JPH03286552A - Semiconductor integrated circuit device - Google Patents
Semiconductor integrated circuit deviceInfo
- Publication number
- JPH03286552A JPH03286552A JP8798590A JP8798590A JPH03286552A JP H03286552 A JPH03286552 A JP H03286552A JP 8798590 A JP8798590 A JP 8798590A JP 8798590 A JP8798590 A JP 8798590A JP H03286552 A JPH03286552 A JP H03286552A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor
- integrated circuit
- films
- circuit device
- semiconductor integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 29
- 239000012212 insulator Substances 0.000 claims abstract description 11
- 230000000295 complement effect Effects 0.000 claims description 5
- 239000000758 substrate Substances 0.000 abstract description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 6
- 229910052681 coesite Inorganic materials 0.000 abstract 3
- 229910052906 cristobalite Inorganic materials 0.000 abstract 3
- 239000000377 silicon dioxide Substances 0.000 abstract 3
- 235000012239 silicon dioxide Nutrition 0.000 abstract 3
- 229910052682 stishovite Inorganic materials 0.000 abstract 3
- 229910052905 tridymite Inorganic materials 0.000 abstract 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract 1
- 229910052593 corundum Inorganic materials 0.000 abstract 1
- 229910001845 yogo sapphire Inorganic materials 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
Abstract
Description
【発明の詳細な説明】 [産業上の利用分野] 本発明は半導体集積回路装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a semiconductor integrated circuit device.
[従来の技術]
半導体集積回路装置は、ジャック・セントフレア キル
ビイによるUSP791602.特公昭61−5525
6に規定された、主要な表面と裏面とを有する単一の半
導体薄板に、本質的に平面状に配置された複数の回路素
子と、この薄板の外部に接続が必要とされる回路素子に
対し電気的に接続された複数の引出線とを有する電子回
路用の半導体装置であるとされて来たのが通例であった
[発明が解決しようとする課題]
しかし、上記従来技術によると、半導体集積回路装置に
は主要な表面と裏面とを有する単一の半導体薄板に複数
の回路素子を含む事、及び前記の複数の回路素子は、前
記薄板の種々の区域に互いに距離的に離間して形成され
る必要があり、又、前記の複数の回路素子は、前記薄板
の前記主要な表面に終る接合により画定されている薄い
領域をそれぞれ少くともひとつ含む必要があると云う事
が限定があると云う課題があった。[Prior Art] A semiconductor integrated circuit device is disclosed in USP 791602 by Jack St. Flair Kilby. Tokuko Showa 61-5525
A plurality of circuit elements arranged essentially in a planar manner on a single semiconductor thin plate having a principal front surface and a rear surface, as defined in Paragraph 6, and circuit elements requiring connections to the outside of this thin plate. However, according to the above-mentioned prior art, A semiconductor integrated circuit device includes a plurality of circuit elements on a single semiconductor thin plate having a main surface and a back side, and said plurality of circuit elements are spaced apart from each other in various areas of said thin plate. It is non-limiting that said plurality of circuit elements must each include at least one thin region defined by a bond terminating in said major surface of said sheet. There was an issue.
本発明はかかる従来技術の課題を解決し、より新しい半
導体集積回路装置を提供する事を目的とする0
[課題を解決するための手段]
上記課題を解決するために、本発明は、半導体集積回路
装置に関し、
(1)絶縁体上に互いに誘電体分離した半導体回路素子
を形成する手段を取る事、及び(2)半導体回路素子を
相補型半導体回路素子となす手段を取った第1項記載の
半導体集積回路装置となす事、
等である。[Means for Solving the Problems] In order to solve the above problems, the present invention aims to solve the problems of the prior art and provide a newer semiconductor integrated circuit device. Regarding the circuit device, (1) taking means to form semiconductor circuit elements dielectrically separated from each other on an insulator, and (2) taking means to make the semiconductor circuit elements complementary semiconductor circuit elements, as described in paragraph 1. These are things to do with semiconductor integrated circuit devices, etc.
[実施例] 以下、実施例により本発明を詳述する。[Example] Hereinafter, the present invention will be explained in detail with reference to Examples.
第1図は本発明の一実施例を示す相補型MO3集積回路
装置の要部の断面図である。すなわち、Slから筬る基
板1の表面には5i022なる絶縁体が形成され、該絶
縁体上に81膜ろ及び5′を形成し、各々にnチャンネ
ルMO8FETとPチャネルMOS FETを構成し
たものであり各素子は誘電体膜6により完全に誘電体分
離されて成る。各素子は5i02等から成るゲート膜4
及び4′、及びゲート電極5及び5′によりMO8型F
KTを構成して筬ると共に、半導体膜であるSi膜5及
び3′には、半導体膜の少くとも表面と裏面の2主面に
接したP −n接合が形成されて成るのが特徴である。FIG. 1 is a sectional view of a main part of a complementary MO3 integrated circuit device showing one embodiment of the present invention. That is, an insulator 5i022 is formed on the surface of the substrate 1 that is recessed from the Sl, and 81 films and 5' are formed on the insulator, and an n-channel MO8FET and a P-channel MOS FET are formed in each. Each element is completely dielectrically isolated by a dielectric film 6. Each element has a gate film 4 made of 5i02 etc.
and 4', and gate electrodes 5 and 5' to form an MO8 type F
In addition to forming the KT, the Si films 5 and 3', which are semiconductor films, are characterized in that a P-n junction is formed in contact with at least two principal surfaces, the front and back surfaces of the semiconductor film. be.
尚基板1はSlである必要はなく、5i02やAt20
3等他の絶縁体であっても良く、又互いに誘電体分離さ
れた素子は必ずしも相補型である必要がないことは云う
までもない。Note that the substrate 1 does not need to be Sl, but may be 5i02 or At20.
It goes without saying that other insulators, such as No. 3, may be used, and the elements dielectrically separated from each other do not necessarily have to be complementary types.
第2図は、本発明の他の実施例を示すインバータ回路素
子の要部の断面図である。すなわち、Si等から成る基
板110表面には510212から成る絶縁体が形成さ
れ、該絶縁体上にS1膜15が形成され、該Si膜13
に1は、5i02等から成るゲート膜14及び14′、
及びゲート電極15及び15′をそなえたHチャネルM
OSFETとPチャネルMOS FETが連らなって
インバーター回路素子を形成して戊り、各回路素子は互
いに誘電体膜16により完全に誘電体分離されて成るの
が特徴であり、この場合はp −n接合は、S1膜13
0表と裏の2主表面に接して成るのが特徴である。FIG. 2 is a sectional view of a main part of an inverter circuit element showing another embodiment of the present invention. That is, an insulator made of 510212 is formed on the surface of a substrate 110 made of Si or the like, an S1 film 15 is formed on the insulator, and the Si film 13
In 1, gate films 14 and 14' made of 5i02 or the like,
and an H channel M with gate electrodes 15 and 15'.
The OSFET and the P-channel MOS FET are connected to form an inverter circuit element, and each circuit element is completely dielectrically isolated from each other by a dielectric film 16. In this case, p - The n-junction is the S1 film 13
It is characterized by being in contact with two main surfaces, the front and back.
尚、この場合も相補型のインバーター回路素子を示した
が、同一チャネルMO3FETによるインバーター回路
素子であっても良い事は云うまでもない。Although complementary inverter circuit elements are shown in this case as well, it goes without saying that inverter circuit elements using MO3FETs of the same channel may also be used.
更に、誘電体分離して互に独立して形成する素子として
抵抗体や容量体の如き反活性素子を含んでいる事も云う
までもない。Furthermore, it goes without saying that inactive elements such as resistors and capacitors are included as elements which are dielectrically separated and formed independently from each other.
又、本例ではMO8型FETを例に取り上げたがP−ル
ーPやルーアール接合を横型に配列したラテラル バイ
ポーラ トランジスタであっても良い。Further, in this example, an MO8 type FET is taken as an example, but a lateral bipolar transistor in which P-Roup P or Rouar junctions are arranged horizontally may also be used.
更にダイオード素子としてP−ル接合を横型に形成し、
独立に誘電体分離されたものも本発明の範中に入ること
も云うまでもない。Furthermore, a P-le junction is formed horizontally as a diode element,
Needless to say, those independently dielectrically separated also fall within the scope of the present invention.
[発明の効果]
本発明により、半導体集積回路装置が81薄板の一主表
面にp −n接合が接する場合のみならずSi薄型の二
重表面にP −n接合が接し且つ完全に誘電体分離され
た回路素子が集積化できることとなり、半導体集積回路
装置の新らしい横絞を提供することができると共に、半
導体集積回路装置の一層の高集積化や高速化を計ること
ができる笠の効果もある。[Effects of the Invention] According to the present invention, the semiconductor integrated circuit device can be used not only when the p-n junction is in contact with one main surface of the 81 thin plate, but also when the p-n junction is in contact with the double surface of the Si thin plate and completely dielectrically separated. This makes it possible to integrate integrated circuit elements, providing a new lateral limit for semiconductor integrated circuit devices, and also has the effect of making it possible to further increase the integration and speed of semiconductor integrated circuit devices. .
第1図及び第2図は本発明の実施例を示す半導体集積回
路装置の要部の断面図である。
111・・・・・基 板
2.12・・・・・・S工02
5.5’、15・・・・・・S1膜
4.4’、14.14’・・・・・・ゲート膜5、5’
、 15、15’・・・・・・ゲート電極6.16
・・・・・・誘電体膜1 and 2 are cross-sectional views of essential parts of a semiconductor integrated circuit device showing an embodiment of the present invention. 111...Substrate 2.12...S work 02 5.5', 15...S1 film 4.4', 14.14'...Gate Membrane 5, 5'
, 15, 15'... Gate electrode 6.16
・・・・・・Dielectric film
Claims (2)
子が形成されて成る事を特徴とする半導体集積回路装置
。(1) A semiconductor integrated circuit device comprising semiconductor circuit elements dielectrically separated from each other formed on an insulator.
を特徴とする第1項記載の半導体集積回路装置。(2) The semiconductor integrated circuit device according to item 1, wherein the semiconductor circuit element is a complementary semiconductor circuit element.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8798590A JPH03286552A (en) | 1990-04-02 | 1990-04-02 | Semiconductor integrated circuit device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8798590A JPH03286552A (en) | 1990-04-02 | 1990-04-02 | Semiconductor integrated circuit device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03286552A true JPH03286552A (en) | 1991-12-17 |
Family
ID=13930113
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8798590A Pending JPH03286552A (en) | 1990-04-02 | 1990-04-02 | Semiconductor integrated circuit device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03286552A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6383850B2 (en) * | 1999-01-11 | 2002-05-07 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device and method of manufacturing the same |
-
1990
- 1990-04-02 JP JP8798590A patent/JPH03286552A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6383850B2 (en) * | 1999-01-11 | 2002-05-07 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device and method of manufacturing the same |
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