JPH03187558A - Test connecting system - Google Patents

Abstract

PURPOSE:To eliminate necessity for providing a testing device pull-in terminal in a remote exchange by connecting the testing device pull-in terminal of a host exchange through an extended test link, which is provided in the host exchange, to the fundamental test link of the remote exchange. CONSTITUTION:An exchange system is composed of the host exchange (host station) and plural remote exchanges (remote stations) 1, 2,... under the control of this host station. For example, when an insulation test is executed as a subscriber test to a subscriber terminal S11 housed in the remote station 1, a testing device pull-in terminal Ti of the host station is connected through an extended test link E1, fundamental test link L1 of the remote station 1 and line circuit LC to the subscriber terminal S11. Then, the insulation test is executed from a testing device, which is connected to the pull-ion terminal Ti, to the subscriber terminal S11. Thus, it is not necessary to provide the testing device pull-in terminal in the remote exchange.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a test connection method in a switching system, and in particular, the present invention relates to a test connection method in a switching system, and in particular, connection from a test equipment lead-in terminal of a host exchange to a remote exchange without providing a test equipment lead-in terminal in the remote exchange. This invention relates to a test connection method that enables testing of subscriber terminals.

[Conventional technology]

Conventionally, in a switching system having a host switching center and a remote switching center, in order to conduct a subscriber test via a test link, testing equipment was installed in each of the host switching center and each remote switching center.

Here, referring to Figure 2, we will explain the host exchange (host station) and the multiple remote exchanges (remote stations) under its control.
A subscriber test in an exchange system consisting of the following will be explained. Subscriber terminals SOO, Sol at the host station and remote station.

SIO, S11. S20 is accommodated in a digital line switch DLSW via a line circuit LC, and each switch DLSW is connected to a time division network TDNW in the host station via a multiplexing device (not shown) in the host station. The test equipment lead-in terminals To, Ti, and Tn provided for each test item of the host station and each remote station are the connection points 4 of the respective test links LO, LL, and L2.
0, J2, and Am, and connect the subscriber terminal 5OO-320 to the test equipment (
(not shown), and all these controls are performed by 11 times 1-1 GTL.

For example, subscriber terminal Sll accommodated in remote station I
When performing an insulation test as a subscriber test for , the test equipment of remote station 1 specifies the telephone number of the subscriber terminal Sll and the test items.The test equipment specifies its accommodation location information, the telephone number of the subscriber terminal Sll The test items are transmitted to the control circuit CTL of the host station via a signal line (not shown). The control circuit CTL is connected to the subscriber terminal S11 to be tested.
A database (subscriber data) is searched for accommodation location information corresponding to the telephone number of , and it is recognized that the telephone number is accommodated in the remote station 1 . Furthermore, the control circuit CTL recognizes that this test device is accommodated in the remote station 1 from the received accommodation position information of the test device (corresponding to the test device lead-in terminal Ti in this case), and selects the specified connection position. Only when the subscriber terminal S to be tested is the same as the subscriber terminal Sll, the subscriber terminal S to be tested is connected via the connection point 42k in the corresponding test link Ll.
The remote station 1 is controlled via the multiplexer and the digital line switch DLSW of the remote station 1 so as to draw in the line circuit LC of the remote station 1. Thereby, the test equipment lead-in terminal Ti of the remote station 1 is connected to the subscriber terminal Sll via the test link L1 and the line circuit LC, and an insulation test is performed from the test equipment. Note that when testing subscriber terminals accommodated in the host station and the remote station 2, the test is performed in the same manner at each station.

[Problem to be solved by the invention]

In the conventional test connection method described above, test equipment lead-in terminals are provided in the host exchange and each remote exchange, which not only requires a large number of test equipment lead-in terminals in proportion to the number of exchanges, but also requires new test equipment lead-in terminals. When additional subscriber test items are added, there is a problem in that test equipment lead-in terminals must be provided not only at the host exchange but also at all remote exchanges under control.

[Means to solve the problem]

The test connection method of the present invention includes a host exchange that tests subscriber terminals accommodated in its own station through a basic test link and an extended test link from a lead-in terminal connected to a test device, and a test connection for subscriber terminals accommodated in the host exchange. at least one remote exchange under the control of the host exchange having a basic test link used when The test device further includes an extended test link for connecting the test device to enable testing from the test device.

Further, a plurality of the lead-in terminals of the host exchange are provided and are assigned in correspondence with the test items.

〔Example〕

Next, the present invention will be explained with reference to the drawings.

Referring to FIG. 1, which shows one embodiment, this switching system is composed of a host switching center (host station) and a plurality of remote switching centers (remote stations) under the control of this host station. The terminals SOO and SQL are each accommodated in a digital line switch DLSW via a line circuit LC in the host station.This switch DLSW is connected to a time division network TDNW.

The basic test link LO is capable of drawing in the subscriber terminals SOO, SQL via a line circuit LC and connects Jim to the terminals eo, ej, em of the extended test link EO at connection points ff1o, β.

Terminals tQ, tt, and tn of the extended test link EO are connected to test equipment lead-in terminals To, Ti, and Tn. Other extended test links El, E2. En is the terminal to
, ti, tn, and the terminal to of the extended test link EO
, ti, and tn. Extended test link E
Each of O to En has an input terminal and an output terminal that can be selectively connected to each other under the control of the control circuit CTL. The test equipment lead-in terminals To, Ti, and Tn are used to perform different test items, respectively. A testing device (not shown) is connected to these lead-in terminals To, Ti, and Tn.The testing device performs subscriber testing functions such as insulation testing, button signal testing, dial pulse testing, and subscriber call testing. Ordinary test equipment can be used that has an extended test link El connected to terminal eo.

It is connected to multiple remote stations via ei and em.

Extended test link E2. En is connected to a plurality of other remote stations through terminals ej.

Subscriber terminals SIO and Sll are connected to digital line switch D via line circuit LC at remote station 1.
It will be housed in LSW. This switch DLSW is connected to the network TDNW of the host station. The basic test link L1 connects the subscriber terminal SIO via the line circuit LC.
, Sll can be retracted, and the connection point ff1k,
,! RP to host station extended test link E1 terminal ej
, connected to em. Further, the subscriber terminal S20 is accommodated in the digital line switch DLSW at the remote station 2 via the line circuit LC. This switch DLS
W is connected to the host station's network TDNW. The basic test link L2 can be connected to a subscriber terminal S20 via a line circuit LC and connects the connection point 1k to the terminal ej of the extended test link E1 of the host station. The other remote stations have basically the same configuration as remote station 1.2.

In the switching system having the above-described configuration, when performing an insulation test as a subscriber test on the subscriber terminal Sll housed in the remote station 1, for example, information indicating the test items along with the telephone number of the subscriber terminal Sll is sent from the testing device of the host station. When inputted, the telephone number and test items of the subscriber terminal Sll to be tested are transmitted to the control circuit CTL via a signal line (not shown). Based on the input information, the control circuit CTL identifies that this test item is to be carried out through the pre-assigned test equipment lead-in terminal Ti, and also provides accommodation position information corresponding to the telephone number of the subscriber terminal Sll to be tested. Search the database (subscriber data) to find
It is recognized that the subscriber terminal to be tested is accommodated in the remote station 1.

Subsequently, the control circuit CTL connects the terminal e of the extended test link E1 connected to the remote station 1 in order to establish a connection path between the test equipment lead-in terminal Ti and the subscriber terminal Sll.
Make all selections of j and em.

If the selected empty terminal is terminal ej, the control circuit CTL
controls the switches in the test link so as to connect the terminals ti and ej of the extended test link E1, and then controls the switching of the line circuit LC connected to the subscriber terminal Sll of the remote station 1. . This allows the test equipment lead-in terminal Ti of the host station to pass through the extended test link El and the basic test link L1 of the remote station 1.
and can be connected to the subscriber terminal Sll via the line circuit LC. Then, an insulation test is performed on the subscriber terminal Sll from a testing device connected to the lead-in terminal Ti.

Above, we have described the case where an insulation test is performed as a subscriber test on the subscriber terminal S11 housed in the remote station 1 through the test equipment lead-in terminal Ti of the host station, but other items can be tested through the lead-in terminals To and Tn. You can also do this. Further, when performing a subscriber test on a subscriber terminal accommodated in another remote station, the same can be done by setting the connection progress through the corresponding extended test links E1 to En. Furthermore, subscriber tests for subscriber terminals SOO and SQL accommodated in the host station can be performed in the same way through the extended test link EO and the basic test link LO.

〔Effect of the invention〕

As explained above, according to the present invention, the test equipment lead-in terminal of the host exchange can be connected to the basic test link of the remote exchange through the extended test link provided within the host exchange, thereby allowing the test equipment to be connected to the remote exchange. There is no need to provide an equipment lead-in terminal, and various types of connections can be made from the test equipment lead-in terminal in the host exchange not only to subscriber terminals accommodated in the host exchange, but also to subscriber terminals housed in remote exchanges. Enables you to conduct subscriber testing. Furthermore, when adding test equipment lead-in terminals due to the addition of new test items, subscriber tests of remote exchanges can be performed by simply providing them at the host exchange.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing an embodiment of the present invention, and FIG. 2 is a block diagram showing a conventional example. SOO, SQL, SIO, Sll, S20...Subscriber terminal, To, Ti, Tn...Test equipment lead-in terminal, L
O, Ll, L2...Basic test link, EO, El,
E2. En-Extended test link, LC...Line circuit, CTL...Control circuit.

Claims (1)

[Claims] 1. A host exchange that performs tests on subscriber terminals accommodated in its own station through a basic test link and an extended test link from a lead-in terminal connected to a test device, and tests on subscriber terminals accommodated in its own station. at least one remote exchange under the control of the host exchange having a basic test link used when A test connection method characterized in that the test connection method further comprises an extended test link that connects the test device and enables testing from the test device. 2. The test connection system according to claim 1, wherein a plurality of said lead-in terminals of said host exchange are provided and are assigned in correspondence with test items.