JPH0299351U - - Google Patents

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Publication number
JPH0299351U
JPH0299351U JP644689U JP644689U JPH0299351U JP H0299351 U JPH0299351 U JP H0299351U JP 644689 U JP644689 U JP 644689U JP 644689 U JP644689 U JP 644689U JP H0299351 U JPH0299351 U JP H0299351U
Authority
JP
Japan
Prior art keywords
reagent
amount
function
remaining
dispensing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP644689U
Other languages
English (en)
Other versions
JP2503751Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989006446U priority Critical patent/JP2503751Y2/ja
Publication of JPH0299351U publication Critical patent/JPH0299351U/ja
Application granted granted Critical
Publication of JP2503751Y2 publication Critical patent/JP2503751Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Automatic Analysis And Handling Materials Therefor (AREA)

Description

【図面の簡単な説明】
第１図は本案の一実施例を示す概略図、第２図
は第１図の試薬デイスクの測定時における説明図
である。 １０……試薬残量判別機能付試薬分注プローブ
、１２……試薬デイスク、１３……試薬ビン、ａ
……試薬ビンポジシヨンａ、ｂ……試薬ビンポジ
シヨンｂ、ｃ……試薬ビンポジシヨンｃ。

Claims (1)

    【実用新案登録請求の範囲】
  1. 試薬残量判別機能を有する自動分析装置におい
    て、試薬残量が一定量以下になると自動的に試薬
    ポジシヨンを変更し、新しいポジシヨンから同一
    試薬を分注する機能を設けたことを特徴とする自
    動分析装置。
JP1989006446U 1989-01-25 1989-01-25 自動分析装置 Expired - Lifetime JP2503751Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989006446U JP2503751Y2 (ja) 1989-01-25 1989-01-25 自動分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989006446U JP2503751Y2 (ja) 1989-01-25 1989-01-25 自動分析装置

Publications (2)

Publication Number Publication Date
JPH0299351U true JPH0299351U (ja) 1990-08-08
JP2503751Y2 JP2503751Y2 (ja) 1996-07-03

Family

ID=31210632

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989006446U Expired - Lifetime JP2503751Y2 (ja) 1989-01-25 1989-01-25 自動分析装置

Country Status (1)

Country Link
JP (1) JP2503751Y2 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008304481A (ja) * 2008-09-19 2008-12-18 Sysmex Corp 自動分析装置
JP2013120161A (ja) * 2011-12-08 2013-06-17 Hitachi High-Technologies Corp 自動分析装置
US8920722B2 (en) 2006-06-30 2014-12-30 Sysmex Corporation Sample analyzer and sample analyzing method

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4439024B2 (ja) * 1998-12-03 2010-03-24 株式会社東芝 自動分析装置
JP3873039B2 (ja) 2003-05-14 2007-01-24 株式会社日立ハイテクノロジーズ 自動分析装置
JP5178891B2 (ja) * 2011-08-23 2013-04-10 株式会社日立ハイテクノロジーズ 自動分析装置
JP6622665B2 (ja) * 2016-07-26 2019-12-18 株式会社日立ハイテクノロジーズ 電解質濃度測定装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60207061A (ja) * 1984-03-31 1985-10-18 Toshiba Corp 自動化学分析装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60207061A (ja) * 1984-03-31 1985-10-18 Toshiba Corp 自動化学分析装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8920722B2 (en) 2006-06-30 2014-12-30 Sysmex Corporation Sample analyzer and sample analyzing method
JP2008304481A (ja) * 2008-09-19 2008-12-18 Sysmex Corp 自動分析装置
JP4567776B2 (ja) * 2008-09-19 2010-10-20 シスメックス株式会社 自動分析装置
JP2013120161A (ja) * 2011-12-08 2013-06-17 Hitachi High-Technologies Corp 自動分析装置

Also Published As

Publication number Publication date
JP2503751Y2 (ja) 1996-07-03

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Legal Events

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