JPH0330834B2 - - Google Patents
Info
- Publication number
- JPH0330834B2 JPH0330834B2 JP57129868A JP12986882A JPH0330834B2 JP H0330834 B2 JPH0330834 B2 JP H0330834B2 JP 57129868 A JP57129868 A JP 57129868A JP 12986882 A JP12986882 A JP 12986882A JP H0330834 B2 JPH0330834 B2 JP H0330834B2
- Authority
- JP
- Japan
- Prior art keywords
- electric field
- field strength
- radiated
- frequency signal
- intensity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005684 electric field Effects 0.000 claims description 87
- 238000012360 testing method Methods 0.000 claims description 33
- 238000012545 processing Methods 0.000 claims description 18
- 230000005855 radiation Effects 0.000 claims description 17
- 239000000835 fiber Substances 0.000 claims description 11
- 230000035945 sensitivity Effects 0.000 claims description 9
- 238000005259 measurement Methods 0.000 claims description 6
- 230000003321 amplification Effects 0.000 claims description 4
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims description 4
- 239000003989 dielectric material Substances 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 17
- 238000006243 chemical reaction Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 230000004907 flux Effects 0.000 description 5
- 238000005457 optimization Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 238000005070 sampling Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000002427 irreversible effect Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001915 proofreading effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57129868A JPS5919874A (ja) | 1982-07-26 | 1982-07-26 | 放射干渉感度試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57129868A JPS5919874A (ja) | 1982-07-26 | 1982-07-26 | 放射干渉感度試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5919874A JPS5919874A (ja) | 1984-02-01 |
| JPH0330834B2 true JPH0330834B2 (zh) | 1991-05-01 |
Family
ID=15020273
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57129868A Granted JPS5919874A (ja) | 1982-07-26 | 1982-07-26 | 放射干渉感度試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5919874A (zh) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6385372A (ja) * | 1986-09-29 | 1988-04-15 | Fujitsu Ltd | 電磁波測定装置 |
| JPH0252261A (ja) * | 1988-08-17 | 1990-02-21 | Erena Denshi Kk | Ｔｅｍセル内部電界自動補正装置 |
| US5302960A (en) * | 1992-07-20 | 1994-04-12 | Digital Equipment Corporation | Multi-element susceptibility room |
| US8577631B2 (en) | 2010-01-26 | 2013-11-05 | Power Survey Llc | Method and apparatus for discrimination of sources in stray voltage detection |
| JP5499919B2 (ja) * | 2010-06-07 | 2014-05-21 | 日本電気株式会社 | マイクロ波照射試験装置、該試験装置に用いられる照射試験方法及び照射試験プログラム |
-
1982
- 1982-07-26 JP JP57129868A patent/JPS5919874A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5919874A (ja) | 1984-02-01 |
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