JPH03103636U - - Google Patents
Info
- Publication number
- JPH03103636U JPH03103636U JP1100990U JP1100990U JPH03103636U JP H03103636 U JPH03103636 U JP H03103636U JP 1100990 U JP1100990 U JP 1100990U JP 1100990 U JP1100990 U JP 1100990U JP H03103636 U JPH03103636 U JP H03103636U
- Authority
- JP
- Japan
- Prior art keywords
- phase
- loop filter
- clock signal
- frequency difference
- detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims 3
- 230000003044 adaptive effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1100990U JPH03103636U (fr) | 1990-02-05 | 1990-02-05 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1100990U JPH03103636U (fr) | 1990-02-05 | 1990-02-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03103636U true JPH03103636U (fr) | 1991-10-28 |
Family
ID=31514553
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1100990U Pending JPH03103636U (fr) | 1990-02-05 | 1990-02-05 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03103636U (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4718388B2 (ja) * | 2006-07-28 | 2011-07-06 | 旭化成エレクトロニクス株式会社 | 周波数比較回路、pll周波数シンセサイザテスト回路及びそのテスト方法 |
-
1990
- 1990-02-05 JP JP1100990U patent/JPH03103636U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4718388B2 (ja) * | 2006-07-28 | 2011-07-06 | 旭化成エレクトロニクス株式会社 | 周波数比較回路、pll周波数シンセサイザテスト回路及びそのテスト方法 |