JPH03272404A - Phase measuring apparatus for heterodyne interferometer - Google Patents
Phase measuring apparatus for heterodyne interferometerInfo
- Publication number
- JPH03272404A JPH03272404A JP2069646A JP6964690A JPH03272404A JP H03272404 A JPH03272404 A JP H03272404A JP 2069646 A JP2069646 A JP 2069646A JP 6964690 A JP6964690 A JP 6964690A JP H03272404 A JPH03272404 A JP H03272404A
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- Japan
- Prior art keywords
- signal
- light
- phase difference
- phase
- clock signal
- Prior art date
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- Pending
Links
- 238000006243 chemical reaction Methods 0.000 claims abstract description 14
- 238000005259 measurement Methods 0.000 claims description 32
- 238000001514 detection method Methods 0.000 abstract description 17
- 230000003111 delayed effect Effects 0.000 abstract description 2
- 230000002452 interceptive effect Effects 0.000 abstract 2
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000001934 delay Effects 0.000 description 1
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- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、位相差の読み取りを行うヘロダイン干渉計用
の位相測定装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a phase measuring device for a Herodyne interferometer that reads phase differences.
[従来の技術]
従来のヘテロダイン干渉計用の位相測定装置は、基準干
渉光の周波数の位相から測定干渉光の位相を測定するこ
とにより光の位相差を測定するようになっている。[Prior Art] A conventional phase measuring device for a heterodyne interferometer measures the phase difference of light by measuring the phase of measurement interference light from the phase of the frequency of reference interference light.
そして、この基準干渉光と測定干渉光とをそれぞれ電気
信号に変換し、これらの各電気信号の位相差の検出は、
第3図に示すように、各電気信号に変換された基準信号
a1と測定信号d1との七ロクロス位置の時間差を検出
して行われる。すなわち、この時間差を検出するために
は、第3図の(a)図の基準信号alをもとに(b)図
のような三角波信号す、を作成し3また、(d)図で示
される測定信号d、をもとに(c)図のような矩形波信
号C】を作成する。そして、これらの信号を比較するこ
とにより基準信号a1と測定信号dlとの間の位相差を
検出する。Then, the reference interference light and the measurement interference light are each converted into electrical signals, and the phase difference between these electrical signals is detected by
As shown in FIG. 3, this is performed by detecting the time difference between the seven-point cross positions of the reference signal a1 converted into each electric signal and the measurement signal d1. That is, in order to detect this time difference, a triangular wave signal S as shown in Fig. 3(b) is created based on the reference signal al shown in Fig. 3(a). Based on the measured signal d, a rectangular wave signal C as shown in (c) is created. Then, by comparing these signals, the phase difference between the reference signal a1 and the measurement signal dl is detected.
すなわち、基準信号a1から三角波信号す、を作成すれ
ば、この信号b1の電圧は、基準信号a1のゼロクロス
地点からの時間に比例する。そして、測定信号d1のゼ
ロクロス地点、すなわち矩形波信号c1の立ち上がりで
この三角波信号す、の電圧値を読み取るようにすれば、
基準信号a1と測定信号d1どの時間差、すなわち位相
差が検出できることになる。That is, if a triangular wave signal S is created from the reference signal a1, the voltage of this signal b1 is proportional to the time from the zero-crossing point of the reference signal a1. Then, if the voltage value of this triangular wave signal S is read at the zero cross point of the measurement signal d1, that is, at the rising edge of the rectangular wave signal c1,
The time difference, that is, the phase difference, between the reference signal a1 and the measurement signal d1 can be detected.
また、基準信号a1は、測定信号d1を1周期分追い越
したり、また測定信号d1に1周期分追い越されたりす
ることがあるので、アップダウンカウンタを設けてこれ
らの追越し回数を計数する。そして、これらの計数値は
例えば上位桁で図示しない表示部に表示され、また、下
位桁の位相差の表示、すなわち1周期以内の位相差の表
示は、三角波信号b1と矩形波信号c1との間の1周期
以内の時間差を検出して表示される。Further, since the reference signal a1 may overtake the measurement signal d1 by one cycle or may be overtaken by the measurement signal d1 by one cycle, an up/down counter is provided to count the number of times the reference signal a1 overtakes the measurement signal d1. These counted values are displayed, for example, in the upper digits on a display section (not shown), and the display of the phase difference in the lower digits, that is, the display of the phase difference within one cycle, is the display of the phase difference between the triangular wave signal b1 and the rectangular wave signal c1. The time difference within one cycle between the two is detected and displayed.
[発明が解決しようとする課題1
このような従来のヘテロダイン干渉計用の位相測定装置
は、基準信号a1を三角波信号り、に変換して位相差を
検出しているので、線形計算が高速で行え、下位桁に対
応する位相差検出処理、すなわち1周期以内の位相差検
出処理は高速で行える。[Problem to be Solved by the Invention 1] Such a conventional phase measuring device for a heterodyne interferometer detects a phase difference by converting the reference signal a1 into a triangular wave signal, so linear calculations can be performed at high speed. The phase difference detection process corresponding to the lower digits, that is, the phase difference detection process within one cycle, can be performed at high speed.
しかしながら、この種の干渉計は、一般に1M82以上
の信号を必要としているため、このLM)12以上の基
準信号a1から精度の良い三角波信号h1を作成するこ
とが困難となり、従って、位相検出を精度良く行うこと
かできないという問題があった。However, since this type of interferometer generally requires a signal of 1M82 or more, it is difficult to create a highly accurate triangular wave signal h1 from this LM) 12 or more reference signal a1, and therefore, the phase detection cannot be performed accurately. There was a problem of not being able to do well.
「課題を解決するための手段コ
このような課距を解決するために本発明に係るヘテロダ
イン干渉計用位相検出装置は、参照干渉光を電気信号に
変換して正弦波信号を出力する第1の光電変換手段と、
参照干渉光の一方を1/′4波長移相した干渉光を電気
信号に変換して余弦波信号を出力する第2の光電変換手
段と、測定光ビートを電気信号に変換してクロック信号
として出力する第3の光電変換手段と、クロック信号に
基づいて正弦波信号および余弦波信号を取り込み、この
振幅値からクロック信号に対する正弦波信号および余弦
波信号の位相差を算出して出力する演算手段と、正弦波
信号に基づくクロック信号と第3の光電変換手段から出
力されるクロック信号とをア・ツブ端子、ダウン端子に
それぞれ入力してカウントするアップダウンカウンタと
、演算手段から出力される位相差信号とアップダウンカ
ウンタから出力される計数値とを入力して加算処理する
加算処理手段とを備えたものである。``Means for Solving the Problems'' In order to solve such distance problems, the phase detection device for a heterodyne interferometer according to the present invention has a first phase detection device that converts reference interference light into an electrical signal and outputs a sine wave signal. photoelectric conversion means,
a second photoelectric conversion means that converts the interference light obtained by shifting the phase of one of the reference interference lights by 1/'4 wavelength into an electrical signal and outputs a cosine wave signal; a third photoelectric conversion means for outputting; and a calculation means for capturing a sine wave signal and a cosine wave signal based on a clock signal, calculating a phase difference between the sine wave signal and a cosine wave signal with respect to the clock signal from the amplitude value, and outputting the result. , an up/down counter that inputs a clock signal based on a sine wave signal and a clock signal output from the third photoelectric conversion means to the A/Tsub terminal and the DOWN terminal for counting, and a count output from the arithmetic means. It is provided with addition processing means for inputting and adding the phase difference signal and the count value output from the up/down counter.
「作用〕
測定干渉光に基づくクロック信号に対して参照干渉光に
基づく正弦波信号および余弦波信号の位相差が算出され
、また、正弦波信号および余弦波信号に基づくクロック
信号と測定干渉光に基っくクロック信号とが入力されて
カウントされる。そして、このカウント値と上記で算出
された位相差の値とが加算処理され、この結果参照干渉
光と測定干渉光と間の位相差の検出がされる。Effect: The phase difference between the sine wave signal and cosine wave signal based on the reference interference light is calculated with respect to the clock signal based on the measurement interference light, and the phase difference between the clock signal based on the sine wave signal and cosine wave signal and the measurement interference light is calculated. The base clock signal is input and counted.Then, this count value and the phase difference value calculated above are added, and as a result, the phase difference between the reference interference light and the measurement interference light is calculated. Detected.
[実施例] 次に、本発明について図面を参照して説明する。[Example] Next, the present invention will be explained with reference to the drawings.
第1図は1本発明に係るヘテロダイン干渉計用位相測定
装置の一実施例を示すブロック図である。同図において
、1−3は光信号を二乗検波し電気信号に変換するフォ
トダイオード、4は入力した光信号を1−・74波長位
相を遅らせて出力する1774波長板、5〜7は電流を
電圧に変換する電流電圧変換回路、8.9はバンドパス
フィルタ10、]1はコンパレータ、12はアナログ電
気信号をディジタルに変換するA/D変換器である。ま
た、13はデインタル信号化された測定信号および基準
信号を入力してこれらの信号の1周期内の位相差の高速
演算を行うDSP (ディジタル・シグナル・プロセッ
サ)等で構成される高速演算器、14は基準信号と測定
信号との間の位相差の1周期分の追越しまたは追い越さ
れ回数を計数するアップダウンカウンタ、15は1周期
内の位相差信号およびアップダウンカウンタ14からの
計数値を入力して基準信号と測定信号との位相差の加算
処理を行う加算処理部、16はこの加算処理された値を
表示する表示部である。なお、a、a’は基準光(参照
干渉光)、bは測定光、c、c“は基準信号、dは測定
信号、e、fはクロック信号である。FIG. 1 is a block diagram showing an embodiment of a phase measuring device for a heterodyne interferometer according to the present invention. In the figure, 1-3 is a photodiode that square-law detects an optical signal and converts it into an electrical signal, 4 is a 1774 wavelength plate that delays the input optical signal by 1-74 wavelengths and outputs it, and 5-7 are current converters. 8.9 is a bandpass filter 10; 1 is a comparator; and 12 is an A/D converter that converts an analog electrical signal into a digital signal. In addition, 13 is a high-speed calculation unit composed of a DSP (digital signal processor), etc., which inputs the measurement signal and the reference signal converted into digital signals and performs high-speed calculation of the phase difference within one period of these signals; 14 is an up/down counter that counts the number of times the phase difference between the reference signal and the measurement signal is overtaken or overtaken in one cycle; 15 is input with the phase difference signal within one cycle and the count value from the up/down counter 14; 16 is a display section that displays the added value. Note that a and a' are reference lights (reference interference lights), b is measurement light, c and c'' are reference signals, d is measurement signal, and e and f are clock signals.
以上のように構成された干渉用位相検出装置の動作を説
明する。The operation of the interference phase detection device configured as above will be explained.
基準光aは、フォトダイオード1により二乗検波されて
電流信号に変換され、さらに電流電圧変換回路5により
電圧信号に変換され、バンドパスフィルタ8により雑音
成分が除去されて第2図の(a)図に示すように、正弦
波の基準信号CとしてA/D変換器12およびコンパレ
ータ10に送出される。The reference light a is square-law detected by the photodiode 1 and converted into a current signal, further converted into a voltage signal by the current-voltage conversion circuit 5, and noise components are removed by the bandpass filter 8, resulting in the signal shown in FIG. 2(a). As shown in the figure, it is sent to the A/D converter 12 and the comparator 10 as a sine wave reference signal C.
また、この基準光aは、1/4波長板により基準光aの
干渉光と比較して1/4位相の遅れた余弦波の干渉光を
生じる基準光a′に変換されてフォトダイオード2によ
り上記したと同様に二乗検波後電流信号に変換され、さ
らに電流電圧変換回路6により電圧信号に変換されてバ
ンドパスフィルタ9により雑音成分が除去され、第2図
の(b)図に示すように、基準信号Cが1/4波長移相
された余弦波の基準信号C“とじてA 7’ D変換器
12に送出される。Further, this reference light a is converted by a 1/4 wavelength plate into reference light a' which generates a cosine wave interference light whose phase is delayed by 1/4 compared to the interference light of the reference light a, and the reference light a' is converted by a photodiode 2. In the same way as described above, it is converted into a current signal after square law detection, further converted into a voltage signal by the current-voltage conversion circuit 6, and the noise component is removed by the band-pass filter 9, as shown in FIG. 2(b). , the reference signal C is sent to the A 7' D converter 12 as a cosine wave reference signal C'' whose phase is shifted by 1/4 wavelength.
一方、測定光すは、フォトダイオード3により電流信号
に変換され、さらに電流電圧変換回路7により電圧信号
に変換されて第2図の(d)図で示されるような測定信
号dが生成される。この測定信号dは、コンパレータ1
1により、第2図の(C)図で示されるようにクロック
信号eとして生成され、A/D変換器12およびアップ
ダウンカウンタ14のアップ端子に送出される。On the other hand, the measurement light beam is converted into a current signal by the photodiode 3, and further converted into a voltage signal by the current-voltage conversion circuit 7 to generate a measurement signal d as shown in FIG. 2(d). . This measurement signal d is transmitted to comparator 1
1, the clock signal e is generated as a clock signal e as shown in FIG.
そして、A/D変換器12では、このクロック信号eを
入力して高速演算器13に送出するとともに、このクロ
ック信号eに基づいて基準信号c、c′をディジタル信
号に変換して高速演算器13に送出し、高速演算器13
ではこれらの各信号を入力して高速演算処理を行う。The A/D converter 12 inputs this clock signal e and sends it to the high-speed arithmetic unit 13, and also converts the reference signals c and c' into digital signals based on this clock signal e to the high-speed arithmetic unit 13. 13, high-speed arithmetic unit 13
Then, each of these signals is input and high-speed arithmetic processing is performed.
すなわち、基準信号CをAs1nΦ、基準信号C′をA
cosΦとすると、位相差ΦはA cos Φ
となる。また、振幅値Aは
となる。That is, the reference signal C is As1nΦ, and the reference signal C' is A
When cos Φ, the phase difference Φ becomes A cos Φ. Further, the amplitude value A is as follows.
そして、A/D変換器12においては、クロック信号e
の立ち上がりで基準信号c、c“のAs1nΦ A c
osΦの値をディジタル信号に変換して高速演算器13
に送出し、高速演算器13ではこれを入力するとともに
、上記の式!11.!21を求めてこのディジタル化さ
れたAs1nΦ、AcosΦの値から位相差Φおよび振
幅値Aを高速演算処理する。Then, in the A/D converter 12, the clock signal e
As1nΦ A c of the reference signal c, c" at the rising edge of
The value of osΦ is converted into a digital signal and the high-speed arithmetic unit 13
The high-speed arithmetic unit 13 inputs this to the above equation! 11. ! 21 is obtained, and the phase difference Φ and amplitude value A are processed at high speed from the digitized values of As1nΦ and AcosΦ.
こうして、測定信号dから生成されるクロック信号eの
立ち上がり、すなわち位相差「0」の地点で基準信号c
、c’の位相差Φが読み取られることになり、従って基
準信号c、c’ と測定信号dとの1周期内の位相差が
検出でき、この検出結果は加算処理部15に送出される
。In this way, at the rising edge of the clock signal e generated from the measurement signal d, that is, at the point where the phase difference is "0", the reference signal c
, c' is read. Therefore, the phase difference within one cycle between the reference signals c, c' and the measurement signal d can be detected, and this detection result is sent to the addition processing section 15.
また、コンパレータ10は、基準信号Cを入力してクロ
ック信号fを生成し、アップダウンカウンタ14のダウ
ン端子に送出する。そして、アップダウンカウンタ14
は、この基準信号Cに基づくクロック信号fと測定信号
dに基づくクロック信号eとを入力して、これらの各信
号間の1周期以上の位相差の追越しまたは追い越されの
回数を計数し、この計数値を加算処理部15に送出する
。Further, the comparator 10 receives the reference signal C, generates a clock signal f, and sends it to the down terminal of the up/down counter 14. And up/down counter 14
inputs the clock signal f based on the reference signal C and the clock signal e based on the measurement signal d, counts the number of times the phase difference between these signals is overtaken or overtaken by one cycle or more, and The count value is sent to the addition processing section 15.
こうして、加算処理部15では、基準信号Cと測定信号
dとの1周期以上の位相差の値と1周期以内の位相差の
値とを入力して、これらの加算を行って全体の位相差を
算出し、この算出結果を表示部16に送出して表示させ
る。In this way, the addition processing unit 15 inputs the value of the phase difference of one cycle or more and the value of the phase difference of less than one cycle between the reference signal C and the measurement signal d, and adds these values to obtain the total phase difference. is calculated, and the calculation result is sent to the display unit 16 for display.
以上説明したように、本発明のヘテロダイン干渉計用位
相検出装置は、読み取られる信号として、正弦波である
干渉光を生じる測定光aから光学的に1/4波長移相さ
せた余弦波の干渉光を生じる測定光すを精度良く簡単に
生成させるようにしたので、従来の三角波信号と異なり
、精度の良い位相検出が行える。As explained above, the phase detection device for a heterodyne interferometer of the present invention uses a cosine wave interference whose phase is optically shifted by 1/4 wavelength from the measurement light a which generates interference light which is a sine wave as a signal to be read. Since the measurement beam that generates light is easily generated with high precision, it is possible to perform phase detection with high precision, unlike conventional triangular wave signals.
[発明の効果コ
以E説明したように本発明に係る干渉計用位相検出装置
は、測定光に基づくクロック信号に対して参照先に基づ
く正弦波信号および余弦波信号の位相差を算出し、また
、正弦波信号および余弦波信号に基づくクロック信号と
測定光に基づくタロツク信号とを入力してカウントし、
このカウント値と上記で算出された位相差の値とを加算
処理して測定光と参照光との位相差を検出するように構
成したので、読み取られて参照される信号が従来の装置
で生成される三角波信号と異なって、精度の良い余弦波
信号が生成できることになり、従って位相検出が正確に
行えるという効果がある。[Effects of the Invention] As explained above, the phase detection device for an interferometer according to the present invention calculates the phase difference between a sine wave signal and a cosine wave signal based on a reference destination with respect to a clock signal based on a measurement light, In addition, a clock signal based on a sine wave signal and a cosine wave signal and a tarokk signal based on measurement light are input and counted.
This count value and the phase difference value calculated above are added together to detect the phase difference between the measurement light and the reference light, so the signal that is read and referenced is generated using conventional equipment. Unlike the triangular wave signal that is generated, a highly accurate cosine wave signal can be generated, which has the effect that phase detection can be performed accurately.
第1図は本発明のヘテロダイン干渉計用位相検出装置の
一実施例を示すブロック図、第2図はこの装置の各部の
タイミングチャート、第3図は従来の干渉計用の位相検
出装置のタイミングチャートである。
1〜3・・・・フォトダイオード、4・・・・1/4波
長板、5〜7・−・・電流電圧変換回路、8,9・・・
・バンドパスフィルタ、10゜11・・・・コンパレー
タ、12・・・・A、/D変換器、13・・・・高速演
算器、14・アップダウンカウンタ、15・・・・加算
処理部、16・・・・表示部、a、a’ ・・・・基
準光、b−・・・測定光、c、c’ ・・・・基準信
号、d・・・・測定信号、e、f・−・・クロック信号
。Fig. 1 is a block diagram showing an embodiment of the phase detection device for a heterodyne interferometer of the present invention, Fig. 2 is a timing chart of each part of this device, and Fig. 3 is a timing diagram of a conventional phase detection device for an interferometer. It is a chart. 1-3...Photodiode, 4...1/4 wavelength plate, 5-7...Current-voltage conversion circuit, 8, 9...
・Band pass filter, 10° 11...Comparator, 12...A, /D converter, 13...High speed arithmetic unit, 14.Up/down counter, 15...Addition processing unit, 16...Display section, a, a'...Reference light, b-...Measurement light, c, c'...Reference signal, d...Measurement signal, e, f... -...Clock signal.
Claims (1)
るヘテロダイン干渉計用位相測定装置において、 参照干渉光を電気信号に変換して正弦波信号を出力する
第1の光電変換手段と、 前記参照干渉光を1/4波長移相した光を電気信号に変
換して余弦波信号を出力する第2の光電変換手段と、 測定干渉光を電気信号に変換してクロック信号として出
力する第3の光電変換手段と、 前記クロック信号に基づいて前記正弦波信号および余弦
波信号を取り込み、この振幅値からクロック信号に対す
る正弦波信号および余弦波信号の位相差を算出して出力
する演算手段と、 前記正弦波信号に基づくクロック信号と前記第3の光電
変換手段から出力されるクロック信号とをアップ端子、
ダウン端子にそれぞれ入力してカウントするアップダウ
ンカウンタと、 前記演算手段から出力される位相差信号と前記アップダ
ウンカウンタから出力される計数値とを入力して加算処
理する加算処理手段と を有することを特徴とするヘテロダイン干渉計用位相測
定装置。[Claims] In a phase measuring device for a heterodyne interferometer that measures a value according to a phase difference of a measurement signal with respect to a reference signal, a first photoelectronic device that converts reference interference light into an electrical signal and outputs a sine wave signal is provided. a conversion means; a second photoelectric conversion means for converting light obtained by shifting the phase of the reference interference light by a quarter wavelength into an electrical signal and outputting a cosine wave signal; and a second photoelectric conversion means for converting the measurement interference light into an electrical signal and outputting a clock signal. a third photoelectric conversion means that captures the sine wave signal and the cosine wave signal based on the clock signal, calculates and outputs a phase difference between the sine wave signal and the cosine wave signal with respect to the clock signal from the amplitude value; a calculation means for transmitting a clock signal based on the sine wave signal and a clock signal output from the third photoelectric conversion means to an up terminal;
It has an up/down counter that inputs each input to a down terminal and counts, and an addition processing means that inputs and performs addition processing on the phase difference signal output from the calculation means and the count value output from the up/down counter. A phase measuring device for a heterodyne interferometer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2069646A JPH03272404A (en) | 1990-03-22 | 1990-03-22 | Phase measuring apparatus for heterodyne interferometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2069646A JPH03272404A (en) | 1990-03-22 | 1990-03-22 | Phase measuring apparatus for heterodyne interferometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03272404A true JPH03272404A (en) | 1991-12-04 |
Family
ID=13408821
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2069646A Pending JPH03272404A (en) | 1990-03-22 | 1990-03-22 | Phase measuring apparatus for heterodyne interferometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03272404A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1995014236A1 (en) * | 1993-11-18 | 1995-05-26 | Robert Bosch Gmbh | Phase-measurement device |
US6351312B1 (en) * | 1997-07-23 | 2002-02-26 | Mitsubishi Denki Kabushiki Kaisha | Interference-type distance measuring device |
-
1990
- 1990-03-22 JP JP2069646A patent/JPH03272404A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1995014236A1 (en) * | 1993-11-18 | 1995-05-26 | Robert Bosch Gmbh | Phase-measurement device |
EP0729583A1 (en) * | 1993-11-18 | 1996-09-04 | Robert Bosch Gmbh | Phase-measurement device |
US6351312B1 (en) * | 1997-07-23 | 2002-02-26 | Mitsubishi Denki Kabushiki Kaisha | Interference-type distance measuring device |
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