JPH03239339A - Semiconductor package - Google Patents

Semiconductor package

Info

Publication number
JPH03239339A
JPH03239339A JP2036660A JP3666090A JPH03239339A JP H03239339 A JPH03239339 A JP H03239339A JP 2036660 A JP2036660 A JP 2036660A JP 3666090 A JP3666090 A JP 3666090A JP H03239339 A JPH03239339 A JP H03239339A
Authority
JP
Japan
Prior art keywords
temperature
package
integrated circuit
semiconductor package
substance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2036660A
Other languages
Japanese (ja)
Inventor
Takeshi Hashizume
毅 橋爪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2036660A priority Critical patent/JPH03239339A/en
Publication of JPH03239339A publication Critical patent/JPH03239339A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544Marks applied to semiconductor devices or parts
    • H01L2223/54473Marks applied to semiconductor devices or parts for use after dicing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544Marks applied to semiconductor devices or parts
    • H01L2223/54473Marks applied to semiconductor devices or parts for use after dicing
    • H01L2223/54486Located on package parts, e.g. encapsulation, leads, package substrate

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To recognize the temperature change of a semiconductor package by heat generated by an integrated circuit and to simply execute a temperature- measuring operation by a method wherein a substance whose color is changed by a temperature change is applied or pasted in an arbitrary part on the surface. CONSTITUTION:A substance 2 whose color is changed by a temperature is applied or pasted on the surface of a package 1 in order to confirm heat generated by an integrated circuit which has been housed at the inside of the package 1. That is to say, when the discoloration of the temperature-sensing part 2 is confirmed in advance by the correspondence between a discolored color and a temperature, it is possible to visually confirm, at its inside, by means of the discoloration, abnormal heat on the surface of the package and the integrated circuit which has been housed. Thereby, it is possible to simply recognize a temperature on the surface of the package.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は集積回路を収納する半導体パッケージに関し
、特に高温によって不良となりやすい集積回路を保護す
る方法を提供するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor package that houses an integrated circuit, and in particular provides a method for protecting an integrated circuit that is susceptible to failure due to high temperatures.

〔従来の技術〕[Conventional technology]

近年のデバイスの高密度化、高速化に伴って、消費電力
が増大し集積回路の発熱が問題となってきている。また
、通常の消費電力による発熱の他にも過大電流による発
熱などにより、それ自体の不良の他にも熱的ストレスに
よる不良誘発が生じる事が多い。このため、このような
デバイスが実装された集積回路基板に訣いては温度解析
が重要となってきてにす、多くの場合、赤外線カメラ等
を用いたシステムによって集積回路基板上のデバイスの
温度を測定していた。
In recent years, as devices have become more dense and faster, power consumption has increased and heat generation in integrated circuits has become a problem. Furthermore, in addition to heat generated by normal power consumption, heat generated by excessive current, etc., often induces defects due to thermal stress in addition to the defects themselves. For this reason, temperature analysis has become important for integrated circuit boards on which such devices are mounted. was measuring.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来の半導体パッケージは以上のように構成されていた
ので、集積回路基板における温度測定は赤外線カメラ等
による高価なシステムが必要であるという問題点があっ
た。
Conventional semiconductor packages have been configured as described above, but there has been a problem in that an expensive system such as an infrared camera is required to measure the temperature on the integrated circuit board.

この発明は上記のような問題点を解消するためになされ
たもので、集積回路の発熱による半導体パッケージの温
度変化を認識するために赤外線カメラなどを用いたシス
テムを必要とせず簡単に温度測定を行うことを目的とす
る。
This invention was made to solve the above-mentioned problems, and allows for easy temperature measurement without the need for a system using an infrared camera or the like in order to recognize temperature changes in semiconductor packages due to heat generation in integrated circuits. The purpose is to do something.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係る半導体パッケージは、温度によって変色
する物質をパッケージ表面に塗布または張り付けること
によって、パッケージすなわちその内部に収納された集
積回路の発熱を確認するようにしたものである。
In the semiconductor package according to the present invention, heat generation of the package, that is, the integrated circuit housed inside the package, can be confirmed by applying or pasting a substance that changes color depending on temperature on the package surface.

〔作用〕[Effect]

この発明における半導体パッケージの湿度によって変色
する物質は、温度感知部の変色を前もって変色した色と
温度の対応を確認しておけば、その変色によってパッケ
ージ表面ひいてはその内部に収納された集積回路の異常
発熱を目視で確認することができる○ 〔実施例〕 以下、この発明の一実施例を図について説明する0 第1図はこの発明の一実施例による半導体パッケージの
平面図である。
In this invention, the substance that changes color due to humidity in the semiconductor package can be used to detect discoloration of the temperature sensing part by confirming the correspondence between the color change and the temperature in advance. Heat generation can be visually confirmed. [Example] Hereinafter, an embodiment of the present invention will be described with reference to the drawings.0 Fig. 1 is a plan view of a semiconductor package according to an embodiment of the present invention.

すなわち、図に示されたパッケージ(1)においては、
例えはパッケージ(1)の上部等の基板に実装された場
合にも目視で確認しやすい位置に丸形の温度感知部(2
)を設置し、この温度感知部に例えば液晶等の温度によ
って変色する物質が塗布されているO 第2図はこの発明の他の実施例を示したもので、正方形
状のパッケージ(1)の上面に角形の湿度感知部(2)
が張り付けられている。
That is, in package (1) shown in the figure,
For example, when mounted on a board such as the top of the package (1), a round temperature sensing part (2
), and this temperature sensing part is coated with a substance that changes color depending on the temperature, such as liquid crystal. Figure 2 shows another embodiment of the present invention. Square humidity sensor on top (2)
is attached.

ま−た、パッケージ(1)の表面の湿度が温度によって
変色する物質(2)のその可変領域を越えている場合、
パッケージ(1)表面の温度感知部(2)と変色する液
晶等の物質の間に断熱材などの緩熱拐を挾んで使用して
もよい。
Also, if the humidity on the surface of the package (1) exceeds the variable range of the substance (2) that changes color depending on temperature,
A heat-reducing material such as a heat insulating material may be interposed between the temperature sensing portion (2) on the surface of the package (1) and a substance such as a liquid crystal that changes color.

〔発明の効果〕〔Effect of the invention〕

以上のようにこの発明によれは、パッケージ表面の温度
感知部に塗布または張り付けられた液晶によって、パッ
ケージ表面の温度が認識でき、このパッケージが複数実
装された基板であれは、基板における湯度分布が目視に
よっである程度認識でき、またその内部に収納されてい
る集積回路の過大電流による発熱そのものの不良並びに
発熱による熱的ストレスによって誘発した不良を予想で
き、不良デバイスを交換することが可能となる。
As described above, according to the present invention, the temperature of the package surface can be recognized by the liquid crystal coated or pasted on the temperature sensing part of the package surface, and if a plurality of such packages are mounted on a board, the hot temperature distribution on the board can be detected. can be visually recognized to some extent, and it is also possible to predict defects due to heat generation itself due to excessive current in the integrated circuit housed inside, as well as defects induced by thermal stress due to heat generation, and it is possible to replace defective devices. Become.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例による半導体パンケージの
平面図、第2図はこの発明の他の実施例を示す平面図で
ある。 図において、(1)・・・パッケージ、(2)・・・温
度感知部である0 な釦、図中、同一符号は同一 または相当部分を示す。
FIG. 1 is a plan view of a semiconductor pancake according to one embodiment of the invention, and FIG. 2 is a plan view showing another embodiment of the invention. In the figure, (1)...Package, (2)...A button which is a temperature sensing section. In the figure, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】[Claims] 集積回路を収納する半導体パッケージの表面においてそ
の任意の箇所に温度変化によつて変色する物質を塗布も
しくは張り付けたことを特徴とする半導体パッケージ。
1. A semiconductor package that is characterized in that a substance that changes color due to temperature changes is coated or pasted on any part of the surface of the semiconductor package that houses an integrated circuit.
JP2036660A 1990-02-16 1990-02-16 Semiconductor package Pending JPH03239339A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2036660A JPH03239339A (en) 1990-02-16 1990-02-16 Semiconductor package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2036660A JPH03239339A (en) 1990-02-16 1990-02-16 Semiconductor package

Publications (1)

Publication Number Publication Date
JPH03239339A true JPH03239339A (en) 1991-10-24

Family

ID=12476016

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2036660A Pending JPH03239339A (en) 1990-02-16 1990-02-16 Semiconductor package

Country Status (1)

Country Link
JP (1) JPH03239339A (en)

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