JPH0325170U - - Google Patents
Info
- Publication number
- JPH0325170U JPH0325170U JP8587989U JP8587989U JPH0325170U JP H0325170 U JPH0325170 U JP H0325170U JP 8587989 U JP8587989 U JP 8587989U JP 8587989 U JP8587989 U JP 8587989U JP H0325170 U JPH0325170 U JP H0325170U
- Authority
- JP
- Japan
- Prior art keywords
- sucked
- holes
- fixing portion
- utility
- registration request
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 3
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
第１図は本考案の一実施例の要部の平面図、第
２図は第１図のＡ−Ａ線断面図、第３図は従来の
半導体装置自動選別装置要部の断面図である。
１……外枠、２……ＩＣ固定部、３……固定部
の孔、５……ＩＣ。
FIG. 1 is a plan view of a main part of an embodiment of the present invention, FIG. 2 is a sectional view taken along line A-A in FIG. 1, and FIG. 3 is a sectional view of a main part of a conventional automatic semiconductor device sorting device. . 1... Outer frame, 2... IC fixing part, 3... Hole of fixing part, 5... IC.
Claims (1)
別装置において、搬送レールの半導体装置固定部
に空気の吹き出し・吸いこみが行なわれる孔があ
けられていることを特徴とする半導体装置の自動
選別装置。 An automatic sorting device for horizontally transporting product semiconductor devices to a measuring machine, characterized in that a semiconductor device fixing portion of a transport rail is provided with holes through which air is blown out and sucked in.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8587989U JPH0325170U (en) | 1989-07-20 | 1989-07-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8587989U JPH0325170U (en) | 1989-07-20 | 1989-07-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0325170U true JPH0325170U (en) | 1991-03-14 |
Family
ID=31635232
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8587989U Pending JPH0325170U (en) | 1989-07-20 | 1989-07-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0325170U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5928484A (en) * | 1982-08-11 | 1984-02-15 | Mitsui Toatsu Chem Inc | Method for isolating l-amino acid |
| JPS6423171A (en) * | 1987-07-18 | 1989-01-25 | Matsushita Electronics Corp | Inspecting device for semiconductor laser chip |
-
1989
- 1989-07-20 JP JP8587989U patent/JPH0325170U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5928484A (en) * | 1982-08-11 | 1984-02-15 | Mitsui Toatsu Chem Inc | Method for isolating l-amino acid |
| JPS6423171A (en) * | 1987-07-18 | 1989-01-25 | Matsushita Electronics Corp | Inspecting device for semiconductor laser chip |
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