JPH0317581U - - Google Patents

Info

Publication number
JPH0317581U
JPH0317581U JP7813889U JP7813889U JPH0317581U JP H0317581 U JPH0317581 U JP H0317581U JP 7813889 U JP7813889 U JP 7813889U JP 7813889 U JP7813889 U JP 7813889U JP H0317581 U JPH0317581 U JP H0317581U
Authority
JP
Japan
Prior art keywords
power source
characteristic measuring
semiconductor device
measuring device
transient voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7813889U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7813889U priority Critical patent/JPH0317581U/ja
Publication of JPH0317581U publication Critical patent/JPH0317581U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP7813889U 1989-06-30 1989-06-30 Pending JPH0317581U (US06650917-20031118-M00005.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7813889U JPH0317581U (US06650917-20031118-M00005.png) 1989-06-30 1989-06-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7813889U JPH0317581U (US06650917-20031118-M00005.png) 1989-06-30 1989-06-30

Publications (1)

Publication Number Publication Date
JPH0317581U true JPH0317581U (US06650917-20031118-M00005.png) 1991-02-21

Family

ID=31621144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7813889U Pending JPH0317581U (US06650917-20031118-M00005.png) 1989-06-30 1989-06-30

Country Status (1)

Country Link
JP (1) JPH0317581U (US06650917-20031118-M00005.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11293978B2 (en) 2017-09-12 2022-04-05 Tokyo Electron Limited Voltage application device for testing plurality of devices and method of forming output voltage waveform

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5719673A (en) * 1980-07-10 1982-02-01 Yokogawa Hewlett Packard Ltd Electric current detector with resistance change-over circuit
JPS61169770A (ja) * 1985-01-23 1986-07-31 Chuo Riken:Kk 試験装置の電源回路

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5719673A (en) * 1980-07-10 1982-02-01 Yokogawa Hewlett Packard Ltd Electric current detector with resistance change-over circuit
JPS61169770A (ja) * 1985-01-23 1986-07-31 Chuo Riken:Kk 試験装置の電源回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11293978B2 (en) 2017-09-12 2022-04-05 Tokyo Electron Limited Voltage application device for testing plurality of devices and method of forming output voltage waveform

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