JPH03293558A - Making of reference test piece for ultrasonic flaw detection by diffusion junction method - Google Patents

Making of reference test piece for ultrasonic flaw detection by diffusion junction method

Info

Publication number
JPH03293558A
JPH03293558A JP2093865A JP9386590A JPH03293558A JP H03293558 A JPH03293558 A JP H03293558A JP 2093865 A JP2093865 A JP 2093865A JP 9386590 A JP9386590 A JP 9386590A JP H03293558 A JPH03293558 A JP H03293558A
Authority
JP
Japan
Prior art keywords
product
test piece
same
standard test
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2093865A
Other languages
Japanese (ja)
Inventor
Mitsumasa Sakamoto
坂本 光正
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP2093865A priority Critical patent/JPH03293558A/en
Publication of JPH03293558A publication Critical patent/JPH03293558A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:To evaluate quality of a product junction part narrow in width by making a test piece the same in width as a product having several types of defects in one reference test piece by a diffusion junction method while material thereof is made equal in quality to be the same in ultrasonic transmission capacity. CONSTITUTION:Material the same in a product is used to make an ultrasonic transmission capacity of reference test pieces 5 and 8 equal to that of the product. Hence, ultrasonic flaw detecting conditions are set so that noises between a defect echoes and surface echoes and bottom echoes of the test pieces 5 and 8 having the same junction width as that of the product are removed to extract the defect echo only. A detection of flaws is performed on the conditions thereby enabling the detection of any defect 4 existing in product junction parts 6 and 7.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は接合部幅の狭い接合部品質評価を行なう拡散接
合法による超音波探傷用標準試験片作製方法に関するも
のである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for producing a standard test piece for ultrasonic flaw detection using a diffusion bonding method for evaluating the quality of a joint having a narrow joint width.

(従来の技術) 従来の超音波探傷用のASTM標準試験片1は第4図に
示す如く直径約50肛で、その中央部に種々な深さの各
種サイズの欠陥2を有していた。そこでこの標準試験片
1で製品接合部の欠陥を探傷する場合に製品接合部位置
と標準試験片の欠陥深さが一致しないと、その付近の欠
陥深さの試験片で目的とする欠陥深さに対する検量線を
作ったりしていた。しかしこの場合でもASTM標準試
験片と製品との金属組織の差による超音波透過能の差に
より製品の接合部欠陥が検出されなかったり、また幅の
狭い接合部に含まれる欠陥が検出できないという欠点が
あった。
(Prior Art) A conventional ASTM standard test piece 1 for ultrasonic flaw detection had a diameter of about 50 holes as shown in FIG. 4, and had defects 2 of various sizes and depths in the center thereof. Therefore, when detecting defects in the product joint using this standard test piece 1, if the product joint position and the defect depth of the standard test piece do not match, the target defect depth can be detected using a test piece with a nearby defect depth. I was also creating a calibration curve for this. However, even in this case, defects in the joints of the product may not be detected due to the difference in ultrasonic transmission power due to the difference in metal structure between the ASTM standard test piece and the product, and defects in narrow joints may not be detected. was there.

(発明が解決しようとする課題) 前記従来方法では、製品と標準試験片間で金KMi織や
欠陥位置が異なる場合、拡散接合部幅が狭い製品の接合
品質評価は困難であった。
(Problems to be Solved by the Invention) In the conventional method described above, it is difficult to evaluate the bonding quality of a product with a narrow diffusion bonded portion when the gold-KMi weave or defect position differs between the product and the standard test piece.

本発明は前記従来の欠点を排除して、拡散接合部幅が狭
くても接合部品質評価ができる標準試験片作製方法を提
供せんとするものである。
The present invention aims to eliminate the above-mentioned conventional drawbacks and provide a method for producing a standard test piece that allows the quality of a bonded portion to be evaluated even if the width of the diffusion bonded portion is narrow.

(課題を解決するための手段) このため本発明は、拡散接合部の幅が狭い製品の接合品
質評価を可能とする方法であって、1つの標準試験片に
数種類の欠陥を有する製品と幅が同じ試験片を拡散接合
法により作製し、同拡散接合法により作製した標準試験
片の材料は製品と同一として標準試験片と製品との超音
波透過能を同じとしてなるもので、これを課題解決のた
めの手段とするものである。
(Means for Solving the Problems) Therefore, the present invention provides a method that enables the evaluation of the bonding quality of products with a narrow width of the diffusion bonded portion. The same test piece was made using the diffusion bonding method, and the material of the standard test piece made using the same diffusion bonding method was the same as the product, and the ultrasonic transmission ability of the standard test piece and the product were the same. It is intended as a means to solve the problem.

(作用) 拡散接合部欠陥評価用の標準試験片として、製品と同一
金属組織と同一接合幅を有するものを作製することによ
り、従来のASTM標準試験片使用時よりも欠陥検出精
度が改善され、拡散接合部の品質信頼性の向上を図るこ
とができる。
(Function) By producing a standard test piece for evaluating diffusion bond defects that has the same metal structure and the same bond width as the product, defect detection accuracy is improved compared to when using a conventional ASTM standard test piece. It is possible to improve the quality reliability of the diffusion bonding portion.

(実施例) 以下本発明の実施例を図面について説明すると、第1図
〜第3図は材質がTi−6A14V に対する実施例を
示し、第1図は拡散接合前に、片方の接合片3に機械加
工で欠陥サイズの異なる各種接合欠陥4を故意に加工し
た場合を示し、二の接合片の材料は製品と同一とした場
合であり、同接合片3と同一サイズの欠陥のないものを
接合する。
(Example) Below, an example of the present invention will be explained with reference to the drawings. Figures 1 to 3 show an example in which the material is Ti-6A14V. This shows the case where various bonding defects 4 with different defect sizes were intentionally machined, and the material of the second bonded piece is the same as the product, and the same bonded piece 3 and the same size without defects are bonded. do.

第2図は拡散接合後の標準試験片5の外観を示す。なお
、この試験片5の拡散接合部6は製品と同一接合条件(
900″C10,3kg/m、2Hr加圧、10−5m
mHg)とした。
FIG. 2 shows the appearance of the standard test piece 5 after diffusion bonding. The diffusion bonded portion 6 of this test piece 5 was bonded under the same bonding conditions as the product (
900″C10, 3kg/m, 2Hr pressurization, 10-5m
mHg).

第3図は機械加工及びワイヤカット等の加工法により拡
散接合部7の幅を製品と同じにした超音波探傷用標準試
験片8の外観を示す。加工により除去した試験片を研磨
し、光学顕微鏡観察をすることにより欠陥サイズの実体
を把握することができる。以上の実施例はTi −6A
I−4Vを対象としたが、本発明は拡散接合が可能な全
ての材料の接合欠陥検出に適用できる。
FIG. 3 shows the appearance of a standard test piece 8 for ultrasonic flaw detection in which the width of the diffusion bonded portion 7 is made the same as that of the product by processing methods such as machining and wire cutting. The actual size of the defect can be ascertained by polishing the specimen removed by processing and observing it with an optical microscope. The above example is Ti-6A
Although the present invention is aimed at I-4V, it can be applied to detection of bonding defects in all materials that can be diffusion bonded.

(発明の効果) 以上詳細に説明した如く本発明は構成されており、製品
と同一材料を用いることにより標準試験片の超音波透過
能が製品と同じとなるため、製品と同一接合幅を有する
標準試験片の表面エコー及び底面エコーと欠陥エコー間
のノイズを除去し、欠陥エコーだけを抽出するような超
音波探傷条件を設定し、その条件で製品の超音波探傷を
実施することにより、製品接合部に欠陥が存在する場合
は欠陥が検出できる。
(Effects of the Invention) As explained in detail above, the present invention is configured, and by using the same material as the product, the ultrasonic transmittance of the standard test piece is the same as that of the product, so it has the same bonding width as the product. By setting ultrasonic flaw detection conditions that remove noise between the surface and bottom echoes and defect echoes of a standard test piece and extracting only the defect echoes, and performing ultrasonic flaw detection on the product under those conditions, the product If a defect exists in the joint, the defect can be detected.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)は本発明の実施例に係る拡散接合前の接合
片の平面図、第1図(b)は第1図(a)のA〜A断面
図、第2図(a)は拡散接合後の標準試験片を示す正面
図、第2図b)は第2図(a)の平面図、第3図(a)
は接合部幅を製品と同一に加工した標準試験片を示す正
面図、第3図Φ)は第3図(a)の平面図、第4図(a
)は従来の標準試験片を示す正面図、第4図(b)は第
4図(a)の平面図である。 図の主要部分の説明 3−接合片      4−・−接合欠陥5−試験片 6−・・拡散接合部 7−拡散接合部 8−試験片
FIG. 1(a) is a plan view of a bonded piece before diffusion bonding according to an embodiment of the present invention, FIG. 1(b) is a sectional view taken from A to A in FIG. 1(a), and FIG. 2(a) is a front view showing the standard test piece after diffusion bonding, Figure 2b is a plan view of Figure 2(a), and Figure 3(a) is a front view of the standard test piece after diffusion bonding.
is a front view showing a standard test piece processed to have the same joint width as the product, Figure 3 Φ) is a plan view of Figure 3 (a), Figure 4 (a)
) is a front view showing a conventional standard test piece, and FIG. 4(b) is a plan view of FIG. 4(a). Explanation of the main parts of the figure 3 - Bonded piece 4 - - Bonding defect 5 - Test piece 6 - Diffusion bonded part 7 - Diffusion bonded part 8 - Test piece

Claims (1)

【特許請求の範囲】[Claims] 拡散接合部の幅が狭い製品の接合品質評価を可能とする
方法であって、1つの標準試験片に数種類の欠陥を有す
る製品と幅が同じ試験片を拡散接合法により作製し、同
拡散接合法により作製した標準試験片の材料は製品と同
一として標準試験片と製品との超音波透過能を同じとし
てなることを特徴とする拡散接合法による超音波探傷用
標準試験片の作製方法。
This is a method that enables the evaluation of the bonding quality of products with narrow diffusion bonding parts, in which test pieces with the same width as a product with several types of defects are prepared using the diffusion bonding method, and the same diffusion bonding is performed. A method for producing a standard test piece for ultrasonic flaw detection using a diffusion bonding method, characterized in that the material of the legally produced standard test piece is the same as that of the product, and the ultrasonic transmission ability of the standard test piece and the product are the same.
JP2093865A 1990-04-11 1990-04-11 Making of reference test piece for ultrasonic flaw detection by diffusion junction method Pending JPH03293558A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2093865A JPH03293558A (en) 1990-04-11 1990-04-11 Making of reference test piece for ultrasonic flaw detection by diffusion junction method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2093865A JPH03293558A (en) 1990-04-11 1990-04-11 Making of reference test piece for ultrasonic flaw detection by diffusion junction method

Publications (1)

Publication Number Publication Date
JPH03293558A true JPH03293558A (en) 1991-12-25

Family

ID=14094343

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2093865A Pending JPH03293558A (en) 1990-04-11 1990-04-11 Making of reference test piece for ultrasonic flaw detection by diffusion junction method

Country Status (1)

Country Link
JP (1) JPH03293558A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005078428A1 (en) * 2004-02-17 2005-08-25 Masao Yoshida Method of manufacturing reference gauge for flaw inspection

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005078428A1 (en) * 2004-02-17 2005-08-25 Masao Yoshida Method of manufacturing reference gauge for flaw inspection

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