the wafer is free from defects. The objective is to achieve the above object by separating and taking out the components.

【考案の実施例】[Example of idea]

第1図に本考案に基づいて構成されたウエハ分
離装置の要部の実施例を示す。複数枚スタツク状
に積み重ねられたウエハ6は、その最下部に配さ
れた分厚い台板5を介し、エアシリンダ装置3と
して形成された進退機構の上に載置されている。
エアシリンダ装置3は図示されない空気源と繋が
つており、この装置に空気を供給し、あるいは供
給した空気を装置外へ排出することにより、図の
上下方向に進退動作を行なう。積み重ねられたウ
エハ6は、一方の端部が開放された筒状のマガジ
ン4によつて取り囲まれ、前記エアシリンダ装置
3が上下方向に進退するときに、このマガジン4
により進退方向が案内される。 マガジン4の開放端には、この開放端面Xとの
間にウエハ6の1枚分より大きく2枚分より小さ
いギヤツプδを有する吸着面Yを備え真空源2と
接続された吸着パツド1が配される。吸着パツド
1の吸着面Y側には、多数の小孔を有する円板状
に形成された吸着片1aが、そのウエハ側の面が
前記Y面と同一平面となるように埋め込まれてい
る。この吸着片の背後側を真空に引くことによ
り、Y面と当接したウエハが吸着される。 複数枚積み重ねられてスタツク状をなすウエハ
から1枚づつウエハを分離する工程は次の通りで
ある。 まず、エアシリンダ装置3に、図示されない空
気源から空気を供給してこの装置を図の上方へ前
進させ、スタツクを吸着パツド1に押し付ける。
ここで、エアシリンダ装置3はたとえば第2図の
ように構成され、内側シリンダ3bと外側シリン
ダ3cとの間にコイルばね3dが圧縮して挿入さ
れて一体化され、この一体化された可動部が、固
定ピストンを兼ねた空気供給管3aに送られてき
た空気により図の上方へ移動し、ウエハを吸着パ
ツド1(第1図)に押し付ける。外側シリンダ3
cはこの押し付けた位置で静止するが、内側シリ
ンダ3bはなお、コイルばね3dを圧縮しながら
前進しようとするから、内外両シリンダは相対的
にずれようとする。従つてこのずれを適当な方法
で検出すれば、ウエハが吸着パツドに押し付けら
れたことが確認される。 このようにして、ウエハが吸着パツドに押し付
けられたことが確認されたら、吸着パツドと接続
された真空源を作動状態にして吸着片1aの背後
側を真空に引きウエハを吸着する。この吸着がた
とえば吸着片背後側の真空圧の変化により、確認
されたら、吸着パツド1を保持している保持部材
8を第3図の矢印のように水平方向に移動させ、
所定位置まで移動したところで吸着片1aの背後
側を真空から大気圧にもどしてウエハを所定位置
に置く。この水平移動の際、吸着パツド1とマガ
ジン4の開放端面とのギヤツプはウエハ1枚分よ
り大きく2枚分より小さいから、吸着パツドに吸
着された最上部のウエハと密着した1枚または複
数枚のウエハは、マガジン4の開放端面に遮ら
れ、マガジン内に取り残されて落下する。また、
これら落下するウエハは常に重力方向の力を受け
ており、吸着された最上部のウエハには加圧力が
作用していないから、水平移動すなわち剪断方向
の移動時に表面に瑕を生ずることがない。 以上に説明したように、本実施例においては、
吸着パツド1にウエハを吸着させるのに、ウエハ
を吸着面Yまで前進させるエアシリンダ装置3を
用いているが、このエアシリンダ装置を用いる代
わりに、吸着パツド1の外径をマガジン4の内径
よりも小さめにし、この吸着パツドをマガジン内
へ前進させて吸着する方法も考えられる。しかし
このように構成すると、保持部材8を上下方向と
水平方向とに駆動する機構を必要とするため機構
が複雑となり、このため、ミクロンオーダの精度
を保持すべきギヤツプ長δが分離作業の途上にお
いて狂いを生じやすくなる。従つて厚さの薄いウ
エハの分離装置としては、保持部材8の移動を1
方向(水平方向)のみとし、ギヤツプδの精度保
持をより確実ならしめる構成とするのがよい。
FIG. 1 shows an embodiment of the main parts of a wafer separation apparatus constructed based on the present invention. A plurality of wafers 6 stacked in a stack are placed on an advancing/retracting mechanism formed as an air cylinder device 3 via a thick base plate 5 disposed at the bottom thereof.
The air cylinder device 3 is connected to an air source (not shown), and moves forward and backward in the vertical direction in the figure by supplying air to the device or discharging the supplied air to the outside of the device. The stacked wafers 6 are surrounded by a cylindrical magazine 4 with one end open, and when the air cylinder device 3 moves up and down, this magazine 4
The direction of advance and retreat is guided by. At the open end of the magazine 4, there is disposed a suction pad 1 connected to the vacuum source 2, which has a suction surface Y having a gap δ larger than one wafer 6 and smaller than two wafers 6 between it and the open end surface X. be done. A disk-shaped suction piece 1a having a large number of small holes is embedded in the suction surface Y side of the suction pad 1 so that its wafer side surface is flush with the Y surface. By evacuating the back side of this suction piece, the wafer that is in contact with the Y surface is suctioned. The process of separating wafers one by one from a stack of wafers is as follows. First, air is supplied to the air cylinder device 3 from an air source (not shown) and the device is advanced upward in the figure to press the stack against the suction pad 1.
Here, the air cylinder device 3 is configured, for example, as shown in FIG. is moved upward in the figure by the air sent to the air supply pipe 3a, which also serves as a fixed piston, and presses the wafer against the suction pad 1 (FIG. 1). outer cylinder 3
c remains stationary at this pressed position, but since the inner cylinder 3b still tries to move forward while compressing the coil spring 3d, both the inner and outer cylinders tend to shift relative to each other. Therefore, if this deviation is detected by an appropriate method, it can be confirmed that the wafer has been pressed against the suction pad. When it is confirmed that the wafer is pressed against the suction pad in this manner, the vacuum source connected to the suction pad is activated to evacuate the back side of the suction piece 1a, and the wafer is suctioned. When this suction is confirmed, for example, by a change in the vacuum pressure behind the suction piece, the holding member 8 holding the suction pad 1 is moved horizontally as shown by the arrow in FIG.
When the wafer is moved to a predetermined position, the back side of the suction piece 1a is returned from vacuum to atmospheric pressure and the wafer is placed in a predetermined position. During this horizontal movement, the gap between the suction pad 1 and the open end surface of the magazine 4 is larger than one wafer and smaller than two wafers, so one or more wafers are in close contact with the top wafer suctioned by the suction pad. The wafers are blocked by the open end surface of the magazine 4, are left behind in the magazine, and fall. Also,
These falling wafers are always subjected to a force in the direction of gravity, and since no pressing force is applied to the topmost wafer that is attracted, no defects are produced on the surface during horizontal movement, that is, movement in the shearing direction. As explained above, in this example,
To attract a wafer to the suction pad 1, an air cylinder device 3 is used to advance the wafer to the suction surface Y. It is also conceivable to make the suction pad smaller and advance the suction pad into the magazine for suction. However, this configuration requires a mechanism to drive the holding member 8 vertically and horizontally, which makes the mechanism complicated. Therefore, the gap length δ, which should maintain accuracy on the order of microns, is shortened during the separation process. It is easy to cause errors in the process. Therefore, as a separation device for thin wafers, the movement of the holding member 8 is
It is preferable to use a configuration in which only the direction (horizontal direction) is used to more reliably maintain the accuracy of the gap δ.

【考案の効果】[Effect of the idea]

以上に述べたように、この考案によれば、複数
枚積み重ねられたウエハを1枚づつ分離する装置
として、前記積み重ねられたウエハが載置されこ
の積重ね方向に進退する進退機構と、前記積み重
ねられたウエハの反進退機構側が開放された開放
端面を有し該ウエハを取り囲み前記進退機構の進
退時に該ウエハをこの進退方向に案内するマガジ
ンと、真空源と接続され前記マガジンの前記開放
端面との間のギヤツプが前記ウエハの1枚分より
大きく2枚分より小さい吸着面を備えて前記ウエ
ハの積重ね方向と直角の方向に移動可能に構成さ
れた吸着パツドとを備え、前記ウエハの分離時
に、前記進退機構が前進してウエハを前記吸着パ
ツドに押し着けるとともに前記真空源を作動させ
てウエハを吸着させた後前記進退機構を後退さ
せ、しかる後前記吸着パツドをウエハの積重ね方
向と直角の方向に移動させることによりウエハを
分離して取り出すようにしたので、 (1) 取り出されるウエハには加圧力が作用せず、
従つてウエハを無瑕で取り出すことができる。 (2) ウエハを剪断方向にずらせて分離するから、
分離するのにほとんど力を必要とせず、材質的
には脆くても破損しにくい。 (3) 吸着パツドの移動方向を、ウエハの積重ね方
向と直角な方向の1方向のみとし、ウエハを吸
着パツドに押し付ける機構を別機構とすること
により、吸着パツドの吸着面とウエハを取り囲
むマガジンの開放端面との間のギヤツプ長の精
度が保たれやすくなり、1枚づつの分離が確実
となる。 などの効果が得られる。
As described above, according to this invention, as an apparatus for separating a plurality of stacked wafers one by one, the stacked wafers are placed and the advancing/retracting mechanism moves back and forth in the stacking direction, and the stacked wafers are moved back and forth in the stacking direction. a magazine which has an open end face on the opposite side of the advancing/retracting mechanism of the wafer and which surrounds the wafer and guides the wafer in the advancing/retreating direction when the advancing/retracting mechanism advances and retreats; and a magazine which is connected to a vacuum source and has an open end face of the magazine. and a suction pad configured to be movable in a direction perpendicular to the stacking direction of the wafers, the suction pad having a suction surface with a gap larger than one wafer and smaller than two wafers, and when separating the wafers, The advancing/retracting mechanism moves forward to press the wafer against the suction pad, and the vacuum source is activated to attract the wafer, after which the advancing/retracting mechanism is moved backward, and then the suction pad is moved in a direction perpendicular to the stacking direction of the wafers. Since the wafers are separated and taken out by moving the wafers to
Therefore, the wafer can be taken out without any defects. (2) Because the wafers are separated by shifting in the shearing direction,
It requires almost no force to separate, and although the material is brittle, it does not easily break. (3) By setting the suction pad to move only in one direction, perpendicular to the stacking direction of the wafers, and using a separate mechanism to press the wafer onto the suction pad, the suction surface of the suction pad and the magazine surrounding the wafer are The accuracy of the gap length between the open end surface and the gap length can be easily maintained, and separation of each sheet can be ensured. Effects such as this can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例によるウエハ分離装置
の要部構成図、第2図は第1図のウエハ分離装置
のウエハを進退させる進退機構を示す構造図、第
3図は第1図のウエハ分離装置によりウエハを分
離するときの状況を示す動作説明図である。 1……吸着パツド、2……真空源、3……進退
機構、4……マガジン、6……ウエハ、X……開
放端面、Y……吸着面。
FIG. 1 is a structural diagram of the main parts of a wafer separation apparatus according to an embodiment of the present invention, FIG. 2 is a structural diagram showing the advancing and retracting mechanism for moving wafers forward and backward in the wafer separation apparatus of FIG. 1, and FIG. FIG. 3 is an operation explanatory diagram showing a situation when a wafer separation device separates a wafer. 1... Suction pad, 2... Vacuum source, 3... Advance/retreat mechanism, 4... Magazine, 6... Wafer, X... Open end surface, Y... Adsorption surface.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 複数枚積み重ねられたウエハを1枚づつ分離す
る装置であつて、前記積み重ねられたウエハが載
置されこの積重ね方向に進退する進退機構と、前
記積み重ねられたウエハの反進退機構側が開放さ
れた開放端面を有し該ウエハを取り囲み前記進退
機構の進退時に該ウエハをこの進退方向に案内す
るマガジンと、真空源と接続され前記マガジンの
前記開放端面との間のギヤツプが前記ウエハの1
枚分より大きく2枚分より小さい吸着面を備えて
前記ウエハの積重ね方向と直角の方向に移動可能
に構成された吸着パツドとを備え、前記ウエハの
分離時に、前記進退機構が前進してウエハを前記
吸着パツドに押し着けるとともに前記真空源を作
動させてウエハを吸着させた後前記進退機構を後
退させ、しかる後前記吸着パツドをウエハの積重
ね方向と直角の方向に移動させることによりウエ
ハを1枚づつ分離することを特徴とするウエハ分
離装置。
A device for separating a plurality of stacked wafers one by one, comprising an advancing/retracting mechanism on which the stacked wafers are placed and advancing and retreating in the stacking direction, and an opening in which the side of the stacked wafers opposite the advancing/retracting mechanism is open. A gap between a magazine having an end surface that surrounds the wafer and guides the wafer in the advancing and retreating direction when the advancing and retreating mechanism advances and retreats, and the open end surface of the magazine that is connected to a vacuum source is one of the wafers.
A suction pad is provided with a suction surface larger than one wafer and smaller than two wafers, and configured to be movable in a direction perpendicular to the stacking direction of the wafers, and when the wafers are separated, the advance/retreat mechanism moves forward to remove the wafers. is pressed against the suction pad and the vacuum source is activated to adsorb the wafer, and then the advancing and retracting mechanism is retracted, and then the suction pad is moved in a direction perpendicular to the stacking direction of the wafers, thereby removing the wafer one by one. A wafer separation device that separates wafers one by one.
JP9281885U 1985-06-19 1985-06-19 Expired JPH0344754Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9281885U JPH0344754Y2 (en) 1985-06-19 1985-06-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9281885U JPH0344754Y2 (en) 1985-06-19 1985-06-19

Publications (2)

Publication Number Publication Date
JPS622537U JPS622537U (en) 1987-01-09
JPH0344754Y2 true JPH0344754Y2 (en) 1991-09-20

Family

ID=30649951

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9281885U Expired JPH0344754Y2 (en) 1985-06-19 1985-06-19

Country Status (1)

Country Link
JP (1) JPH0344754Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6573168B2 (en) * 2015-10-30 2019-09-11 日本電気硝子株式会社 Sheet glass manufacturing method and manufacturing apparatus

Also Published As

Publication number Publication date
JPS622537U (en) 1987-01-09

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