JPH031439U - - Google Patents
Info
- Publication number
- JPH031439U JPH031439U JP5909089U JP5909089U JPH031439U JP H031439 U JPH031439 U JP H031439U JP 5909089 U JP5909089 U JP 5909089U JP 5909089 U JP5909089 U JP 5909089U JP H031439 U JPH031439 U JP H031439U
- Authority
- JP
- Japan
- Prior art keywords
- outer periphery
- defect detection
- conductive line
- defect
- semiconductor chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 9
- 230000007547 defect Effects 0.000 claims description 7
- 238000001514 detection method Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5909089U JPH031439U (US07122603-20061017-C00045.png) | 1989-05-24 | 1989-05-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5909089U JPH031439U (US07122603-20061017-C00045.png) | 1989-05-24 | 1989-05-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH031439U true JPH031439U (US07122603-20061017-C00045.png) | 1991-01-09 |
Family
ID=31585287
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5909089U Pending JPH031439U (US07122603-20061017-C00045.png) | 1989-05-24 | 1989-05-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH031439U (US07122603-20061017-C00045.png) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000026965A1 (fr) * | 1998-10-30 | 2000-05-11 | Hitachi, Ltd. | Dispositif a circuit integre a semi-conducteur et carte a circuit integre |
| WO2008004414A1 (en) * | 2006-07-07 | 2008-01-10 | Sharp Kabushiki Kaisha | Semiconductor device having defect detecting function |
| JP2009290132A (ja) * | 2008-05-30 | 2009-12-10 | Oki Semiconductor Co Ltd | 半導体装置及び半導体チップのクラック検出方法 |
| JP2012007978A (ja) * | 2010-06-24 | 2012-01-12 | On Semiconductor Trading Ltd | 半導体集積回路 |
| JP2013125753A (ja) * | 2011-12-13 | 2013-06-24 | Semiconductor Components Industries Llc | 半導体集積回路 |
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1989
- 1989-05-24 JP JP5909089U patent/JPH031439U/ja active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000026965A1 (fr) * | 1998-10-30 | 2000-05-11 | Hitachi, Ltd. | Dispositif a circuit integre a semi-conducteur et carte a circuit integre |
| WO2008004414A1 (en) * | 2006-07-07 | 2008-01-10 | Sharp Kabushiki Kaisha | Semiconductor device having defect detecting function |
| JP2009290132A (ja) * | 2008-05-30 | 2009-12-10 | Oki Semiconductor Co Ltd | 半導体装置及び半導体チップのクラック検出方法 |
| JP2012007978A (ja) * | 2010-06-24 | 2012-01-12 | On Semiconductor Trading Ltd | 半導体集積回路 |
| JP2013125753A (ja) * | 2011-12-13 | 2013-06-24 | Semiconductor Components Industries Llc | 半導体集積回路 |
