JPH034175A - Probe - Google Patents

Abstract

PURPOSE:To improve the accuracy of continuity inspection by bringing a part to be inspected and a probe into contact with each other on a contact surface which is differently long in its lengthwise direction and a direction perpendicular to the direction. CONSTITUTION:The part 2 to be inspected corresponds to the terminal of the conductor pattern 2a of a printed wiring board 12. A hole 3 in it is a nonconductive part and formed of a through hole where a lead is inserted. The probe 1, on the other hand, has parallel width and is formed entirely of a conductive material and bent parts 1a and 1b are formed at the tip thereof. The probe 1 and part 2 to be inspected at brought into contact with each other on the contact surface 4 on the part 2 to be inspected so that the lengthwise length and length in the direction perpendicular to the lengthwise direction are different. Consequently, even if the part 2 to be inspected and probe 1 shift in position to any extent when contacting each other, they are brought into contact on the surface 4 whose orthogonal lengths are different, so the contact surface increases to realize accurate contacting, so that accurate inspection is performed.

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field 1] The present invention relates to a probe for a continuity testing device that tests the continuity state of a conductor pattern on a substrate.

[Prior Art 1] Conventionally, as a probe of a continuity testing device for testing the continuity state of a conductor pattern on a substrate, for example, two probes 211 that are electrically insulated from each other and close to each other are used.
There is a probe that uses the so-called 4JL measurement method, in which two sets of two needle-type probes that are electrically insulated and close to each other are brought into contact with the part to be tested at the same time, and the voltage between the conductor patterns to be measured is measured. The present applicant has proposed a device in which the conductivity state of the conductor pattern is tested by comparing it with a preset voltage value (Japanese Patent Application Laid-Open No. 62-282277), -1001
37, the tip of the probe that comes into contact with the conductor pattern is needle-shaped, and the needle-shaped probe is elastically biased and comes into contact with the portion to be inspected of the conductor pattern to test the electrical characteristics of the conductor pattern. This is a so-called needle type probe.

[Problem to be Solved by the Invention 1] In a needle type probe having a dotted tip as in the above two conventional techniques, when the probe is brought into contact with the part to be inspected of the conductor pattern, it is difficult to If there is a hole that is a non-conductive part, if the positioning of the tip of the probe and the part to be inspected is inaccurate, the tip of the needle-type probe may fall into the hole, or the outer edge of the hole may become rounded. When this happens, the tip of the needle-type probe comes off the part to be tested or comes into contact with a different part from the contact part at the end of the probe, resulting in unstable contact resistance, which makes it impossible to perform a proper continuity test. . In order to solve this problem, it is necessary to adjust the position ra of the needle type probe with respect to the part to be inspected with higher precision, which causes the problem that the positioning device becomes complicated. Further, if the area of contact between the tip of the needle probe and the inspected portion is less than 0.2 mm2, there is a problem that the contact state becomes unstable due to positional deviation, and the contact resistance becomes unstable.

The present invention has a structure in which the contact surface between the part to be inspected and the probe on the part to be inspected has a contact surface having different lengths in the longitudinal direction of the contact surface and in the direction perpendicular to the longitudinal direction. Even if the positioning of the inspection part and the tube a-b deviates to some extent,
It is an object of the present invention to provide a probe that allows good contact between the probe and a part to be inspected, and allows correct continuity testing of a conductor pattern on the substrate without adversely affecting the continuity testing.

[Means for Solving the Problems 1] In order to achieve the above object, the probe in the continuity testing device that tests the continuity state of the conductor pattern on the board is configured to detect the connection between the part to be tested of the conductor pattern and the probe. The contact surface on the part has a contact surface having different lengths in each of the longitudinal direction of the contact surface and the direction perpendicular to the longitudinal direction.

Further, the probe has an extending contact surface between the inspected section and the probe on the inspected section, which has an angle with respect to the longitudinal center axis of the probe.

Furthermore, the area of the contact surface between the inspected section and the probe on the inspected section is 0.2 mm'' or more.

[Operation 1] When the probe of the present invention is used, the contact surface between the tested part of the conductor pattern on the substrate and the probe on the tested part is in the longitudinal direction of the contact surface and in the direction perpendicular to the longitudinal direction. Since the probes are brought into contact with each other through contact surfaces having different lengths, the number of contact surfaces between the part to be tested and the probe is increased during a continuity test, and the probes are brought into contact reliably.

Embodiment J Hereinafter, one set of probes used in a four-terminal measurement method, which is an embodiment of the present invention, will be explained with reference to the drawings.

FIG. 1 is an optical illusion diagram of the probe according to the first embodiment of the present invention, FIG. 2 (a) is an enlarged view of the tip of the f51 probe, and FIG. Figure 1-(c) is a plan view showing the contact state between the tip of the probe and the part to be inspected, and Figure 2-(c) is
FIG. 1 is a cross-sectional view in which the probe contacts at least a flat surface of a portion to be inspected. # In the diagram S1, the part to be inspected 2 corresponds to the terminal of the conductor pattern 2a of the printed wiring board 12, and is made of a thick film conductive material such as copper, gold, or aluminum. The hole 3, which is a non-conductive part, is formed as a through hole, etc., for inserting the lead of an active component such as a memory, or the lead of a passive component such as a capacitor or resistor, and is also made of an insulating material. The probe 1, which has a substantially parallel width and is connected to the holding plate 6 via the conductive part 5, is entirely made of a conductive material and has bent parts 1a and 1b at its tip, as shown in FIG. , ) and as shown in FIG. 2-(b), the part to be inspected 2 and the probe 1
The contact surface 4 on the inspected part 2 contacts with the contact surface 4 having different lengths in each of the longitudinal direction of the contact surface 4 and the direction orthogonal to the longitudinal direction.

↓ Note that this contact 4 is a contact surface between the part to be tested 2 and the probe 1 on the part to be tested 2 when testing the conduction state of the conductor pattern 2a. Furthermore, in FIG. 2-(b), the length of the contact surface 4 between the part to be inspected 2 and the probe 1 in the direction orthogonal to the longitudinal direction is extremely short, and the contact surface 4 is not rectangular. Flat surfaces 2 other than any non-flat surfaces 2'' that come into contact
'' and small (both have different lengths in the longitudinal direction of the contact surface 4 and in a direction orthogonal to the longitudinal direction).

In addition, in FIG. 1, the lead wire 7 is connected via the conductive part 5.
It is electrically connected to the probe 1, and the holder 8 is provided to fix the entire probe to a probe head (not shown).

Figure 3 is a perspective view of a second embodiment of the probe, which is a modification of the first embodiment of the present invention. Figure 4 is an enlarged view of the tip of the probe shown in Figure 3. , Fig. 3 is a sectional view showing the contact state when the probe contacts the part to be inspected via an elastic body, and Fig. 6 is a cross-sectional view showing the state of contact when the probe contacts the part to be inspected via an elastic body. It is a figure which shows the 3rd Example of this invention, and is sectional drawing which shows the change of the contact state. f
jS3, the probe 9 has a rectangular contact surface 9a that comes into contact with the inspected section 2, and a plate-shaped elastic section 9b.
The elastic part 9b and the contact surface 9a are connected by a connecting member 9c, and the elastic part 9b is
The probe 9 is fixed to a holder 10, and the probe 9 is made of a conductive material as in the first embodiment, and conducts electrical signals between the contact surface 9a of the probe 9 and the part to be inspected 2 to the outside using a lead wire 11. The structure is such that it can be taken out. The holder 10 is then fixed to a probe head (not shown).

In FIG. 5, the probe head (not shown) is lowered, and the contact surface 9a of the probe 9 formed in the rectangular shape of the conductor pattern formed on the printed wiring board 12 is as shown in the same figure.
Since it does not come into close contact with the part to be inspected 2 and one end of the contact surface 9a rises, even if the elastic part 9b bends according to the elastic biasing force given in advance (as shown by the broken line in FIG. The tip of the probe 9 is preset at an angle θ so that the contact surface 9d that contacts the flat surface 2' of the part to be inspected 2 has a contact surface 9a' that contacts the flat surface 2'.

FIG. 7 shows a wiring pattern 14b made of a thick film conductive material such as copper, gold, or aluminum formed in advance on the surface of a 7-lexiple board 13 with an arbitrary width, and connected to a probe 1.
FIG. 8 is an enlarged view showing a contact state between a part of the probe in FIG. 7 and the part to be inspected 2, and FIG. ,
9 is a plan view showing an embodiment of tjS5 in which the shape of the contact surface 14a' of the probe is different from that in FIG. 8. FIG.

A fourth embodiment of the present invention will be described below.

FIG. 7 shows an example of a probe in which two wiring patterns 14b and one test object 11s2 can come into contact. A wiring pattern 14b made of a thick film conductive material such as 1
3 is fixed. The contact surface 14a of the seven-layer board 13 with the part to be inspected 2 is formed so as to be in contact with the part to be inspected 2, and the lead @16 is connected to the wiring pattern 14.
b, and is electrically connected to the printed wiring board 1
By bringing the wiring pattern 14b into contact with the inspected section 21 formed in the test section 2 and using it as a probe 14, a continuity test of the inspected section 2 is performed at the contact surface 14a' shown in FIG. Further, the holder 15 is fixed to a probe head (not shown).

Next, FIG. ff19, which is a fifth embodiment of the present invention, shows the contact surface 14 of the wiring pattern 14b with the part to be inspected 2 shown in FIG.
It is shown that the portion corresponding to a' is used as wiring patterns 18 and 19 facing each other in a U-shape. Also, the seventh
In the figure, an example in which two wiring patterns 14b and one inspected part 2 are in contact has been explained, but the present invention is not limited to this, and the number of wiring patterns in contact with one inspected part 2 is one. But it is possible.

In addition, although the case where the to-be-inspected part 2 has the hole 3 was demonstrated above, it is applicable also to the case where the said to-be-inspected part 2 does not have the hole 3. Further, although an example has been described in which the part to be inspected 2 is a terminal, the conductor pattern 2a is also similar to the probe 1.
The contact surface with 9.14 on the conductor pattern 2a is in the longitudinal direction of the contact surface and in the direction perpendicular to the longitudinal direction! 3 can be brought into contact with different contact surfaces to perform a continuity test.

Hereinafter, the probes used in the 14i probe measurement method have been described as a set of two probes that are close to each other, but the same can be applied to the case where one probe is brought into contact with the inspected parts 2 at different locations. .

Furthermore, when testing the conductivity state of the conductive pattern, a contact surface between the part to be tested and the probe on the part to be tested has a contact surface having different lengths in the longitudinal direction and in a direction orthogonal to the longitudinal direction. However, as long as the area of the contact surface is 0.2 m112 or more, it may be a circular or square contact surface, and in short, it is sufficient to have a non-point-like contact state.

[Effects of the Invention J] According to the present invention, according to claim 1, in a probe of a continuity testing device for testing the continuity state of a conductor pattern on a substrate, a portion to be inspected of the conductor pattern is brought into contact with the probe; When testing the conductivity state of a conductor pattern, a contact surface between the part to be tested and the probe on the part to be tested has different lengths in a longitudinal direction of the contact surface and in a direction perpendicular to the longitudinal direction. Since the contact surface has a wide contact surface, the instability of contact resistance caused by point-like contact with the part to be inspected, which is typical of needle-type probes, can be reduced, and the position of the tip of the probe and the part to be inspected can be misaligned. However, it can be resolved. Further, the probe of the present invention and the part to be inspected change from point contact to surface contact, which makes it easier to adjust the position of the probe with respect to the part to be inspected.

According to the second aspect, when the probe inspects the conduction state of the conductive pattern, the contact surface between the test target part and the probe on the test target part is set such that the contact surface between the test target part and the probe is relative to the longitudinal center axis of the probe.
Since it has an angled and extending contact surface, the probe of the present invention will not slip even if the outer edge of the part to be inspected is sagging.
At least the conductor pattern on the board is in contact with the flat surface of the part to be inspected, and even if there is a hole in the part to be inspected, there is no inspection error or leakage such as the probe falling into the hole. Accurate continuity testing becomes possible.

According to claim 3, when inspecting the conductive state of the conductor pattern, the area of the contact surface between the inspected section and the probe on the inspected section is 0.2III112 or more, so that the probe of the present invention makes contact. A sufficient surface area can be secured for practical use, and stable continuity testing can be performed.

[Brief explanation of the drawing]

FIG. 1 is a perspective view of the probe according to the first embodiment of the present invention, FIG. 2-(a) is an enlarged view of the tip of the probe in FIG. FIG.
3 is a perspective view of the probe according to the second embodiment of the present invention; FIG. 4 is an enlarged view of the tip of the probe shown in FIG. 3. ,
The tjSs diagram is a cross-sectional view showing the contact state when the probe in Figure 3 contacts the part to be inspected via the elastic body, and Figure 6 is
FIGS. 3 and 4 are cross-sectional views showing changes in the contact state according to the third embodiment of the present invention in which the shape of the tip of the probe is changed, and FIG. #S7 is a probe according to the fourth embodiment of the present invention. FIG. 8 is an enlarged view showing the contact state between a part of the probe in FIG. fjS7 and the part to be inspected 2, and FIG. FIG. 10 is an enlarged view of the tip of a conventional needle-type probe, and FIG. f:tSl1 is a sectional view of the needle-type probe in FIG. 1.9.14・φ・Probe 2011 Fist/needle probe 2... Part to be inspected 2'... Flat surface 2'''... Non-flat surface 3...
・Hole 4.9a, 9a', 14a, 14a'...
Contact surface 8.10.15...Holding body 7.11.16...Lead li 9b...Elastic part 12...Printed wiring board 13...7 Lexiple board 14b...Wiring pattern

Claims (1)

[Claims] 1. In a probe of a continuity testing device for testing the continuity state of a conductor pattern on a substrate, when testing the continuity state of the conductor pattern by bringing the probe into contact with a portion to be tested of the conductor pattern. The contact surface between the inspected section and the probe on the inspected section has a contact surface having different lengths in a longitudinal direction of the contact surface and in a direction perpendicular to the longitudinal direction. probe. 2. When the probe tests the conductivity state of the conductor pattern, a contact surface between the test target part and the probe on the test target part has an angle with respect to the longitudinal center axis of the probe;
Probe according to claim 1, characterized in that it has an elongated contact surface. 3. The scope of claims characterized in that when testing the conductivity state of the conductor pattern, the area of the contact surface between the part to be tested and the probe on the part to be tested is 0.2 mm^2 or more. The probe according to item 1 or 2.