JPH03272413A - Distance measuring apparatus - Google Patents

Distance measuring apparatus

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Publication number
JPH03272413A
JPH03272413A JP7401190A JP7401190A JPH03272413A JP H03272413 A JPH03272413 A JP H03272413A JP 7401190 A JP7401190 A JP 7401190A JP 7401190 A JP7401190 A JP 7401190A JP H03272413 A JPH03272413 A JP H03272413A
Authority
JP
Japan
Prior art keywords
voltage
circuits
circuit
light
outputs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7401190A
Other languages
Japanese (ja)
Inventor
Eiichi Matsuyama
松山 栄一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP7401190A priority Critical patent/JPH03272413A/en
Publication of JPH03272413A publication Critical patent/JPH03272413A/en
Pending legal-status Critical Current

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  • Measurement Of Optical Distance (AREA)

Abstract

PURPOSE:To achieve a high distance measuring accuracy by varying a time constant of an integration circuit according to a distance and a reflection factor of a target object. CONSTITUTION:In the case of a short range or in the case of a large reflection factor of an object. A good condition is created with a higher level than a reference voltage 11 of amplification circuits 6a and 6b and limited noises in outputs of integration circuits 9a and 9b. In addition, outputs of voltage comparators 10a and 10b are not inverted and switches 13a and 13b are OFF. Then, in the case of a long range or a small reflection factor of the object, a condition with a bad signal/noise ratio is caused with an output voltage of the circuits 6a and 6b being lower than the voltage 11 and output voltages of the circuits 9a and 9b being low. Here, the outputs of the comparators 10a and 10b are inverted and the switches 13a and 13b are ON. Thus, integration time constants of the circuits 9a and 9b are reset for a larger value. By the contrary, the integration time constants are set larger at an initial stage and them, the integration time constants are reduced when input levels of the comparators 10a and 10b exceed the voltage 11.

Description

【発明の詳細な説明】 〔産業上の利用分野) この発明は、例えば写真などの光学機器に好適な目標物
体までの距離を測定する測距装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a distance measuring device for measuring the distance to a target object, which is suitable for optical equipment such as photography.

(従来の技術) 従来、目標物体までの距離を測定する測距装置の信号処
理回路としては、種々提案されているが、その−例を第
3図に示して説明する。
(Prior Art) Conventionally, various signal processing circuits have been proposed for distance measuring devices that measure the distance to a target object, and an example thereof will be described with reference to FIG. 3.

この図において、1は発光回路で、発光素子2を駆動す
る。発光回路1および発光素子2は測距対象となる目標
物体3に対して発光する発光手段を構成し、発光素子2
からの光は目標物体3に向けて照射されるように構成さ
れている。
In this figure, numeral 1 denotes a light emitting circuit that drives a light emitting element 2. As shown in FIG. The light emitting circuit 1 and the light emitting element 2 constitute a light emitting means that emits light toward a target object 3 to be measured, and the light emitting element 2
The light from the target object 3 is configured to be irradiated onto the target object 3.

4aおよび4bは光を信号電圧に変換して増幅する受光
回路で、それぞれ目標物体3からの反射光を受光して電
圧信号に変換する受光素子5aおよび5bを有しており
、受光回路4a、4bは目標物体3からの反射光を受光
して光電変換する受光手段を構成している。6aおよび
6bは増幅回路で、それぞれ受光回路4aおよび受光回
路4bから出力される光情報信号を入力とし、その出力
を増幅する。7は波形処理回路で、増幅回路6a、6b
からの出力を入力として演算する。8は距離情報である
4a and 4b are light-receiving circuits that convert light into a signal voltage and amplify it, each having light-receiving elements 5a and 5b that receive reflected light from the target object 3 and convert it into a voltage signal; the light-receiving circuits 4a, Reference numeral 4b constitutes a light receiving means for receiving reflected light from the target object 3 and photoelectrically converting it. Reference numerals 6a and 6b denote amplifier circuits, which receive optical information signals outputted from the light receiving circuit 4a and the light receiving circuit 4b, respectively, and amplify their outputs. 7 is a waveform processing circuit, which includes amplifier circuits 6a and 6b.
Compute using the output from as input. 8 is distance information.

次に、動作について説明する。Next, the operation will be explained.

発光回路1によって駆動された発光素子2より発光され
た光は目標物体3に当たり、反射されて受光素子5a、
5bに入る。そして、この受光素子5a、5bに入った
光はそれぞれ受光回路4a、4bで信号電圧に変換され
て増幅される。
The light emitted from the light emitting element 2 driven by the light emitting circuit 1 hits the target object 3 and is reflected to the light receiving element 5a,
Enter 5b. The light entering the light receiving elements 5a and 5b is converted into a signal voltage and amplified by the light receiving circuits 4a and 4b, respectively.

次に、受光回路4a、4bから出力された光情報信号は
、それぞれ次段の増幅回路6a、6bによって増幅され
た後、波形処理回路7に入力され、演算が行われること
によりて距離が算出され、距離情報8として出力される
Next, the optical information signals output from the light receiving circuits 4a and 4b are amplified by the next-stage amplifier circuits 6a and 6b, respectively, and then input to the waveform processing circuit 7, where calculations are performed to calculate the distance. and output as distance information 8.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来の測距装置の信号処理回路は以上のように構成され
ていたので、受光素子5a、5bにそれぞれ入射する光
強度は目標物体3への距離1反射率などの相違により、
微弱な信号となることがあり、この場合、通常と同様に
増幅回路6a、6bで増幅しても雑音が生じて真の光信
号のみを増幅することが難しく、信号対雑音比(S/N
)が悪くなっていた。そして、受光回路4a、4bおよ
び増幅回路5a、5bによって発生する雑音が光信号電
圧に加算されので、結果として、特に光信号が微弱な場
合(例えば遠距離時あるいは被写体反射率が低い場合等
)には測距性能が悪化するという問題点があった。
Since the signal processing circuit of the conventional distance measuring device is configured as described above, the light intensity incident on each of the light receiving elements 5a and 5b varies depending on the distance to the target object 31 and the reflectance, etc.
The signal may be weak, and in this case, even if it is amplified by the amplifier circuits 6a and 6b as usual, noise will occur, making it difficult to amplify only the true optical signal, and the signal-to-noise ratio (S/N
) was getting worse. Then, the noise generated by the light receiving circuits 4a, 4b and the amplifier circuits 5a, 5b is added to the optical signal voltage, so as a result, especially when the optical signal is weak (for example, at a long distance or when the subject reflectance is low) However, there was a problem in that the ranging performance deteriorated.

この発明は、上記のような問題点を解消するためになさ
れたもので、光信号の微弱な場合でも、信号対雑音比(
S/N)を向上できるとともに、測距精度を向上できる
測距装置を得ることを目的とするものである。
This invention was made to solve the above problems, and even when the optical signal is weak, the signal-to-noise ratio (
It is an object of the present invention to provide a distance measuring device that can improve the S/N ratio and the distance measuring accuracy.

〔課題を解決するための手段) この発明に係る測距装置は、目標物体に対して発光する
発光手段と、前記目標物体からの反射光を受光して光電
変換する受光手段と、この受光手段からの光情報信号を
増幅する増幅回路と、この増幅回路の出力電圧を基準電
圧に対して比較する電圧比較器と、この電圧比較器の出
力により、積分時定数が変化する積分回路と、この積分
回路からの出力を演算して距離情報を算出する波形処理
回路とを備えたものである。
[Means for Solving the Problems] A distance measuring device according to the present invention includes: a light emitting device that emits light toward a target object; a light receiving device that receives reflected light from the target object and photoelectrically converts the received light; and the light receiving device. an amplifier circuit that amplifies the optical information signal from the amplifier circuit, a voltage comparator that compares the output voltage of this amplifier circuit with a reference voltage, an integration circuit whose integration time constant changes depending on the output of this voltage comparator, and It is equipped with a waveform processing circuit that calculates distance information by calculating the output from the integrating circuit.

〔作用〕[Effect]

この発明においては、増幅回路から電圧比較器への入力
レベルが基準電圧と比較され、その比較結果に対応して
積分回路の積分時定数が変化する。
In this invention, the input level from the amplifier circuit to the voltage comparator is compared with a reference voltage, and the integration time constant of the integration circuit is changed in accordance with the comparison result.

〔実施例〕〔Example〕

以下、この発明の一実施例を図面について説明する。 An embodiment of the present invention will be described below with reference to the drawings.

第1図はこの発明の測距装置の信号処理回路の一実施例
を示すブロック図である。
FIG. 1 is a block diagram showing an embodiment of a signal processing circuit of a distance measuring device according to the present invention.

この図において、第3図に示した従来のものと同一符号
は同一につ台その説明は省略する。
In this figure, the same reference numerals as in the conventional one shown in FIG. 3 are the same, and the explanation thereof will be omitted.

9a、9Bはそれぞれ前記増幅回路6a、8bの出力を
人力とする時定数の切換えが可能な積分回路、10a、
10bは電圧比較器で、増幅回路6a、6bの出力を入
力とし、基準電圧11に対して比較を行い、光信号が微
弱である場合に出力が変化するように設定される。12
はANDゲートで、光信号が2チヤンネルともに微弱で
あるときに、すなわち、増幅回路6a、6bの出力が小
さい場合にスイッチ13a、13bを動作させて積分回
路9a、9bの積分時定数を大きくする。
9a and 9B are integral circuits whose time constants can be switched manually using the outputs of the amplifier circuits 6a and 8b, respectively; 10a;
A voltage comparator 10b receives the outputs of the amplifier circuits 6a and 6b, compares it with a reference voltage 11, and is set so that the output changes when the optical signal is weak. 12
is an AND gate, which operates switches 13a and 13b to increase the integration time constant of integration circuits 9a and 9b when the optical signals are weak in both channels, that is, when the outputs of amplifier circuits 6a and 6b are small. .

次に、この発明の信号処理回路の動作を第2図を参照し
て説明する。
Next, the operation of the signal processing circuit of the present invention will be explained with reference to FIG.

第2図(a)〜(f)は、第1図の動作説明図で、横軸
に時間、縦軸に増幅回路6a、6bの出力電圧v6a+
 V6bx積分回路9a、9bの出力電圧V911+ 
vobおよびスイッチ13a、13bのオン、オフ状態
を示している。
FIGS. 2(a) to 2(f) are explanatory diagrams of the operation of FIG. 1, with the horizontal axis representing time and the vertical axis representing the output voltage v6a+ of the amplifier circuits 6a and 6b.
V6bx integration circuit 9a, 9b output voltage V911+
The on/off states of vob and switches 13a and 13b are shown.

まず、光信号が大きい場合(近距離時または被写体反射
率が大きい場合)を説明する。
First, a case where the optical signal is large (at a short distance or when the object reflectance is large) will be explained.

この場合、増幅回路6a、6bの基準電圧11よりも高
く(第2図(a))、積分回路9a、9bの出力も雑音
が少ない良好な状態となる(第2図(b))、また、電
圧比較器10a、10bの出力も反転せず、スイッチ1
3a、13bはオフ状態である(第2図C))。
In this case, the reference voltage 11 of the amplifier circuits 6a and 6b is higher (FIG. 2(a)), and the outputs of the integrating circuits 9a and 9b are also in a good state with less noise (FIG. 2(b)). , the outputs of voltage comparators 10a and 10b are not inverted, and switch 1
3a and 13b are in the off state (FIG. 2C)).

次に、光信号が小さい場合(遠距離時または被写体反射
率が小さい場合)を説明する。
Next, a case where the optical signal is small (at a long distance or when the object reflectance is small) will be explained.

このような場合は、増幅回路6a、6bの出力電圧が基
準電圧11よりも低く(第2図(d))、積分回路9a
、9bの出力電圧が低く、信号対雑音比の悪い状態とな
っている(第2図(e))。このとき、電圧比較器10
g、10bの出力は反転し、スイッチ13a、13bは
オン状態になる第2図(f))。
In such a case, the output voltages of the amplifier circuits 6a and 6b are lower than the reference voltage 11 (FIG. 2(d)), and the output voltage of the integrator circuit 9a
, 9b is low, resulting in a poor signal-to-noise ratio (FIG. 2(e)). At this time, voltage comparator 10
The outputs of the terminals g and 10b are inverted, and the switches 13a and 13b are turned on (FIG. 2(f)).

すなわち、このようにスイッチ13a、13bがオン状
態となることによって、積分回路9a。
That is, by turning on the switches 13a and 13b in this way, the integrating circuit 9a.

9bの積分時定数が大きな値に設定し直される。The integration time constant of 9b is reset to a larger value.

このため、積分回路9a、9bの出力は第2図(e)の
後半部分に示されるように、信号対雑音比(S/N)が
改善され、波形処理が容易になり、測距精度が向上する
Therefore, as shown in the second half of FIG. 2(e), the outputs of the integrating circuits 9a and 9b have an improved signal-to-noise ratio (S/N), facilitate waveform processing, and improve distance measurement accuracy. improves.

なお、上記実施例は積分回路9a、9bの積分時定数を
初期状態でノ」1さくしている場合を説明したが、逆に
初期状態で積分時定数を大きくしておき、電圧比較器1
0a、10bの入力レベルが基準電圧11以上となった
場合に積分時定数を小さくするように構成することも可
能である。
In the above embodiment, the integration time constants of the integration circuits 9a and 9b are set to 1 in the initial state, but conversely, the integration time constants are increased in the initial state, and the voltage comparator 1
It is also possible to configure the integration time constant to be small when the input level of 0a and 10b becomes equal to or higher than the reference voltage 11.

〔発明の効果〕〔Effect of the invention〕

この発明は、以上説明したように、目標物体に対して発
光する発光手段と、前記目標物体からの反射光を受光し
て光電変換する受光手段と、この受光手段からの光情報
信号を増幅する増幅回路と、この増幅回路の出力電圧を
基準電圧に対して比較する電圧比較器と、この電圧比較
器の出力により、積分時定数が変化する積分回路と、こ
の積分回路からの出力を演算して距離情報を算出する波
形処理回路とを備えたので、目標物体(被写体)の距離
1反射率に応じて積分回路の時定数を変化させることが
でき、常時信号対雑音比(S/N)のよい状態を維持で
き、測距精度の向上を図ることができるという効果があ
る。また、回路構成が簡単であるため、特に集積回路に
適用した場合には、製造が容易になり、量産に適するた
め、コストアップの防止も可能である。
As explained above, the present invention includes a light emitting means for emitting light toward a target object, a light receiving means for receiving reflected light from the target object and photoelectrically converting it, and amplifying an optical information signal from the light receiving means. An amplifier circuit, a voltage comparator that compares the output voltage of this amplifier circuit with a reference voltage, an integrator circuit whose integration time constant changes depending on the output of this voltage comparator, and an output from this integrator circuit that calculates the output voltage. Since it is equipped with a waveform processing circuit that calculates distance information, the time constant of the integrating circuit can be changed according to the distance 1 reflectance of the target object (subject), and the signal-to-noise ratio (S/N) This has the effect that a good state of distance measurement can be maintained and distance measurement accuracy can be improved. Furthermore, since the circuit configuration is simple, manufacturing is easy, especially when applied to an integrated circuit, and it is suitable for mass production, so it is possible to prevent cost increases.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の測距装置の一実施例を示すブロック
図、第2図は、第1図の動作説明図、第3図は従来の測
距装置の信号処理回路のブロック図である。 図において、1は発光回路、2は発光素子、3は目標物
体、4a、4bは受光回路、5a、5bは受光素子、6
a、6bは増幅回路、7は波形処理回路、8は距離情報
、9a、9bは積分回路、10a、TObは電圧比較器
、11は基準電圧、12はANDゲート、13a、13
bはスイッチである。 なお、各図中の同一符号は同一または相当部分を示す。
FIG. 1 is a block diagram showing an embodiment of the distance measuring device of the present invention, FIG. 2 is an explanatory diagram of the operation of FIG. 1, and FIG. 3 is a block diagram of a signal processing circuit of a conventional distance measuring device. . In the figure, 1 is a light emitting circuit, 2 is a light emitting element, 3 is a target object, 4a, 4b are light receiving circuits, 5a, 5b are light receiving elements, 6
a, 6b are amplifier circuits, 7 is a waveform processing circuit, 8 is distance information, 9a, 9b are integration circuits, 10a, TOb are voltage comparators, 11 is a reference voltage, 12 is an AND gate, 13a, 13
b is a switch. Note that the same reference numerals in each figure indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] 目標物体に対して発光する発光手段と、前記目標物体か
らの反射光を受光して光電変換する受光手段と、この受
光手段からの光情報信号を増幅する増幅回路と、この増
幅回路の出力電圧を基準電圧に対して比較する電圧比較
器と、この電圧比較器の出力により、積分時定数が変化
する積分回路と、この積分回路からの出力を演算して距
離情報を算出する波形処理回路とを備えたことを特徴と
する測距装置。
A light emitting means for emitting light toward a target object, a light receiving means for receiving reflected light from the target object and photoelectrically converting it, an amplifying circuit for amplifying an optical information signal from the light receiving means, and an output voltage of the amplifying circuit. A voltage comparator that compares the voltage with a reference voltage, an integrating circuit whose integration time constant changes depending on the output of this voltage comparator, and a waveform processing circuit that calculates distance information by calculating the output from this integrating circuit. A distance measuring device characterized by comprising:
JP7401190A 1990-03-22 1990-03-22 Distance measuring apparatus Pending JPH03272413A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7401190A JPH03272413A (en) 1990-03-22 1990-03-22 Distance measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7401190A JPH03272413A (en) 1990-03-22 1990-03-22 Distance measuring apparatus

Publications (1)

Publication Number Publication Date
JPH03272413A true JPH03272413A (en) 1991-12-04

Family

ID=13534724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7401190A Pending JPH03272413A (en) 1990-03-22 1990-03-22 Distance measuring apparatus

Country Status (1)

Country Link
JP (1) JPH03272413A (en)

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