JPH03117750U - - Google Patents

Info

Publication number
JPH03117750U
JPH03117750U JP2626590U JP2626590U JPH03117750U JP H03117750 U JPH03117750 U JP H03117750U JP 2626590 U JP2626590 U JP 2626590U JP 2626590 U JP2626590 U JP 2626590U JP H03117750 U JPH03117750 U JP H03117750U
Authority
JP
Japan
Prior art keywords
moisture
infrared
measurement
measuring device
measurement object
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2626590U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2626590U priority Critical patent/JPH03117750U/ja
Publication of JPH03117750U publication Critical patent/JPH03117750U/ja
Pending legal-status Critical Current

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Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2626590U 1990-03-15 1990-03-15 Pending JPH03117750U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2626590U JPH03117750U (enExample) 1990-03-15 1990-03-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2626590U JPH03117750U (enExample) 1990-03-15 1990-03-15

Publications (1)

Publication Number Publication Date
JPH03117750U true JPH03117750U (enExample) 1991-12-05

Family

ID=31529170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2626590U Pending JPH03117750U (enExample) 1990-03-15 1990-03-15

Country Status (1)

Country Link
JP (1) JPH03117750U (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013515248A (ja) * 2009-12-22 2013-05-02 ビューラー・アクチエンゲゼルシャフト 揺動可能な生成物を測定するための装置及び方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61209340A (ja) * 1985-03-14 1986-09-17 Chino Works Ltd 光学的測定装置
JPS62228934A (ja) * 1986-03-31 1987-10-07 Inoue Japax Res Inc 汚泥含水率測定方法
JPS6363949A (ja) * 1986-09-04 1988-03-22 Yokogawa Electric Corp シ−ト状物体の特性測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61209340A (ja) * 1985-03-14 1986-09-17 Chino Works Ltd 光学的測定装置
JPS62228934A (ja) * 1986-03-31 1987-10-07 Inoue Japax Res Inc 汚泥含水率測定方法
JPS6363949A (ja) * 1986-09-04 1988-03-22 Yokogawa Electric Corp シ−ト状物体の特性測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013515248A (ja) * 2009-12-22 2013-05-02 ビューラー・アクチエンゲゼルシャフト 揺動可能な生成物を測定するための装置及び方法

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