JPH03211849A - Device for mounting flip chip - Google Patents

Device for mounting flip chip

Info

Publication number
JPH03211849A
JPH03211849A JP803290A JP803290A JPH03211849A JP H03211849 A JPH03211849 A JP H03211849A JP 803290 A JP803290 A JP 803290A JP 803290 A JP803290 A JP 803290A JP H03211849 A JPH03211849 A JP H03211849A
Authority
JP
Japan
Prior art keywords
flip chip
chip
board
wiring board
pressurizing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP803290A
Other languages
Japanese (ja)
Other versions
JP2513052B2 (en
Inventor
Harutaka Taniguchi
谷口 春隆
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP803290A priority Critical patent/JP2513052B2/en
Publication of JPH03211849A publication Critical patent/JPH03211849A/en
Application granted granted Critical
Publication of JP2513052B2 publication Critical patent/JP2513052B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To accurately position a flip chip to a wiring board so as to bring them into uniform contact with each other by positioning the flip chip by means of a position adjusting means and fixedly connecting a bump electrode with a wiring conductor in a state where a pressing means is made to make second-stage operations. CONSTITUTION:A means which makes first-stage operations and second-stage operations which are smaller in moving quantity than the first-stage operations is used as the pressing means 10 of this device. The means 10 is made to make the first stage operations and positional deviation of a flip chip 1 to a wiring board 3 or the relative positional deviation between the chip 1 and board 3 are detected by means of an optical means 40 through the transparent board receiving base 31 of a board holding mechanism 30 in a state immediately before mounting the chip 1 on the board 3 where the chip 1 held by the front end face of the pressing rod 21 of a chip pressing mechanism 20 is brought nearer to the board 3 held on the transparent base 31. A position adjusting means 50 adjusts the relative position between the mechanisms 20 and 30 on the basis of the accurate detected results and makes the pressing means 10 to make the second-stage operations in such state so as to bring the bump electrode of the chip 1 into contact with the wiring conductor 5 of the board 3. Therefore, uniformity of the contact and positioning accuracy between the flip chip 1 and wiring board 3 can be improved even when many connecting points exist.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は集積回路装置用のバンプ電極を備えるフリップ
チップを配線基板に実装するための装置であって、とく
に多数個の微細なバンプ電極がごく狭い配列ピッチで設
けられるフリップチップの実装に適する装置に関する。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to an apparatus for mounting a flip chip equipped with bump electrodes for an integrated circuit device on a wiring board, and in particular a device for mounting a flip chip equipped with bump electrodes for an integrated circuit device. The present invention relates to a device suitable for mounting flip chips provided at a very narrow arrangement pitch.

〔従来の技術〕[Conventional technology]

表示パネルやプリンタを駆動する集積回路装置では、で
きるだけ小さなチップサイズで画素や印字素子である負
荷をできるだけ多数個駆動できることが要求され、かつ
負荷ごとに接続が必要になるので、数−角の小形チップ
に数百側の接続点を配列しなければならない、かかる多
端子の集積回路装置では、従来からのワイヤボンディン
グ用の接続パッドは狭いピッチで配列するのが困難でか
つ接続作業が非常に厄介になるので、外部接続点として
金やはんだのバンプ電極を用いるフリップチップとする
のが、チップの製作面とその実装面から見て非常に有利
になる。
Integrated circuit devices that drive display panels and printers are required to be able to drive as many loads, such as pixels and printing elements, with as small a chip size as possible, and since a connection is required for each load, it is necessary to use a small chip size of several squares. In such multi-terminal integrated circuit devices, in which hundreds of connection points must be arranged on a chip, conventional connection pads for wire bonding are difficult to arrange at a narrow pitch and the connection work is extremely troublesome. Therefore, it is very advantageous to use a flip chip that uses gold or solder bump electrodes as external connection points from the viewpoint of chip production and mounting.

かかる多端子のフリップチップに通する実装の要領を第
3図を参照して概要説明する。
The procedure for mounting such a multi-terminal flip chip will be briefly explained with reference to FIG.

第3図(alはバンプ電極がはんだの場合で、このバン
プ1ii12aを多数個備えるフリップチップ1を絶縁
基Fi11に配線導体5が配列された配!Ill基板3
上に実装するには、はんだの溶融温度に加熱された配線
基Fi、3にフリップチップ1を軽く押し付けることに
よりはんだバンプ電i2aを対応する配線導体5に接触
させて溶融させた後に、押し付は力を取り除くことによ
り、溶融はんだの表面張力を利用してチップlを配線基
板3と自己整合させた状態で冷却してはんだを固化させ
る。
FIG. 3 (Al shows the case where the bump electrodes are solder, and the flip chip 1 having a large number of bumps 1ii12a is mounted on an insulating base Fi11 with wiring conductors 5 arranged on it!Ill board 3
To mount the solder bumps on the wiring board Fi, 3 heated to the melting temperature of the solder, lightly press the flip chip 1 to bring the solder bumps I2a into contact with the corresponding wiring conductors 5 and melt them. By removing the force, the chip l is cooled in a self-aligned state with the wiring board 3 using the surface tension of the molten solder, and the solder is solidified.

第3図〜ンはバンプ電極が金や銅の場合で、まず配線基
板3上に樹脂6を1jIi量付けて置いた後に、フリッ
プチップ1をこれに強く押し付けて金等のバンプ電極2
bを配線導体5によく導電接触させた状態で樹脂6を光
硬化ないしは熱硬化させることにより、樹脂6の硬化時
の収縮力と接着力を利用して導電接触状態を維持させる
とともに、接触部を樹脂封止によって保護する。
Figures 3 to 3 show the case where the bump electrodes are made of gold or copper. First, 1jIi amount of resin 6 is placed on the wiring board 3, and then the flip chip 1 is strongly pressed against it and the bump electrodes 2 are made of gold or the like.
By photo-curing or thermally curing the resin 6 with b in good conductive contact with the wiring conductor 5, the conductive contact state is maintained using the shrinkage force and adhesive force of the resin 6 during curing, and the contact portion protected by resin sealing.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかし上述の従来の方法では、フリソブチ、7ブの接続
点数を増やし、これに応じてバンプ電極の配列ピッチを
狭めようとすると、接続の均一性を保証するのがむつか
しく、かつ実装時のチップの位置合わせが困難になって
来る。
However, with the above-mentioned conventional method, when trying to increase the number of connection points for Frisobuttons and 7-buttons and narrow the arrangement pitch of bump electrodes accordingly, it is difficult to guarantee the uniformity of the connections, and Positioning becomes difficult.

フリップチップのバンプ電極数が画側程度を越えるとバ
ンプの高さのばらつきの最大幅が大きくなるので、実装
の際にはかなりの圧力でフリップチップを配線基板に押
し付けて高さの大なバンプ電極を変形させることにより
配線導体との接触を均一化させるが、それでもフリップ
チップの反りや配線Mlの凹凸の影響が重なると、高さ
の小なバンプ電極では配線導体との接触が不完全になり
やすい、バンプ電極がはんだの場合はその溶融時にかか
る不均一性はかなり軽減されるが、バンプ電極が金等の
場合は接触圧力の不均一がそのまま接続の不完全として
最後まで残ってしまうので、極端な場合にはバンプ電極
が配線導体と全く接続されない接続不良が発生する。
When the number of bump electrodes on a flip chip exceeds the image side, the maximum variation in bump height increases, so during mounting, the flip chip is pressed against the wiring board with considerable pressure to avoid bumps with large heights. By deforming the electrode, the contact with the wiring conductor is made uniform, but even so, when the warpage of the flip chip and the unevenness of the wiring Ml are combined, the contact with the wiring conductor is incomplete with a bump electrode of small height. If the bump electrode is made of solder, the unevenness that occurs during melting will be considerably reduced, but if the bump electrode is made of gold, etc., the unevenness of the contact pressure will remain until the end as an incomplete connection. In extreme cases, a connection failure occurs in which the bump electrode is not connected to the wiring conductor at all.

バンプ電極数が多くなるとその配列ピッチがこれに応じ
て狭くなり、配列インナが5on以下になると実装時の
ソリツブチップの配線基板との位置ずれを10n程度以
下に抑える必要がある。従来がらこの位置合わせはソリ
ツブチップの外形を配線基板上のマークに合わせること
によって行なうのがふつうであるが、ずれを確実に10
n以下にするのは必ずしも容易でない、はんだバンプ電
極の場合は位置ずれがあると溶融はんだが流れて接続点
間の短絡が発生しやすく、上述の自己整合による位置合
わせを利用してもバンプ電極の配列ピッチを40n以下
にするのは困難である。金バンプ電極の場合は短絡の問
題はないが、位置ずれによって接続の不均一性が当然増
大する。
As the number of bump electrodes increases, the arrangement pitch becomes narrower accordingly, and when the inner arrangement becomes 5 on or less, it is necessary to suppress the positional deviation between the solid chip and the wiring board during mounting to about 10 nm or less. Conventionally, this positioning was usually done by aligning the outer shape of the solid chip with the mark on the wiring board, but it was necessary to ensure that the misalignment was
In the case of solder bump electrodes, it is not always easy to make the alignment smaller than n.If there is a misalignment in the solder bump electrode, molten solder flows and short circuits between the connection points are likely to occur. It is difficult to reduce the arrangement pitch to 40n or less. In the case of gold bump electrodes, there is no short circuit problem, but misalignment naturally increases the non-uniformity of the connection.

なお、バンプ電極の配列ピッチが狭い場合いわゆるTA
B法ないしインナーリードボンディング法も利用できる
が、リードとそのためのスペースが余分に必要になるの
で、第3図のようにフリップチップを直接フェースダウ
ンボンディングするのがやはり最も有利である。
In addition, when the arrangement pitch of bump electrodes is narrow, so-called TA
Method B or inner lead bonding can also be used, but since additional leads and space are required, direct face-down bonding of the flip chip as shown in FIG. 3 is still most advantageous.

本発明の目的は、かかる問題点を解決して接続点が多い
場合にも接続の均一性と位置合わせ精度を同上できる実
装装!を提供することにある。
The object of the present invention is to provide a mounting device that solves these problems and achieves uniformity of connection and alignment accuracy even when there are many connection points. Our goal is to provide the following.

〔課題を解決するための手段〕[Means to solve the problem]

本発明によれば、第1段動作と第2段動作を行なう加圧
手段と、これにより加圧方向以外には移動自在に操作さ
れる加圧ロッドとその先端面へのフリップチップの保持
手段を備えるチップ加圧機構と、透明な基板受台と配線
基板の保持手段を備える基板保持機構と、基板受台を通
してフリップチップと配線基板の位置を検出する光学手
段と、チップ加圧機構と基板保持機構の相対位置を調整
する位置調整手段とを実装装置に設け、フリップチップ
を加圧ロッドの先端面に配線基板を基板受台上にそれぞ
れ保持させかつ加圧手段を第1段動作させ両者を近接さ
せた状態で光学手段により両者の位置を検出しながら位
置調整手段により位置合わせし、次に加圧手段を第2段
動作させた状態でバンプ電極を配線導体と固定接続する
ことにより上述の目的が達成される。
According to the present invention, there is provided a pressurizing means for performing a first-stage operation and a second-stage operation, a pressurizing rod that is movably operated in directions other than the pressurizing direction, and a means for holding a flip chip on its tip surface. a chip pressing mechanism comprising a transparent board holder and a wiring board holding means; an optical means for detecting the position of the flip chip and the wiring board through the board holder; a chip pressing mechanism and a board holding mechanism; The mounting apparatus is provided with a position adjustment means for adjusting the relative position of the holding mechanism, and the flip chip is held on the tip end surface of the pressure rod and the wiring board is held on the board holder, respectively, and the pressure means is operated in the first stage to hold both the flip chips. The positions of the two are detected by optical means while the two are brought close to each other, and the position adjusting means is used to align the two, and then the bump electrode is fixedly connected to the wiring conductor while the pressing means is operated in the second stage. objectives are achieved.

なお、加圧手段に上記構成にいう第工段動作とそれより
移動量の小な第2段動作を行なわせるには、1段目のシ
リンダとそれよりストロークの小な2段目のシリンダを
組み合わせた空気圧ないし油圧操作の二重シリンダ機構
を用いるのが有利であり、と(に2段目のシリンダには
圧力調整弁等により操作圧力を所定速度で上昇させた後
に所定値に保つ制御を施すのが望ましい。
In addition, in order to cause the pressurizing means to perform the first stage operation in the above configuration and the second stage operation with a smaller movement amount, the first stage cylinder and the second stage cylinder with a smaller stroke are combined. It is advantageous to use a pneumatically or hydraulically operated double cylinder mechanism, in which the second stage cylinder is controlled by a pressure regulating valve or the like to increase the operating pressure at a predetermined rate and then maintain it at a predetermined value. is desirable.

この加圧手段とチップ加圧機構の間の加圧方向以外に移
動自在な結合には、例えば鋼球を用いる自在結合とする
のが最も簡単である。チップ加圧機構の加圧ロッドの先
端の面積はフリップチップの面積以上にするのがよいが
、この先端面は焼き入れや高硬度金属ないし超硬合金の
取り付は等により硬度を高めて宜くのが接続の均一性を
長期間に亘って維持する上で望ましい。
The easiest way to connect the pressurizing means and the chip pressurizing mechanism so that they can move in a direction other than the pressurizing direction is to use a flexible connection using, for example, a steel ball. The area of the tip of the pressurizing rod of the chip pressurizing mechanism should be larger than the area of the flip chip, but this tip should be hardened by hardening or attaching high-hardness metal or cemented carbide. It is desirable to maintain uniformity of connection over a long period of time.

チップ加圧機構のフリップチップ保持手段および基板保
持機構の配線基板保持手段としては、例えば真空吸着法
を利用するのが簡単でありしがも実用性が高い。
As the flip chip holding means of the chip pressurizing mechanism and the wiring board holding means of the substrate holding mechanism, it is simple and highly practical to use, for example, a vacuum suction method.

本発明では上記構成にいうよう基板保持機構の基板受台
に透明なものが用いられるが、フリップチップのバンプ
電極が金等であってその実装時に紫外線硬化樹脂が利用
される場合には、この基板受台に紫外線透過率の高い石
英ガラスを用いるのが有利である。
In the present invention, a transparent substrate is used for the substrate holder of the substrate holding mechanism as described in the above structure, but if the bump electrode of the flip chip is made of gold or the like and an ultraviolet curing resin is used during the mounting, this It is advantageous to use quartz glass with high ultraviolet transmittance for the substrate holder.

光学手段には焦点深度の深い実体顕微鏡を用いるのが好
適で、ビデオカメラやモニタテレビ等をこれに組み合わ
せるのが実装作業の能率を上げる上で有利であり、さら
にはパターン認識装置をも利用することにより実装工程
の完全自動化を図ることができる。
It is preferable to use a stereomicroscope with a deep depth of focus as the optical means, and it is advantageous to combine it with a video camera, monitor TV, etc. in order to increase the efficiency of the mounting work, and it is also possible to use a pattern recognition device. This makes it possible to fully automate the mounting process.

位置調整手段には、通例のようにx−y操作機や角度操
作機を適宜組み合わせて利用することができ、これをチ
ップ加圧機構および基板保持機構の一方側に設けて両者
間の相対位置を調整させることでよい。
As the position adjustment means, an appropriate combination of an x-y operation device or an angle operation device can be used as usual, and by providing this on one side of the chip pressure mechanism and the substrate holding mechanism, the relative position between the two can be adjusted. It is possible to adjust the

なお、本発明のフリップチップ用実装装置は、はんだ、
金、銅等のバンプ電極を備えるフリップチップの実装一
般に適用できる。
Note that the flip chip mounting device of the present invention uses solder,
It can be applied to general mounting of flip chips equipped with bump electrodes of gold, copper, etc.

〔作用〕[Effect]

前項の構成にいうように本発明によるフリップチップ用
実装装!では、加圧手段に第1段動作とそれより移動量
の小な第2段動作をするものを用い、この加圧手段にま
ず第1段動作をさせて、これにより操作されるチップ加
圧機構の加圧ロッドの先端面に保持したフリップチップ
を基板保持機構の透明な基板受台上に保持した配線基板
に近接させたいわば実装寸前の状態で、透明な基板受台
を通して光学手段によってフリップチップと配線基板の
位!ないし相対的な位置ずれを正確に検出できるように
する。
As described in the configuration in the previous section, the flip chip mounting device according to the present invention! Here, we use a pressurizing means that performs a first-stage operation and a second-stage operation with a smaller amount of movement, and first causes the pressurizing means to perform the first-stage operation, thereby controlling the chip pressure. The flip chip held on the tip of the pressure rod of the mechanism is brought close to the wiring board held on the transparent board holder of the board holding mechanism, and the flip chip is flipped by optical means through the transparent board holder in a state on the verge of mounting. The level of chips and wiring boards! To enable accurate detection of relative positional deviations.

位置調整手段はこの正確な検出結果に基づいてチップ加
圧機構と基板保持機構の相対位置を調整するもので、本
発明ではフリップチップと配線基板の間のずれが最大で
も10n以下になるように、これによって両者が精密に
位置合わせされ、そのままの状態で加圧手段を第2段動
作させることによりフリップチップのバンプ電極を配線
基板の配線導体に接触させる。
The position adjusting means adjusts the relative position of the chip pressing mechanism and the substrate holding mechanism based on this accurate detection result, and in the present invention, the displacement between the flip chip and the wiring board is 10n or less at the maximum. As a result, the two are precisely aligned, and by operating the pressurizing means in the second stage in this state, the bump electrodes of the flip chip are brought into contact with the wiring conductors of the wiring board.

この際、フリップチップを保持しているチップ加圧機構
の加圧ロッドがこの加圧手段によってその加圧方向以外
には移動自在に操作されるので、加圧手段が第2段動作
時に加圧方向に対し横方向に多少動いても、加圧ロッド
はこれに影響されることなくフリップチップのバンプ電
極を上述の精密に位置合わせされた状態のまま配線基板
の配線導体に接触させ、かついわゆる片押しを発生する
ことなくフリップチップ内のバンプ電極を均一な圧力で
配線導体に押し付けることができる。
At this time, the pressurizing rod of the chip pressurizing mechanism that holds the flip chip is operated by this pressurizing means to be movable in directions other than the pressurizing direction, so that the pressurizing means applies pressure during the second stage operation. Even if there is some movement in the lateral direction, the pressurizing rod is not affected by this movement and keeps the bump electrodes of the flip chip in contact with the wiring conductors of the wiring board in the above-mentioned precisely aligned state, and the so-called The bump electrode inside the flip chip can be pressed against the wiring conductor with uniform pressure without causing one-sided pressing.

かかる押圧状態では、配線基板の実装面が多少端いてい
ても、それにフリップチップを押し付ける加圧ロッドは
それに応じた姿勢をとることができる0本発明装置では
配線基板に対するフリップチップの1頃きをチップサイ
ズがLowのときに数n以内に抑えることができ、従っ
てフリップチップの片押しは実際上ないといってよい、
なお、この押圧状態ではフリップチップ中の高さの大な
バンプ電極を例えば最大20%程度変形させることによ
りバンプ電極の高さが揃えられる。
In such a pressing state, even if the mounting surface of the wiring board is slightly edged, the pressure rod that presses the flip chip onto it can take a corresponding posture. When the chip size is low, it can be suppressed to within a few n, so it can be said that there is virtually no one-sided push of the flip chip.
Note that in this pressed state, the heights of the bump electrodes can be made uniform by deforming the large bump electrodes in the flip chip by, for example, about 20% at most.

この加圧手段を第2段動作させた状態でバンプ電極と配
線導体を固定接続する要領はバンプ電極の種類により異
なり、金バンプの場合は加圧状態のままで樹脂が光硬化
ないし熱硬化され、はんだバンプの場合は押圧状態を一
旦釈放して溶融はんだによりフリップチップと配線基板
を前述のように自己整合させた上で、望ましくはもう一
度押圧した状態で冷却によりはんだを固化させる。
The procedure for fixedly connecting the bump electrode and the wiring conductor with this pressurizing means in the second stage operation varies depending on the type of bump electrode, and in the case of gold bumps, the resin is photo-cured or heat-cured while the pressure is applied. In the case of solder bumps, the pressed state is once released, the flip chip and the wiring board are self-aligned as described above using molten solder, and then the solder is preferably solidified by cooling while being pressed again.

〔実施例) 以下、図を参照しながら本発明の実施例を具体的に説明
する。第1図は本発明のフリップチップ用実装装置の要
部の構成例を主な動作状態ごとに示すもので、同図(a
)にフリップチップと配線基板を各所定個所に保持させ
る時の、同図(b)には加圧手段の第1段動作時の、同
図(C)には第2段動作時の状態がそれぞれ示されてい
る。以下、この実施例では、フリップチヮブエは金のバ
ンプ電極2を備え、その配&l!基板3への実装には紫
外線硬化形樹脂6が利用され、配線基板3には透明なガ
ラスの絶縁基板4が用いられるものとする。
[Example] Hereinafter, an example of the present invention will be specifically described with reference to the drawings. FIG. 1 shows an example of the configuration of the main parts of the flip-chip mounting apparatus of the present invention for each main operating state.
) to hold the flip chip and the wiring board in their respective predetermined positions, the same figure (b) shows the state of the pressurizing means during the first stage operation, and the same figure (C) shows the state during the second stage operation. shown respectively. Hereinafter, in this embodiment, the flip chip is equipped with a gold bump electrode 2, and its arrangement &l! It is assumed that an ultraviolet curing resin 6 is used for mounting on the substrate 3, and a transparent glass insulating substrate 4 is used for the wiring board 3.

第1図(a)の上部に簡略に示された加圧手段10はこ
の実施例では空気圧ないし油圧操作される2段のシリン
ダ機構からなるが、この図では便宜上そのごく一部の操
作ロッドにより代表して示されている。その下側に示さ
れたチップ加圧機構20の加圧ロッド21は図で簡略に
示された位置調整手段50により図の上下方向に移動自
在に案内され、かつ図示しないばね等の手段によりその
上端面の凹み内の鋼球22が加圧機構10の操作ロッド
の下端面に常に接触するよう付勢されており、加圧機構
10からは図の下方に向かう加圧方向のみに力を受ける
ようになっている。加圧ロッド21のこの例では下側先
端面21aがフリップチップlに対する押圧面と保持面
を兼ねており、保持手段としてその中央部に真空ポンプ
に接続された吸着孔23を備える。
In this embodiment, the pressurizing means 10 shown schematically in the upper part of FIG. Shown as a representative. The pressurizing rod 21 of the chip pressurizing mechanism 20 shown below is guided so as to be movable in the vertical direction of the figure by a position adjustment means 50 shown simply in the figure, and is guided by means such as a spring (not shown). The steel ball 22 in the recess on the upper end surface is biased so as to always contact the lower end surface of the operating rod of the pressure mechanism 10, and receives force from the pressure mechanism 10 only in the downward pressure direction in the figure. It looks like this. In this example of the pressure rod 21, the lower end surface 21a serves as both a pressing surface and a holding surface for the flip chip l, and a suction hole 23 connected to a vacuum pump is provided in the center as a holding means.

また、この押圧用の先端面21aには長期使用中にフリ
ップチップ1による凹みが発生しないようにこの実施例
では焼き入れ処理が施される。なお、上述の位置調整手
段50には例えばXとyとθ方向に対する位置操作機が
用いられる。
Furthermore, in this embodiment, the pressing end surface 21a is hardened to prevent dents from occurring due to the flip chip 1 during long-term use. Note that the above-mentioned position adjusting means 50 uses, for example, position operating devices for the X, y, and θ directions.

第1図(alの下部に示された基板保持機構30は、こ
の例では石英ガラスである透明な基板受台31を支持F
i32の上面の凹所32aにごく僅か突出するよう嵌め
込んだもので、基板受台31上に配線基板3を保持する
ためその周囲に吸着孔33が複数個配線され、支持板3
2の基板受台31の下側は開口とされてその錐状面が鏡
面32bに仕上げられる。
The substrate holding mechanism 30 shown at the bottom of FIG.
It is fitted into the recess 32a on the top surface of the i32 so as to protrude very slightly.A plurality of suction holes 33 are wired around the support plate 3 to hold the wiring board 3 on the board holder 31.
The lower side of the second board holder 31 is an opening, and its conical surface is finished into a mirror surface 32b.

第1図(a)の中央部にはアーム84により支承された
装入ヘッド85が示されている。このヘッド85はフリ
ップチップ1をその上面に装着されたテフロン等の受座
86の上に置き、かつ配線基板3をその下面に吸着孔8
8により真空吸着した状態で図示の位置に装入される0
次に、ヘッド85の位置を基板受台31に近付けた上で
吸着孔88からの吸引を切ることにより、配線1[3を
基板受台3I上に移して吸着保持させ、かつその位!を
加圧ロッド21に近付けた上で噴出孔87から圧搾空気
を噴出させることにより、フリップチップlを受座86
から浮かせて加圧ロッド21の先端面21aに移し、そ
れに吸着保持させるようになっている。
A charging head 85 supported by an arm 84 is shown in the center of FIG. 1(a). This head 85 places the flip chip 1 on a seat 86 made of Teflon or the like mounted on its upper surface, and holds the wiring board 3 with suction holes 8 on its lower surface.
0 is loaded into the position shown in the figure while being vacuum-adsorbed by 8.
Next, by moving the head 85 closer to the board holder 31 and cutting off the suction from the suction hole 88, the wiring 1[3 is moved onto the board holder 3I and held there by suction, and that's about it! By bringing the flip chip l close to the pressurizing rod 21 and blowing out compressed air from the blowing hole 87, the flip chip l is moved to the seat 86.
It is floated and transferred to the tip end surface 21a of the pressure rod 21, where it is held by suction.

第1図(ロ)は加圧手段10を第1段動作させた吠庸を
示す、上述のように、フリップチップlを加圧ロッド2
1の先端面21aに配線基板3を基板受台31にそれぞ
れ保持させた後、ヘッド85を第1図(a)の状態から
例えば図の左方に引き込め、かつ微量の樹脂6をこの例
では配線基板3の表面上に滴下した上で、加圧手段10
を第1段動作させて図の状態とすることによりフリシブ
チップlを配線基[3に近接させる。この際、バンプ電
極2の先端と配線導体5との間隙が充分小さく例えば0
.5m程度になるように、加圧手段10の第1段動作の
行程が設定される。
FIG. 1(b) shows the operation of the pressurizing means 10 in the first stage.As mentioned above, the flip chip l is moved to the pressurizing rod 2
After the wiring board 3 is held on the board holder 31 by the front end surface 21a of the head 85, the head 85 is retracted from the state shown in FIG. Now, after dropping it on the surface of the wiring board 3, pressurizing means 10
By performing the first stage operation to achieve the state shown in the figure, the freesive chip 1 is brought close to the wiring base [3]. At this time, the gap between the tip of the bump electrode 2 and the wiring conductor 5 is sufficiently small, for example, 0.
.. The stroke of the first stage operation of the pressurizing means 10 is set so that the distance is about 5 m.

この例では配線基板3の絶縁基板4が透明なので基板受
台31を通して配線基板3のばかフリップチップLを見
ることができ、それらの位置検出に図では簡略に示され
た光学手段40が用いられる。
In this example, since the insulating substrate 4 of the wiring board 3 is transparent, the flip chips L of the wiring board 3 can be seen through the board holder 31, and an optical means 40, which is simply shown in the figure, is used to detect their positions. .

この光学手段40には実体顕微鏡が好適で、これにビデ
オカメラを組み合わせることにより、モニタテレビ上に
配線基板3とフリップチップ1の映像が重なった拡大画
像を写すことができる。
A stereoscopic microscope is suitable for this optical means 40, and by combining this with a video camera, an enlarged image in which images of the wiring board 3 and the flip chip 1 are superimposed can be displayed on a monitor television.

従って、この実施例ではこの拡大画像を見ながら位置調
整手段50により加圧ロッド21の位置を調整して、例
えば各バンプ電極2の映像を対応する配線導体5の先端
の映像と重ね合わせることにより、フリップチップlを
配線基板3と相互ずれが数μ程度になるように精密に位
置合わせできる。
Therefore, in this embodiment, the position of the pressure rod 21 is adjusted by the position adjustment means 50 while viewing this enlarged image, and, for example, the image of each bump electrode 2 is superimposed on the image of the tip of the corresponding wiring conductor 5. , the flip chip l can be precisely aligned with the wiring board 3 so that the mutual displacement is on the order of several microns.

なお、位置調整手段50としては例えばXステージとy
ステージとθステージを組み合わせた3方向の位置操作
機が用いられる。
Note that the position adjustment means 50 includes, for example, an X stage and a y stage.
A three-direction position manipulator that combines a stage and a θ stage is used.

第1図(C)は加圧手段10を第2段動作させた状態を
示す、この第2段動作は0,5■程度のごく僅かな行程
でよく、バンプ電極2の先端が配線導体5に当たってか
ら押圧力を漸次高めることにより、高さの大なバンプ電
極2を最大20%程度変形させて、すべてのバンプ電極
2を対応する配線導体5に接触させた後に、押圧力を一
定に保つ。かがる加圧手段10の押圧力制御は、例えば
第2段動作用のシリンダ機構への作動流体の供給路に、
通例のように圧力調整弁や絞りを挿入することによって
容易に行なうことができる。
FIG. 1(C) shows a state in which the pressurizing means 10 is operated in the second stage. By gradually increasing the pressing force after contact, the large bump electrodes 2 are deformed by up to 20%, and after all the bump electrodes 2 are brought into contact with the corresponding wiring conductors 5, the pressing force is kept constant. . The pressing force of the pressurizing means 10 can be controlled by, for example, supplying working fluid to the cylinder mechanism for second-stage operation.
This can be easily done by inserting a pressure regulating valve or throttle as usual.

この際、加圧ロッド21は鋼球22を介して加圧手段1
0から押圧力をその加圧方向にのみ受け、かつ第2段動
作の行程がごく僅かなので、第1図(blの状態で精密
に位置合わせされた状態のままバンプ電極2を配線導体
5に接触させることができる。
At this time, the pressure rod 21 is inserted into the pressure means 1 via the steel ball 22.
Since the pressing force is applied only in the pressing direction from 0, and the stroke of the second stage operation is very small, the bump electrode 2 can be attached to the wiring conductor 5 while being precisely aligned in the state shown in Figure 1 (bl). can be brought into contact.

また、この接触後の押圧状態では、配線基板3が多少鋼
いていても加圧ロッド21はそれに応じた姿勢でフリッ
プチップlを配線基板3に押し付けるので、両者間の傾
きを最小に抑えて片押し不良の発生をほぼ皆無にするこ
とができる。
In addition, in this pressed state after contact, even if the wiring board 3 is somewhat stiff, the pressurizing rod 21 presses the flip chip l against the wiring board 3 in a corresponding posture, so that the tilt between the two is minimized and the pressure rod 21 is pressed against the wiring board 3. The occurrence of pressing defects can be almost completely eliminated.

このようにバンプ電極2を対応する配線導体5に均一に
押圧した状態で、この例では図の下部に簡略に示された
光投射手段70の例えば光フアイバ先端の投射ヘッドか
ら、透明な基板受台31と絶縁基Vi4とを通して樹脂
6に紫外線を短時間当て、それを紫外線硬化させること
により実装を完了させる。以後は、第1図(a)の装入
へラド85と同様に構成された装出ヘッドにより、フリ
ップチップ1を実装済みの配線基板3を真空吸着等の手
段により基板受台31上から取り出せばよい。
With the bump electrodes 2 uniformly pressed against the corresponding wiring conductors 5 in this way, a transparent substrate receiver is emitted from the projection head, for example, the tip of an optical fiber, of the light projection means 70 shown briefly in the lower part of the figure in this example. The resin 6 is exposed to ultraviolet rays for a short time through the stand 31 and the insulating base Vi4, and the resin 6 is cured by ultraviolet rays, thereby completing the mounting. Thereafter, the wiring board 3 on which the flip chip 1 has been mounted is taken out from the board holder 31 by means such as vacuum suction using a loading head configured similarly to the loading head 85 shown in FIG. 1(a). Bye.

なお、基板受台31が石英ガラスで配線基板3の絶縁基
板4がパイレックスの場合、365naの波長の紫外線
に対し80%程度以上の透過率が得られ、樹脂6に対し
て250〜3001+111/ cjの強度で紫外線を
照射することができる。この際、基板受台31の下側の
支持板32の鏡面32bは散乱紫外線を有効に利用する
役目を果たす。
In addition, when the board holder 31 is quartz glass and the insulating substrate 4 of the wiring board 3 is made of Pyrex, a transmittance of about 80% or more is obtained for ultraviolet rays with a wavelength of 365 na, and the transmittance is 250 to 3001 + 111/cj to the resin 6. It is possible to irradiate ultraviolet rays with an intensity of . At this time, the mirror surface 32b of the support plate 32 below the substrate holder 31 serves to effectively utilize the scattered ultraviolet rays.

第2図は、第1図では要部のみが示されていた本発明装
置の全体構成を例示するもので、同図(a)にその正面
図、同図(b)に一部の上面図1同図(C)に側面図が
それぞれ示されている。
FIG. 2 illustrates the overall configuration of the device of the present invention, of which only the main parts were shown in FIG. 1. FIG. 2(a) is a front view thereof, and FIG. 1 A side view is shown in FIG. 1 (C).

第2図(a)の上部の中央には第1図で説明した要部が
示されている。加圧手段IOは直列に結合された第1段
シリンダ機構11と第2段シリンダ機構12とからなり
、これらのストロークは例えば前者が50鴎、後者が0
゜5■とされる。この加圧手段10は同図(C)のよう
に位置調整手段50の可動台51に位置操作機52とと
もに搭載され、位置操作4152により案内された加圧
ロッド21に前述の鋼球等を介して加圧力を賦与する。
The main parts explained in FIG. 1 are shown in the center of the upper part of FIG. 2(a). The pressurizing means IO consists of a first stage cylinder mechanism 11 and a second stage cylinder mechanism 12 connected in series, and the strokes of these are, for example, 50 strokes for the former and 0 strokes for the latter.
It is said to be ゜5■. This pressurizing means 10 is mounted together with a position operating device 52 on a movable base 51 of a position adjusting means 50 as shown in FIG. to apply pressure.

同図(C1のように、基板保持機構30の支持板32は
複数の脚を介して台枠等に強固に取り付けられ、その下
側に光学手段40が配線される。光学手段40実体顕微
鏡41は可動台42上の位置操作機43により位置制御
される支柱44に支承され、位置操作機43によりその
視野を微調整できる。実体顕微鏡41は倍率が数十程度
の同軸照明付きのものが好適で、これにビデオカメラが
組み合わされて、その視野が同図(萄のモニタテレビ4
5上の映像として表示される。このモニタテレビ45に
は、ビデオカメラと同様に400〜500本の水平解像
度のものを用いるのが適当である0位置操作機43用に
はXステージとyステージが組み合わされる。
As shown in the same figure (C1), the support plate 32 of the substrate holding mechanism 30 is firmly attached to a frame etc. via a plurality of legs, and the optical means 40 is wired under it.Optical means 40 Stereo microscope 41 is supported on a column 44 whose position is controlled by a position control device 43 on a movable table 42, and its field of view can be finely adjusted by the position control device 43.The stereo microscope 41 is preferably one with a coaxial illumination and a magnification of about several dozen. A video camera is combined with this, and its field of view is similar to that shown in the figure (Tape's Monitor TV 4).
5 is displayed as the image above. This monitor television 45 is combined with an X stage and a y stage for the zero position operating device 43, which is preferably one with a horizontal resolution of 400 to 500 lines, similar to a video camera.

同図(a)のモニタテレビ45の上側の樹脂供給系60
のデイスペンサ61は、前述の紫外線硬化形樹脂を0.
1■g程度の精度で微量ずつ供給可能なもので、可撓性
ホース62を介して位置操作機52に担持されたキャピ
ラリ状の樹脂供給用ノズル63と接続される。シリンダ
64は可動台51を介してこのノズル63を樹脂供給位
置に操作するものである。
Resin supply system 60 above the monitor television 45 in FIG.
The dispenser 61 dispenses the above-mentioned ultraviolet curable resin at 0.
It can be supplied in minute amounts with an accuracy of about 1 g, and is connected via a flexible hose 62 to a capillary-shaped resin supply nozzle 63 supported on the position operating device 52. The cylinder 64 operates the nozzle 63 via the movable base 51 to the resin supply position.

同図(alの右下部に示された光投射系70の紫外線1
1171で発生される紫外線光は、光ファイバ72を介
して実体顕微鏡41に担持された投射ヘッド73に送ら
れる。この光投射系70に対してもシリンダ74が設け
られ、可動台42を介して投射へラド73を投射位置に
操作できるようになっている。
The ultraviolet rays 1 of the light projection system 70 shown in the lower right of the same figure (al.
The ultraviolet light generated by 1171 is sent via optical fiber 72 to projection head 73 carried by stereomicroscope 41 . A cylinder 74 is also provided for this light projection system 70, so that the projection radar 73 can be operated to the projection position via the movable table 42.

フリップチップおよび配線基板を実装位置に装入する前
述の装入ヘッド85の操作用にロボッ)80が設けられ
る。このロボット80は、同図(b)に示すようにX方
向操作機81とy方向操作機82により、前述のアーム
84を介して装入ヘッド85を支承する操作ヘッド83
の位置をプログラム制御により操作するものである。な
お、操作ヘッド83内には前に第1図で説明したように
装入ヘッド85を加圧ロッド21の下端面21aまたは
基板受台31に近付けるようにアーム84を上下方向に
僅かずつ操作する簡単な機構が組み込まれる。
A robot 80 is provided for operating the aforementioned loading head 85 for loading flip chips and wiring boards into mounting positions. As shown in FIG. 8B, this robot 80 uses an X-direction manipulator 81 and a Y-direction manipulator 82 to operate a manipulating head 83 that supports a charging head 85 via the aforementioned arm 84.
The position of is operated by program control. As previously explained in FIG. 1, an arm 84 is inserted into the operation head 83 and is operated slightly in the vertical direction so as to bring the charging head 85 closer to the lower end surface 21a of the pressure rod 21 or the substrate holder 31. A simple mechanism is incorporated.

また、フリップチップや配線基板の吸着用に、真空ポン
プ91と駆動モータ92からなる真空系9oが本発明装
置に付属して設けられる。
Further, a vacuum system 9o consisting of a vacuum pump 91 and a drive motor 92 is attached to the apparatus of the present invention for suctioning flip chips and wiring boards.

このほか本発明装置内には、その各部の動作をシーケン
スfIiI!御するプログラム制御装置100 と、そ
の指令により装置内の各部を制御ないしは操作する操作
制御袋ztoiが組み込まれる。
In addition, the operation of each part in the device of the present invention is sequence fIiI! A program control device 100 that controls the device and an operation control bag ztoi that controls or operates various parts in the device according to instructions from the program control device 100 are incorporated.

このプログラム制御装置1000制御下で行なわれるフ
リップチップの実装手順例を順序を追って述べると次の
とおりである。
An example of a flip-chip mounting procedure performed under the control of this program control device 1000 will be described in sequence as follows.

(11まず装入ヘッド85を実装位置の外側の所定位置
に置いた状態で、フリップチップを図示しない設備ない
し手によってその上側に載せ、ついで装入ヘッド85を
ロボット80により第2図(a)に示すような適当な台
上に置かれた基板トレイ7の上に移動させて、その中に
並べられている配線基板を装入へラド85の下側に真空
吸着する。
(11) First, with the loading head 85 placed at a predetermined position outside the mounting position, the flip chip is placed on top of it by equipment (not shown) or by hand, and then the loading head 85 is moved by the robot 80 as shown in FIG. 2(a). The board tray 7 is placed on a suitable table as shown in FIG.

〔2〕ロボツト80により装入ヘッド85を第11ff
l(alの位置まで移動させ、かつそれを操作へラド8
3により上下方向に僅かずつ操作しながら、前に説明し
た要領に従ってフリップチップ1を加圧ロッド21の下
端面21aに、配線基板3を基板受台31上にそれぞれ
移して保持させる。
[2] The robot 80 moves the charging head 85 to the 11th ff.
l (Move to the al position and operate it with Rad8
3, move the flip chip 1 to the lower end surface 21a of the pressure rod 21 and the wiring board 3 onto the board holder 31 and hold them, respectively, while operating the flip chip 1 slightly in the up and down direction according to the procedure described above.

(3)装入ヘッド85をロボッ)80により当初の位!
に復帰させた後、シリンダ64を付勢してノズル63を
配線基Fi、3の上に移動させた上でデイスペンサ61
からあらかじめこれに設定された数−g程度の微量の樹
脂6を配線基板3上に滴下させる。
(3) Move the charging head 85 to the original position!
After returning to the position, the cylinder 64 is energized to move the nozzle 63 onto the wiring base Fi, 3, and then the dispenser 61
Then, a minute amount of resin 6 of about several grams set in advance is dropped onto the wiring board 3.

(4)加圧手段10を第1段動作させて第1図し)の状
態とし、前に説明したように実体顕微鏡41が捉えたモ
ニタテレビ45上の映像を見ながら位置操作852を用
いてフリップチップlを配線基板2とずれが10n以下
になるまで位置合わせする。
(4) Operate the pressurizing means 10 in the first stage to the state shown in FIG. The flip chip l is aligned with the wiring board 2 until the deviation is 10n or less.

(5〕加圧手段lOを第2段動作させて第1図(C)の
状態とし、バンプ電極2を配線導体5と均一に接触させ
た後、シリンダ74を付勢して光投射へラド73を投射
位置に置いた状態で紫外線源71からの紫外線を樹脂6
にふつうは数十秒間程度照射してそれを硬化させる。
(5) After operating the pressurizing means lO in the second stage to bring the state shown in FIG. 73 is placed at the projection position, the ultraviolet rays from the ultraviolet source 71 are applied to the resin 6.
Usually, it is irradiated for several tens of seconds to cure it.

(6)以上で実装が完了するので、フリップチップlが
実装された配線基板3を図示しない適宜な手段によって
実装位置から取り出し、以後は同じ動作を繰り返えす。
(6) Since the mounting is completed above, the wiring board 3 on which the flip chip l is mounted can be taken out from the mounting position by an appropriate means (not shown), and the same operation can be repeated thereafter.

なお、この実施例における上述の手順中で(4)の位置
合わせに人手が掛かるが、実体顕微鏡41が捉える映像
信号をパターン認識動作をする計算機に与え、それに位
置操作機52を制御させるようにすれば全手順を完全自
動化することができる。
Although the positioning in step (4) in the above-mentioned procedure in this embodiment requires human effort, the video signal captured by the stereomicroscope 41 is fed to a computer that performs a pattern recognition operation, and the position control device 52 is controlled by the computer. The entire procedure can be fully automated.

以上説明した本発明による実装装置により実装されたフ
リップチップは、配線基板との間に認め得る程度の傾き
がなく、実装前のチップに若干の反りがあってもバンプ
電極と配線導体の間の接触抵抗のばらつきが少なく、バ
ンプ電極数が100個以上の場合でも最大ばらつきは2
0%以下である。
The flip chip mounted by the mounting apparatus according to the present invention described above has no appreciable inclination between it and the wiring board, and even if the chip before mounting is slightly warped, the difference between the bump electrode and the wiring conductor is There is little variation in contact resistance, and the maximum variation is 2 even when the number of bump electrodes is 100 or more.
It is 0% or less.

また実装品の使用期間中にも、長期に亘りかかる接触の
均一性を保つことができる。
Furthermore, the uniformity of contact can be maintained over a long period of time while the mounted product is in use.

なお、かかる均一な接触ないし接続を保証するには、加
圧ロッドの下ra面や基板受台の面、とくに前者の平坦
度をサブミクロンの精度に維持する必要があり、従来は
装置の運転中にこの平坦度が次第に悪化しやすいなやみ
があったが、本発明による実装装置では長期間中かかる
押圧面の平坦度を維持することができる。
In order to guarantee such uniform contact or connection, it is necessary to maintain the flatness of the lower surface of the pressure rod and the surface of the substrate pedestal, especially the former, to submicron precision. However, the mounting apparatus according to the present invention can maintain the flatness of the pressing surface for a long period of time.

本発明によるフリップチップ用実装装置は、各サイズが
10〜50μ角、配列ピッチが20〜100nのバンプ
電極を100個以上備えるフリップチップの実装に適用
可能で、配線基板との位置合わせ精度は10n以下を、
それとの傾きは10閣角のチップに対して3n以下をそ
れぞれ保証できる。
The flip chip mounting apparatus according to the present invention is applicable to mounting flip chips that have 100 or more bump electrodes each having a size of 10 to 50 μ square and an arrangement pitch of 20 to 100 nm, and the alignment accuracy with the wiring board is 10 nm. The following,
The slope with that can be guaranteed to be 3n or less for a chip of 10 squares.

以上説明した実施例に限らず、本発明は種々の態様で実
施をすることができる。実施例ではバンプ電極を金とし
たが、銅やはんだのバンプ電極に対しても通用可能であ
る。また、配線基板の絶縁基板も必ずしも透明である必
要はなく、実装作業の手順等を適宜変更することにより
本発明をその要旨内で実施できる8本発明装置の第1図
の要部の構成や第2図の全体の具体構成はあくまで例示
であって、バンプ電極の種類や実装作業の自動化要求等
に合わせて、種々な実用上の構成や形態をこれに与える
ことができる。実装作業の具体的な手順や条件について
も同様であって、必要ないしは場合に応じて種々な変形
を加えないしは選択を行なうことができる。
The present invention is not limited to the embodiments described above, and the present invention can be implemented in various embodiments. In the embodiment, the bump electrodes are made of gold, but bump electrodes of copper or solder can also be used. Furthermore, the insulating substrate of the wiring board does not necessarily have to be transparent, and the present invention can be carried out within its gist by appropriately changing the steps of mounting work. The overall specific configuration shown in FIG. 2 is merely an example, and various practical configurations and forms can be given to it in accordance with the type of bump electrode, the demand for automation of mounting work, etc. The same applies to the specific procedures and conditions of the mounting work, and various modifications or selections can be made depending on necessity or circumstances.

〔発明の効果〕〔Effect of the invention〕

以上説明したとおり本発明では、フリップチップ用実装
装置に対して、第1段動作とこれより移動量の小な第2
段動作を行なう加圧手段と、これによって加圧方向以外
には移動自在に操作される加圧ロッドとその先端面への
フリップチップの保持手段とを備えるチップ加圧機構と
、透明な基板受台と配線基板の保持手段を備える基板保
持機構と、基板受台を通してフリ7ブチツプと配線基板
の位置を検出する光学手段と、チップ加圧機構と基板保
持機構の相対位置を調整する位置調整手段とを設け、フ
リップチップを加圧ロッドの先端面に配線基板を基板受
台上にそれぞれ保持させかつ加圧手段を第1段動作させ
両者を近接させた状態で光学手段により両者の位置を検
出しながら位置調整手段により位置合わせし、つぎに加
圧手段を第2段動作させた状態でバンプ電極を配線導体
と固定接続するようにすることにより、従来技術のもっ
ていた問題点を解決して、次の効果を奏することができ
る。
As explained above, in the present invention, for a flip-chip mounting apparatus, the first stage operation and the second stage operation with a smaller movement amount are provided.
A chip pressurizing mechanism includes a pressurizing means that performs a stepped operation, a pressurizing rod that is movably operated in directions other than the pressurizing direction, a means for holding a flip chip on its tip surface, and a transparent substrate holder. A board holding mechanism comprising a stand and a means for holding the wiring board; an optical means for detecting the position of the flip-chip and the wiring board through the board holder; and a position adjustment means for adjusting the relative position of the chip pressing mechanism and the board holding mechanism. A flip chip is mounted on the tip of the pressure rod to hold the wiring board on the board holder, and the pressure means is operated in the first stage to bring the two close together, and the position of both is detected by optical means. The problems of the prior art can be solved by aligning the bump electrodes with the wiring conductor while adjusting the position using the position adjusting means, and then operating the pressurizing means in the second stage to firmly connect the bump electrodes to the wiring conductors. , the following effects can be achieved.

(a)加圧手段にまず第1段動作をさせて、フリップチ
ップを配線基板に近接させた実装寸前の状態で透明な基
板受台を通して光学手段によりフリップチップと配線基
板の相対的な位置を検出し、これに基づいて位置調整手
段により両者を正確に位置合わせできる。
(a) First, the pressurizing means is operated in the first stage, and the relative position of the flip chip and the wiring board is measured by optical means through a transparent board holder in a state where the flip chip is brought close to the wiring board and is about to be mounted. Based on this detection, both can be accurately aligned by the position adjustment means.

(blこの位置合わせ後に加圧手段を第2段動作させて
フリップチップのバンプ電極を配線基板の配線導体に接
触させる際、フリップチップを保持する加圧ロッドが加
圧手段によって加圧方向以外には移動自在に操作され、
加圧手段が位置ずれを起こす方向に多少動いても加圧ロ
ッドはこの影響を受けず、しかも第2段動作の行程がご
くわずかなので、バンプ電極を精密に位置合わせされた
ままの状態で対応する配線導体に正確に接触させること
ができる。
(bl After this positioning, when the pressing means is operated in the second stage to bring the bump electrodes of the flip chip into contact with the wiring conductors of the wiring board, the pressing rod holding the flip chip is moved in a direction other than the pressing direction by the pressing means. is operated in a mobile manner,
Even if the pressurizing means moves slightly in a direction that causes misalignment, the pressurizing rod will not be affected by this, and the second stage movement is very short, so the bump electrode can be handled while remaining precisely aligned. It is possible to accurately contact the wiring conductor.

この(a)と(blの効果により、本発明ではフリップ
チップと配線基板の間のずれを最大でもLOn以下に、
さらに画像処理やパターン認識の技術を利用すれば5n
以下に抑えることができる。
Due to the effects of (a) and (bl), the present invention can reduce the misalignment between the flip chip and the wiring board to less than LOn at the maximum.
Furthermore, by using image processing and pattern recognition technology, 5n
It can be kept below.

(C)バンプ電極を配線導体に接触させた後に実装用の
押圧を掛ける際、フリップチップの反りゃ配線基板面の
傾き等の接続不均一の要因があっても、加圧ロッドが押
圧方向以外には移動自在でかがる要因に応じた姿勢でフ
リップチップを配線基板に押圧するので、いわゆる片押
し等の不都合の発生を有効に防止しながら多数個のバン
プ電極を配線導体に均一に固定接続できる。これにより
、配線基板に対するフリップチップの実装姿勢の傾きを
チップサイズが10m角のときも数n以内に抑え、n個
以上の金バンプ電極をもつフリップチップを樹脂接着力
を利用して実装する場合でも、バンプ電極と配線導体の
間の接触抵抗のばらつきを20%以内に抑え、実装品の
使用中この接触の均一性を長期に亘って保つことができ
る。
(C) When applying pressure for mounting after bringing the bump electrode into contact with the wiring conductor, even if there are causes of uneven connection such as warpage of the flip chip or inclination of the wiring board surface, the pressure rod may move in a direction other than the pressing direction. Since the flip chip is pressed against the wiring board in a freely movable and bent position according to the bending factor, a large number of bump electrodes are evenly fixed to the wiring conductor while effectively preventing problems such as so-called one-sided pressing. Can be connected. As a result, the tilt of the mounting posture of the flip chip with respect to the wiring board can be suppressed to within several nanometers even when the chip size is 10 m square, and when a flip chip with n or more gold bump electrodes is mounted using resin adhesive strength. However, the variation in contact resistance between the bump electrode and the wiring conductor can be suppressed to within 20%, and the uniformity of this contact can be maintained over a long period of time during use of the mounted product.

かかる本発明の特長は、数十μのサイズの小形バンプ電
極が狭いピッチで配列される多接続点のフリップチップ
の実装にとくに有用で、この種の集積回路装置のチップ
の小形化とその動作信鯨性の向上に貢献することができ
る。
These features of the present invention are particularly useful for mounting flip chips with multiple connection points in which small bump electrodes with a size of several tens of microns are arranged at a narrow pitch. This can contribute to improving trustworthiness.

【図面の簡単な説明】[Brief explanation of drawings]

図はすべて本発明に関し、第1図は本発明によるフリッ
プチップ用実装装置の要部の構成例を主な動作状態ごと
に示す断面図、第2図は本発明装置の全体構成を例示す
る正面図、一部の上面図。 および側面図、第3図は配線基板に対しフリップチップ
を実装する要領を示す側面図である。これらの図におい
て、 l:フリップチップ、2:バンプ電橿、2a:はんだバ
ンプ電橿、2b:金バンプ電橋、3:配線基板、4:絶
縁基板、5:配線導体、6:樹脂、7;基板トレイ、I
O:加圧手段、11第1段シリンダ機構、12:第2段
シリンダ機構、20:チップ加圧機構、21:加圧ロッ
ド、21a;加圧ロッドの先端面、22:鋼球、23:
フリップチップの保持手段としての吸着孔、30:基板
保持機構、31:基板受台、32:支持板、32a;凹
所、32b:鏡面、33:配線基板の保持手段としての
吸着孔、40:光学手段、41:実体顕微鏡、42:可
動台、43:位置操作機、44:支柱、45:モニタテ
レビ、50:位置調整手段、51:可動台、52:位置
調整機、60:樹脂供給系、61:デイスペンサ、62
:ホース、63:樹脂供給ノズル、64:ノズル位置操
作用シリンダ、70:光投射系、71:紫外線源、72
:光ファイバ、73:投射ヘッド、74:ヘッド位置操
作用シリンダ、80:ロボット、81:x方向操作機、
82:y方向操作機、83:操作ヘッド、84:アーム
、858装入ヘツド、86:フリップチップ用受座、8
7:空気噴出孔、88:吸着孔、90:真空系、91:
真空ポンプ、92:駆動モータ、100ニブログラム制
御装置、101:操作第 図 第 図
The figures all relate to the present invention; FIG. 1 is a sectional view showing an example of the configuration of the main parts of the flip-chip mounting device according to the present invention in each main operating state, and FIG. 2 is a front view illustrating the overall configuration of the device of the present invention. Figure, partial top view. FIG. 3 is a side view showing how to mount a flip chip on a wiring board. In these figures, l: flip chip, 2: bump electric bridge, 2a: solder bump electric bridge, 2b: gold bump electric bridge, 3: wiring board, 4: insulating substrate, 5: wiring conductor, 6: resin, 7 ;Substrate tray, I
O: Pressure means, 11 1st stage cylinder mechanism, 12: 2nd stage cylinder mechanism, 20: Chip pressure mechanism, 21: Pressure rod, 21a: Tip surface of pressure rod, 22: Steel ball, 23:
Suction hole as holding means for flip chip, 30: Board holding mechanism, 31: Board holder, 32: Support plate, 32a; Recess, 32b: Mirror surface, 33: Suction hole as holding means for wiring board, 40: Optical means, 41: Stereo microscope, 42: Movable base, 43: Position operation device, 44: Support column, 45: Monitor TV, 50: Position adjustment means, 51: Movable base, 52: Position adjustment machine, 60: Resin supply system , 61: Dispensa, 62
: Hose, 63: Resin supply nozzle, 64: Cylinder for nozzle position operation, 70: Light projection system, 71: Ultraviolet source, 72
: optical fiber, 73: projection head, 74: cylinder for head position operation, 80: robot, 81: x-direction operating device,
82: Y direction operating device, 83: Operating head, 84: Arm, 858 Charging head, 86: Flip chip catch, 8
7: Air blowout hole, 88: Adsorption hole, 90: Vacuum system, 91:
Vacuum pump, 92: Drive motor, 100 Nibragram control device, 101: Operation diagram

Claims (1)

【特許請求の範囲】[Claims] 第1段動作とそれより移動量の小な第2段動作を行なう
加圧手段と、これにより加圧方向以外には移動自在に操
作される加圧ロッドとその先端面にフリップチップを保
持する手段を備えるチップ加圧機構と、透明な基板受台
とその上に配線基板を保持する手段を備える基板保持機
構と、基板受台を通してフリップチップと配線基板の位
置を検出する光学手段と、チップ加圧機構と基板保持機
構の一方に対する他方の位置を調整可能な位置調整手段
とを備え、フリップチップを加圧ロッドの先端面に配線
基板を基板受台上にそれぞれ保持させかつ加圧手段を第
1段動作させて両者を近接させた状態で光学手段によっ
て両者の位置を検出しながら位置調整手段によって位置
合わせし、加圧手段を第2段動作させた状態でフリップ
チップのバンプ電極を配線基板の配線導体と固定接続す
るようにしたフリップチップ用実装装置。
A pressurizing means that performs a first-stage operation and a second-stage operation with a smaller amount of movement, a pressurizing rod that is movably operated in directions other than the pressurizing direction, and a flip chip held on its tip surface. a chip pressing mechanism comprising a means for pressing the flip chip, a substrate holding mechanism comprising a transparent substrate holder and a means for holding the wiring board thereon, an optical means for detecting the position of the flip chip and the wiring board through the substrate holder, and a chip A pressurizing mechanism and a position adjusting means capable of adjusting the position of one of the substrate holding mechanisms relative to the other are provided, and the flip chip is held on the tip surface of the pressurizing rod and the wiring board is held on the substrate holder, and the pressurizing means is provided. The first stage is operated and the two are brought close to each other, and the positions of the two are detected by optical means and the position adjusting means is used to align them.The second stage of the pressurizing means is operated and the bump electrodes of the flip chip are wired. A flip chip mounting device that makes a fixed connection to the wiring conductor of the board.
JP803290A 1990-01-17 1990-01-17 Flip chip mounting equipment Expired - Lifetime JP2513052B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP803290A JP2513052B2 (en) 1990-01-17 1990-01-17 Flip chip mounting equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP803290A JP2513052B2 (en) 1990-01-17 1990-01-17 Flip chip mounting equipment

Publications (2)

Publication Number Publication Date
JPH03211849A true JPH03211849A (en) 1991-09-17
JP2513052B2 JP2513052B2 (en) 1996-07-03

Family

ID=11681997

Family Applications (1)

Application Number Title Priority Date Filing Date
JP803290A Expired - Lifetime JP2513052B2 (en) 1990-01-17 1990-01-17 Flip chip mounting equipment

Country Status (1)

Country Link
JP (1) JP2513052B2 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5348611A (en) * 1992-05-20 1994-09-20 General Signal Corporation Die paste transfer system and method
JPH098084A (en) * 1995-06-22 1997-01-10 Matsushita Electric Ind Co Ltd Electronic component mounting equipment and soldering method of electronic components
WO2001041209A1 (en) * 1999-11-30 2001-06-07 Toray Engineering Co., Ltd. Chip bonding device
JP2004511081A (en) * 2000-03-10 2004-04-08 チップパック,インク. Package and method for flip-chip-in-leadframe
JP2008198710A (en) * 2007-02-09 2008-08-28 Fujitsu Ltd Method for manufacturing observation apparatus, and electronic apparatus
JP2012216616A (en) * 2011-03-31 2012-11-08 Internatl Business Mach Corp <Ibm> Semiconductor bonding device
JP2013172057A (en) * 2012-02-22 2013-09-02 Fujifilm Corp Mounting device and control method thereof
CN114466526A (en) * 2021-11-02 2022-05-10 深圳市智链信息技术有限公司 Chip fixing device of wireless receiving signal amplifier

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5348611A (en) * 1992-05-20 1994-09-20 General Signal Corporation Die paste transfer system and method
US5423927A (en) * 1992-05-20 1995-06-13 Kulicke & Soffa Industries, Inc. Die paste transfer system and method
JPH098084A (en) * 1995-06-22 1997-01-10 Matsushita Electric Ind Co Ltd Electronic component mounting equipment and soldering method of electronic components
WO2001041209A1 (en) * 1999-11-30 2001-06-07 Toray Engineering Co., Ltd. Chip bonding device
US6648045B2 (en) 1999-11-30 2003-11-18 Toray Engineering Co., Ltd. Chip bonding apparatus
JP2004511081A (en) * 2000-03-10 2004-04-08 チップパック,インク. Package and method for flip-chip-in-leadframe
JP2008198710A (en) * 2007-02-09 2008-08-28 Fujitsu Ltd Method for manufacturing observation apparatus, and electronic apparatus
JP2012216616A (en) * 2011-03-31 2012-11-08 Internatl Business Mach Corp <Ibm> Semiconductor bonding device
JP2013172057A (en) * 2012-02-22 2013-09-02 Fujifilm Corp Mounting device and control method thereof
CN114466526A (en) * 2021-11-02 2022-05-10 深圳市智链信息技术有限公司 Chip fixing device of wireless receiving signal amplifier

Also Published As

Publication number Publication date
JP2513052B2 (en) 1996-07-03

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