JPH03119740U - - Google Patents
Info
- Publication number
- JPH03119740U JPH03119740U JP2855290U JP2855290U JPH03119740U JP H03119740 U JPH03119740 U JP H03119740U JP 2855290 U JP2855290 U JP 2855290U JP 2855290 U JP2855290 U JP 2855290U JP H03119740 U JPH03119740 U JP H03119740U
- Authority
- JP
- Japan
- Prior art keywords
- substances
- combustion
- combustible
- unburned substances
- exhaust gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims description 2
- 239000000126 substance Substances 0.000 claims 7
- 238000002485 combustion reaction Methods 0.000 claims 4
- 238000000926 separation method Methods 0.000 claims 2
- 238000009833 condensation Methods 0.000 claims 1
- 230000005494 condensation Effects 0.000 claims 1
- 238000005070 sampling Methods 0.000 claims 1
- 238000001179 sorption measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 5
- 239000003054 catalyst Substances 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
Landscapes
- Sampling And Sample Adjustment (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
図面は本考案の実施例を示し、第１図は第１実
施例の構成図、第２図は第２実施例の構成図、第
３図は第３実施例の構成図、第４図は第４実施例
の構成図である。
１……第１サンプルガスライン、３……酸化触
媒、４……第１配管、８……差量測定式ガス分析
計、１１……第２サンプルガスライン、１２，１
２ａ，１２ｂ……第２配管、１３……トラツプ、
１３ｂ……スクラバー、１４……酸化触媒。
The drawings show embodiments of the present invention; FIG. 1 is a block diagram of the first embodiment, FIG. 2 is a block diagram of the second embodiment, FIG. 3 is a block diagram of the third embodiment, and FIG. 4 is a block diagram of the third embodiment. It is a block diagram of 4th Example. DESCRIPTION OF SYMBOLS 1... First sample gas line, 3... Oxidation catalyst, 4... First piping, 8... Differential measurement type gas analyzer, 11... Second sample gas line, 12,1
2a, 12b...second pipe, 13...trap,
13b...Scrubber, 14...Oxidation catalyst.
Claims (1)
手段を備えた第１サンプルガスラインと、前記可
燃性未燃物質の内の特定物質を吸着または結露な
どで分離する物質分離手段及び前記物質分離手段
で特定物質を分離した残りの燃焼排ガス中の可燃
性未燃物質を燃焼させる燃焼手段を備えた第２サ
ンプルガスラインとからなり、第１サンプルガス
ラインと第２サンプルガスラインの各サンプルガ
スを差量測定式ガス分析計に導入するサンプリン
グ装置。 A first sample gas line equipped with a combustion means for burning combustible unburned substances in the combustion exhaust gas, a substance separation means for separating a specific substance from the combustible and unburned substances by adsorption or condensation, and the substance separation means. a second sample gas line equipped with a combustion means for burning combustible and unburned substances in the remaining combustion exhaust gas from which specific substances have been separated; A sampling device installed in a differential measurement type gas analyzer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990028552U JP2543969Y2 (en) | 1990-03-19 | 1990-03-19 | Sampling device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990028552U JP2543969Y2 (en) | 1990-03-19 | 1990-03-19 | Sampling device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03119740U true JPH03119740U (en) | 1991-12-10 |
| JP2543969Y2 JP2543969Y2 (en) | 1997-08-13 |
Family
ID=31531347
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1990028552U Expired - Lifetime JP2543969Y2 (en) | 1990-03-19 | 1990-03-19 | Sampling device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2543969Y2 (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5731151A (en) * | 1980-08-04 | 1982-02-19 | Toshiba Corp | Automatic continuous treating device for semiconductor substrate |
| JPS5836339U (en) * | 1981-09-03 | 1983-03-09 | 横河電機株式会社 | gas sampling device |
| JPS58134767U (en) * | 1982-03-05 | 1983-09-10 | トヨタ自動車株式会社 | Device for measuring particulates in exhaust gas |
| JPS5942951U (en) * | 1982-09-14 | 1984-03-21 | 富士電機株式会社 | NOx analyzer for flue gas |
| JPS6025307A (en) * | 1983-07-21 | 1985-02-08 | Nec Corp | Microwave oscillator |
| JPS61140949U (en) * | 1985-02-22 | 1986-09-01 | ||
| JPH0239443A (en) * | 1988-07-28 | 1990-02-08 | Mitsubishi Electric Corp | Semiconductor device |
-
1990
- 1990-03-19 JP JP1990028552U patent/JP2543969Y2/en not_active Expired - Lifetime
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5731151A (en) * | 1980-08-04 | 1982-02-19 | Toshiba Corp | Automatic continuous treating device for semiconductor substrate |
| JPS5836339U (en) * | 1981-09-03 | 1983-03-09 | 横河電機株式会社 | gas sampling device |
| JPS58134767U (en) * | 1982-03-05 | 1983-09-10 | トヨタ自動車株式会社 | Device for measuring particulates in exhaust gas |
| JPS5942951U (en) * | 1982-09-14 | 1984-03-21 | 富士電機株式会社 | NOx analyzer for flue gas |
| JPS6025307A (en) * | 1983-07-21 | 1985-02-08 | Nec Corp | Microwave oscillator |
| JPS61140949U (en) * | 1985-02-22 | 1986-09-01 | ||
| JPH0239443A (en) * | 1988-07-28 | 1990-02-08 | Mitsubishi Electric Corp | Semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2543969Y2 (en) | 1997-08-13 |
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