JPH0344415B2 - - Google Patents

Info

Publication number
JPH0344415B2
JPH0344415B2 JP61163882A JP16388286A JPH0344415B2 JP H0344415 B2 JPH0344415 B2 JP H0344415B2 JP 61163882 A JP61163882 A JP 61163882A JP 16388286 A JP16388286 A JP 16388286A JP H0344415 B2 JPH0344415 B2 JP H0344415B2
Authority
JP
Japan
Prior art keywords
test
circuit
radiation
integrated circuit
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61163882A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6319833A (ja
Inventor
Masataka Kato
Takahiro Okabe
Kikuo Watanabe
Minoru Nagata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP61163882A priority Critical patent/JPS6319833A/ja
Publication of JPS6319833A publication Critical patent/JPS6319833A/ja
Publication of JPH0344415B2 publication Critical patent/JPH0344415B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP61163882A 1986-07-14 1986-07-14 半導体集積回路の試験方法 Granted JPS6319833A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61163882A JPS6319833A (ja) 1986-07-14 1986-07-14 半導体集積回路の試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61163882A JPS6319833A (ja) 1986-07-14 1986-07-14 半導体集積回路の試験方法

Publications (2)

Publication Number Publication Date
JPS6319833A JPS6319833A (ja) 1988-01-27
JPH0344415B2 true JPH0344415B2 (enrdf_load_stackoverflow) 1991-07-05

Family

ID=15782586

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61163882A Granted JPS6319833A (ja) 1986-07-14 1986-07-14 半導体集積回路の試験方法

Country Status (1)

Country Link
JP (1) JPS6319833A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4387546B2 (ja) 2000-03-22 2009-12-16 株式会社リコー カメラ、画像入力装置、携帯端末装置およびカメラの形態変更方法
NO315293B1 (no) 2001-10-31 2003-08-11 Procyss As Fremgangsmåte for absorbering av damper og gasser ved kontroll av overtrykki lagertanker for v¶sker samt anvendelse av fremgangsmåten
JP4935789B2 (ja) * 2008-10-06 2012-05-23 トヨタ自動車株式会社 半導体装置の放射線照射試験方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5081165U (enrdf_load_stackoverflow) * 1973-11-30 1975-07-12
JPS5683955A (en) * 1979-12-13 1981-07-08 Nec Corp Manufacturing of semiconductor

Also Published As

Publication number Publication date
JPS6319833A (ja) 1988-01-27

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term