JPH03126052U - - Google Patents

Info

Publication number
JPH03126052U
JPH03126052U JP3555090U JP3555090U JPH03126052U JP H03126052 U JPH03126052 U JP H03126052U JP 3555090 U JP3555090 U JP 3555090U JP 3555090 U JP3555090 U JP 3555090U JP H03126052 U JPH03126052 U JP H03126052U
Authority
JP
Japan
Prior art keywords
board
conductive pins
socket
performance
heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3555090U
Other languages
English (en)
Japanese (ja)
Other versions
JP2535744Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990035550U priority Critical patent/JP2535744Y2/ja
Publication of JPH03126052U publication Critical patent/JPH03126052U/ja
Application granted granted Critical
Publication of JP2535744Y2 publication Critical patent/JP2535744Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1990035550U 1990-04-02 1990-04-02 Ｉｃ試験装置 Expired - Lifetime JP2535744Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990035550U JP2535744Y2 (ja) 1990-04-02 1990-04-02 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990035550U JP2535744Y2 (ja) 1990-04-02 1990-04-02 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH03126052U true JPH03126052U (da) 1991-12-19
JP2535744Y2 JP2535744Y2 (ja) 1997-05-14

Family

ID=31541005

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990035550U Expired - Lifetime JP2535744Y2 (ja) 1990-04-02 1990-04-02 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2535744Y2 (da)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61165470U (da) * 1985-04-01 1986-10-14
JPS6373877U (da) * 1986-10-31 1988-05-17
JPH0191267U (da) * 1987-12-09 1989-06-15

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61165470U (da) * 1985-04-01 1986-10-14
JPS6373877U (da) * 1986-10-31 1988-05-17
JPH0191267U (da) * 1987-12-09 1989-06-15

Also Published As

Publication number Publication date
JP2535744Y2 (ja) 1997-05-14

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Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term