JPH0295873U - - Google Patents

Info

Publication number
JPH0295873U
JPH0295873U JP462989U JP462989U JPH0295873U JP H0295873 U JPH0295873 U JP H0295873U JP 462989 U JP462989 U JP 462989U JP 462989 U JP462989 U JP 462989U JP H0295873 U JPH0295873 U JP H0295873U
Authority
JP
Japan
Prior art keywords
power supply
common potential
transistor
diode
whose
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP462989U
Other languages
Japanese (ja)
Other versions
JPH0719011Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP462989U priority Critical patent/JPH0719011Y2/en
Publication of JPH0295873U publication Critical patent/JPH0295873U/ja
Application granted granted Critical
Publication of JPH0719011Y2 publication Critical patent/JPH0719011Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measurement Of Current Or Voltage (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Emergency Protection Circuit Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案に係る電源監視装置の要部構成
例を示す図、第2図は従来例を示す図である。 R1〜R3……抵抗、Q1……トランジスタ、
Q2……FET、D1……ダイオード。
FIG. 1 is a diagram showing an example of the main part configuration of a power supply monitoring device according to the present invention, and FIG. 2 is a diagram showing a conventional example. R1 to R3...Resistor, Q1...Transistor,
Q2...FET, D1...diode.

Claims (1)

【実用新案登録請求の範囲】 +Ev電源と−Ev電源の供給停止を監視する
装置において、 前記監視対象の2つの電源電圧間を分圧する抵
抗分圧手段R1,R2と、 この抵抗分圧手段の分圧電圧をベースに導入し
、エミツタを−Ev電源に接続するトランジスタ
と、 このトランジスタのコレクタにカソードが接続
され、抵抗R3を介して共通電位にアノードが接
続されたダイオードと、 このダイオードのアノードにゲートが接続され
、ソースが共通電位に接続され、ドレインから警
報信号を出力する電界効果型トランジスタ(以下
単にFETと記す)と、 を備えた電源監視装置。
[Claims for Utility Model Registration] A device for monitoring the supply stop of +Ev power supply and -Ev power supply, comprising resistive voltage dividing means R1 and R2 for dividing the voltage between the two power supply voltages to be monitored; A transistor whose emitter is connected to the -Ev power supply by introducing a divided voltage into the base, a diode whose cathode is connected to the collector of this transistor, and whose anode is connected to a common potential via a resistor R3; and an anode of this diode. A power supply monitoring device comprising: a field effect transistor (hereinafter simply referred to as FET) having a gate connected to a common potential, a source connected to a common potential, and a drain outputting an alarm signal.
JP462989U 1989-01-19 1989-01-19 Power supply monitoring device Expired - Lifetime JPH0719011Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP462989U JPH0719011Y2 (en) 1989-01-19 1989-01-19 Power supply monitoring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP462989U JPH0719011Y2 (en) 1989-01-19 1989-01-19 Power supply monitoring device

Publications (2)

Publication Number Publication Date
JPH0295873U true JPH0295873U (en) 1990-07-31
JPH0719011Y2 JPH0719011Y2 (en) 1995-05-01

Family

ID=31207308

Family Applications (1)

Application Number Title Priority Date Filing Date
JP462989U Expired - Lifetime JPH0719011Y2 (en) 1989-01-19 1989-01-19 Power supply monitoring device

Country Status (1)

Country Link
JP (1) JPH0719011Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010210238A (en) * 2009-03-06 2010-09-24 Renesas Electronics Corp Probe card, semiconductor inspection device equipped with the same and method for checking fuse of probe card

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010210238A (en) * 2009-03-06 2010-09-24 Renesas Electronics Corp Probe card, semiconductor inspection device equipped with the same and method for checking fuse of probe card

Also Published As

Publication number Publication date
JPH0719011Y2 (en) 1995-05-01

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