JPH0335459U - - Google Patents
Info
- Publication number
- JPH0335459U JPH0335459U JP9577889U JP9577889U JPH0335459U JP H0335459 U JPH0335459 U JP H0335459U JP 9577889 U JP9577889 U JP 9577889U JP 9577889 U JP9577889 U JP 9577889U JP H0335459 U JPH0335459 U JP H0335459U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- width
- level
- defect
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 5
- 238000003384 imaging method Methods 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 3
Description
第１図は本考案の一実施例による欠陥検査装置
の概略構成図、第２図は同装置における要部の波
形図、第３図は同装置におけるクランプ回路４の
具体的な回路図である。
１……撮像装置（撮像手段）、４……クランプ
回路、５……コンパレータ（レベル弁別回路）、
７……アンドゲート（欠陥幅検出回路）、８……
カウンタ（欠陥幅検出回路）、９……デジタルコ
ンパレータ（幅弁別回路）。
FIG. 1 is a schematic configuration diagram of a defect inspection device according to an embodiment of the present invention, FIG. 2 is a waveform diagram of the main parts of the device, and FIG. 3 is a specific circuit diagram of the clamp circuit 4 in the device. . 1... Imaging device (imaging means), 4... Clamp circuit, 5... Comparator (level discrimination circuit),
7...AND gate (defect width detection circuit), 8...
Counter (defect width detection circuit), 9...Digital comparator (width discrimination circuit).
Claims (1)
撮像手段と、前記アナログ画像信号の特定の輝度
レベルを特定の信号レベルに固定するクランプ回
路と、このクランプ回路を経たアナログ画像信号
と所定のしいき値とを比較するレベル弁別回路と
、このレベル弁別回路から出力される方形波信号
の時間幅を検出する欠陥幅検出回路と、検出され
た前記時間幅が所定の基準幅よりも大きいときに
欠陥検出信号を発生する幅弁別回路とを備えた欠
陥検査装置。 an imaging means for imaging an object to be inspected to obtain an analog image signal; a clamp circuit for fixing a specific brightness level of the analog image signal to a specific signal level; a defect width detection circuit that detects a time width of a square wave signal outputted from the level discrimination circuit; and a defect width detection circuit that detects a time width of a square wave signal outputted from the level discrimination circuit; A defect inspection device comprising a width discrimination circuit that generates a detection signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9577889U JPH0335459U (en) | 1989-08-17 | 1989-08-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9577889U JPH0335459U (en) | 1989-08-17 | 1989-08-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0335459U true JPH0335459U (en) | 1991-04-08 |
Family
ID=31645025
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9577889U Pending JPH0335459U (en) | 1989-08-17 | 1989-08-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0335459U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6130685A (en) * | 1984-07-23 | 1986-02-12 | Furukawa Electric Co Ltd:The | Method for preventing corrosion of copper-base piping |
| JPS62242844A (en) * | 1986-04-15 | 1987-10-23 | Gunze Ltd | Defective detecting method for knitted texture |
-
1989
- 1989-08-17 JP JP9577889U patent/JPH0335459U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6130685A (en) * | 1984-07-23 | 1986-02-12 | Furukawa Electric Co Ltd:The | Method for preventing corrosion of copper-base piping |
| JPS62242844A (en) * | 1986-04-15 | 1987-10-23 | Gunze Ltd | Defective detecting method for knitted texture |
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