JPH03255358A - Ultrasonic automatic flaw detector - Google Patents

Ultrasonic automatic flaw detector

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Publication number
JPH03255358A
JPH03255358A JP2052959A JP5295990A JPH03255358A JP H03255358 A JPH03255358 A JP H03255358A JP 2052959 A JP2052959 A JP 2052959A JP 5295990 A JP5295990 A JP 5295990A JP H03255358 A JPH03255358 A JP H03255358A
Authority
JP
Japan
Prior art keywords
defect
signal
flaw detection
probe
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2052959A
Other languages
Japanese (ja)
Inventor
Yukiro Sugimoto
幸郎 杉元
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2052959A priority Critical patent/JPH03255358A/en
Publication of JPH03255358A publication Critical patent/JPH03255358A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:To find the erroneous connection of flaw detecting cables for connecting probes and a transmitting/receiving part readily by detecting a test piece wherein artificial defects are provided at the different position for every probe with an ultrasonic wave, displaying the output signal of the defect, and visually checking the defect. CONSTITUTION:Defects are provided at predetermined positions in a test piece 22. A defect-position-gate setting part 8 generates the defect position signal corresponding to the position of the defect. An automatic display part 17 discriminate and displays the defect signal. A rationality checking part 21 checks the rationality of the output sequence of the defects. Since the positions of the defects are different in the scanning directions of probes 3, the results of the detections are displayed on the display device 17 in the sequence corresponding to the positions of the defects after the flaw detection of the test piece 22. Therefore, the connecting errors of flaw detecting cables for connecting the probes 3 and a transmitting/receiving part 2 can be readily found by visually checking the result of the display.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は、lll1送ライン上を搬送されてくる鋼材
などの被検査物の内部に存在する欠陥を超音波を利用し
て検査する超音波自動探傷装置に関するものである。
Detailed Description of the Invention [Field of Industrial Application] This invention is an ultrasonic technology that uses ultrasonic waves to inspect defects existing inside an object to be inspected, such as a steel material that is conveyed on an lll1 feed line. This relates to automatic flaw detection equipment.

[従来の技術] 被検査物の一例として5iil板を探傷する従来の超音
波自動探傷装置としては9例えば日本非破戒検査協会発
行の雑誌“非破壊検査第29巻第10号P731− P
737”に示されたものがある。
[Prior Art] A conventional automatic ultrasonic flaw detection device for detecting flaws on a 5IIL board as an example of an object to be inspected is 9, for example, as described in the magazine "Non-Destructive Inspection Vol. 29 No. 10 P731-P" published by the Japan Non-Destructive Inspection Association.
There is one shown in ``737''.

第4図は従来例で、被検査物をその表面より探傷する超
音波探傷装置を示すものであり1図において、(1)は
超音波探傷装置の時間系を制御する同期部、(2)は同
期部(1)よりの送信指令信号に対応した送信信号の発
生及び探触子よりの探傷信号を増巾識別するための送受
信部、(3)は送受信部(2)よりの送信信号により超
音波信号を発生する探触子、(4)は探触子(3)を保
持し、被検査物(5)に追従させるための追従機構部、
(6)は被検査物(5)の移動距離に対応したパルスを
発生するためのパルス発生器、(7)は送受信部(2)
で識別された被検査物(5)の探傷反射信号、(8)は
被検査物(5)の探傷範囲を設定するためのゲート設定
部、(9)はゲート設定部(8)で設定された欠陥ゲー
ト信号、  flolはゲート設定部(8)で設定した
探傷範囲内の欠陥検出信号(11)を判別するためのゲ
ート回路部、 fil)はゲート回路部で判別された欠
陥検出信号、 (12)は欠陥検出信号(Illより欠
陥出力信号(13)を判定するための判定回路部。
Figure 4 shows a conventional example of an ultrasonic flaw detector that detects flaws from the surface of an object to be inspected. In Figure 1, (1) is a synchronization unit that controls the time system of the ultrasonic flaw detector, (2) (3) is a transmitting/receiving unit for generating a transmitting signal corresponding to a transmitting command signal from the synchronizing unit (1) and amplifying and identifying the flaw detection signal from the probe; a probe that generates an ultrasonic signal; (4) a tracking mechanism for holding the probe (3) and making it follow the object to be inspected (5);
(6) is a pulse generator for generating pulses corresponding to the moving distance of the object to be inspected (5), and (7) is a transmitter/receiver unit (2).
(8) is the gate setting section for setting the flaw detection range of the inspection object (5), and (9) is the flaw detection reflection signal of the object to be inspected (5) identified in . flol is the gate circuit section for determining the defect detection signal (11) within the flaw detection range set by the gate setting section (8), fil) is the defect detection signal determined by the gate circuit section, ( 12) is a determination circuit unit for determining the defect output signal (13) from the defect detection signal (Ill).

(13)は欠陥出力信号、  f14+は欠陥を判定す
るための判定レベル信号(15)を設定するための判定
レベル設定部、  f151は判定レベル信号、 (1
6)はパルス発生器(6)よりのパルス出力信号により
被検査物(5)の長さを計測するための測長計数部、 
 (17)は被検査物(5)の位置に対応した欠陥を表
示するための表示器、 (18)は送受信部(2)と探
触子(3)を接続するための探傷ケーブルである。
(13) is a defect output signal, f14+ is a judgment level setting unit for setting a judgment level signal (15) for judging a defect, f151 is a judgment level signal, (1
6) is a length measuring unit for measuring the length of the object to be inspected (5) using the pulse output signal from the pulse generator (6);
(17) is a display for displaying defects corresponding to the position of the object to be inspected (5), and (18) is a flaw detection cable for connecting the transmitting/receiving section (2) and the probe (3).

次に動作について説明する。同期部ill よりの送信
指令信号に対応して送受信部(2)は送信信号を発生し
、探傷ケーブル(18)を通して探触子(3)に印加す
る。探触子(3)は送信信号の印加により、超音波信号
を発生し、接触媒質を通じて被検査物(5)に超音波信
号を伝搬する。被検査物(5)よりの反射信号は探傷ケ
ーブル(18)を通し送受信部(2)で識別され、探傷
反射信号(7) として。
Next, the operation will be explained. The transmitting/receiving section (2) generates a transmission signal in response to the transmission command signal from the synchronization section ill, and applies it to the probe (3) through the flaw detection cable (18). The probe (3) generates an ultrasonic signal by applying a transmission signal, and propagates the ultrasonic signal to the object to be inspected (5) through the couplant. The reflected signal from the inspected object (5) passes through the flaw detection cable (18) and is identified by the transmitting/receiving section (2) as a flaw detection reflected signal (7).

又、被検査物(5)の探傷範囲を設定するためのゲート
信号はゲート設定部(8)で設定され、欠陥ゲート信号
(9)となって、それぞれゲート回路部(10)に入力
される。ゲート回路部(lO)では。
Further, a gate signal for setting the flaw detection range of the inspected object (5) is set in a gate setting section (8), becomes a defect gate signal (9), and is inputted to the gate circuit section (10). . In the gate circuit section (lO).

前記2つの信号より、被検査物(5)の厚さ(表面より
底面まで)に対応した欠陥検出信号(illを出力し7
判定回路部(12)へ入力する。判定回路部(12)は
判定レベル設定部(14)で設定された判定レベル信号
 (15)により、欠陥検出信号を判定し、欠陥出力信
号(13)を表示器(17)へ送る。
From the above two signals, a defect detection signal (ill) corresponding to the thickness (from the surface to the bottom) of the object to be inspected (5) is output.
Input to the determination circuit section (12). The determination circuit section (12) determines the defect detection signal based on the determination level signal (15) set by the determination level setting section (14), and sends a defect output signal (13) to the display (17).

一方、測長計数部(16)は、被検査物(5)の移動に
対応したパルス信号を発生するパルス発生器(6)より
のパルス信号を計測し、被検査物(5)の先端よりの距
離情報信号を表示器(17)へ送る。表示器 (17)
は判定回路部(12)よりの各チャンネルに対応した欠
陥出力信号(13)と、測長計数部(16)よりの被検
査物(5)の距離情報信号とにより、被検査物(5)の
どこに欠陥があるかを表示する。
On the other hand, the length measurement/counting section (16) measures a pulse signal from a pulse generator (6) that generates a pulse signal corresponding to the movement of the object to be inspected (5), and measures the pulse signal from the tip of the object to be inspected (5). The distance information signal is sent to the display (17). Display (17)
The object to be inspected (5) is detected by the defect output signal (13) corresponding to each channel from the judgment circuit section (12) and the distance information signal of the object to be inspected (5) from the length measuring and counting section (16). Show where the defects are.

尚、追従機構部(4)は、探触子(3)を保持すると共
に、被検査物(5)の動きに追従して、探触子(3)よ
りの超音波信号を被検査物(5)に安定に伝搬するため
のものである。
The tracking mechanism section (4) holds the probe (3) and tracks the movement of the object (5) to transmit the ultrasonic signal from the probe (3) to the object (5). 5) for stable propagation.

第5図は、従来の超音波探傷装置の探傷時間系の関係を
示すものであり1図において、Tは送信信号、Sは被検
査物(5)の表面よりの反射信号(Sエコー)、Fは被
検査物(5)の欠陥よりの反射信号(Fエコー)、Bは
被検査物(5)の底面よりの反射信号(Sエコー)を示
す。又、被検査物(5)と探触子(3)との関係を第6
図に示す。
Fig. 5 shows the relationship between the flaw detection time system of a conventional ultrasonic flaw detection device. In Fig. 1, T is a transmitted signal, S is a reflected signal (S echo) from the surface of the inspected object (5), F indicates a signal reflected from a defect in the object to be inspected (5) (F echo), and B indicates a signal reflected from the bottom surface of the object to be inspected (5) (S echo). In addition, the relationship between the object to be inspected (5) and the probe (3) is
As shown in the figure.

図は探触子(3)を4個配置した場合で、探触子(3a
)の1チヤンネルは探傷ケーブル(18)の1チヤンネ
ルで探触子(3b)の2チヤンネルは探傷ケーブル(1
8)の2チヤンネルで、探触子(3C)の3チヤンネル
は探傷ケーブル(18)の3チヤンネルで、探触子(3
d)の4チヤンネルは探傷ケーブル(18)の4チヤン
ネルでそれぞれ送受信部(2)に接続されており、1〜
4チヤンネルの各々の探触子(3)によって受信した探
傷信号は送受信部(2)、ゲート回路部(10) 、判
定回路部(12)で各チャンネルそれぞれ欠陥判定され
た後、探触子(3)の配置によって決められた探傷区域
に合致して表示器(17)に表示される。
The figure shows the case where four probes (3) are arranged.
) is one channel of the flaw detection cable (18), and the second channel of the probe (3b) is the flaw detection cable (18).
8), and the 3rd channel of the probe (3C) is the 3rd channel of the flaw detection cable (18), and the 3rd channel of the probe (3C).
The four channels in d) are the four channels of the flaw detection cable (18), which are each connected to the transmitting/receiving section (2).
The flaw detection signals received by the probes (3) of each of the four channels are judged to be defective in each channel by the transmitting/receiving section (2), the gate circuit section (10), and the judgment circuit section (12), and then sent to the probe (3). 3) is displayed on the display (17) in accordance with the flaw detection area determined by the arrangement.

し発明が解決しようとする課題1 上記の様な従来の超音波探傷装置では、追従機構部(4
)に配置した探触子(3)と探傷ケーブル(18)と、
送受信部(2)とのチャンネルの接続が合ってなければ
ならず、万一接続が異なった場合は、被検査物(5)の
実際の欠陥位置とは異なった位置に探傷結果表示される
不具合が発生する。第7図は探傷ケーブル(18)の接
続誤りの場合の探傷結果出力表示例を示す図であり、探
触子(3a)の1チヤンネルに探傷ケーブル(18)の
2チヤンネルが、又探触子(3b)の2チヤンネルに探
傷ケーブル(18)の1チヤンネルが接続されていた場
合の出力表示であり9図の様に、被検査物(5)の実際
位置A(1チヤンネルの位置)と異なった位置(2チヤ
ンネルの位置の破線表示)に欠陥表示される。
Problem 1 to be solved by the invention In the conventional ultrasonic flaw detection device as described above, the tracking mechanism section (4
), the probe (3) and the flaw detection cable (18),
The channel connection with the transmitting/receiving unit (2) must match, and if the connection is incorrect, the flaw detection result will be displayed at a location different from the actual defect location on the inspected object (5). occurs. FIG. 7 is a diagram showing an example of displaying the flaw detection result output in the case of incorrect connection of the flaw detection cable (18). This is the output display when one channel of the flaw detection cable (18) is connected to the second channel of (3b), and as shown in Figure 9, it differs from the actual position A (position of the first channel) of the inspected object (5). A defect is displayed at the position (dotted line display at the 2nd channel position).

特に探触子(3)は、追従機構部(4)に保持され、被
検査物(5)に超音波信号を伝搬するために、常に被検
査物(5)の表面に接触しており、そのため消耗が激し
く、交換頻度が多く、交換の都度探触子(3)を探傷ケ
ーブル(18)とのチャンネルの接続確認が必要である
。又、被検査物(5)の大型化に伴なう探触子(3)や
、探傷ケーブル(18)の増加及び追従機構部(4)内
の探傷ケーブル(18)の複雑な布線経路及び結束のた
め、探傷ケーブル(18)のチャンネルの接続確認に多
大の時間を費していた。
In particular, the probe (3) is held by the tracking mechanism section (4) and is always in contact with the surface of the object to be inspected (5) in order to propagate the ultrasonic signal to the object to be inspected (5). Therefore, it is subject to heavy wear and has to be replaced frequently, and it is necessary to check the channel connection between the probe (3) and the flaw detection cable (18) each time it is replaced. In addition, as the object to be inspected (5) becomes larger, the number of probes (3) and flaw detection cables (18) increases, and the wiring route of the flaw detection cables (18) in the tracking mechanism (4) becomes complicated. In addition, due to the bundling, a great deal of time was spent checking the connection of the channel of the flaw detection cable (18).

上記のように従来の超音波探傷装置では、自動的に探傷
ケーブル(18)の接続確認を行う機能がなく問題であ
った。
As mentioned above, the conventional ultrasonic flaw detection apparatus has a problem in that it does not have a function to automatically check the connection of the flaw detection cable (18).

この発明は、これらの問題点を解消するためのもので、
探触子(3)の数量が増大しても、又、追従機構部(4
)内の探傷ケーブル(18)の布線経路の複雑及び結束
の状態に関係な(、探傷ケーブル(18)のチャンネル
の接続の確認を自動的に行うことができる超音波探傷装
置を得ることを目的とする。
This invention is intended to solve these problems.
Even if the number of probes (3) increases, the following mechanism (4)
It is an object of the present invention to obtain an ultrasonic flaw detection device that can automatically check the connection of the channel of the flaw detection cable (18), regardless of the complexity of the wiring route and the bundling state of the flaw detection cable (18) in ). purpose.

[課題を解決するための手段1 この発明に係る超音波自動探傷装置は、あらかじめ決め
た位置に欠陥を設けた試験片と、試験片の欠陥位置に対
応した欠陥位置ゲート信号を発生するための欠陥位置ゲ
ート設定部と、超音波探傷した欠陥出力信号を上記欠陥
位置ゲート信号によって判別表示するための自動表示部
とを具備したものである。
[Means for Solving the Problems 1] The automatic ultrasonic flaw detection device according to the present invention includes a test piece having a defect at a predetermined position and a defect position gate signal for generating a defect position gate signal corresponding to the defect position of the test piece. The apparatus is equipped with a defect position gate setting section and an automatic display section for distinguishing and displaying a defect output signal obtained by ultrasonic flaw detection using the defect position gate signal.

またこの発明に係る超音波自動探傷装置はさらに欠陥判
別出力信号を受けて各探触子に対応する欠陥の出力順番
の合理性をチェックする合理性チェック部を設けたもの
である。
Further, the automatic ultrasonic flaw detection apparatus according to the present invention further includes a rationality check section that receives the defect discrimination output signal and checks the rationality of the output order of defects corresponding to each probe.

[作用] この発明は各探触子ごとに異なる位置に人工欠陥を設け
た試験片を超音波探傷し、その結果、得られた欠陥出力
信号を表示器で表示する。
[Operation] This invention performs ultrasonic flaw detection on a test piece in which artificial defects are provided at different positions for each probe, and displays the resulting defect output signal on a display.

また欠陥出力信号の出力順番を自動的に判断することに
より探傷ケーブルの接続を確認する。
Additionally, the connection of the flaw detection cable is confirmed by automatically determining the output order of the defect output signals.

[実施例] 第1図はこの発明の一実施例を示す図で、試験片を探傷
し、探傷ケーブルの接続確認を行うことで、超音波探傷
装置に適用したものである。第1図において、(1)〜
(18)は第4図に示したものと同様である。
[Embodiment] FIG. 1 is a diagram showing an embodiment of the present invention, which is applied to an ultrasonic flaw detection apparatus by flaw detecting a test piece and checking the connection of a flaw detection cable. In Figure 1, (1) ~
(18) is similar to that shown in FIG.

(19)は各探触子が欠陥を検出する順番を設定する欠
陥順番設定部、  (20)は欠陥の検出順番信号、 
 +211は判定回路部(12)からの欠陥判別出力信
号 (13)および欠陥順番設定部(19)からの欠陥
検出順番信号 (20)を受けて、各探触子に対応する
欠陥の出力順番の合理性をチェックする合理性チェック
部、  (221は各探触子ごとにその走査方向におい
て欠陥検出時刻がそれぞれ異なる位置に人工欠陥を設け
た接続N語用試験片である。
(19) is a defect order setting unit that sets the order in which each probe detects defects; (20) is a defect detection order signal;
+211 receives the defect discrimination output signal (13) from the judgment circuit section (12) and the defect detection order signal (20) from the defect order setting section (19), and determines the output order of defects corresponding to each probe. A rationality check unit that checks rationality (221 is a connected N-word test piece in which artificial defects are provided at positions with different defect detection times in the scanning direction for each probe.

つぎに動作について説明する。同期部(11よりの送信
指令信号に対応して、送受信部(2)は送信信号を発生
し、探傷ケーブル(18)を通して、探触子(3)に印
加する。探触子(3)は送信信号の印加により、超音波
信号を発生し、接触媒質を通じて被検査物(5)に超音
波信号を伝搬する。被検査物(5)よりの反射信号は探
傷ケーブル(18)を通し送受信部(2)で識別され、
探傷反射信号(7)として、被検査物(5)の探傷範囲
を設定するためのゲート信号はゲート設定部(8)で設
定され、欠陥ゲ−ト信号 (9)となって、それぞれゲ
ート回路部(IO)に入力される。ゲート回路部(10
)では。
Next, the operation will be explained. In response to the transmission command signal from the synchronization unit (11), the transmission/reception unit (2) generates a transmission signal and applies it to the probe (3) through the flaw detection cable (18).The probe (3) By applying the transmission signal, an ultrasonic signal is generated, and the ultrasonic signal is propagated to the object to be inspected (5) through the couplant.The reflected signal from the object to be inspected (5) passes through the flaw detection cable (18) to the transmitter/receiver section. (2) is identified by
As a flaw detection reflection signal (7), a gate signal for setting the flaw detection range of the object to be inspected (5) is set in a gate setting section (8), and becomes a defect gate signal (9), which is sent to each gate circuit. (IO). Gate circuit section (10
) then.

前記2つの信号より、被検査物(5)の厚さ(表面より
底面まで)に対応した欠陥検出信号(11)を出力し9
判定回路部(12)へ入力する。判定回路部(12)は
9判定レベル設定部(14)で設定された判定レベル信
号 (15)により欠陥検出信号を判定し、欠陥出力信
号 (13)を表示器(17)へ送る。
From the above two signals, a defect detection signal (11) corresponding to the thickness (from the surface to the bottom surface) of the object to be inspected (5) is outputted.
Input to the determination circuit section (12). The determination circuit section (12) determines the defect detection signal based on the determination level signal (15) set by the 9 determination level setting section (14), and sends a defect output signal (13) to the display (17).

一方、測長計数部(16)は、被検査物(5)の移動に
対応したパルス信号を発生するパルス発生器(6)より
のパルス信号を計測し、被検査物(5)の先端よりの距
離情報信号を表示器(17)へ送る。
On the other hand, the length measurement/counting section (16) measures a pulse signal from a pulse generator (6) that generates a pulse signal corresponding to the movement of the object to be inspected (5), and measures the pulse signal from the tip of the object to be inspected (5). The distance information signal is sent to the display (17).

表示器(17)は判定回路部(12)よりの各チャンネ
ルに対応した欠陥出力信号(13)と、測長計数部(1
6)よりの被検査物(5)の距離情報信号とにより、被
検査物(5)のどこに欠陥があるかを表示する。そして
追従機構部(4)は、探触子(3)を保持すると共に、
被検査物(5)の動きに追従して、探触子(3)よりの
超音波信号を被検査物(5)に安定に伝搬するためのも
のである。
The display device (17) displays the defect output signal (13) corresponding to each channel from the determination circuit section (12) and the length measurement counter section (1
6) The distance information signal of the object to be inspected (5) is used to display where the defect is located on the object to be inspected (5). The tracking mechanism section (4) holds the probe (3) and
This is for stably propagating the ultrasonic signal from the probe (3) to the object to be inspected (5) while following the movement of the object to be inspected (5).

次に被検査物(5)の変わりに試験片(22)を用いて
探傷ケーブル(18)の各チャンネルの接続を確認する
動作について説明する。
Next, the operation of checking the connection of each channel of the flaw detection cable (18) using a test piece (22) instead of the object to be inspected (5) will be described.

いま試験片(22)には各探触子にそれぞれ対応して人
工欠陥が設けれており、それぞれの人工欠陥の位置は探
触子の走査方向において異なるため、試験片(22)を
探勝した徒の表示器(17)上にはそれぞれの欠陥の位
置に対応した順番に欠陥検出結果が表示出力される。し
たがって、その表示結果を目視チェックすることによっ
て容易に探傷ケーブルの接続誤りを発見することができ
る。
Now, the test piece (22) is provided with an artificial defect corresponding to each probe, and the position of each artificial defect is different in the scanning direction of the probe. The defect detection results are displayed on the second display (17) in the order corresponding to the position of each defect. Therefore, by visually checking the displayed results, it is possible to easily discover a connection error in the flaw detection cable.

以上の様子を第2図によってさらに具体的に説明する。The above situation will be explained in more detail with reference to FIG.

第2図ia)において、試験片(22)上の○印は探触
子の探傷区域(図では探触子が4個−つ例であり、1−
4チヤンネル(CH)で区分した。)ごとに設けた人工
欠陥Fであり、ここでは図示のように1チヤンネルから
順番に異なる位置に加工されているものと想定している
。第2図(b)の欠陥出力信号(13)の1−4CHは
、試験片(22)を探傷することによって得られた判定
回路部(12)の出力信号であり、この信号にしたがっ
て表示器(17)土には第2図(c)に示されたような
欠陥マツプが出力される。もし探傷ケーブルの接続状態
が正常であれば、当然ながら欠陥マツプは試験片(22
)に付けられた人工欠陥の位置をそのまま反映したもの
となるが、接続状態が異常であればその表示出力から即
座に誤り接続の個所を知ることができる。なおここでは
、最終の探傷結果は表示器上に出力されるものとしたが
、印字プリンタやベンレコーダなどの出力器機を使用し
ても同じ効果が得られることは言うまでもないことであ
る。
In Figure 2 ia), the circle mark on the test piece (22) indicates the flaw detection area of the probe (in the figure, there are 4 probes in the example, 1-
It was divided into 4 channels (CH). ), and here it is assumed that they are processed at different positions sequentially starting from channel 1 as shown in the figure. CHs 1-4 of the defect output signal (13) in FIG. 2(b) are the output signals of the determination circuit (12) obtained by testing the test piece (22), and the display is displayed according to this signal. (17) A defect map as shown in FIG. 2(c) is output for the soil. If the connection state of the flaw detection cable is normal, the defect map will naturally be on the test piece (22
), but if the connection status is abnormal, you can immediately know the location of the erroneous connection from the display output. In this case, it is assumed that the final flaw detection results are output on the display, but it goes without saying that the same effect can be obtained by using an output device such as a printer or a Ben recorder.

つぎにこの発明のもう一つの実施例について説明する。Next, another embodiment of the invention will be described.

第1図の合理性チェック部(21)は判定回路部(12
)からの欠陥判定信号(13)を受け、各探触子が試験
片 (22)の人工欠陥を検出する順番の合理性をチェ
ックするもので、欠陥順番設定部(19)で予め設定さ
れた欠陥順番設定信号(20)にしたがって欠陥の表わ
れる順番が正常であるかどうかを自動的に判断するもの
である。もし試験片 (22)に設けられた人工欠陥の
順番が決まっているものであれば、上記の欠陥順番判定
部(19)は特に具備する必要はない。
The rationality check section (21) in FIG.
) is used to check the rationality of the order in which each probe detects artificial defects in the test piece (22) by receiving the defect determination signal (13) from It is automatically determined whether the order in which defects appear is normal or not according to a defect order setting signal (20). If the order of the artificial defects provided on the test piece (22) is determined, it is not necessary to provide the defect order determining section (19).

第3図は第2図と同様に探触子が4個の場合において、
探傷ケーブル(18)の探触子(3)への接続が誤った
とき(l CHと2CHとが逆に接続された場合)の動
作を示したものである。第3図(alの試験片 (22
)は探触子のIcHから4CHまで順番に欠陥を検出す
るように加工されたものであるが、第3図fblの欠陥
出力信号(13)のI CHは探触子(3)の2CIが
検出すべき欠陥を出力しており、また欠陥出力信号(1
3)の2CHは探触子(3)の1.CHが検出すべき欠
陥を出力している。ここで第3図fclの合理性チェッ
ク信号の一例として、各CHの欠陥出力信号(13)に
よって立ち上がり1次のCHの欠陥出力信号 (13)
によって立ち下がるゲート信号を考えたとき、そのゲー
ト信号の期間に他のCHの欠陥出力信号が表れた場合は
探傷ケーブルの接続に誤りがあったものと見なすことが
できる。
Figure 3 shows the case where there are four probes as in Figure 2.
This figure shows the operation when the flaw detection cable (18) is incorrectly connected to the probe (3) (lCH and 2CH are connected in reverse). Figure 3 (Al test piece (22
) are processed to detect defects in order from IcH to 4CH of the probe, but the ICH of the defect output signal (13) in Fig. 3 fbl is the result of 2CI of the probe (3). The defect to be detected is output, and the defect output signal (1
2CH of 3) is 1.CH of probe (3). CH outputs the defects to be detected. Here, as an example of the rationality check signal of fcl in FIG.
When considering a gate signal that falls by , if a defective output signal of another CH appears during the period of the gate signal, it can be assumed that there is an error in the connection of the flaw detection cable.

[発明の効果] この発明は以上説明したように、各探触子ごとに異なる
位置に人工欠陥を設けた試験片を超音波探傷し、その結
果得られた欠陥出力信号を表示部で表示して目視チェッ
クしたり、また上記欠陥出力信号の出力順番を自動的に
判断することにより、探触子と送受信部とを接続する探
傷ケーブルの接続誤りを容易に発見することができると
いう効果がある。
[Effects of the Invention] As explained above, the present invention performs ultrasonic flaw detection on a test piece in which artificial defects are provided at different positions for each probe, and displays the defect output signal obtained as a result on a display section. This has the effect of making it possible to easily discover connection errors in the flaw detection cable that connects the probe and the transmitter/receiver by visually checking the defect output signals and automatically determining the output order of the defect output signals. .

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例を示す超音波探傷装置の構
成図、第2図および第3図はこの発明の一実施例の動作
を説明するための図、第4図は従来の超音波探傷装置を
示す図、第5図は従来の超音波探傷装置の動作を示す図
、第6図は従来の超音波探傷装置の被検査物と探触子と
の関係を示す図、第7図は被検査部の実際の欠陥位置と
探傷出力された欠陥の位置との関係を示す図である。 図において、(1)は同期部、(2)は送受信部。 (3)は探触子、(4)は追従機構部、(5)は被検査
物、(6)はパルス発生器、(7)は探傷反射信号。 (8)はゲート設定部、(9)は欠陥ゲート信号。 (10)はゲート回路部、 (111は欠陥検出信号。 (12)は判定回路部、  (13)は欠陥出力信号。 (14)は判定レベル設定部、  f151は判定レベ
ル信号、   f161は測長針数部、  f17)は
表示器。 (18)は探傷ケーブル、  (191は欠陥順番設定
部。 (20)は欠陥順番設定信号、  f211は合理性チ
ェック部、  (221は試験片、である。 なお、各図中同一符号は同一または相当部分を示す。
FIG. 1 is a block diagram of an ultrasonic flaw detection device showing an embodiment of the present invention, FIGS. 2 and 3 are diagrams for explaining the operation of an embodiment of the invention, and FIG. FIG. 5 is a diagram showing the operation of a conventional ultrasonic flaw detection device. FIG. 6 is a diagram showing the relationship between an object to be inspected and a probe in a conventional ultrasonic flaw detection device. The figure is a diagram showing the relationship between the actual defect position of the part to be inspected and the position of the defect detected and output. In the figure, (1) is a synchronization section, and (2) is a transmission/reception section. (3) is a probe, (4) is a tracking mechanism, (5) is an object to be inspected, (6) is a pulse generator, and (7) is a flaw detection reflection signal. (8) is a gate setting section, and (9) is a defective gate signal. (10) is the gate circuit section, (111 is the defect detection signal. (12) is the judgment circuit section, (13) is the defect output signal. (14) is the judgment level setting section, f151 is the judgment level signal, and f161 is the length measuring needle. Several copies, f17) is the display. (18) is the flaw detection cable, (191 is the defect order setting section, (20) is the defect order setting signal, f211 is the rationality check section, and (221 is the test piece.) The same reference numerals in each figure indicate the same or A considerable portion is shown.

Claims (2)

【特許請求の範囲】[Claims] (1)超音波を用いて被検査物の欠陥を探傷する超音波
自動探傷装置において、装置全体の時間系を制御する同
期部、探触子への送信信号の発生および探触子からの受
信信号を増幅識別する送受信部と、送信信号により超音
波を発生する探触子と、上記送受信部と探触子とを接続
する探傷器ケーブルと、上記探触子を保持し被検査物に
接触追従させるための追従機構部と、被検査物の断面方
向の探傷範囲を設定するゲート設定部と、上記ゲート設
定部で設定した探傷範囲内の欠陥検出信号を判別するゲ
ート回路部と、上記欠陥検出信号より欠陥出力信号を判
別する判定回路部と、欠陥を判定するための判定レベル
信号を設定する判定レベル設定部と、被検査物の位置に
対応した欠陥を表示するための表示器と、各探触子ごと
にその走査方向において欠陥検出時刻がそれぞれ異なる
位置に人工欠陥を設けた接続確認用試験片とを具備し、
その試験片の探傷時における欠陥出力信号を表示器で表
示することにより探傷ケーブルの接続誤りが判断できる
ようにしたことを特徴とする超音波自動探傷装置。
(1) In an ultrasonic automatic flaw detection device that uses ultrasonic waves to detect defects in a test object, there is a synchronization section that controls the time system of the entire device, and a synchronization section that generates transmission signals to the probe and receives them from the probe. A transmitter/receiver unit that amplifies and identifies signals, a probe that generates ultrasonic waves based on the transmitted signal, a flaw detector cable that connects the transmitter/receiver unit and the probe, and a flaw detector cable that holds the probe and contacts the object to be inspected. A tracking mechanism section for tracking, a gate setting section for setting a flaw detection range in the cross-sectional direction of the object to be inspected, a gate circuit section for determining a defect detection signal within the flaw detection range set by the gate setting section, and a gate circuit section for determining a defect detection signal within the flaw detection range set by the gate setting section; a determination circuit unit that determines a defect output signal from a detection signal; a determination level setting unit that sets a determination level signal for determining a defect; and a display unit that displays a defect corresponding to a position of an object to be inspected; Each probe is equipped with a test piece for connection confirmation in which artificial defects are provided at positions with different defect detection times in the scanning direction,
An automatic ultrasonic flaw detection device characterized in that a defect output signal during flaw detection of the test piece is displayed on a display, thereby making it possible to determine whether there is a connection error in a flaw detection cable.
(2)前記の判別回路部からの欠陥判別出力信号を受け
て、各探触子に対応する欠陥の出力順番の合理性をチェ
ックする合理性チェック部を具備し、前記試験片の探傷
時に探傷ケーブルの接続誤りを自動的に判別する機能を
備えたことを特徴とする特許請求の範囲第(1)項記載
の超音波自動探傷装置。
(2) A rationality check unit is provided which receives the defect discrimination output signal from the discrimination circuit unit and checks the rationality of the output order of defects corresponding to each probe, and is equipped with The automatic ultrasonic flaw detection device according to claim 1, characterized by having a function of automatically determining cable connection errors.
JP2052959A 1990-03-05 1990-03-05 Ultrasonic automatic flaw detector Pending JPH03255358A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2052959A JPH03255358A (en) 1990-03-05 1990-03-05 Ultrasonic automatic flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2052959A JPH03255358A (en) 1990-03-05 1990-03-05 Ultrasonic automatic flaw detector

Publications (1)

Publication Number Publication Date
JPH03255358A true JPH03255358A (en) 1991-11-14

Family

ID=12929430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2052959A Pending JPH03255358A (en) 1990-03-05 1990-03-05 Ultrasonic automatic flaw detector

Country Status (1)

Country Link
JP (1) JPH03255358A (en)

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