JPH03217069A - Manufacture of wiring board - Google Patents
Manufacture of wiring boardInfo
- Publication number
- JPH03217069A JPH03217069A JP1283690A JP1283690A JPH03217069A JP H03217069 A JPH03217069 A JP H03217069A JP 1283690 A JP1283690 A JP 1283690A JP 1283690 A JP1283690 A JP 1283690A JP H03217069 A JPH03217069 A JP H03217069A
- Authority
- JP
- Japan
- Prior art keywords
- copper
- polyimide
- polyimide resin
- wiring
- wiring board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 17
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 77
- 239000010949 copper Substances 0.000 claims abstract description 77
- 229910052802 copper Inorganic materials 0.000 claims abstract description 76
- 229920001721 polyimide Polymers 0.000 claims abstract description 65
- 229910000881 Cu alloy Inorganic materials 0.000 claims abstract description 35
- 239000004020 conductor Substances 0.000 claims abstract description 31
- 239000009719 polyimide resin Substances 0.000 claims abstract description 27
- 238000000034 method Methods 0.000 claims abstract description 20
- 229910000000 metal hydroxide Inorganic materials 0.000 claims abstract description 15
- 150000004692 metal hydroxides Chemical class 0.000 claims abstract description 15
- 230000005684 electric field Effects 0.000 claims description 6
- 239000008151 electrolyte solution Substances 0.000 claims description 6
- 239000000615 nonconductor Substances 0.000 claims 2
- 239000004642 Polyimide Substances 0.000 abstract description 38
- 239000002243 precursor Substances 0.000 abstract description 21
- 239000000758 substrate Substances 0.000 abstract description 13
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 abstract description 12
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 abstract description 12
- 238000006243 chemical reaction Methods 0.000 abstract description 12
- JJLJMEJHUUYSSY-UHFFFAOYSA-L Copper hydroxide Chemical compound [OH-].[OH-].[Cu+2] JJLJMEJHUUYSSY-UHFFFAOYSA-L 0.000 abstract description 11
- 239000005750 Copper hydroxide Substances 0.000 abstract description 11
- 229910001956 copper hydroxide Inorganic materials 0.000 abstract description 11
- 239000000463 material Substances 0.000 abstract description 10
- 239000010936 titanium Substances 0.000 abstract description 10
- 229910052719 titanium Inorganic materials 0.000 abstract description 10
- 238000000576 coating method Methods 0.000 abstract description 9
- 239000011248 coating agent Substances 0.000 abstract description 8
- 238000010438 heat treatment Methods 0.000 abstract description 8
- 239000000919 ceramic Substances 0.000 abstract description 6
- 239000011229 interlayer Substances 0.000 abstract description 3
- KZBUYRJDOAKODT-UHFFFAOYSA-N Chlorine Chemical compound ClCl KZBUYRJDOAKODT-UHFFFAOYSA-N 0.000 abstract description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract description 2
- 239000001301 oxygen Substances 0.000 abstract description 2
- 229910052760 oxygen Inorganic materials 0.000 abstract description 2
- 229910000851 Alloy steel Inorganic materials 0.000 abstract 1
- 239000003989 dielectric material Substances 0.000 abstract 1
- 238000007598 dipping method Methods 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 13
- 229910052751 metal Inorganic materials 0.000 description 7
- 239000002184 metal Substances 0.000 description 7
- 150000002739 metals Chemical class 0.000 description 5
- 238000010292 electrical insulation Methods 0.000 description 4
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000003792 electrolyte Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000002925 chemical effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910000365 copper sulfate Inorganic materials 0.000 description 1
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 210000004709 eyebrow Anatomy 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 1
- 125000005462 imide group Chemical group 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000027756 respiratory electron transport chain Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Landscapes
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野コ
この発明は、銅又は銅合金配線とポリイミド樹脂絶縁層
を有する配線板の製造方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a method of manufacturing a wiring board having copper or copper alloy wiring and a polyimide resin insulating layer.
[従来の技術コ
近年、電子機器に対する高密度化、小型化、高速化の要
求が高まっている。そのため、配線板にも高密度配線と
高速信号伝送能が求められており、この要求を満たすた
め、電気導体材料としては低抵抗である銅又は銅合金が
、絶縁材料としては高密度なパターンニングが可能で、
耐熱性が高く、比誘電率が小さいポリイミド樹脂が注目
されている。[Conventional technology] In recent years, there has been an increasing demand for higher density, smaller size, and faster speed for electronic devices. Therefore, wiring boards are also required to have high-density wiring and high-speed signal transmission capability. To meet these demands, low-resistance copper or copper alloys are used as electrical conductors, and high-density patterning is used as insulating materials. is possible,
Polyimide resins are attracting attention because of their high heat resistance and low dielectric constant.
従来の配線板、例えば「電子情報通信学会論文誌C J
Vo1.J71−C,No.11(1988年11月
),PP1510−1515に示された配線板は、第6
図の断面図に示す構造である。図中、(1)は基板、(
2)は銅からなる電気導体、(3)はポリイミド樹脂絶
縁体である。Conventional wiring boards, for example, "IEICE Journal of Electronics, Information and Communication Engineers CJ
Vol1. J71-C, No. 11 (November 1988), PP1510-1515, the wiring board shown in No. 6
This is the structure shown in the cross-sectional view of the figure. In the figure, (1) is the substrate, (
2) is an electrical conductor made of copper, and (3) is a polyimide resin insulator.
絶縁層としてのポリイミド樹脂の形成にあたっては、溶
剤に可溶なポリイミド前駆体を基板上に塗布し、その後
の熱処理によってポリイミド前駆体をポリイミド樹脂に
転換する手法が一般的に用いられている。しかし、銅と
ポリイミド前駆体はこの熱処理過程において化学的に反
応し易く、銅/ポリイミド界面付近のポリイミド樹脂が
変質し、ポリイミド樹脂本来の電気絶縁性と酎熱性が得
られず、ひいては銅/ポリイミド界面で剥離し、配線板
として機能しないという問題点があった。前記反応は、
ポリイミドのイミド環の分解に起因するものと考えられ
る。In forming a polyimide resin as an insulating layer, a commonly used method is to apply a polyimide precursor soluble in a solvent onto a substrate, and then convert the polyimide precursor into a polyimide resin by heat treatment. However, copper and the polyimide precursor tend to chemically react during this heat treatment process, and the polyimide resin near the copper/polyimide interface changes in quality, making it impossible to obtain the electrical insulation and heat resistance properties inherent to the polyimide resin. There was a problem that it peeled off at the interface and did not function as a wiring board. The reaction is
This is thought to be caused by decomposition of the imide ring of polyimide.
従来、このような問題点を解決するために、例えば、F
.S.OhuchiらのrJ.Vac.Sci.Tec
hnol.J ^,Vol.6,No3,阿ay/Ju
n 1988,pp1004−1006に、銅とポリイ
ミド樹脂との間にチタニウム(8)など他の材料を挿入
してポリイミド中への銅の拡散を抑制した配線板が考え
られている。第7図は、このような銅(2)とポリイミ
ド樹脂(3)との間に他の材料(8)を挿入した配線板
の断面図である。Conventionally, in order to solve such problems, for example, F.
.. S. Ohuchi et al.'s rJ. Vac. Sci. Tec
hnol. J^, Vol. 6, No3, Aay/Ju
No. 1988, pp. 1004-1006, a wiring board is proposed in which another material such as titanium (8) is inserted between copper and polyimide resin to suppress the diffusion of copper into the polyimide. FIG. 7 is a sectional view of a wiring board in which another material (8) is inserted between such copper (2) and polyimide resin (3).
ところがチタニウムなどの他の材料を上記のようにして
用いると、異種金属の接触により局部電界が発生して腐
食し易くなるので、長期信頼性が低下するという問題が
ある。However, when other materials such as titanium are used as described above, a local electric field is generated due to contact between dissimilar metals, which tends to cause corrosion, resulting in a problem of reduced long-term reliability.
[発明が解決しようとする課題]
さらに銅又は銅合金とポリイミドとを物理的に− 3
−
分離するためにチタニウムなどの他の材料を介在させる
ので、チタニウムなどの他の材料の膜厚が厚くなり、チ
タニウムなどの他の材料が銅又は銅合金に比べて比抵抗
が高いことから、例えば層聞接続に関して、配線の電気
抵抗値が高くなるという課題があった。[Problem to be solved by the invention] Furthermore, copper or copper alloy and polyimide are physically separated from each other.
- Since other materials such as titanium are interposed for separation, the film thickness of the other materials such as titanium becomes thicker, and other materials such as titanium have higher resistivity than copper or copper alloys. For example, regarding interlayer connections, there was a problem in that the electrical resistance value of the wiring became high.
本発明者らは上記のような課題を解消するための手段と
して、銅又は銅合金の表面を改質して銅とポリイミド前
駆体の間の電子移動を抑制するようにした配線板の製造
方法を見いだし、平成元年8月29日に特願平1−22
2221号明細書として出願した。さらに、ポリイミド
又は銅に反応を抑制する効果を有する元素を添加した配
線板についても、平成2年1月10日に事件番号A−A
E097号明細書として出願した。本発明は別の手段に
より前記問題を解消するためになされたものであり、チ
タニウムなどの他の材料を介在させる場合より膜厚が厚
くならず、例えば眉間接続に関して、配線の電気抵抗値
が高くならないで、銅又は銅合金とポリイミドの反応を
抑制する配線板の製造方法を得ることを目的とする。As a means to solve the above-mentioned problems, the present inventors have developed a method for manufacturing a wiring board in which the surface of copper or copper alloy is modified to suppress electron transfer between copper and a polyimide precursor. was discovered and filed a patent application on August 29, 1989.
The application was filed as Specification No. 2221. Furthermore, on January 10, 1990, Case No.
The application was filed as Specification No. E097. The present invention was made in order to solve the above problem by another means, and the film thickness is not thicker than when other materials such as titanium are used, and the electrical resistance of the wiring is high for, for example, a connection between the eyebrows. It is an object of the present invention to provide a method for manufacturing a wiring board that suppresses the reaction between copper or copper alloy and polyimide.
[課題を解決するための手段コ
この発明の配線板の製造方法は、銅又は銅合金の表面に
金属水酸化物皮膜を形成した後に、ポリイミド樹脂を形
成するようにしたものである。[Means for Solving the Problems] In the method for manufacturing a wiring board of the present invention, a metal hydroxide film is formed on the surface of copper or a copper alloy, and then a polyimide resin is formed.
叉この発明の別の発明は、銅又は銅合金を電解液中に浸
漬し、対極に対して電界を印加して、銅又は銅合金の表
面に改質皮膜を形成した後に、ポリイミド樹脂を形成す
るようにしたものである。Another invention of this invention is to form a polyimide resin after immersing copper or a copper alloy in an electrolytic solution and applying an electric field to a counter electrode to form a modified film on the surface of the copper or copper alloy. It was designed to do so.
[作用コ
銅又は銅合金の表面に金属水酸化物皮膜を形成した後に
、ポリイミド樹脂を形成するようにしたので、金属水酸
化物皮膜が、銅又は銅合金とポリイミド前駆体の間の化
学的な反応を抑制する。金属水酸化物皮膜は、銅又は銅
合金の表面に化学的な作用があればよく、金属水酸化物
が銅又は銅合金の表面にリッチな状態であればよいので
、金属水酸化物皮膜の厚さは、ほとんど無視できる。そ
のため配線の電気抵抗値が高くならない。[Effects] Since the polyimide resin is formed after forming a metal hydroxide film on the surface of copper or copper alloy, the metal hydroxide film is formed by chemical bonding between the copper or copper alloy and the polyimide precursor. suppress reactions. The metal hydroxide film only needs to have a chemical effect on the surface of the copper or copper alloy, and the metal hydroxide only needs to be in a rich state on the surface of the copper or copper alloy. The thickness is almost negligible. Therefore, the electrical resistance value of the wiring does not become high.
叉別の発明では、銅又は銅合金を電界液中に浸漬し、対
極に対して電界を印可して、銅又は銅合金の表面に改質
皮膜を形成した後に、ポリイミド樹脂を形成するように
したので、改質皮膜が、銅又は銅合金とポリイミド前駆
体の間の化学的な反応を抑制する。改質皮膜の厚さは、
ほとんど無視できつるので、配線の電気抵抗値が高くな
らない。In another invention, copper or a copper alloy is immersed in an electrolytic solution and an electric field is applied to a counter electrode to form a modified film on the surface of the copper or copper alloy, and then a polyimide resin is formed. As such, the modified coating suppresses the chemical reaction between the copper or copper alloy and the polyimide precursor. The thickness of the modified film is
Since it is almost negligible, the electrical resistance of the wiring does not increase.
[実施例コ
以下、本発明の実施例を図と共に説明する。第1図、及
び第2図は本発明の一実施例の配線板の製造方法を工程
順に示す断面図で、図において、(1)は基板、この場
合はセラミック基板、(2)は銅導体配線、(3)は銅
導体配線(2)上で形成されたポリイミド前駆体膜、(
4)は銅導体配線(2)の表面に形成した金属水酸化物
からなる皮膜、この場合は銅水酸化物皮膜である。[Embodiments] Hereinafter, embodiments of the present invention will be described with reference to the drawings. 1 and 2 are cross-sectional views showing the manufacturing method of a wiring board according to an embodiment of the present invention in the order of steps. In the figures, (1) is a substrate, in this case a ceramic substrate, and (2) is a copper conductor. Wiring, (3) is a polyimide precursor film formed on copper conductor wiring (2), (
4) is a film made of metal hydroxide formed on the surface of the copper conductor wiring (2), in this case a copper hydroxide film.
第1図に示すように、セラミック基板(1)上に銅導体
配線(2)で形成した後、銅導体配線(2)の表面に銅
水酸化物皮膜(3)を形成する。銅水酸化物を形成する
方法としては、例えば、塩素ガス中で100℃、10分
処理した後、10%水酸化ナトリウム水溶液に10秒浸
漬する。又は、相対湿度60%の酸素中、250℃で熱
処理する。その後、第2図に示すようにポリイミド前駆
体膜(3)を配線板上に形成し、必要に応じてパターン
形成する。As shown in FIG. 1, after forming a copper conductor wiring (2) on a ceramic substrate (1), a copper hydroxide film (3) is formed on the surface of the copper conductor wiring (2). As a method for forming copper hydroxide, for example, the material is treated in chlorine gas at 100° C. for 10 minutes, and then immersed in a 10% aqueous sodium hydroxide solution for 10 seconds. Alternatively, heat treatment is performed at 250° C. in oxygen at a relative humidity of 60%. Thereafter, as shown in FIG. 2, a polyimide precursor film (3) is formed on the wiring board, and patterned if necessary.
さらに熱処理によりポリイミド前駆体をポリイミド樹脂
に転換させる。Furthermore, the polyimide precursor is converted into polyimide resin by heat treatment.
この場合、銅導体配線(2)の表面に形成した銅水酸化
物皮膜が、絹とポリイミド前駆体の間の化学的な反応を
抑制する作用を有するので、銅/ポリイミド界面付近の
ポリイミドが変質せず、ポリイミド樹脂本来の電気絶縁
性と酎熱性が得られる。In this case, the copper hydroxide film formed on the surface of the copper conductor wiring (2) has the effect of suppressing the chemical reaction between the silk and the polyimide precursor, so the polyimide near the copper/polyimide interface is altered. The electrical insulation properties and heat resistance inherent to polyimide resin can be obtained without any heat generation.
上記、銅とポリイミドの反応の抑制のメカニズムは現在
のところ不明であるが、本発明においては、上記の水酸
化物の効果として、初めて開示するものである。銅水酸
化物皮膜を用いた実施例では、従来例のように異種金属
を介在させておらず、配線導体を銅単体で構成している
ので、異種金属間で局部的に発生する電池効果による配
線導体の腐食や信頼性の低下が防止でき、信頼性の高い
配線板が得られる。Although the mechanism for suppressing the reaction between copper and polyimide is currently unknown, the present invention discloses this for the first time as an effect of the hydroxide. In the example using a copper hydroxide film, unlike the conventional example, different metals are not interposed, and the wiring conductor is made of copper alone, so that the battery effect that occurs locally between different metals is Corrosion of wiring conductors and deterioration of reliability can be prevented, and a highly reliable wiring board can be obtained.
−7 ー
金属水酸化物からなる皮膜の厚みの効果としては、厚み
25人以下では顕著な効果が得られない。-7 - As for the effect of the thickness of the film made of metal hydroxide, no significant effect can be obtained if the thickness is less than 25 mm.
好ましくは、50人以上で顕著な効果が得られる。Preferably, significant effects can be obtained in 50 or more people.
上記実施例では銅水酸化物からなる皮膜についてのみ述
べたが、銅とは異種金属ではあるがニッケル、アルミニ
ウム、鉄、チタニウム等他の金属水酸化物からなる皮膜
でも、銅又は銅合金とポリイミドの反応の抑制の作用を
有するので応用が可能である。さらに、上記実施例にお
いては、銅の水酸化物を形成する方法として、上記2つ
の方法を示したが、他の方法であっても良い。In the above example, only a coating made of copper hydroxide was described, but although copper is a different metal, coatings made of other metal hydroxides such as nickel, aluminum, iron, titanium, etc. can also be used with copper or copper alloy and polyimide. It can be applied because it has the effect of suppressing the reaction of Further, in the above embodiments, the above two methods are shown as methods for forming copper hydroxide, but other methods may be used.
第3図、第4図、第5図は本発明の他の発明の実施例の
配線板の製造方法を工程順に示す新面図で、図において
、(1)は基板、この場合はセラミック基板、(2)は
銅導体配線、(3)は銅導体配線(2)上で形成された
ポリイミド前駆体膜、(4)は銅導体配線(2)の表面
に本発明の他の発明により形成した表面改質皮膜である
。(5)は電解液、この場合は2%の硫酸銅( C u
S O 4) を主体とする水溶液、(6)は対極
、この場合は銅導体(2)に対し−8 −
て責な金属である白金(pt)、(7)は電源で、銅導
体(2)側が正電極である直流電源である。FIGS. 3, 4, and 5 are new views showing the manufacturing method of a wiring board according to another embodiment of the present invention in the order of steps. In the figures, (1) is a substrate, in this case a ceramic substrate. , (2) is a copper conductor wiring, (3) is a polyimide precursor film formed on the copper conductor wiring (2), and (4) is a film formed on the surface of the copper conductor wiring (2) according to another invention of the present invention. This is a surface-modified coating. (5) is an electrolytic solution, in this case 2% copper sulfate (Cu
(6) is the counter electrode, in this case platinum (pt), which is a metal that has a negative effect on the copper conductor (2), (7) is the power source, and the copper conductor (2) is 2) is a DC power source with the positive electrode.
第3図に示すように、セラミック基板(1)上に銅導体
配線(2)を形成した後、第4図に示すように、電解液
(5)中に浸漬し、銅導体配線(2)を正極、対極(6
)を負極として電源(7)を用いて、電界を印加する。As shown in FIG. 3, after forming the copper conductor wiring (2) on the ceramic substrate (1), as shown in FIG. to the positive electrode and the opposite electrode (6
) is used as a negative electrode and a power source (7) is used to apply an electric field.
電圧としては1v、好ましくは3v、さらに好ましくは
IOV以上、印加時間としては1分、好ましくは3分、
さらに好ましくは、15分以上が適当である。この処理
により銅の表面は薄い赤褐色に改質される。現在のとこ
ろ、この表面改質部の徹細構造は正確に決定されていな
いが、本発明の第1の発明と同様に、銅とポリイミドの
反応を抑制する効果を有するため、この発明の銅上の表
面改質皮膜(4)は銅の水酸化物を含有するものと予想
される。その後、第5図に示すようにポリイミド前駆体
膜(3)を配線板上に形成し、必要に応じてパターン形
成する。さらに熱処理によりポリイミド前駆体をポリイ
ミド樹脂に転換させこの場合、銅導体配線(2)の表面
に形成した表面改質皮膜(4)が、銅とポリイミド前駆
体の間の化学的な反応を抑制する作用を有するので、銅
/ポリイミド界面付近のポリイミドが変質せず、ポリイ
ミド本来の電気絶縁性と耐熱性が得られる。The voltage is 1 V, preferably 3 V, more preferably IOV or more, and the application time is 1 minute, preferably 3 minutes.
More preferably, 15 minutes or more is appropriate. This treatment modifies the surface of the copper to a light reddish-brown color. At present, the detailed structure of this surface-modified part has not been determined accurately, but like the first invention of the present invention, the copper of this invention has the effect of suppressing the reaction between copper and polyimide. The upper surface modified coating (4) is expected to contain copper hydroxide. Thereafter, as shown in FIG. 5, a polyimide precursor film (3) is formed on the wiring board and patterned as necessary. Furthermore, the polyimide precursor is converted into polyimide resin by heat treatment, and in this case, the surface modification film (4) formed on the surface of the copper conductor wiring (2) suppresses the chemical reaction between the copper and the polyimide precursor. Because of this effect, the polyimide near the copper/polyimide interface does not change in quality, and the electrical insulation and heat resistance inherent to polyimide can be obtained.
この実施例の場合では従来例のように異種金属を介在さ
せておらず、配線導体を銅単体で構成しているので、異
種金属間で局部的に発生する電池効果による配、線導体
の腐食や信頼性の低下が防止でき、信頼性の高い配線板
が得られる。この実施例においては、電解液として、硫
酸鋼水溶液であることについて示したが、水酸化ナトリ
ウム( N aOH)等、他の電解液であっても良い。In the case of this example, unlike the conventional example, different metals are not interposed, and the wiring conductor is made of copper alone, so corrosion of the wiring and wire conductor due to the battery effect that occurs locally between different metals. Therefore, a highly reliable wiring board can be obtained. In this embodiment, a sulfuric acid steel aqueous solution is used as the electrolyte, but other electrolytes such as sodium hydroxide (NaOH) may be used.
さらに、電源として直流電源であることについて示した
が、交流電源、パルス電源等他の電源であっても良い。Further, although a DC power source is used as the power source, other power sources such as an AC power source or a pulse power source may be used.
これら2つの発明においては、セラミック基板上の銅導
体配線の処理についてのみ述べたが、これに限ることは
なく、あらゆる基板上の銅導体配線に対して適用が可能
である。In these two inventions, only the treatment of copper conductor wiring on a ceramic substrate has been described, but the present invention is not limited to this and can be applied to copper conductor wiring on any substrate.
さらには、銅導体配線形成、本発明による銅導体配線の
処理、ポリイミド前駆体形成、ポリイミド前駆体の熱処
理を順次繰り返して、銅導体配線とポリイミド樹脂絶縁
体からなる多層配線板を製造することができる。Furthermore, by sequentially repeating the formation of copper conductor wiring, the treatment of the copper conductor wiring according to the present invention, the formation of a polyimide precursor, and the heat treatment of the polyimide precursor, it is possible to manufacture a multilayer wiring board consisting of copper conductor wiring and a polyimide resin insulator. can.
なお、銅導体配線の形成方法としては、蒸着法、スパッ
タ法、めっき法等、従来公知に実施されている方法であ
れば良い。Note that as a method for forming the copper conductor wiring, any conventionally known method such as vapor deposition, sputtering, plating, etc. may be used.
さらに、基板上に銅膜を形成、本発明による処理の後,
銅膜にエッチング処理等を施すことにより、配線形成し
てもよい。さらに,配線形成の後に、本発明による処理
を施しても良い。Furthermore, after forming a copper film on the substrate and processing according to the present invention,
The wiring may be formed by subjecting the copper film to an etching process or the like. Furthermore, the process according to the present invention may be performed after the wiring is formed.
[発明の効果]
以上説明したようにこの発明の配線板の製造方法は、銅
又は銅合金の表面に金属水酸化物皮膜を形成した後に、
ポリイミド樹脂を形成するようにしたので、金属水酸化
物皮膜が、銅又は銅合金とポリイミド前駆体の間の化学
的な反応を抑制し、銅又は銅合金/ポリイミド界面付近
のポリイミドが変質せず、ポリイミド樹脂本来の電気絶
縁性と耐熱性が得られる。従来における銅又は銅合金と
ポリイミドとを物理的に分離するためにチタニウムなど
を介在させるものは、物理的に分離であるためチタニウ
ムなどがどうしても厚くなる。しかしこの発明の金属水
酸化物皮膜は、銅又は銅合金の表面に化学的な作用があ
わばよく、銅又は銅合金の表面に金属水酸化物がリツチ
な状態であればよいので、金属酸化物皮膜の厚さは、ほ
とんど無視でき、これを用いた、例えば層間接続に関し
て、配線板の配線の電気抵抗値が高くならないようにで
きる。[Effects of the Invention] As explained above, in the method for manufacturing a wiring board of the present invention, after forming a metal hydroxide film on the surface of copper or copper alloy,
Since a polyimide resin is formed, the metal hydroxide film suppresses the chemical reaction between the copper or copper alloy and the polyimide precursor, and the polyimide near the copper or copper alloy/polyimide interface does not deteriorate. , the electrical insulation and heat resistance inherent to polyimide resin can be obtained. In conventional methods in which titanium or the like is interposed to physically separate copper or copper alloy from polyimide, the titanium or the like inevitably becomes thick due to the physical separation. However, the metal hydroxide film of the present invention only needs to have a chemical action on the surface of the copper or copper alloy, and only needs to be rich in metal hydroxide on the surface of the copper or copper alloy. The thickness of the material film is almost negligible, and when using this film, for example, for interlayer connections, it is possible to prevent the electrical resistance value of the wiring on the wiring board from increasing.
叉別の発明の配線板の製造方法は、銅又は銅合金を電解
液中に浸漬し、対極に対して電界を印可して、銅又は銅
合金の表面に改質皮膜を形成した後に、ポリイミド樹脂
を形成するようにしたので、改質皮膜が銅又は銅合金と
ポリイミド前駆体の間の化学的な反応を抑制する。さら
に改質皮膜の厚さは、ほとんど無視できるので、配線の
電気抵抗値が高くならないようにできる。Another method of manufacturing a wiring board according to the invention is to immerse copper or a copper alloy in an electrolytic solution, apply an electric field to a counter electrode, form a modified film on the surface of the copper or copper alloy, and then immerse the copper or copper alloy in an electrolytic solution. Since a resin is formed, the modified coating suppresses the chemical reaction between the copper or copper alloy and the polyimide precursor. Furthermore, since the thickness of the modified film can be almost ignored, it is possible to prevent the electrical resistance value of the wiring from increasing.
第1図、第2図は、この発明の配線板の製造方11 −
法の一実施例を工程順に示す断面図、第3図、第4図、
第5図は別な発明の一実施例をコ一程順に示す断面図、
第6図、第7図は従来の配線板の製造方法をそれぞれ示
す断面図である。
図中,(1)は基板、(2)は銅導体配線、(3)はポ
リイミド前駆体膜、(4)は銅の水酸化物皮膜、あるい
は表面改質皮膜である。
なお,図中、同一符号は、同一又は相当部分を示す。FIGS. 1 and 2 are cross-sectional views showing an embodiment of the wiring board manufacturing method 11-method of the present invention in the order of steps; FIGS. 3 and 4;
FIG. 5 is a sectional view showing an embodiment of another invention in order of steps;
FIG. 6 and FIG. 7 are cross-sectional views showing a conventional wiring board manufacturing method, respectively. In the figure, (1) is a substrate, (2) is a copper conductor wiring, (3) is a polyimide precursor film, and (4) is a copper hydroxide film or a surface modified film. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.
Claims (2)
電気絶縁体とする配線板の製造方法において、銅又は銅
合金の表面に金属水酸化物皮膜を形成した後に、ポリイ
ミド樹脂を形成するようにしたことを特徴とする配線板
の製造方法。(1) In a method for manufacturing wiring boards in which copper or copper alloy is used as an electrical conductor and polyimide resin is used as electrical insulator, a metal hydroxide film is formed on the surface of copper or copper alloy, and then polyimide resin is formed. A method for manufacturing a wiring board, characterized in that:
電気絶縁体とする配線板の製造方法において、銅又は銅
合金を電解液中に浸漬し、対極に対して電界を印加して
、銅又は銅合金の表面に改質皮膜を形成した後に、ポリ
イミド樹脂を形成するようにしたことを特徴とする配線
板の製造方法。(2) In a method for manufacturing wiring boards using copper or copper alloy as an electrical conductor and polyimide resin as an electrical insulator, copper or copper alloy is immersed in an electrolytic solution and an electric field is applied to a counter electrode. Alternatively, a method for manufacturing a wiring board, characterized in that a modified film is formed on the surface of a copper alloy, and then a polyimide resin is formed.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1283690A JPH03217069A (en) | 1990-01-22 | 1990-01-22 | Manufacture of wiring board |
US07/572,245 US5175399A (en) | 1989-08-29 | 1990-08-27 | Wiring panel including wiring having a surface-reforming layer and method for producing the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1283690A JPH03217069A (en) | 1990-01-22 | 1990-01-22 | Manufacture of wiring board |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03217069A true JPH03217069A (en) | 1991-09-24 |
Family
ID=11816462
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1283690A Pending JPH03217069A (en) | 1989-08-29 | 1990-01-22 | Manufacture of wiring board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03217069A (en) |
-
1990
- 1990-01-22 JP JP1283690A patent/JPH03217069A/en active Pending
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