JPH03104236U - - Google Patents

Info

Publication number
JPH03104236U
JPH03104236U JP1070790U JP1070790U JPH03104236U JP H03104236 U JPH03104236 U JP H03104236U JP 1070790 U JP1070790 U JP 1070790U JP 1070790 U JP1070790 U JP 1070790U JP H03104236 U JPH03104236 U JP H03104236U
Authority
JP
Japan
Prior art keywords
parity
detection circuit
test device
transmitted data
memory element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1070790U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1070790U priority Critical patent/JPH03104236U/ja
Publication of JPH03104236U publication Critical patent/JPH03104236U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの考案の一実施例によるパリテイ検
出回路の試験回路構成図、第2図はこの考案の他
の実施例を示すパリテイ検出回路の試験回路構成
図、第3図は従来のパリテイ検出回路の試験回路
構成図である。 図において、1……パリテイエラー生起値設定
レジスタ、2……入力バツフア、3……比較制御
回路、4……パリテイビツト反転素子、5……出
力バツフア、6……パリテイエラー生起値設定R
AM、7……パリテイエラー設定回路である。な
お、図中、同一符号は同一、又は相当部分を示す
Fig. 1 is a test circuit configuration diagram of a parity detection circuit according to one embodiment of this invention, Fig. 2 is a test circuit diagram of a parity detection circuit showing another embodiment of this invention, and Fig. 3 is a conventional parity detection circuit diagram. It is a test circuit configuration diagram of a circuit. In the figure, 1... Parity error occurrence value setting register, 2... Input buffer, 3... Comparison control circuit, 4... Parity bit inversion element, 5... Output buffer, 6... Parity error occurrence value setting R.
AM, 7... Parity error setting circuit. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] パリテイ検出回路の試験をする試験装置におい
て、パリテイエラーを生起させるパターンを格納
する記憶素子と、その記憶素子の内容と伝送デー
タを比較し制御する比較制御回路と伝送データの
パリテイビツトを反転する素子と入出力のバツフ
アを備えた瞬時的なパリテイエラーの発生試験を
可能にしたことを特徴とするパリテイ検出回路の
試験装置。
A test device that tests a parity detection circuit includes a memory element that stores a pattern that causes a parity error, a comparison control circuit that compares and controls the contents of the memory element and transmitted data, and an element that inverts the parity bit of the transmitted data. A test device for a parity detection circuit, characterized in that it is capable of testing the occurrence of an instantaneous parity error with an input/output buffer.
JP1070790U 1990-02-06 1990-02-06 Pending JPH03104236U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1070790U JPH03104236U (en) 1990-02-06 1990-02-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1070790U JPH03104236U (en) 1990-02-06 1990-02-06

Publications (1)

Publication Number Publication Date
JPH03104236U true JPH03104236U (en) 1991-10-29

Family

ID=31514265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1070790U Pending JPH03104236U (en) 1990-02-06 1990-02-06

Country Status (1)

Country Link
JP (1) JPH03104236U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010044490A (en) * 2008-08-11 2010-02-25 Alps Electric Co Ltd Multi-directional input device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010044490A (en) * 2008-08-11 2010-02-25 Alps Electric Co Ltd Multi-directional input device

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