JPH03149783A - Ic socket - Google Patents

Ic socket

Info

Publication number
JPH03149783A
JPH03149783A JP28629889A JP28629889A JPH03149783A JP H03149783 A JPH03149783 A JP H03149783A JP 28629889 A JP28629889 A JP 28629889A JP 28629889 A JP28629889 A JP 28629889A JP H03149783 A JPH03149783 A JP H03149783A
Authority
JP
Japan
Prior art keywords
lead
semiconductor device
socket
contact
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28629889A
Other languages
Japanese (ja)
Inventor
Norimasa Kurahara
藏原 憲政
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP28629889A priority Critical patent/JPH03149783A/en
Publication of JPH03149783A publication Critical patent/JPH03149783A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent the breakage of the lead of a semiconductor device and suppress the increase of contact resistance by providing a conducting rubber at a contact section with the lead of the semiconductor device, and electrically connecting it to the lead of the semiconductor device. CONSTITUTION:A conducting rubber 3 is filled in the lead 3 of an IC socket, the lead 1 of a semiconductor device is inserted into a fine hole provided at its center section, thus electric conduction is obtained. The face of the lead 2 of the IC socket in contact with the lead 1 of the semiconductor device is made of the conducting rubber 3. Even if the semiconductor device is repeatedly fitted and removed from the IC socket, the lead 1 of the semiconductor device is not broken, the contact area is large, defective contact and the increase of contact resistance are reduced, and electric conduction is easily obtained.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はICソケットに関し、特に半導体装置のリード
と接触する部分の構造を改良したICソケットに関する
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an IC socket, and more particularly to an IC socket with an improved structure of a portion that comes into contact with a lead of a semiconductor device.

〔従来の技術〕[Conventional technology]

従来、この種のDIPタイプのICソケットは、第3図
(a)、(b)に示す様に、ICソケットのリード22
は、ばね性を有する2つの金属板にて構成され、半導体
装置のリード1を狭む様に押圧して金属同志が接触し、
電気的導通をとっていた。
Conventionally, this type of DIP type IC socket has a lead 22 of the IC socket, as shown in FIGS. 3(a) and 3(b).
is composed of two metal plates having spring properties, and the leads 1 of the semiconductor device are pressed so that the metal plates come into contact with each other.
There was electrical continuity.

一方、JリードタイプのICソケットは、第4図(a)
、(b)に示す様に、ICソケットのリード32は、半
導体リード11との接触面が平坦で、この平坦部でJリ
ードタイプの半導体装置のり一ド11を押圧する様なば
ね構造を有し、金属同志が接触し、電気的導通をとって
いた。
On the other hand, the J-lead type IC socket is shown in Figure 4(a).
, (b), the IC socket lead 32 has a flat contact surface with the semiconductor lead 11, and has a spring structure that presses the J lead type semiconductor device glue 11 with this flat part. However, the metals were in contact with each other, creating electrical continuity.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来のICソケットは、ICソケットのリード
が金属性であるため、半導体装置のリードをICソケッ
トに着脱する事により半導体装置のリード部を傷め、ま
た、接触が部分的であるため接触部の摩耗により、接触
抵抗が増加し、電気的導通が取れにくくなるという欠点
がある。
In the conventional IC socket described above, the leads of the IC socket are made of metal, so attaching and detaching the leads of the semiconductor device to and from the IC socket may damage the leads of the semiconductor device, and since the contact is only partial, the contact portion There is a drawback that contact resistance increases due to wear, making it difficult to establish electrical continuity.

本発明の目的は、半導体装置のリードを傷めず、また接
触抵抗の増加を印刷できるICソケットを提供すること
にある。
SUMMARY OF THE INVENTION An object of the present invention is to provide an IC socket that does not damage the leads of a semiconductor device and can print an increase in contact resistance.

〔課題を解決するための手段〕[Means to solve the problem]

本発明のICソケットは、半導体装置のリードとの接触
部に導電性ゴムを設け、前記半導体装置のリードと電気
的に接続されている。
The IC socket of the present invention is electrically connected to the lead of the semiconductor device by providing conductive rubber at the contact portion with the lead of the semiconductor device.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
。第1図(a)、(b)は本発明の第1の実施例の断面
図及び部分拡大断面図である。
Next, embodiments of the present invention will be described with reference to the drawings. FIGS. 1(a) and 1(b) are a sectional view and a partially enlarged sectional view of a first embodiment of the present invention.

第1の実施例は、DIPタイプのICソケットの例であ
る。第1図(a)、(b)に示す様に、ICソケットの
りード2には、導電性ゴム3が充填され、その中心部に
設けられた細孔に半導体装置のりード1を挿入すること
により電気的導通が得られる構造となっている。
The first embodiment is an example of a DIP type IC socket. As shown in FIGS. 1(a) and 1(b), the IC socket lead 2 is filled with conductive rubber 3, and the semiconductor device lead 1 is inserted into the pore provided in the center. This structure provides electrical continuity.

この様な構造にすることによって、ICソケットのリー
ド2の半導体装置のりード1と接触する面が導電性ゴム
3となっているため、半導体装置をICソケットにくり
返し着脱しても半導体装置のりード1を傷めることはな
い、また、接触面積が大きくなるため、接触不良、接触
抵抗の増加も少く、電気的導通がとれ易くなる。
With this structure, the surface of the lead 2 of the IC socket that comes into contact with the lead 1 of the semiconductor device is made of conductive rubber 3, so even if the semiconductor device is repeatedly attached and detached from the IC socket, the semiconductor device remains stable. The lead 1 is not damaged, and since the contact area is increased, contact failure and increase in contact resistance are reduced, and electrical continuity is easily established.

第2図(a)、(b)は本発明の第2の実施例の断面図
及び部分拡大断面図である。
FIGS. 2(a) and 2(b) are a sectional view and a partially enlarged sectional view of a second embodiment of the present invention.

第2の実施例はJリードタイプの例である。第2図(a
)、(b)に示す様に、ICソケットのリード12の半
導体リード11との接触部には、導電性ゴム13が取付
けられ、半導体装置のりード11を導電性ゴム13に押
えつけることにより電気的導通が得られる構造となって
いる。
The second embodiment is an example of a J lead type. Figure 2 (a
), (b), a conductive rubber 13 is attached to the contact portion of the lead 12 of the IC socket with the semiconductor lead 11, and by pressing the lead 11 of the semiconductor device onto the conductive rubber 13, The structure provides electrical continuity.

この様な構造にするによって、半導体装置のり一ド11
を導電性ゴム13に押えつけた場合、導電性ゴム13の
弾性により、半導体装置のりード11の変形を防ぎ、確
実に電気的導通がとれるという利点がある。
With such a structure, the semiconductor device glue 11
When pressed against the conductive rubber 13, there is an advantage that the elasticity of the conductive rubber 13 prevents deformation of the leads 11 of the semiconductor device and ensures electrical continuity.

その他、QFP、LCC,PGA等のタイプの半導体装
置用のICソケットについても、ソケットのリードの半
導体装置のリードとの接触面に導電性ゴムを設ける事に
より、同様の効果が得られる。
In other IC sockets for semiconductor devices of types such as QFP, LCC, and PGA, similar effects can be obtained by providing conductive rubber on the contact surface of the leads of the socket with the leads of the semiconductor device.

〔発明の効果〕〔Effect of the invention〕

以上説明した様に本発明は、ICソケットのリードの半
導体装置のリードと接触する面に、導電性ゴムを設ける
事により、半導体装置のリードを傷つけたり、変形させ
る事もなく、接触不良や接触抵抗の増加を抑制できると
いう効果がある。
As explained above, the present invention provides conductive rubber on the surface of the IC socket lead that comes into contact with the lead of the semiconductor device, thereby preventing damage or deformation of the lead of the semiconductor device, and preventing contact failure and contact. This has the effect of suppressing an increase in resistance.

図面の簡単な説明 第1図(a)(b)は本発明の第1の実施例の断面図及
び部分拡大断面図、第2図(a)。
BRIEF DESCRIPTION OF THE DRAWINGS FIGS. 1(a) and (b) are a sectional view and a partially enlarged sectional view of a first embodiment of the present invention, and FIG. 2(a) is a sectional view of a first embodiment of the present invention.

(b)は本発明の第2の実施例の断面図及び部分拡大断
面図、第3図(a)、(b)は従来のDIPタイプのI
Cソケットの一例の断面図及び部分拡大断面図、第4図
(a)、(b)は従来のJリードタイプのICソケット
の一例の断面図及び部分拡大断面図である。
(b) is a sectional view and partially enlarged sectional view of the second embodiment of the present invention, and FIGS. 3(a) and (b) are conventional DIP type I
FIGS. 4(a) and 4(b) are a sectional view and a partially enlarged sectional view of an example of a conventional J-lead type IC socket.

1.11・一半導体装置のリード、2,12゜22.3
2・−・ICソケットのリード、3,13・−・導電性
ゴム。
1.11.1 Semiconductor device lead, 2,12°22.3
2.--IC socket lead, 3,13.--.Conductive rubber.

Claims (1)

【特許請求の範囲】[Claims] 半導体装置のリードとの接触部に導電性ゴムを設け、前
記半導体装置のリードと電気的に接続させることを特徴
とするICソケット。
An IC socket characterized in that a conductive rubber is provided at a contact portion with a lead of a semiconductor device to electrically connect with the lead of the semiconductor device.
JP28629889A 1989-11-02 1989-11-02 Ic socket Pending JPH03149783A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28629889A JPH03149783A (en) 1989-11-02 1989-11-02 Ic socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28629889A JPH03149783A (en) 1989-11-02 1989-11-02 Ic socket

Publications (1)

Publication Number Publication Date
JPH03149783A true JPH03149783A (en) 1991-06-26

Family

ID=17702567

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28629889A Pending JPH03149783A (en) 1989-11-02 1989-11-02 Ic socket

Country Status (1)

Country Link
JP (1) JPH03149783A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0643686U (en) * 1992-11-20 1994-06-10 弘視 桜庭 Luminescent element and luminous body

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0643686U (en) * 1992-11-20 1994-06-10 弘視 桜庭 Luminescent element and luminous body

Similar Documents

Publication Publication Date Title
US7189080B2 (en) Land grid array connector contact
EP0844657A4 (en) Method for mounting semiconductor chip
KR100349896B1 (en) Mounting structure of ic and mounting method thereof
US6913469B2 (en) Conductive terminal and electrical connector applying the conductive terminal
JP2003149291A (en) Contact structure
JP2000021526A (en) Conductive sheet for electronic parts
JPH04242088A (en) Ic socket
JP2000353579A (en) Socket for semiconductor device and method connecting semiconductor device with board
JPH03149783A (en) Ic socket
JP3379920B2 (en) Socket for IC
US6392165B1 (en) Adapter for a ball grid array device
JP2001043920A (en) Contact structure of contact to spherical bump
JP4156125B2 (en) IC socket
JPH0684379U (en) Jig for inspection device of integrated circuit
JPH10144440A (en) Bga socket
JPH04206752A (en) Inspecting device for surface-mounting type ic
JP2000082553A (en) Ic socket
JPH11176545A (en) Bga socket adapter
JPH07161399A (en) Connector for electric connection
JP2003208959A (en) Ic socket
JPH0498779A (en) Ic socket
JPH11307155A (en) Electric contact plate
JPH09178777A (en) Probe unit
JPH04163874A (en) Ic socket mounting method on printed circuit board
JPS6221007Y2 (en)