JPH0344656U - - Google Patents
Info
- Publication number
- JPH0344656U JPH0344656U JP10587289U JP10587289U JPH0344656U JP H0344656 U JPH0344656 U JP H0344656U JP 10587289 U JP10587289 U JP 10587289U JP 10587289 U JP10587289 U JP 10587289U JP H0344656 U JPH0344656 U JP H0344656U
- Authority
- JP
- Japan
- Prior art keywords
- image
- information
- sample stage
- recording
- input means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 4
- 238000013500 data storage Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第1図は本考案の実施例1を示す制御ブロツク
図、第2図aは従来の不良解析用顕微鏡を示す構
成図、第2図bは量産ライン向き外観チエツカー
を示す制御ブロツク図、第3図は本考案の実施例
2を示す制御ブロツク図である。
1……X−Yテーブル、2……顕微鏡、3……
画像入力手段、4……X−Yテーブル制御手段、
5……X−Yテーブル移動スイツチ、6……X−
Yテーブル現在位置記憶手段、7……キー入力手
段、8……不良モードコード表データ記憶手段、
9……情報制御手段、10……画像処理手段、1
1……画像記録手段、12……画像再生手段、1
3……ロツトデータ記憶手段。
Fig. 1 is a control block diagram showing the first embodiment of the present invention, Fig. 2a is a configuration diagram showing a conventional defect analysis microscope, Fig. 2b is a control block diagram showing an external checker suitable for mass production lines, and Fig. The figure is a control block diagram showing a second embodiment of the present invention. 1...X-Y table, 2...Microscope, 3...
Image input means, 4...X-Y table control means,
5...X-Y table movement switch, 6...X-
Y table current position storage means, 7...key input means, 8...failure mode code table data storage means,
9... Information control means, 10... Image processing means, 1
1... Image recording means, 12... Image reproducing means, 1
3...Lot data storage means.
Claims (1)
−Yテーブルをモータで駆動制御し、試料ステー
ジを移動させながら試料を顕微鏡で観察する外観
チエツカーにおいて、顕微鏡観察像を画像信号と
して取り込む画像入力手段と、キー入力手段と、
試料ステージ位置情報及び不良モードコード表情
報を記憶する記憶手段と、文字情報を画像情報に
変換して画像入力手段で得られた画像信号に重ね
合わせる画像処理手段と、画像信号を記録する画
像記録手段と、前記記憶手段、画像処理手段及び
画像記録手段を制御する情報制御手段とを含むこ
とを特徴とする不良解析用外観チエツカー。 Place the sample stage on the X-Y table and
- In an appearance checker that drives and controls a Y table with a motor and observes a sample with a microscope while moving the sample stage, an image input means for capturing a microscope observation image as an image signal, and a key input means;
a storage means for storing sample stage position information and failure mode code table information; an image processing means for converting character information into image information and superimposing it on the image signal obtained by the image input means; and an image recording means for recording the image signal. and information control means for controlling the storage means, image processing means, and image recording means.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10587289U JPH0344656U (en) | 1989-09-08 | 1989-09-08 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10587289U JPH0344656U (en) | 1989-09-08 | 1989-09-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0344656U true JPH0344656U (en) | 1991-04-25 |
Family
ID=31654627
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10587289U Pending JPH0344656U (en) | 1989-09-08 | 1989-09-08 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0344656U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010085347A (en) * | 2008-10-02 | 2010-04-15 | Edm Kk | Image inspection system |
-
1989
- 1989-09-08 JP JP10587289U patent/JPH0344656U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010085347A (en) * | 2008-10-02 | 2010-04-15 | Edm Kk | Image inspection system |
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