JPH0325938B2 - - Google Patents

Info

Publication number
JPH0325938B2
JPH0325938B2 JP56147559A JP14755981A JPH0325938B2 JP H0325938 B2 JPH0325938 B2 JP H0325938B2 JP 56147559 A JP56147559 A JP 56147559A JP 14755981 A JP14755981 A JP 14755981A JP H0325938 B2 JPH0325938 B2 JP H0325938B2
Authority
JP
Japan
Prior art keywords
chamber
plasma processing
arm member
unloader
loader
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56147559A
Other languages
Japanese (ja)
Other versions
JPS5848935A (en
Inventor
Akira Uehara
Isamu Hijikata
Juichi Myazaki
Hiroyuki Kyota
Hisashi Nakane
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Ohka Kogyo Co Ltd
Original Assignee
Tokyo Ohka Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Ohka Kogyo Co Ltd filed Critical Tokyo Ohka Kogyo Co Ltd
Priority to JP14755981A priority Critical patent/JPS5848935A/en
Publication of JPS5848935A publication Critical patent/JPS5848935A/en
Publication of JPH0325938B2 publication Critical patent/JPH0325938B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67766Mechanical parts of transfer devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67778Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • H01L21/67781Batch transfer of wafers

Description

【発明の詳細な説明】 本発明はLSI或いは超LSI等の大集積回路を形
成したチツプの製造に用いる半導体ウエハーのエ
ツチング、クリーニング及び半導体ウエハー表面
のホトレジスト層のアツシング(灰化剥離)等に
用いるプラズマ処理装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention is used for etching and cleaning semiconductor wafers used in the manufacture of chips on which large integrated circuits such as LSI or VLSI are formed, and for ashing (ashing and peeling) the photoresist layer on the surface of semiconductor wafers. The present invention relates to a plasma processing apparatus.

半導体集積回路における微細加工には、露光・
現像によりパターンを形成したレジスト膜によつ
て被覆されていない半導体ウエハー上に作成され
た絶縁膜、半導体膜或いは導体膜をエツチングす
る工程、上記膜をクリーニングする工程、及び、
エツチング終了後にマスクに用いたレジスト膜を
ウエハー表面から除去するアツシング工程等が含
まれている。
Microfabrication in semiconductor integrated circuits requires exposure and
a step of etching an insulating film, a semiconductor film, or a conductive film formed on a semiconductor wafer that is not covered with a resist film formed with a pattern by development; a step of cleaning the film;
The process includes an ashing process in which the resist film used as a mask is removed from the wafer surface after etching is completed.

そして従来にあつては、これらエツチング、ク
リーニング或いはアツシングは無機酸、有機溶剤
等の種々の液体化学薬品を用いた湿式処理によつ
て行なつてきた。しかしながら斯る湿式処理では
微細加工の精度を高めることができず且つ廃液処
理等の問題があり、特に最近では超LSIの開発に
伴ないパターンは更に微細化する傾向にあるた
め、プラズマを利用した所謂ドライエツチング、
ドライアツシングへ移行している。
Conventionally, etching, cleaning or ashing has been carried out by wet processing using various liquid chemicals such as inorganic acids and organic solvents. However, such wet processing cannot improve the precision of microfabrication and has problems such as waste liquid treatment.In particular, with the recent development of VLSI, patterns tend to become even finer, so it is difficult to improve the precision of microfabrication using plasma. So-called dry etching
Moving to dry ashing.

このため、ドライエツチング等を行なうプラズ
マ処理装置も種々提案されているが、これらの多
くは、手作業によつて半導体ウエハーをプラズマ
発生用チヤンバー内に装填したり、チヤンバー内
から取り出すようにしたものであり、極めて作業
能率が低く、且つウエハー自体を破損させる場合
が多く製品歩留も好ましいものではない。このた
め自動的に処理する装置も提案されている。例え
ば特開昭53−90870号に示される如きものである。
しかしながら斯る装置は、ウエハーを収納したカ
セツトの搬送方向に対して直角にチヤンバーが開
口しているため、カセツトの搬送方向を途中で変
化させなければならず、このため装置自体の機構
が複雑化し、大型化するという問題がある。
For this reason, various plasma processing apparatuses have been proposed that perform dry etching, etc., but most of these are devices in which semiconductor wafers are manually loaded into or removed from a plasma generation chamber. Therefore, the work efficiency is extremely low, the wafer itself is often damaged, and the product yield is not favorable. For this reason, devices for automatic processing have also been proposed. For example, it is shown in Japanese Patent Application Laid-Open No. 53-90870.
However, in such an apparatus, since the chamber opens at right angles to the direction of conveyance of the cassette containing wafers, the direction of conveyance of the cassette must be changed midway through the process, which complicates the mechanism of the apparatus itself. , there is a problem of increasing the size.

本発明者等は上述の如き従来の問題点に鑑み、
これを有効に解決すベく本発明を為したものであ
り、その目的とする処は簡単な機構でコンパクト
化が図れ、且つ半導体ウエハーを連続して自動的
に処理できる自動プラズマ処理装置を提供するに
ある。
In view of the conventional problems as described above, the present inventors
The present invention was developed to effectively solve this problem, and its purpose is to provide an automatic plasma processing apparatus that can be made compact with a simple mechanism and that can continuously and automatically process semiconductor wafers. There is something to do.

斯る目的を達成すべく第1発明は装置本体に複
数枚のウエハーを収納したカセツトを搬送する搬
送部材を設けるとともに、この搬送部材の搬送方
向に対して開口するプラズマ発生用チヤンバーを
設置し、このチヤンバーの開口を自動的に開閉す
る蓋体を付設し、更に昇降動作及び水平動作を行
なうアーム部材によつて、搬送部材上のカセツト
をチヤンバー内に送り込むとともに、チヤンバー
内のカセツトを搬送部材上に取り出すようにした
ことを要旨としている。そして第2発明は上記第
1発明の搬送部材をアーム部材に一体的に取り付
けたことをその要旨としている。
In order to achieve such an object, the first invention is provided with a transport member for transporting a cassette containing a plurality of wafers in the main body of the apparatus, and a plasma generation chamber that is open in the transport direction of the transport member, A lid body that automatically opens and closes the opening of this chamber is attached, and an arm member that performs vertical and horizontal movements feeds the cassettes on the transport member into the chamber, and also transports the cassettes inside the chamber onto the transport member. The main point is that it has been taken out. The gist of the second invention is that the conveyance member of the first invention is integrally attached to the arm member.

以下に本発明の好適一実施例を添付図面に基い
て詳述する。
A preferred embodiment of the present invention will be described in detail below with reference to the accompanying drawings.

第1図は第1発明に係るプラズマ処理装置の全
体斜視図である。図中1は2つのチヤンバーを併
設し、多数のウエハーを同時に処理し得るように
したプラズマ処理装置であり、このプラズマ処理
装置1は中央に各種制御ボタン2…を備えた制御
ボツクス3の配設し、この制御ボツクス3内に各
種配線の他、真空ポンプ及び高周波電源等を組み
込んでいる。
FIG. 1 is an overall perspective view of a plasma processing apparatus according to the first invention. In the figure, 1 is a plasma processing apparatus that has two chambers and can process a large number of wafers at the same time.This plasma processing apparatus 1 has a control box 3 equipped with various control buttons 2 in the center. However, in addition to various wiring, a vacuum pump, a high frequency power source, etc. are incorporated in this control box 3.

そして上記制御ボツクス3のローダ側及びアン
ローダ側に長箱状のケース4,5を連設し、それ
らケース4,5の側面を開閉扉6…としている。
またケース4,5の上面中央部には長手方向に開
口部7,8を形成し、この開口部7,8に複数の
ウエハー9…を収納したカセツト10の搬送部材
である無端ベルト11,12を臨ませている。こ
の無端ベルト11,12の上面は上記ケース4,
5の上面と略々面一とされ、その幅は開口部7,
8の幅よりも狭くなつており、無端ベルト11,
12の側端部と開口部7,8との間には隙間1
3,14が形成され、この隙間13,14から側
面アングル状をなす二股状のアーム部材15の上
部が突出し得るようにしている。
Long box-shaped cases 4 and 5 are connected to the loader side and unloader side of the control box 3, and doors 6 are formed on the sides of the cases 4 and 5.
In addition, openings 7 and 8 are formed in the center of the upper surfaces of the cases 4 and 5 in the longitudinal direction, and endless belts 11 and 12, which are conveying members for a cassette 10 containing a plurality of wafers 9, are formed in the openings 7 and 8 in the longitudinal direction. is coming. The upper surface of these endless belts 11, 12 is the case 4,
5, and its width is approximately flush with the upper surface of the opening 7,
8, the endless belt 11,
There is a gap 1 between the side end of 12 and the openings 7 and 8.
3 and 14 are formed, and the upper part of a bifurcated arm member 15 having an angular side surface can protrude from the gaps 13 and 14.

またケース4の前端部には前工程における処理
が済んだウエハー9を収納したカセツト10を無
端ベルト11上に載せるためのリフト機構等を組
み込んだ連通部16を設け、ケース5の後端部に
はプラズマ処理が済んだウエハー9を収納したカ
セツト10を次工程へ移送するための連通部17
を設けている。
Further, at the front end of the case 4, there is provided a communication section 16 incorporating a lift mechanism etc. for placing the cassette 10 containing the wafers 9 that have been processed in the previous process onto the endless belt 11. A communication section 17 is used to transfer the cassette 10 containing the wafer 9 that has been subjected to plasma processing to the next process.
has been established.

更に上記制御ボツクス3の上部には前面及び後
面が開口したカバー18を設け、このカバー18
内にプラズマ発生用チヤンバー19を配設してい
る。このプラズマ発生用チヤンバー19は略々円
筒状をなす石英管の外周部に電極板を固定して高
周波を印加するようにしたものであり、両端の開
口部は上記カセツト10の搬送方向に向つて開口
している。換言すればカセツト10の搬送方向と
チヤンバー18の軸とは一致している。
Furthermore, a cover 18 with openings on the front and rear sides is provided above the control box 3, and this cover 18
A plasma generation chamber 19 is disposed inside. This plasma generating chamber 19 is constructed by fixing an electrode plate to the outer periphery of a quartz tube having a substantially cylindrical shape to apply a high frequency wave, and openings at both ends face toward the transport direction of the cassette 10. It's open. In other words, the transport direction of the cassette 10 and the axis of the chamber 18 coincide.

第2図及び第3図はアーム部材15に昇降動作
及び水平動作をなさしめる機構を示すものであ
り、前記ケース4の底部にシリンダユニツト20
を水平方向に固定設置し、このシリンダユニツト
20のロツド21に支持体22を嵌着し、この支
持体22上面に垂直方向にシリンダユニツト23
を立設し、このシリンダユニツト23のロツド2
4の先端部にアーム部材15の下端部を固着して
いる。而してアーム部材15はシリンダユニツト
20のロツド21の出没動によつて水平動作を行
ない、シリンダユニツト23のロツド24の出没
動で昇降動作を行なう。
2 and 3 show a mechanism that allows the arm member 15 to move up and down and horizontally, and a cylinder unit 20 is installed at the bottom of the case 4.
A support body 22 is fitted onto the rod 21 of this cylinder unit 20, and a cylinder unit 23 is installed vertically on the upper surface of this support body 22.
is erected, and the rod 2 of this cylinder unit 23 is
The lower end of the arm member 15 is fixed to the tip of the arm member 4. The arm member 15 moves horizontally as the rod 21 of the cylinder unit 20 moves in and out, and moves up and down as the rod 24 of the cylinder unit 23 moves in and out.

また、上記の機構はケース5の内部にも設けら
れている。
Further, the above mechanism is also provided inside the case 5.

第4図乃至第6図はチヤンバー19の開口部を
開閉する蓋体25の開閉動作を示すものであり、
前記カバー18の前端部下方、即ち制御ボツクス
3とケース4の境界部近傍の底部にシリンダユニ
ツト26を垂直方向に立設している。そしてこの
シリンダユニツト26のロツド27はカバー18
の前端下部から内方に折曲したブラケツト28を
貫通して上下方向に出没可能とされ、且つロツド
27の先端部には支持体29を固着している。こ
の支持体29の側面には前記蓋体25がアーム3
0,30を介して取り付けられており、このアー
ム30,30は支持体29内に設けたスプリング
によつて図中反時計方向に付勢されている。した
がつて第4図に示す如くロツド27が引つ込んだ
状態にあるときは蓋体25の上端部が支持体29
の上端部よりも上方へ突出することとなる。
4 to 6 show the opening and closing operation of the lid body 25 that opens and closes the opening of the chamber 19,
A cylinder unit 26 is vertically provided below the front end of the cover 18, that is, at the bottom near the boundary between the control box 3 and the case 4. The rod 27 of this cylinder unit 26 is attached to the cover 18.
It passes through a bracket 28 bent inward from the lower front end of the rod 27 so that it can extend and retract vertically, and a support 29 is fixed to the tip of the rod 27. The cover body 25 is attached to the arm 3 on the side surface of the support body 29.
0 and 30, and these arms 30 and 30 are biased counterclockwise in the figure by a spring provided within the support body 29. Therefore, when the rod 27 is in the retracted state as shown in FIG.
It protrudes upward from the upper end of the .

而して第4図の状態から、ロツド27が突出動
すると、蓋体25はそれにつれて上昇し、その上
端部がカバー18の天井面18aに当接する。そ
して更にロツド27が突出すると支持体29のみ
が上昇し、これにつれてアーム30,30は時計
方向に回動する。その結果蓋体25はその上端部
を天井面18aに摺動しつつ図中右方向、即ちチ
ヤンバー19の開口部19aに向つて移動する。
そして支持体29の上端部が天井面18aに当接
したとき、つまりロツド27の上動限において、
蓋体25の側面に取り付けたシールリング31が
チヤンバー19の前端部のフランジ19bに当接
し、第5図に示すように開口部19aを気密に閉
塞することとなる。そして前記と逆の動作により
第6図に示す如き元の状態に戻る。
When the rod 27 protrudes from the state shown in FIG. 4, the lid 25 rises accordingly, and its upper end abuts against the ceiling surface 18a of the cover 18. Then, when the rod 27 protrudes further, only the support body 29 rises, and the arms 30, 30 rotate clockwise accordingly. As a result, the lid 25 moves rightward in the figure, ie, toward the opening 19a of the chamber 19, while sliding its upper end on the ceiling surface 18a.
When the upper end of the support body 29 comes into contact with the ceiling surface 18a, that is, at the upper limit of movement of the rod 27,
The seal ring 31 attached to the side surface of the lid body 25 comes into contact with the flange 19b at the front end of the chamber 19, thereby airtightly closing the opening 19a as shown in FIG. Then, by the reverse operation to the above, the original state as shown in FIG. 6 is returned.

またチヤンバー19の後端部の開口部を開閉す
る蓋体25も上記と同様の機構によつて動作する
ようになつている。
The lid 25 that opens and closes the opening at the rear end of the chamber 19 is also operated by the same mechanism as described above.

以上の如き構成からなる第1発明の作用を第7
図に基いて説明する。
The seventh invention describes the operation of the first invention having the above configuration.
This will be explained based on the diagram.

先ず第7図イに示す如く、カセツト10が無端
ベルト11の先端部までくるとリミツトスイツチ
により無端ベルト11が停止し、これと同時にチ
ヤンバー19の前端開口部を閉じていた蓋体25
が降下し、開口部を開ける。次いでロに示す如く
アーム部材15が上昇し、カセツト10を無端ベ
ルト11上から持ち上げ、ハに示す如くアーム部
材15が右方向に移動しカセツト10をチヤンバ
ー19内に送り込む。次いでニに示す如くアーム
部材15が若干降下してチヤンバー19内に配設
した載置台32上にカセツト10を載せ、ホに示
す如くアーム部材15が後退し、これと同時にロ
ーダ側の蓋体25が上昇しチヤンバー19の開口
部を気密に閉じる。
First, as shown in FIG. 7A, when the cassette 10 reaches the tip of the endless belt 11, the endless belt 11 is stopped by the limit switch, and at the same time, the lid 25, which had closed the front end opening of the chamber 19, is closed.
descends and opens the opening. Next, the arm member 15 rises as shown in (b) and lifts the cassette 10 from the endless belt 11, and the arm member 15 moves rightward as shown in (c) to feed the cassette 10 into the chamber 19. Next, as shown in D, the arm member 15 descends slightly to place the cassette 10 on the mounting table 32 disposed inside the chamber 19, and as shown in E, the arm member 15 retreats, and at the same time, the lid 25 on the loader side rises and hermetically closes the opening of the chamber 19.

そして所定時間チヤンバー内でプラズマ処理を
行なつた後、ヘに示す如くアンローダ側の蓋体2
5を下げてチヤンバー19の後端開口を設け、次
いでトに示す如くアンローダ側のアーム部材15
がチヤンバー内に入りカセツト10の下方に位置
する。この後アーム部材15は先端部にカセツト
を載せたまま後退し、チに示す如くアンローダ側
の無端ベルト12上にカセツト10を移す。そし
てこのカセツト10はリに示す如く無端ベルト1
2により後方へ搬送され、次工程へと送られる。
After performing plasma treatment in the chamber for a predetermined period of time, the lid body 2 on the unloader side
5 to form a rear end opening of the chamber 19, and then lower the arm member 15 on the unloader side as shown in FIG.
enters the chamber and is located below the cassette 10. Thereafter, the arm member 15 moves backward with the cassette placed on its tip, and the cassette 10 is transferred onto the endless belt 12 on the unloader side, as shown in FIG. This cassette 10 is connected to an endless belt 1 as shown in FIG.
2 to the rear and sent to the next process.

つまり、カセツト10は第1図及び第7図に示
すごとく、ほぼ直線上を後退することなく略前進
搬送される。
In other words, as shown in FIGS. 1 and 7, the cassette 10 is transported substantially forward in a substantially straight line without moving backward.

第8図及び第9図は第2発明の第1発明とは異
つた構成としてアーム部材の動作機構を示すもの
である。
FIGS. 8 and 9 show the operating mechanism of the arm member as a second invention different from the first invention.

即ち第2発明にあつては、水平方向に設置した
シリンダユニツト33のロツド34の先端部に支
持体35を固着し、この支持体35に案内棒3
6,36を貫通せしめることで、支持体35がロ
ツド34の出没動によつて案内棒36,36に沿
つて水平動作を行なうようにしている。そしてこ
の支持体35上には支持板37を介して案内棒3
8,38を垂直方向に設けるとともに、シリンダ
ユニツト39を立設し、このシリンダユニツト3
9のロツド40の先端部にアーム部材41の基部
下面を固着している。このアーム部材41は上面
を水平とするとともに、その上面に長さ方向に伸
びる凹溝42を形成し、この凹溝42によつてア
ーム部材41を左右の突条部41a,41bに分
けている。そして左側の突条部41aには上記案
内棒38が挿通する孔を形成し、上記ロツド40
の出没動に応じてアーム部材41が案内棒38に
沿つて昇降動するようにしている。また右側の突
条部41bの先端部及び後端部に軸43,44を
回転自在に挿通し、これら軸43,44の両端に
プーリ45,46を嵌合し、プーリ45,46間
にベルト47,47を張り渡し、図示しないモー
タによりベルト47を駆動するようにしている。
That is, in the second invention, a support 35 is fixed to the tip of the rod 34 of the cylinder unit 33 installed horizontally, and the guide rod 3 is attached to the support 35.
By passing through the guide rods 6 and 36, the support body 35 can be horizontally moved along the guide rods 36 and 36 by the movement of the rod 34 in and out. A guide rod 3 is placed on this support 35 via a support plate 37.
8 and 38 are provided in the vertical direction, and a cylinder unit 39 is provided upright, and this cylinder unit 3
The lower surface of the base of the arm member 41 is fixed to the tip of the rod 40 of No. 9. This arm member 41 has a horizontal upper surface and has a groove 42 extending in the length direction on the upper surface, and this groove 42 divides the arm member 41 into left and right protrusions 41a and 41b. . A hole through which the guide rod 38 is inserted is formed in the left protrusion 41a, and the rod 40 is inserted into the hole.
The arm member 41 moves up and down along the guide rod 38 in accordance with the movement of the arm member 41 into and out. Further, shafts 43 and 44 are rotatably inserted into the tip and rear ends of the right protrusion 41b, pulleys 45 and 46 are fitted to both ends of these shafts 43 and 44, and a belt is inserted between the pulleys 45 and 46. 47, 47 are stretched, and the belt 47 is driven by a motor (not shown).

第10図及び第11図はアーム部材41に昇降
動作及び水平動作をなさしめる機構の別実施例を
示すものであり、同一部材については同一番号を
付している。
FIGS. 10 and 11 show another embodiment of a mechanism for making the arm member 41 move up and down and horizontally, and the same members are given the same numbers.

即ちモータ48によつて回転せしめられるとと
もに、雄ネジ部を刻設した軸49を水平方向に架
設し、且つこの軸49に支持体35を螺着し、軸
49の回転に応じて支持体35が案内棒36に沿
つて水平方向に移動するようにしている。そして
支持体35上にモータ50を固定し、このモータ
50によつて回転せしめられるとともに雄ネジ部
を刻設した軸51を立設し、この軸51に前記ア
ーム部材41を螺合している。而してモータ50
を駆動することでアーム部材41は案内棒38に
沿つて昇降動を行なう。
That is, a shaft 49 which is rotated by a motor 48 and has a male threaded portion is installed in the horizontal direction, and the support body 35 is screwed onto this shaft 49, so that the support body 35 is rotated by the rotation of the shaft 49. is moved horizontally along the guide rod 36. A motor 50 is fixed on the support body 35, and a shaft 51 which is rotated by the motor 50 and has a male thread is provided upright, and the arm member 41 is screwed onto this shaft 51. . Therefore, the motor 50
By driving the arm member 41, the arm member 41 moves up and down along the guide rod 38.

以上の如き構成からなる第2発明も前記第7図
に示したと同様の作用によつて半導体ウエハー9
…を収納したカセツト10をチヤンバー19内に
送り込み、所定時間プラズマ処理をした後、カセ
ツト10をチヤンバー19から取り出すようにな
つている。
The second invention having the above-mentioned structure also has a semiconductor wafer 9 by the same effect as shown in FIG.
A cassette 10 containing ... is sent into a chamber 19, and after being subjected to plasma treatment for a predetermined period of time, the cassette 10 is taken out from the chamber 19.

尚、第2発明においても、カセツト10はほぼ
直線上を後退することなく略前進搬送される。
In the second invention as well, the cassette 10 is conveyed substantially forward on a substantially straight line without moving backward.

以上の説明で明らかな如く本発明によれば、プ
ラズマ処理装置のケース等に複数枚の半導体ウエ
ハーを収めたカセツトを搬送する搬送部材を設け
るとともに、該カセツトの搬送方向に開口するプ
ラズマ発生用チヤンバーを設置し、昇降動作及び
水平動作を行なうアーム部材によつてカセツトの
チヤンバー内への送り込み及び取り出しを自動的
に行なえるようにし、或いは上記アーム部材に上
記搬送部材を一体的に取り付けることでカセツト
のチヤンバー内への送り込み及び取り出しを自動
的に行なえるようにしたので、少ない部品点数に
より多数枚のウエハーを効率良く処理でき、且つ
故障しにくくコンパクト化が図れるプラズマ処理
装置を安価に製作できる等多大の利点を有する。
As is clear from the above description, according to the present invention, a transport member for transporting a cassette containing a plurality of semiconductor wafers is provided in a case or the like of a plasma processing apparatus, and a plasma generation chamber that opens in the transport direction of the cassette is provided. The cassettes can be loaded and unloaded into the chamber automatically by installing an arm member that moves up and down and horizontally, or by integrally attaching the conveying member to the arm member. Since it is possible to automatically feed and take out wafers into and out of the chamber, it is possible to efficiently process a large number of wafers with a small number of parts, and to manufacture a plasma processing system that is less likely to break down and can be made more compact at a low cost. It has many advantages.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明の実施の一例を示すものであり、
第1図は第1発明に係るプラズマ処理装置の全体
斜視図、第2図はアーム部材に昇降動作及び水平
動作を行なわせる機構を示す正面図、第3図は同
機構の側面図、第4図乃至第6図は蓋体の開閉動
を行なう機構を示す一部破断正面図、第7図イ乃
至リはプラズマ処理装置の作動を順を追つて説明
した正面図、第8図は第2発明に係るプラズマ処
理装置のアーム部材に昇降動作及び水平動作を行
なわせる機構を示す正面図、第9図は同機構の側
面図、第10図は別実施例を示す第8図と同様の
正面図、第11図は同別実施例の第9図と同様の
側面図である。 尚、図面中9はウエハー、10はカセツト、1
1,12,47は搬送部材、15,41はアーム
部材、19はプラズマ発生用チヤンバー、19a
はチヤンバーの開口、25は蓋体である。
The drawings show an example of the implementation of the present invention,
FIG. 1 is an overall perspective view of the plasma processing apparatus according to the first invention, FIG. 2 is a front view showing a mechanism for making the arm member perform vertical movement and horizontal movement, FIG. 3 is a side view of the same mechanism, and FIG. 6 through 6 are partially cutaway front views showing the mechanism for opening and closing the lid, FIGS. A front view showing a mechanism for vertically moving and horizontally moving the arm member of the plasma processing apparatus according to the invention, FIG. 9 is a side view of the same mechanism, and FIG. 10 is a front view similar to FIG. 8 showing another embodiment. 11 are side views similar to FIG. 9 of the same embodiment. In addition, in the drawing, 9 is a wafer, 10 is a cassette, 1
1, 12, 47 are conveyance members, 15, 41 are arm members, 19 is a plasma generation chamber, 19a
25 is an opening of the chamber, and 25 is a lid.

Claims (1)

【特許請求の範囲】 1 複数枚のウエハーを納めたカセツトをチヤン
バーに収容してウエハーを処理する自動プラズマ
処理装置において、この自動プラズマ処理装置は
カセツトの搬送方向の上流側から下流側に向つて
順次ローダ側搬送部材、ローダ側蓋体、チヤンバ
ー、アンローダ側蓋体及びアンローダ側搬送部材
を直列に配設し、前記ローダ側及びアンローダ側
搬送部材の夫々は、これら搬送部材とチヤンバー
との間でカセツトの受け渡しを行うべく昇降及び
水平動可能とされたアーム部材と、このアーム部
材の長手方向に走行し且つ上面より突出させてア
ーム部材に設けられた一対の無端ベルトとからな
ることを特徴とする自動プラズマ処理装置。 2 複数枚のウエハーを納めたカセツトをチヤン
バーに収容してウエハーを処理する自動プラズマ
処理装置におて、この自動プラズマ処理装置はカ
セツトの搬送方向の上流側から下流側に向つて順
次ローダ側搬送部材、ローダ側蓋体、チヤンバ
ー、アンローダ側蓋体及びアンローダ側搬送部材
を直列に配設し、前記ローダ側及びアンローダ側
搬送部材は無端ベルトで構成し、これら無端ベル
トとチヤンバーとの間でのカセツト受け渡しは昇
降及び水平動可能とされ一対のアーム部材でそれ
ぞれ行うことを特徴とする自動プラズマ処理装
置。
[Scope of Claims] 1. In an automatic plasma processing apparatus that processes wafers by storing a cassette containing a plurality of wafers in a chamber, this automatic plasma processing apparatus operates from the upstream side to the downstream side in the transport direction of the cassettes. A loader-side transport member, a loader-side lid, a chamber, an unloader-side lid, and an unloader-side transport member are sequentially arranged in series, and each of the loader-side and unloader-side transport members is arranged between the transport member and the chamber. It is characterized by consisting of an arm member that can move up and down and horizontally to transfer cassettes, and a pair of endless belts that run in the longitudinal direction of this arm member and are provided on the arm member so as to protrude from the top surface. automatic plasma processing equipment. 2 In an automatic plasma processing apparatus that processes wafers by storing a cassette containing a plurality of wafers in a chamber, this automatic plasma processing apparatus sequentially transports the cassettes from the upstream side to the downstream side in the transport direction on the loader side. A member, a loader-side lid, a chamber, an unloader-side lid, and an unloader-side conveying member are arranged in series, and the loader-side and unloader-side conveying members are constituted by endless belts, and a An automatic plasma processing apparatus characterized in that cassettes are transferred by a pair of arm members that can be moved up and down and horizontally.
JP14755981A 1981-09-18 1981-09-18 Automatic plasma processing apparatus Granted JPS5848935A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14755981A JPS5848935A (en) 1981-09-18 1981-09-18 Automatic plasma processing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14755981A JPS5848935A (en) 1981-09-18 1981-09-18 Automatic plasma processing apparatus

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP61250343A Division JPS6323331A (en) 1986-10-21 1986-10-21 Opening and closing mechanism for lid

Publications (2)

Publication Number Publication Date
JPS5848935A JPS5848935A (en) 1983-03-23
JPH0325938B2 true JPH0325938B2 (en) 1991-04-09

Family

ID=15433075

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14755981A Granted JPS5848935A (en) 1981-09-18 1981-09-18 Automatic plasma processing apparatus

Country Status (1)

Country Link
JP (1) JPS5848935A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01181527A (en) * 1988-01-11 1989-07-19 Mitsubishi Electric Corp Sealing device of plasma vacuum container
US6709522B1 (en) * 2000-07-11 2004-03-23 Nordson Corporation Material handling system and methods for a multichamber plasma treatment system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS513743U (en) * 1974-06-25 1976-01-12

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5633151Y2 (en) * 1977-03-17 1981-08-06

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS513743U (en) * 1974-06-25 1976-01-12

Also Published As

Publication number Publication date
JPS5848935A (en) 1983-03-23

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