JPH0320724Y2 - - Google Patents
Info
- Publication number
- JPH0320724Y2 JPH0320724Y2 JP7460584U JP7460584U JPH0320724Y2 JP H0320724 Y2 JPH0320724 Y2 JP H0320724Y2 JP 7460584 U JP7460584 U JP 7460584U JP 7460584 U JP7460584 U JP 7460584U JP H0320724 Y2 JPH0320724 Y2 JP H0320724Y2
- Authority
- JP
- Japan
- Prior art keywords
- metal
- standard sample
- holder
- metal piece
- film thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002184 metal Substances 0.000 claims description 41
- 239000007769 metal material Substances 0.000 claims description 2
- 239000011888 foil Substances 0.000 description 15
- 238000011088 calibration curve Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 2
- 238000004026 adhesive bonding Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052755 nonmetal Inorganic materials 0.000 description 1
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7460584U JPS60188310U (ja) | 1984-05-22 | 1984-05-22 | 螢光x線膜厚計用標準サンプル板 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7460584U JPS60188310U (ja) | 1984-05-22 | 1984-05-22 | 螢光x線膜厚計用標準サンプル板 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60188310U JPS60188310U (ja) | 1985-12-13 |
JPH0320724Y2 true JPH0320724Y2 (en, 2012) | 1991-05-07 |
Family
ID=30615057
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7460584U Granted JPS60188310U (ja) | 1984-05-22 | 1984-05-22 | 螢光x線膜厚計用標準サンプル板 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60188310U (en, 2012) |
-
1984
- 1984-05-22 JP JP7460584U patent/JPS60188310U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS60188310U (ja) | 1985-12-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0320724Y2 (en, 2012) | ||
JPH0321962Y2 (en, 2012) | ||
JPS627493Y2 (en, 2012) | ||
JPS63111748U (en, 2012) | ||
JPH0537279Y2 (en, 2012) | ||
JPS6246333Y2 (en, 2012) | ||
JPH0313681Y2 (en, 2012) | ||
JPS6098015U (ja) | X線膜厚計に於る測定ポイント表示装置 | |
JPH03113152U (en, 2012) | ||
JPH0453549U (en, 2012) | ||
JPS58112908U (ja) | X線膜厚装置 | |
JPS61102902U (en, 2012) | ||
JPS60193449U (ja) | 放射線検査装置 | |
JPS6119752U (ja) | X線誘導筒 | |
JPS58101113U (ja) | 螢光x線膜厚計に於ける測定点検出装置 | |
JPH0244200Y2 (en, 2012) | ||
JPH03210494A (ja) | 放射線測定素子の遮蔽用グリッド板 | |
JPH02148U (en, 2012) | ||
JPS6395298U (en, 2012) | ||
JPH0378204U (en, 2012) | ||
JPH01117583U (en, 2012) | ||
JPS6019902U (ja) | 直径測定兼用スケ−ル | |
JPS6065664U (ja) | 蛍光x線分析用試料マスク板 | |
JPS63314500A (ja) | X線窓 | |
JPS5893859U (ja) | 単結晶のカツト面検査装置 |