JPH03204223A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPH03204223A JPH03204223A JP1342818A JP34281889A JPH03204223A JP H03204223 A JPH03204223 A JP H03204223A JP 1342818 A JP1342818 A JP 1342818A JP 34281889 A JP34281889 A JP 34281889A JP H03204223 A JPH03204223 A JP H03204223A
- Authority
- JP
- Japan
- Prior art keywords
- gate
- resistor
- input
- semiconductor device
- resistors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims description 15
- 230000005669 field effect Effects 0.000 claims description 5
- 230000003111 delayed effect Effects 0.000 abstract 1
- 230000002035 prolonged effect Effects 0.000 abstract 1
- 230000000630 rising effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 10
- 230000000694 effects Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、等価的に並列に接続された複数の電界効果型
トランジスタを含む半導体装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor device including a plurality of field effect transistors connected equivalently in parallel.
[従来の技術]
電界効果型トランジスタをスイッチングさせた場合、出
力の立上り、立下り時間は、1負荷の状態、ゲートドラ
イブの方法等によって決まるが、立上り、立下り時間を
長くする方法として従来は入力に抵抗を入れる方法があ
った。[Prior Art] When switching a field effect transistor, the rise and fall times of the output are determined by the load condition, gate drive method, etc. Conventionally, there is a method to lengthen the rise and fall times. There was a way to put a resistor in the input.
第5図は半導体装置の従来例の回路図、第6図はその入
出力の波形図である。FIG. 5 is a circuit diagram of a conventional example of a semiconductor device, and FIG. 6 is a waveform diagram of its input and output.
この半導体装置は、MOSFET 12..12□。This semiconductor device includes MOSFET 12. .. 12□.
123、−、 +2nが並列に接続され、各MOS F
ET121〜12.のゲートと入力端子の間に抵抗1
1が接続されており、この抵抗11のために出力の立上
り、立下りは、第6図に示すように長くなっている(破
線は入力抵抗11の抵抗値が小さい場合を示す)。123, -, +2n are connected in parallel, and each MOS F
ET121-12. A resistor 1 is connected between the gate and the input terminal of
1 is connected, and because of this resistor 11, the rise and fall of the output are long as shown in FIG. 6 (the broken line shows the case where the resistance value of the input resistor 11 is small).
[発明が解決しようとする課題]
上述した従来の半導体装置は、立上り、立下り時間を長
くするには入力抵抗値を大きくするため、スイッチング
の遅延時間が大きくなるという欠点があり、また入力抵
抗値を大きくしすぎると、ゲート・トレイン間容量によ
って異常動作を起こすことがあるという欠点がある。[Problems to be Solved by the Invention] The conventional semiconductor device described above has the disadvantage that the switching delay time increases because the input resistance value is increased to increase the rise and fall times. If the value is too large, there is a drawback that abnormal operation may occur due to the capacitance between the gate and the train.
本発明の目的は、スイッチングの遅延時間が小さい半導
体装置を提供することである。An object of the present invention is to provide a semiconductor device with a small switching delay time.
本発明の半導体装置は、入力端子と各電界効果型トラン
ジスタのゲートの間に段階的に相異った抵抗が接続され
ている。In the semiconductor device of the present invention, resistors that differ in stages are connected between the input terminal and the gate of each field effect transistor.
[作用]
段階的に異った抵抗でゲートへの接続を行うことにより
、スイッチングの遅延時間を大きくすることなく立上り
時間、立下り時間を長くすることができる。[Function] By connecting the gate with resistances that differ in stages, the rise time and fall time can be lengthened without increasing the switching delay time.
次に、本発明の実施例について図面を参照して説明する
。Next, embodiments of the present invention will be described with reference to the drawings.
第1図は本発明の一実施例を示す半導体装置の回路図、
第2図はその入出力波形図である。FIG. 1 is a circuit diagram of a semiconductor device showing an embodiment of the present invention;
FIG. 2 is a diagram of its input and output waveforms.
この半導体装置は、MOSFET 3..3□。This semiconductor device includes MOSFET 3. .. 3□.
33、・・・、3oが並列に接続され、入力抵抗1に抵
抗21、22.・・・、2n−1が直列に接続され、抵
抗2Iと22の接続点がMOSFET 3□のゲートに
、抵抗22と抵抗2.の接続点がM OS F E T
3s、のゲートに、・・・・、抵抗2n−1がMO3
FET3nのゲートにそれぞれ接続されている。33,..., 3o are connected in parallel, and the input resistor 1 is connected to the resistors 21, 22, . ..., 2n-1 are connected in series, the connection point between resistors 2I and 22 is the gate of MOSFET 3□, and the resistors 22 and 2n-1 are connected in series. The connection point is MOS FET
At the gate of 3s,..., resistor 2n-1 is MO3
Each is connected to the gate of FET3n.
スイッチングの遅延時間は入力抵抗1の値とゲート容量
によって決定されるため、入力抵抗1の値を小さくする
ことによって遅延時間Tdは短くなり、入力端子から見
てゲートまでの抵抗値が大きいトランジスタはどスイッ
チングが遅くなり、出力端子から見たスイッチング波形
の立上り、立下り時間は長くなる。The switching delay time is determined by the value of the input resistor 1 and the gate capacitance, so by decreasing the value of the input resistor 1, the delay time Td becomes shorter, and a transistor with a large resistance value from the input terminal to the gate is Switching becomes slower, and the rise and fall times of the switching waveform seen from the output terminal become longer.
第4図は本発明の第2の実施例の半導体装置の回路図で
ある。FIG. 4 is a circuit diagram of a semiconductor device according to a second embodiment of the present invention.
本実施例はMOSFET 3.、32.33.・・・、
3□のゲートと入力端子の間に抵抗値が段階的に相異な
る抵抗4+、 4z、 4s、・・・、4oが接続され
ている。This example uses MOSFET 3. , 32.33. ...,
Resistors 4+, 4z, 4s, . . . , 4o having stepwise different resistance values are connected between the gate of 3□ and the input terminal.
本実施例でも第1の実施例と同じ効果が得られる。This embodiment also provides the same effects as the first embodiment.
以上説明したように本発明は、入力端子から各トランジ
スタのゲートへの接続を段階的に異った抵抗値の抵抗で
接続することにより、スイッチングの立上り、立下り時
間が長くなり、スイッチング時のノイズ発生が低減でき
ることと、L(リアクタンス)負荷での逆起電力低減な
どの効果がある。As explained above, in the present invention, by connecting the input terminal to the gate of each transistor using resistors with different resistance values in stages, the rise and fall times of switching are lengthened. This has effects such as reducing noise generation and reducing back electromotive force in an L (reactance) load.
第1図は本発明の第1の実施例の半導体装置の回路図、
第2図はその入出力波形図、第3図は本発明の第2の実
施例の半導体装置の回路図、第4図は従来の半導体装置
の回路図、第5図はその入出力波形図である。
1・・・入力抵抗、
21〜2..4.〜4rl・・・抵抗、31〜3o・・
・電界効果トランジスタ、Td・・・遅延時間、
T1・・・立下り時間、
T2・・・立上り時間。
第1図FIG. 1 is a circuit diagram of a semiconductor device according to a first embodiment of the present invention;
Fig. 2 is an input/output waveform diagram thereof, Fig. 3 is a circuit diagram of a semiconductor device according to a second embodiment of the present invention, Fig. 4 is a circuit diagram of a conventional semiconductor device, and Fig. 5 is an input/output waveform diagram thereof. It is. 1... Input resistance, 21-2. .. 4. ~4rl...Resistance, 31~3o...
- Field effect transistor, Td...delay time, T1...fall time, T2...rise time. Figure 1
Claims (1)
ジスタを含む半導体装置において、入力端子と各トラン
ジスタのゲートの間に段階的に相異った値の抵抗が接続
されていることを特徴とする半導体装置。1. A semiconductor device including a plurality of field-effect transistors connected equivalently in parallel, characterized in that resistances with different values are connected in stages between the input terminal and the gate of each transistor. semiconductor device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1342818A JPH03204223A (en) | 1989-12-29 | 1989-12-29 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1342818A JPH03204223A (en) | 1989-12-29 | 1989-12-29 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03204223A true JPH03204223A (en) | 1991-09-05 |
Family
ID=18356727
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1342818A Pending JPH03204223A (en) | 1989-12-29 | 1989-12-29 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03204223A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5432471A (en) * | 1992-09-04 | 1995-07-11 | Mitsubishi Denki Kabushiki Kaisha | Insulated gate semiconductor device |
JP2006191774A (en) * | 2005-01-07 | 2006-07-20 | Toyota Motor Corp | Power control circuit and vehicle |
JP2009177296A (en) * | 2008-01-22 | 2009-08-06 | Seiko Epson Corp | Output circuit, output method, method of manufacturing output circuit, and electronic equipment |
JP2014039410A (en) * | 2012-08-17 | 2014-02-27 | Sanken Electric Co Ltd | Gate drive circuit |
WO2015033631A1 (en) * | 2013-09-06 | 2015-03-12 | シャープ株式会社 | Transistor circuit |
CN105103448A (en) * | 2013-04-12 | 2015-11-25 | 丰田自动车株式会社 | Electronic apparatus |
-
1989
- 1989-12-29 JP JP1342818A patent/JPH03204223A/en active Pending
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5432471A (en) * | 1992-09-04 | 1995-07-11 | Mitsubishi Denki Kabushiki Kaisha | Insulated gate semiconductor device |
JP2006191774A (en) * | 2005-01-07 | 2006-07-20 | Toyota Motor Corp | Power control circuit and vehicle |
JP2009177296A (en) * | 2008-01-22 | 2009-08-06 | Seiko Epson Corp | Output circuit, output method, method of manufacturing output circuit, and electronic equipment |
JP2014039410A (en) * | 2012-08-17 | 2014-02-27 | Sanken Electric Co Ltd | Gate drive circuit |
CN105103448A (en) * | 2013-04-12 | 2015-11-25 | 丰田自动车株式会社 | Electronic apparatus |
EP2985911A4 (en) * | 2013-04-12 | 2016-06-01 | Toyota Motor Co Ltd | Electronic apparatus |
US9660512B2 (en) | 2013-04-12 | 2017-05-23 | Toyota Jidosha Kabushiki Kaisha | Electronic device for acquiring specific information of respective switching elements |
CN105103448B (en) * | 2013-04-12 | 2018-02-23 | 丰田自动车株式会社 | Electronic installation |
WO2015033631A1 (en) * | 2013-09-06 | 2015-03-12 | シャープ株式会社 | Transistor circuit |
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