JPH0316233A - Manufacture of photoconductive thin film - Google Patents
Manufacture of photoconductive thin filmInfo
- Publication number
- JPH0316233A JPH0316233A JP1151820A JP15182089A JPH0316233A JP H0316233 A JPH0316233 A JP H0316233A JP 1151820 A JP1151820 A JP 1151820A JP 15182089 A JP15182089 A JP 15182089A JP H0316233 A JPH0316233 A JP H0316233A
- Authority
- JP
- Japan
- Prior art keywords
- cds
- cdse
- atmosphere
- thin film
- concentration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 18
- 238000004519 manufacturing process Methods 0.000 title claims description 9
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 claims abstract description 14
- 238000010438 heat treatment Methods 0.000 claims abstract description 11
- 239000010408 film Substances 0.000 claims abstract description 8
- 238000001704 evaporation Methods 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 6
- 230000008020 evaporation Effects 0.000 claims description 5
- 239000006104 solid solution Substances 0.000 claims description 2
- 239000000126 substance Substances 0.000 claims description 2
- 230000007423 decrease Effects 0.000 abstract description 10
- 230000003247 decreasing effect Effects 0.000 abstract description 4
- YKYOUMDCQGMQQO-UHFFFAOYSA-L cadmium dichloride Chemical compound Cl[Cd]Cl YKYOUMDCQGMQQO-UHFFFAOYSA-L 0.000 abstract 4
- BTCSSZJGUNDROE-UHFFFAOYSA-N gamma-aminobutyric acid Chemical compound NCCCC(O)=O BTCSSZJGUNDROE-UHFFFAOYSA-N 0.000 abstract 2
- 229940084388 gammar Drugs 0.000 abstract 2
- 229920006395 saturated elastomer Polymers 0.000 abstract 1
- 230000004044 response Effects 0.000 description 10
- 238000000034 method Methods 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 238000007738 vacuum evaporation Methods 0.000 description 3
- 206010034972 Photosensitivity reaction Diseases 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000036211 photosensitivity Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 206010070834 Sensitisation Diseases 0.000 description 1
- 238000005234 chemical deposition Methods 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 230000008313 sensitization Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明はCdSもしくはCdSeもしくは前記2物質の
固溶体(以下、CdS/Cd’sと略記)を主体とする
光導電性薄膜の製造方法に関し 特にその光応答速度の
改善を目的とした光導電性薄膜の製造方法に関するもの
であも
従来の技術
CdSあるいはCdSeあるいはCdS/CdSeを主
体とする薄膜を適当な雰囲気玄 高温加熱することによ
り光導電性薄膜を作製することは既に知られており、こ
の薄膜の形或方法として化学析出法や真空蒸着法 スパ
ッタ法などがあも
このCdS, CdSeあるいはCdS/CdSeに
光導電性を賦与するために ハロゲン特にC1等と金属
特にCu等を少量だけ添加して500℃以上の温度に加
気 結晶化するのが普通であも
この様な方法で得られる光導電性薄膜はCdSを主体と
するものではO。4〜0.8μ& CdSeを加えた
ものでは更に長波長の光に感応し 同時に応答時間が短
くなることが知られていも
膜中ヘのC1の導入は結晶化の温度を下(デ、結晶粒を
増大するだけでなく、主戒分中に入り結晶中に欠陥をつ
くるカt 同時にCd空孔を作りこれが増感中心となっ
て光電流(以下J.)を著しく増大させも しかしC1
は結晶中ではドナーとなるために同時に暗電流(以下J
.)をもかなり大きくしてしまう。一方Cuを導入する
とドナー電子はCuイオンの補償に消費されるためにJ
−を小さくすることができも そのため一般にはC1の
導入とともにCuを共添加してJpを大きく、 J4を
小さくする方法をとってい氏
また応答時間に関してはjpがOからその50%に達す
るまでの時間を立上がり時間τ11 飽和値からその5
0%に減少する時間をτ−とすると、Cl濃度が高い場
合は増感中心の増加により、電子の寿命が長くなるため
にて−は大きくなも
次に従来の光導電性薄膜の製造方法について述べも こ
のプロセスは大まかに言って絶縁性基板上にCdSある
いはCdSeあるいはCdS/CdSeの薄膜を形或す
るプロセスと、その薄膜をC dC bの蒸気を含む雰
囲気中で熱処理して光感度を得るプロセスに分けられも
不純物としてのCuは薄膜形戊時に導入L,, C
lは熱処理中に導入していも具体的な方法としては特開
昭57−17334号公報に詳しく述べられているよう
4,:..CdSあるいはCdSeあるいはCdS/C
dSeに微量のC uC hを加えたものを混妃 一旦
700〜1000℃で焼結後粉砕して蒸発源とすも こ
れを真空蒸着によりガラス基板上に薄膜化しこの薄膜を
500〜600℃、10〜60分間CdCh蒸気を含へ
空気中で熱処理することにより粒子成長させ、不純物
を格子点に導入して光感度を得てい池
発明が解決しようとする課題
従来の光センサの問題点はその光応答速度にあ褐
第4図に従来の製造方法により、膜中のCu濃度を変え
て作製した光センサの.JDと応答時間の関係を示も
電流の実用領域では応答速度はJ.に関連LA J.が
大きくなるとτrは減少、もしくは減少から飽私 τ−
は増姐 逆にJ−が小さくなるとτ・は増姐 τ−は減
少すも
ここでは一例を示したバ 光センサのJ,はプロセスの
条件(薄膜中のCuC12濃嵐 膜尾 熱処理温嵐 熱
処理時間等)に大きく依存よ また応・答速度はJ−に
依存するたべ プロセスの条件を制御してJ●、それに
従って応答速度を制御していt:oしかし 前述の如く
、 τrとτ−は相反関係にあるた幽 どちらをも小さ
くすることは困難でありt4課題を解決するための手段
本発明による光センサの製造方法j;LCdSもしくは
CdSeもしくは前記2物質の固溶体を主体としてなり
、これに微量のCuを含んだ蒸発源を基板上に蒸着して
得られた膜をCdClgを含む雰囲気中で500〜60
0℃、10〜60分間熱処理して得られる光導電性薄膜
の製造方法において、前記雰囲気はN2と02を主体と
獣 02の含有率が20%以上 80X以下であること
を特徴としていも
作 用
本発明の製造方法でζ戴 熱処理時の雰囲気中の02濃
度を20〜60%とすも ○象濃度の増加と共にJ.は
減少ヒ それに従ってτ4が減少する戟 τ,はほぼ一
定であも つまり第1図に示すよう番ヘ○倉濃度を増加
して減少するJsに従ってτ−は減少する爪 τPは増
加しないという特徴を持つのであも
それゆ丸 熱処理時のO黛濃度を、空気中で行う従来の
製造方法における場合(02!1度は約20%)より高
くすることによりτrを小さくすることができも また
OII濃度を60%以下としたの(上 それ以上ではJ
,が小さくなりすぎ回路コストが高くなるなど実用上不
都合が生じるからであも
実施例
蒸発源の作製としてCdSを0.6モノlkcdseを
0.4モルこれに不純物としてCuC1*を0. 00
2モルを秤t 混合す翫 これを800℃で1時間不
活性ガス中で焼広 冷却後粉砕すも
これを蒸発源として真空蒸着により、ガラス基板( #
7059 コーニング社、40x 40x l. 1
)上に薄膜を形威す褐 基板温度は15Qt, 膜厚
は約4500人であも 次にホトリソ及びエッチングプ
ロセスにより膜を短冊状にパターン化すも
次にこれを、低部にCLICII1を5重量部加えたC
dS粉末lグラムを或形タブレット化したものを置いた
石英製ボー1・に入れ蓋をして全体を石英管中に入れて
熱処理する。そのときの雰囲気はN2と02の混合ガス
で、一旦管中を真空にした後ガスを導入し 熱処理屯
及び冷却中も流し続けも ガスで満たされた後温度を上
ζ1 520t, 30分保持すも ここで02濃
度を0〜80%としtも次に電極形戊のためのレジスト
のりフトオフ用パターンを形或したK N iC r
/ A u(500/650A )を電子ビーム蒸着し
りフトオフしてプレーナ型電極を形成すも 受光部の
大きさは55x90μ一であム 最後にこれをN2中で
250℃30分の熱処理を行う。DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a method for producing a photoconductive thin film mainly composed of CdS, CdSe, or a solid solution of the above two substances (hereinafter abbreviated as CdS/Cd's). Regarding methods for producing photoconductive thin films aimed at improving response speed, conventional techniques are used to produce photoconductive thin films by heating a thin film mainly composed of CdS, CdSe, or CdS/CdSe in an appropriate atmosphere at high temperatures. It is already known that this thin film can be formed using chemical deposition, vacuum evaporation, sputtering, etc. to give photoconductivity to CdS, CdSe, or CdS/CdSe. Although it is common practice to add a small amount of a metal such as Cu, etc. and crystallize it under heating at a temperature of 500°C or higher, the photoconductive thin film obtained by this method is not one that is mainly composed of CdS. Although it is known that a film containing 4 to 0.8μ and CdSe is sensitive to longer wavelength light and at the same time shortens the response time, the introduction of C1 into the film lowers the crystallization temperature (de, crystal grains). C1 not only increases Cd, but also enters into the main precipitate and creates defects in the crystal.At the same time, Cd vacancies are created, which become sensitization centers and significantly increase the photocurrent (hereinafter referred to as J).However, C1
acts as a donor in the crystal, so at the same time dark current (J
.. ) becomes quite large. On the other hand, when Cu is introduced, donor electrons are consumed to compensate for Cu ions, so J
- can be made small. Therefore, in general, a method is adopted in which Cu is co-added with the introduction of C1 to increase Jp and reduce J4. Regarding the response time, the response time is as follows: Time rise time τ11 From saturation value 5
If the time for the decrease to 0% is τ-, then when the Cl concentration is high, the number of sensitized centers increases and the lifetime of the electrons becomes longer. Roughly speaking, this process involves forming a thin film of CdS, CdSe, or CdS/CdSe on an insulating substrate, and then heat-treating the thin film in an atmosphere containing C dC b vapor to increase photosensitivity. Cu is introduced as an impurity when forming a thin film.
Even if l is introduced during the heat treatment, the specific method is as described in detail in Japanese Patent Application Laid-open No. 17334/1984. .. CdS or CdSe or CdS/C
A mixture of dSe and a small amount of CuCh is sintered at 700-1000°C and then crushed to serve as an evaporation source. This is formed into a thin film on a glass substrate by vacuum evaporation, and this thin film is heated to 500-600°C. Particles are grown by heat treatment in air for 10 to 60 minutes, and photosensitivity is obtained by introducing impurities into the lattice points.Problems that the invention aims to solveThe problems with conventional optical sensors are that Figure 4 shows the difference in optical response speed of optical sensors fabricated by the conventional manufacturing method by varying the Cu concentration in the film. Also shows the relationship between JD and response time.
In the practical area of current, the response speed is J. Related to LA J. As τ increases, τr decreases, or becomes exhausted due to the decrease τ−
On the other hand, as J- becomes smaller, τ increases and τ- decreases. Here, an example is shown. However, as mentioned above, τr and τ- are Since they are in a contradictory relationship, it is difficult to reduce the size of both of them. A film obtained by evaporating an evaporation source containing a trace amount of Cu on a substrate was heated to 500 to 60% in an atmosphere containing CdClg.
In the method for producing a photoconductive thin film obtained by heat treatment at 0°C for 10 to 60 minutes, the atmosphere is characterized in that the atmosphere is mainly composed of N2 and 02, and the content of 02 is 20% or more and 80X or less. In the production method of the present invention, the concentration of 02 in the atmosphere during heat treatment is set at 20 to 60%. is decreasing, and τ4 is decreasing accordingly. τ, is almost constant. In other words, as shown in Figure 1, τ- is decreasing as Js is increasing as the concentration is increasing. τP is not increasing. It is also possible to reduce τr by increasing the O concentration during heat treatment compared to the conventional manufacturing method performed in air (approximately 20% at 02!1 degrees). The OII concentration was set below 60% (above, J
, becomes too small, causing practical inconveniences such as increased circuit cost.However, in order to prepare the evaporation source of the example, 0.6 moles of CdS and 0.4 moles of lkcdse were mixed with 0.4 moles of CuC1* as an impurity. 00
Weigh out 2 mol of t and mix. Spread the mixture at 800°C for 1 hour in an inert gas. After cooling, pulverize and use this as an evaporation source by vacuum evaporation to form a glass substrate (#
7059 Corning, 40x 40x l. 1
) The substrate temperature is 15 Qt, and the film thickness is approximately 4,500 mm.Next, the film is patterned into strips using a photolithography and etching process. C added
One gram of dS powder in the form of a tablet is placed in a quartz bowl 1, covered with a lid, and the whole is placed in the quartz tube for heat treatment. The atmosphere at that time was a mixed gas of N2 and 02, and after the inside of the tube was evacuated, the gas was introduced and the heat treatment was carried out.
After the gas is filled, the temperature is maintained at ζ1 520t for 30 minutes.Then, the 02 concentration is set to 0 to 80%, and the pattern for removing the resist paste for the electrode shape is prepared. K N iC r
/Au (500/650A) is electron beam evaporated and lifted off to form a planar electrode.The size of the light receiving area is 55x90μ.Finally, this is heat treated in N2 at 250℃ for 30 minutes. .
センサ特性の測定は電極間の印加電圧10V玄J*i&
570nc 100 luxの光連続照舷 応答
時間(友これをIHzのパルス光にして行うね
第1図に熱処理時雰囲気のOs濃度と応答速度の関係を
、第2図に同じく02濃度とJ−の関係を示to Oe
濃度の増加と共&ス J−は減少し それに従ってτ一
が減少する力交 τPはほぼ一定であん第3図に本発明
の製造方法による光導電性薄膜のJeと応答時間の関係
を示す力t Ol濃度を増加して減少するJ−に従って
τ−は減少し τrは第4図に示す従来の方法による光
センサに見られるように増加しないことがわかん
発明の効果
以上のように本発明の光導電性薄膜の製造方法によれζ
L 従来の方法に比べて、速い応答時間をを持った光導
電性薄膜を得ることができ、ファクシミリ等各種OA機
器端末としての用途が拡大するなど、その工業的価値は
大であもThe sensor characteristics were measured using an applied voltage of 10 V between the electrodes.
570 nc 100 lux light continuous illumination response time (this is done using IHz pulsed light). Show the relationship to Oe
As the concentration increases, J- decreases, and τ decreases accordingly. τP remains almost constant. Figure 3 shows the relationship between Je and response time of the photoconductive thin film produced by the manufacturing method of the present invention. It can be seen that as the force t Ol concentration increases and J- decreases, τ- decreases, and τr does not increase as seen in the optical sensor according to the conventional method shown in FIG. Depending on the method of manufacturing the photoconductive thin film,
L Compared to conventional methods, it is possible to obtain a photoconductive thin film with a faster response time, and its industrial value is enormous, as its use as terminals for various office automation equipment such as facsimiles is expanding.
Claims (1)
を主体としてなり、これに微量のCuを含んだ蒸発源を
基板上に蒸着して得られた膜をCdChを含む雰囲気中
で500〜600℃、10〜60分間熱処理して得られ
る光導電性薄膜の製造方法において、前記雰囲気はN_
2とO_2を主体とし、O_2の含有率が20%以上、
60%以下であることを特徴とする光導電性薄膜の製造
方法。A film obtained by evaporating an evaporation source mainly composed of CdS or CdSe or a solid solution of the above two substances and containing a trace amount of Cu on a substrate is heated at 500 to 600 °C in an atmosphere containing CdCh at 10 to 60 °C. In the method for producing a photoconductive thin film obtained by heat treatment for a minute, the atmosphere is N_
2 and O_2 as main components, with an O_2 content of 20% or more,
60% or less.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1151820A JPH0316233A (en) | 1989-06-14 | 1989-06-14 | Manufacture of photoconductive thin film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1151820A JPH0316233A (en) | 1989-06-14 | 1989-06-14 | Manufacture of photoconductive thin film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0316233A true JPH0316233A (en) | 1991-01-24 |
Family
ID=15527030
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1151820A Pending JPH0316233A (en) | 1989-06-14 | 1989-06-14 | Manufacture of photoconductive thin film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0316233A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8541089B2 (en) | 2006-07-26 | 2013-09-24 | Ricoh Company, Ltd. | Fixing belt, base element for fixing belt, fixing device, image forming apparatus and method for producing base element |
-
1989
- 1989-06-14 JP JP1151820A patent/JPH0316233A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8541089B2 (en) | 2006-07-26 | 2013-09-24 | Ricoh Company, Ltd. | Fixing belt, base element for fixing belt, fixing device, image forming apparatus and method for producing base element |
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