JPH0299374U - - Google Patents
Info
- Publication number
- JPH0299374U JPH0299374U JP789089U JP789089U JPH0299374U JP H0299374 U JPH0299374 U JP H0299374U JP 789089 U JP789089 U JP 789089U JP 789089 U JP789089 U JP 789089U JP H0299374 U JPH0299374 U JP H0299374U
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- drain voltage
- output
- drain
- power supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims description 2
- 230000005669 field effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989007890U JPH0736298Y2 (ja) | 1989-01-26 | 1989-01-26 | 測定用電源 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989007890U JPH0736298Y2 (ja) | 1989-01-26 | 1989-01-26 | 測定用電源 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0299374U true JPH0299374U (it) | 1990-08-08 |
JPH0736298Y2 JPH0736298Y2 (ja) | 1995-08-16 |
Family
ID=31213293
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1989007890U Expired - Fee Related JPH0736298Y2 (ja) | 1989-01-26 | 1989-01-26 | 測定用電源 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0736298Y2 (it) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07151820A (ja) * | 1993-11-29 | 1995-06-16 | Hodaka Denshi Gijutsu Kenkyusho:Kk | 耐圧試験装置 |
WO2004104606A1 (ja) * | 2003-05-21 | 2004-12-02 | Advantest Corporation | 電源装置、試験装置及び電源電圧安定化装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5824870A (ja) * | 1981-08-05 | 1983-02-14 | Nec Corp | 半導体素子試験装置 |
-
1989
- 1989-01-26 JP JP1989007890U patent/JPH0736298Y2/ja not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5824870A (ja) * | 1981-08-05 | 1983-02-14 | Nec Corp | 半導体素子試験装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07151820A (ja) * | 1993-11-29 | 1995-06-16 | Hodaka Denshi Gijutsu Kenkyusho:Kk | 耐圧試験装置 |
WO2004104606A1 (ja) * | 2003-05-21 | 2004-12-02 | Advantest Corporation | 電源装置、試験装置及び電源電圧安定化装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0736298Y2 (ja) | 1995-08-16 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |