JPH0296700U - - Google Patents

Info

Publication number
JPH0296700U
JPH0296700U JP258689U JP258689U JPH0296700U JP H0296700 U JPH0296700 U JP H0296700U JP 258689 U JP258689 U JP 258689U JP 258689 U JP258689 U JP 258689U JP H0296700 U JPH0296700 U JP H0296700U
Authority
JP
Japan
Prior art keywords
memory
fail
signal
counter
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP258689U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP258689U priority Critical patent/JPH0296700U/ja
Publication of JPH0296700U publication Critical patent/JPH0296700U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP258689U 1989-01-12 1989-01-12 Pending JPH0296700U (US07223432-20070529-C00017.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP258689U JPH0296700U (US07223432-20070529-C00017.png) 1989-01-12 1989-01-12

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP258689U JPH0296700U (US07223432-20070529-C00017.png) 1989-01-12 1989-01-12

Publications (1)

Publication Number Publication Date
JPH0296700U true JPH0296700U (US07223432-20070529-C00017.png) 1990-08-01

Family

ID=31203481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP258689U Pending JPH0296700U (US07223432-20070529-C00017.png) 1989-01-12 1989-01-12

Country Status (1)

Country Link
JP (1) JPH0296700U (US07223432-20070529-C00017.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008020238A (ja) * 2006-07-11 2008-01-31 Yokogawa Electric Corp 信号処理装置及び半導体集積回路試験装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5721000A (en) * 1980-07-14 1982-02-03 Nec Corp Memory measuring device
JPS62204500A (ja) * 1986-03-04 1987-09-09 Mitsubishi Electric Corp 多出力冗長回路付メモリicのテスト装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5721000A (en) * 1980-07-14 1982-02-03 Nec Corp Memory measuring device
JPS62204500A (ja) * 1986-03-04 1987-09-09 Mitsubishi Electric Corp 多出力冗長回路付メモリicのテスト装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008020238A (ja) * 2006-07-11 2008-01-31 Yokogawa Electric Corp 信号処理装置及び半導体集積回路試験装置
JP4706577B2 (ja) * 2006-07-11 2011-06-22 横河電機株式会社 信号処理装置及び半導体集積回路試験装置

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