JPH0325832A - 放電制御抵抗付き陰極線管の検査方法 - Google Patents
放電制御抵抗付き陰極線管の検査方法Info
- Publication number
- JPH0325832A JPH0325832A JP1160140A JP16014089A JPH0325832A JP H0325832 A JPH0325832 A JP H0325832A JP 1160140 A JP1160140 A JP 1160140A JP 16014089 A JP16014089 A JP 16014089A JP H0325832 A JPH0325832 A JP H0325832A
- Authority
- JP
- Japan
- Prior art keywords
- grid
- voltage
- discharge control
- control resistor
- cathode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1160140A JPH0325832A (ja) | 1989-06-22 | 1989-06-22 | 放電制御抵抗付き陰極線管の検査方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1160140A JPH0325832A (ja) | 1989-06-22 | 1989-06-22 | 放電制御抵抗付き陰極線管の検査方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0325832A true JPH0325832A (ja) | 1991-02-04 |
| JPH0454333B2 JPH0454333B2 (OSRAM) | 1992-08-31 |
Family
ID=15708739
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1160140A Granted JPH0325832A (ja) | 1989-06-22 | 1989-06-22 | 放電制御抵抗付き陰極線管の検査方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0325832A (OSRAM) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5671254A (en) * | 1994-12-22 | 1997-09-23 | Mitsubishi Denki Kabushiki Kaisha | Modulation, demodulation and antenna coupling circuits used in IC card reading/writing apparatus, and method of supplying power to the IC card |
| WO2004031687A1 (de) * | 2002-09-17 | 2004-04-15 | Gesellschaft Für Schwerionenforschung Gmbh | Einrichtung und verfahren zür örtlichen schichtdickenmessung an einer probe und/oder zür örtlichen veränderung ihrer dicke mit einem elektronenstrahl |
-
1989
- 1989-06-22 JP JP1160140A patent/JPH0325832A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5671254A (en) * | 1994-12-22 | 1997-09-23 | Mitsubishi Denki Kabushiki Kaisha | Modulation, demodulation and antenna coupling circuits used in IC card reading/writing apparatus, and method of supplying power to the IC card |
| WO2004031687A1 (de) * | 2002-09-17 | 2004-04-15 | Gesellschaft Für Schwerionenforschung Gmbh | Einrichtung und verfahren zür örtlichen schichtdickenmessung an einer probe und/oder zür örtlichen veränderung ihrer dicke mit einem elektronenstrahl |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0454333B2 (OSRAM) | 1992-08-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |