JPH029884U - - Google Patents
Info
- Publication number
- JPH029884U JPH029884U JP8918988U JP8918988U JPH029884U JP H029884 U JPH029884 U JP H029884U JP 8918988 U JP8918988 U JP 8918988U JP 8918988 U JP8918988 U JP 8918988U JP H029884 U JPH029884 U JP H029884U
- Authority
- JP
- Japan
- Prior art keywords
- analog
- large number
- analog switches
- circuit tester
- interposed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims description 4
- 239000000523 sample Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 4
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988089189U JPH0743667Y2 (ja) | 1988-07-05 | 1988-07-05 | インサーキットテスタ用アナログマルチプレクサ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988089189U JPH0743667Y2 (ja) | 1988-07-05 | 1988-07-05 | インサーキットテスタ用アナログマルチプレクサ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH029884U true JPH029884U (enExample) | 1990-01-22 |
| JPH0743667Y2 JPH0743667Y2 (ja) | 1995-10-09 |
Family
ID=31313743
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988089189U Expired - Lifetime JPH0743667Y2 (ja) | 1988-07-05 | 1988-07-05 | インサーキットテスタ用アナログマルチプレクサ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0743667Y2 (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01250870A (ja) * | 1988-03-31 | 1989-10-05 | Toshiba Corp | インサーキットテスト装置 |
-
1988
- 1988-07-05 JP JP1988089189U patent/JPH0743667Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01250870A (ja) * | 1988-03-31 | 1989-10-05 | Toshiba Corp | インサーキットテスト装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0743667Y2 (ja) | 1995-10-09 |