JPH0310174A - Contact deficiency sensing system - Google Patents

Contact deficiency sensing system

Info

Publication number
JPH0310174A
JPH0310174A JP1146390A JP14639089A JPH0310174A JP H0310174 A JPH0310174 A JP H0310174A JP 1146390 A JP1146390 A JP 1146390A JP 14639089 A JP14639089 A JP 14639089A JP H0310174 A JPH0310174 A JP H0310174A
Authority
JP
Japan
Prior art keywords
contact
test
section
pkg
bad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1146390A
Other languages
Japanese (ja)
Inventor
Kazumi Banno
番野 一美
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Gunma Ltd
Original Assignee
NEC Gunma Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Gunma Ltd filed Critical NEC Gunma Ltd
Priority to JP1146390A priority Critical patent/JPH0310174A/en
Publication of JPH0310174A publication Critical patent/JPH0310174A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To achieve a higher reliability of testing by applying a voltage between a pair of test pins at a contact section to control a system judging a contact condition of the test pins to eliminate erroneous diagnosis caused by a bad contact. CONSTITUTION:First, a printed wiring board PKG desired to be inspected is mounted on a mechanical driving section 3 and a contact section 1 comprising test pins having a pair of test pins with a mechanical driving section 3 is brought into contact with the same test point of the PKG. Then, with a control section 2, it is judged whether a contact between the contact section 1 and the test point is good or bad and when the contact is bad, the mechanical driving section 3 is operated by a signal from the control section 2 to separate the contact section 1 from the PKG. Then, the contact section 1 is brought into contact with the test point of the PKG to judge whether contact with the test point is good or bad. If the contact is good, a signal of the contact section 1 is switched over to a testing section 4 from the control section 2 to perform a test. Then, after the implementing of the test, the PKG is removed to end the test.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、接触不良感知システム、特に1テストピンと
PKGの接触不良を感知する接触不良感知システムに関
する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a contact failure sensing system, and particularly to a contact failure detection system for sensing a contact failure between one test pin and a PKG.

〔、・従来の技術〕[,・Conventional technology]

従来、この種の電気検査は第4図に示すように1端子1
本のテストビンを有するテストピン群をPKGのテスト
ポイントに接触させ、その時テストポイントとテストビ
ンの接触の良、不良を確認すること無く試験を実施して
いた。
Conventionally, this type of electrical inspection has been performed using one terminal and one terminal as shown in Figure 4.
A group of test pins having a real test bottle was brought into contact with a test point of the PKG, and the test was conducted without confirming whether the contact between the test point and the test bottle was good or bad.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の電気検査システムはテストビン群とPK
Gのテストポイントとの接触の良、不良を確認すること
無く試験を実施しているため実施した試験結果が不良と
判定された場合本当の不良でNGになったのか、テスト
ビンの接触不良によってNGとなったのか疑がわしい場
合試験終了後もう一度はじめから試験を実施して判断し
ていたためテストの信頼性が低いばかりでなくテスト時
間が余計にかかり試験効率が悪いという欠点がある。
The conventional electrical inspection system described above consists of a group of test bins and a PK
Since the test was conducted without checking whether the contact with the G test point was good or bad, if the test result was determined to be defective, it may be NG due to a real defect or NG due to poor contact with the test bottle. If there is any doubt as to whether the test has been completed or not, the test must be repeated from the beginning after the test is completed, which not only has low test reliability, but also requires additional testing time, resulting in low test efficiency.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の接触不良感知システムは (a)  電気的に絶縁されており、それぞれ独立して
動作する1端子に対して1対のテストピンを有する接触
部、 (b)  前記接触部の1対のテストピン間に電圧を印
加してテストピンの接触状態を判断しシステムを制御す
る制御部、 (C)  前記制御部によってPKGとテストピンを接
触させたり離したりする入力駆動部、 (d)PKGとテストピンが接触OKとなった後実際の
試験を実施する試験部、 とを含んで構成される。
The poor contact detection system of the present invention includes (a) a contact portion having a pair of test pins for one terminal that are electrically insulated and each operating independently; (b) a pair of test pins of the contact portion; a control unit that applies a voltage between the test pins to judge the contact state of the test pins and controls the system; (C) an input drive unit that causes the control unit to bring the PKG and the test pin into contact or apart; (d) a PKG and a test section that conducts the actual test after the test pins have made contact.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の一実施例のブロック図である。FIG. 1 is a block diagram of one embodiment of the present invention.

電気的に絶縁されておりそれぞれが独立して動作する1
端子に対して1対のテストピンを有する接触部IK制御
部2から接触確認信号を出し次に接触部1から接触状態
を示す信号を制御部2釦取り込むことKよりテストポイ
ントに対して接触部1が確実に接触しているかどうかを
制御部2が判断しもし、接触NGであれば制御部2から
メカ駆動部3KPKGの脱着動作をするための信号を送
り、接触OKであれば接触部lからの信号を制御部2に
よって試験部41C切替えて試験を実施する。
Electrically isolated and each operates independently1
A contact part IK having a pair of test pins is sent to the terminal from the control part 2, and then a signal indicating the contact state is taken in from the contact part 1 to the control part 2 button. The control unit 2 determines whether the contact portion 1 is securely in contact with the mechanical drive unit 3KPKG, and if the contact is NG, the control unit 2 sends a signal to perform the attachment/detachment operation of the mechanical drive unit 3KPKG, and if the contact is OK, the contact portion l The control unit 2 switches the signal from the test unit 41C to carry out the test.

第3図は第1図の動作を示すフローチャートである。FIG. 3 is a flowchart showing the operation of FIG. 1.

まず検査しようとするPKGをメカ駆動部忙装着(St
ep 1) シ、入力駆動部によって1対のテストピン
を有するラストビン群から成る接触部とPKGの同一テ
ストポイントを接触させ(S tep 2)、その時接
触部とテストポイントとの接触がOKかNGかを制御部
で判断(Step 3 )、L、もし接触NGであれば
制御部からの信号でメカ慰動部を動作させ接触部とPK
Gを一担離しく5tep4)、もう−度接触部とPKG
のテストポイントを接触させてテストポイントとの接触
がOKかNGかを判断しもし接触OKであれば接触部の
信号の制御部から試験部に切替えて、試験を実施(St
ep5)l、、試験実施後PKGをはずして(Step
6)、試験は終了(Step7)とする。
First, the PKG to be inspected is attached to the mechanical drive unit (St.
ep 1) Use the input drive unit to bring the contact part consisting of the last bin group having a pair of test pins into contact with the same test point on the PKG (Step 2), and then check whether the contact between the contact part and the test point is OK or NG. The control unit determines whether the contact is NG (Step 3), and if the contact is NG, the mechanical moving part is operated by a signal from the control unit to connect the contact part and PK.
Remove G by one step 5 step 4), and then touch the contact part and PKG again.
Contact the test point to determine whether the contact with the test point is OK or NG. If the contact is OK, switch the signal control section of the contact section to the test section and conduct the test (St.
ep5) After the test, remove the PKG (Step
6), the test is finished (Step 7).

第2図(a)〜(C)は、第1図に示す接触部の縦断面
図及び左右の横断面図である。
FIGS. 2(a) to 2(C) are a longitudinal cross-sectional view and a left and right cross-sectional view of the contact portion shown in FIG. 1.

接触部はりセプタクル9とリセプタクル13が絶縁保持
部10で結合されており電気的Ke縁されていて接点ピ
ン8と接点ビン14はそれぞれ独立してスプリング11
とスプリング151Cよって摺動じ、シw −)防止板
12は絶縁保持部10に固定されていて接点ビン8と接
点ピン14がテストポイントと接触した時にお互いがシ
曹−トするのを防いでいる。
The contact beam receptacle 9 and the receptacle 13 are connected by an insulating holding part 10 and electrically connected, and the contact pin 8 and the contact pin 14 are each independently connected to a spring 11.
The prevention plate 12 is fixed to the insulating holding part 10 and prevents the contact pin 8 and the contact pin 14 from coming into contact with each other when they come into contact with the test point. .

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明の接触不良感完システムは、
従来の検査システムのよう忙テストピンとPKGのテス
トポイントとの接触不良を確認すること無く試験を実施
していたのに対し接触部から接触信号を感知して試験を
実施できるため、接触不良による誤診断が無くなり試験
の信頼性が著しく高くなり従来誤診断確認のための再試
験が不必要となりテスト時間の効率化が計れることによ
りPKGの検査工種を極めて容易に自動化するこことが
できる効果がある。
As explained above, the contact failure feeling completion system of the present invention has the following features:
Unlike conventional inspection systems, which conduct tests without checking for poor contact between busy test pins and PKG test points, testing can be performed by sensing contact signals from the contact points, eliminating errors caused by poor contact. Since there is no need for diagnosis, the reliability of the test is significantly increased, and re-testing to confirm a wrong diagnosis is no longer necessary, which improves the efficiency of testing time, which has the effect of making it possible to automate the PKG inspection process extremely easily. .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例のブロック図、第2図(a)
〜(c)は第1図に示す接触部の一例の縦断面図及び左
右の横断面図、第3図は本発明の一実施例のフローチャ
ート、第4図は従来の一例を示すフローチャートである
。 1・・・・・・接触部、2・・・・・・制御部、3・・
・・・・メカ駆動部、4・・・・・・試験部、8・・・
・・・接点ピン、9・・・・・・リセプタクル、10・
・・・・・絶縁保持部、11・・・・・・スプリング、
12・・・・・・シ冒−ト防止板、13・・・・・・リ
セプタクル、14・・・・・・接点ビン、15・・・・
・・スプリング。
Fig. 1 is a block diagram of an embodiment of the present invention, Fig. 2(a)
~(c) is a vertical cross-sectional view and a left and right cross-sectional view of an example of the contact portion shown in FIG. 1, FIG. 3 is a flowchart of an embodiment of the present invention, and FIG. 4 is a flowchart of a conventional example. . 1...Contact part, 2...Control part, 3...
...Mechanical drive section, 4...Test section, 8...
...Contact pin, 9...Receptacle, 10.
...Insulation holding part, 11...Spring,
12...Shutdown prevention plate, 13...Receptacle, 14...Contact bottle, 15...
··spring.

Claims (1)

【特許請求の範囲】[Claims] プリント配線基板(以降PKGと書く)組立電気検査用
テスターにおいて1接点部に対して1対のスプリングプ
ローブを有する接触部と、該接触部の1対のスプリング
プロブ間に電気信号を与えると共に該電気信号を与えた
結果によって生ずる電気信号を感知する制御部と、該制
御部からの信号で動作し、PKGをセットし接触部とP
KGを接触させる入力駆動部とより成る接触不良感知シ
ステム。
In a printed wiring board (hereinafter referred to as PKG) assembly electrical inspection tester, an electric signal is applied between a contact part having a pair of spring probes for one contact part, and the pair of spring probes of the contact part, and the electric signal is A control section that senses the electrical signal generated by the result of applying the signal, and a control section that operates based on the signal from the control section, sets the PKG, and connects the contact section and P.
A poor contact detection system consisting of an input drive unit that contacts the KG.
JP1146390A 1989-06-07 1989-06-07 Contact deficiency sensing system Pending JPH0310174A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1146390A JPH0310174A (en) 1989-06-07 1989-06-07 Contact deficiency sensing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1146390A JPH0310174A (en) 1989-06-07 1989-06-07 Contact deficiency sensing system

Publications (1)

Publication Number Publication Date
JPH0310174A true JPH0310174A (en) 1991-01-17

Family

ID=15406619

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1146390A Pending JPH0310174A (en) 1989-06-07 1989-06-07 Contact deficiency sensing system

Country Status (1)

Country Link
JP (1) JPH0310174A (en)

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