JPH0292482A - Laser boring device - Google Patents
Laser boring deviceInfo
- Publication number
- JPH0292482A JPH0292482A JP63244118A JP24411888A JPH0292482A JP H0292482 A JPH0292482 A JP H0292482A JP 63244118 A JP63244118 A JP 63244118A JP 24411888 A JP24411888 A JP 24411888A JP H0292482 A JPH0292482 A JP H0292482A
- Authority
- JP
- Japan
- Prior art keywords
- light
- laser
- reflected
- laser light
- oscillator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 18
- 229910052802 copper Inorganic materials 0.000 claims abstract description 18
- 239000010949 copper Substances 0.000 claims abstract description 18
- 238000005553 drilling Methods 0.000 claims description 11
- 239000002131 composite material Substances 0.000 claims description 4
- 239000012212 insulator Substances 0.000 claims description 4
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 claims 2
- 229910002092 carbon dioxide Inorganic materials 0.000 claims 1
- 239000001569 carbon dioxide Substances 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract description 3
- 239000011810 insulating material Substances 0.000 abstract description 2
- 230000005540 biological transmission Effects 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 14
- 239000000463 material Substances 0.000 description 5
- 229910000831 Steel Inorganic materials 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 239000010959 steel Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
- B23K26/382—Removing material by boring or cutting by boring
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Laser Beam Processing (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、プリント基板のように鋼材が埋設された材料
に穴を堀るC Ozレーザ加工装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a COz laser processing device for drilling a hole in a material in which steel is embedded, such as a printed circuit board.
本発明に最も近い公知例として、特開昭59−゛277
91号公報があるが、この公知例では、加工状態を検出
するために加工用レーザ光以外に、検出用光源を別個に
設置し、同検出光の反射を分離する光学系を必要として
いる。As a known example closest to the present invention, JP-A No. 59-277
In this known example, in order to detect the processing state, a detection light source is installed separately in addition to the processing laser beam, and an optical system is required to separate the reflection of the detection light.
本発明は絶縁物の中に銅板が埋設されたプリント基板等
の複合材で絶縁物のみに穴あけを行ない、埋設銅板部で
穴を非貫通として、且つ、同銅板に対する損傷を最少に
することを目的とする。The present invention is a composite material such as a printed circuit board in which a copper plate is embedded in an insulator, and the hole is drilled only in the insulator, so that the hole does not penetrate through the buried copper plate and damage to the copper plate is minimized. purpose.
この目的に対し、前述の公知例では検出用ビームを加工
ビームに重ねて照射し、その反射光を検出している。し
かし、検出用のレーザ光源は。For this purpose, in the above-mentioned known example, a detection beam is irradiated to overlap the processing beam, and the reflected light is detected. However, the laser light source for detection.
般に数mw〜1w以下のものであり、検出感度が低く、
ノイズに対する信号弁別等の面で信頼性が低い、又は、
加工レーザ光と検出用レーザ光の二種類の波長を選択的
に透過反射させる光学部品は加工用の高出力レーザでは
実現が困難な点があり、光路等も複雑になる欠点がある
。Generally, it is several mw to 1w or less, and the detection sensitivity is low.
The reliability is low in terms of signal discrimination against noise, or
It is difficult to realize an optical component that selectively transmits and reflects two wavelengths of processing laser light and detection laser light using a high-power laser for processing, and the optical path etc. are also complicated.
本発明では、加工用ビームで穴あけを実施し。 In the present invention, drilling is performed using a processing beam.
加工のため照射した光と、加工物からの同ビームの反射
光を、常時、検出比較する構成としたため、検出感度が
あがる。The light emitted for processing and the reflected light of the same beam from the workpiece are constantly detected and compared, increasing detection sensitivity.
加工用レーザ光について、加工点より前に開光の一部を
検出するセンサと、加工点より反射される同レーザ光波
長成分を検出するセンサとを設け、両者の相対比較を行
なうことで、加工中の材質からの反射光量を測定する。For processing laser light, we installed a sensor that detects a part of the light beam before the processing point and a sensor that detects the wavelength component of the same laser beam reflected from the processing point, and made a relative comparison between the two. Measure the amount of light reflected from the material inside.
従って、検出用の光に加工用高出力レーザを使用するた
め、検出感度が大きくとれ、ノイズ等の影響が少なくな
る。Therefore, since a high-output laser for processing is used as the detection light, the detection sensitivity can be increased and the influence of noise etc. can be reduced.
第1図に本発明の実施例を示すa COzレーザ発振器
10より出力されたレーザ光12は、12の波長成分に
対して数%を透過させ、可視光に対して不透過な分光特
性をもつ部分透過ミラー21により、加工ワーク40へ
向けてレーザ光14が照射され、集光レンズ21の作用
により加工ワーク40へ高いエネルギ密度のレーザ光が
照射される。21についてはGaAs材などに部分反射
コーティングを施して所要の特性が得られる。一方、加
工ワーク40に照射されたレーザ光が加工点で反射光を
発生すると、部分透過ミラー21へ向けて反射光15と
なって反射され部分反射鏡21に到達した時点で、レー
ザ光と同波長成分光の一部が透過する。部分反射鏡21
の作用により、透過するレーザ光131反射光16はC
Oz レーザ光の波長成分となって集光レンズ23.2
4を介して光量センサ25A、25Bによって光量が測
定される。すなわち、光量センサ25Aは、レーザ発振
器10の出力ビームの光量を、光量検出センサ25Bは
加工ワーク40からのCO2レ一ザ成分の光量を測定す
ることができ、この信号を演算回路27で比をとること
により入射光に対する反射光の比率を計算し、比較回路
29で、予め設定された基準値28と比較して、反射光
比率が大きくなった場合に、発振器の制御部30に停止
指令を送出する。FIG. 1 shows an embodiment of the present invention. A laser beam 12 output from a COz laser oscillator 10 has spectral characteristics that transmit several percent of 12 wavelength components and do not transmit visible light. The partially transmitting mirror 21 irradiates the workpiece 40 with laser light 14, and the condensing lens 21 irradiates the workpiece 40 with laser light of high energy density. Regarding No. 21, the desired characteristics can be obtained by applying a partial reflection coating to a GaAs material or the like. On the other hand, when the laser beam irradiated onto the workpiece 40 generates reflected light at the processing point, it is reflected toward the partially transmitting mirror 21 as reflected light 15, and when it reaches the partially reflecting mirror 21, it is the same as the laser beam. Part of the wavelength component light is transmitted. Partial reflector 21
Due to the action of C, the transmitted laser light 131 and reflected light 16 are
Oz becomes the wavelength component of the laser beam and passes through the condensing lens 23.2
The amount of light is measured by light amount sensors 25A and 25B via 4. That is, the light amount sensor 25A can measure the amount of light of the output beam of the laser oscillator 10, and the light amount detection sensor 25B can measure the amount of light of the CO2 laser component from the workpiece 40, and the arithmetic circuit 27 calculates the ratio of these signals. The comparison circuit 29 calculates the ratio of reflected light to the incident light, compares it with a preset reference value 28, and issues a stop command to the oscillator control unit 30 when the reflected light ratio becomes large. Send.
一方、加工物40は、絶縁層41とその中に埋設された
胴部片42との複合材料であり、プリント基板などでよ
くみられる構成である。最近のプリント板技術では、こ
の絶縁物に穴あけを行ない、且つ、鋼材に対しては穴を
あけずに損傷の無い状態を保持した非貫通穿孔技術が求
められている。On the other hand, the workpiece 40 is a composite material of an insulating layer 41 and a body piece 42 embedded therein, and has a structure often seen in printed circuit boards and the like. In recent printed circuit board technology, there is a need for a non-through drilling technique that allows holes to be drilled into this insulator, but also to maintain an undamaged state without drilling holes in the steel material.
この用途には鋼材に対して反射率が高いCO2レーザ光
(入=10.6μm)が適しているが、このようなプリ
ント基板の穿孔では、−枚の基板に数十個の穴あけを行
なうため、六が銅層に到達し、銅層への損傷がないこと
を保証する高信頼穴あけ技術が要求されている。CO2 laser light (input = 10.6 μm), which has a high reflectivity for steel materials, is suitable for this purpose, but when drilling such printed circuit boards, it is necessary to drill dozens of holes in one board. , a reliable drilling technique is required to ensure that the holes reach the copper layer and there is no damage to the copper layer.
第2図は、この様な複合材にG O2レーザを照射した
時の反射光の成分を示したものである。絶縁材41を加
工している時は、可視光域の発光が認められるが、銅層
に至ると銅の高い反射率の作用でレーザ光が、直接1反
射される。FIG. 2 shows the components of reflected light when such a composite material is irradiated with a GO2 laser. While processing the insulating material 41, visible light emission is observed, but when it reaches the copper layer, the laser light is directly reflected due to the high reflectance of copper.
この特性を利用して、銅層にレーザ穿孔が到達した時点
で、レーザを停止させる方法について、第3図を用いて
説明する。レーザ光12が照射されると、ワーク上では
、先づ、絶縁層41が加工穿孔される。この時、レーザ
光12の光の一部は部分反射鏡21を通してレーザ光1
3の光となって光量検出センサ25Aで、常に、光量が
検出されている。又、ワーク40からの反射光は絶縁層
41を加工中は、はとんど可視光域であるため、反射さ
れた光は部分反射鏡21のミラ一部で透過が阻止されて
光量検出センサ25Bへの出力は現われない。穿孔加工
が進み、銅層42に穴が到達すると、反射光14に10
.6μmの光の大部分が反射され(銅の反射率、約98
%)るため1反射光16の光量は、レーザ光13の光量
と同程度となって、光量検出センサ25Bの出力となっ
て現われる。従って、回路27の出力値と基準値28を
比較すれば、穿孔が銅層に到達したことを直ちに検出で
き、レーザ発振器10を停止させて銅層への損傷をなく
すことができる。A method of utilizing this characteristic to stop the laser when the laser perforation reaches the copper layer will be described with reference to FIG. When the laser beam 12 is irradiated, the insulating layer 41 is first perforated on the workpiece. At this time, a part of the laser beam 12 passes through the partial reflection mirror 21.
3, and the light amount is always detected by the light amount detection sensor 25A. Furthermore, since the reflected light from the workpiece 40 is mostly in the visible light range while the insulating layer 41 is being processed, the reflected light is blocked by a portion of the mirror of the partial reflecting mirror 21 and is detected by the light amount detection sensor. No output to 25B appears. As the drilling progresses and the hole reaches the copper layer 42, the reflected light 14
.. Most of the 6 μm light is reflected (reflectance of copper, approximately 98
%), the amount of one reflected light 16 is approximately the same as the amount of laser light 13, and appears as the output of the light amount detection sensor 25B. Therefore, by comparing the output value of the circuit 27 with the reference value 28, it is possible to immediately detect that the perforation has reached the copper layer, and the laser oscillator 10 can be stopped to eliminate damage to the copper layer.
又、穿孔を確実にするために必要以上のエネルギを出射
させて銅層に損傷を与えたりすることがなくなり、微細
プロセスにおける信頼性が向上し。In addition, the copper layer is not damaged by emitting more energy than necessary to ensure drilling, improving reliability in microprocessing.
加工時間が短縮される。Processing time is reduced.
本発明によれば、銅層に一抜のプリント基板に数十個の
穿孔を実施した場合の、プリント基板の歩留りを飛躍的
に向上させることができる。According to the present invention, it is possible to dramatically improve the yield of printed circuit boards when dozens of holes are formed in the copper layer of a single printed circuit board.
第1図は本発明の実施例の系統図、第2図は加工ワーク
よりの反射光波長の説明図、第3図は本発明の動作説明
図である。
10・・・レーザ発振器、12,13.14・・・レー
ザ光、15,16・・・反射光、21・・・部分反射鏡
、22.23.24・・・集光レンズ、25A、25B
・・・光量検出センサ、27・・・演算回路、28・・
・基準値設定回路、29・・・比較回路、30・・・レ
ーザ制御部、40・・・加工ワーク、41・・・絶縁層
、42・・・銅第3図FIG. 1 is a system diagram of an embodiment of the present invention, FIG. 2 is an explanatory diagram of the wavelength of reflected light from a processed workpiece, and FIG. 3 is an explanatory diagram of the operation of the present invention. 10...Laser oscillator, 12,13.14...Laser light, 15,16...Reflected light, 21...Partial reflecting mirror, 22.23.24...Condensing lens, 25A, 25B
...Light amount detection sensor, 27...Arithmetic circuit, 28...
・Reference value setting circuit, 29... Comparison circuit, 30... Laser control section, 40... Processing work, 41... Insulating layer, 42... Copper Figure 3
Claims (1)
の一部を選択透過させる反射鏡と、前記レーザ光を加工
物に集光照射させる集光系と、前記反射鏡に対し、前記
レーザ発振器からの直接の透過光と、加工物からの反射
光の透過光を各々捕捉し光量を検出するセンサを設け、
前記センサの光量から反射光量比を演算し、基準値との
比較で前記レーザ光の制御を行なうことを特徴とするレ
ーザ穿孔装置。 2、特許請求項第一項のレーザ穿孔装置に於いて、加工
対象が絶縁物と銅部片との複合材であり、前記レーザ発
振器に炭酸ガスレーザ発振器を使用し、銅層よりのレー
ザ反射光が基準値を超えた時点で、前記レーザ光の送出
を停止させることを特徴とするレーザ穿孔装置。[Claims] 1. A laser oscillator, a reflecting mirror that selectively transmits a part of the laser beam from the laser oscillator, a condensing system that focuses and irradiates the laser beam onto the workpiece, and the reflecting mirror includes: On the other hand, a sensor is provided that captures the direct transmitted light from the laser oscillator and the transmitted light of the reflected light from the workpiece and detects the amount of light,
A laser drilling device characterized in that the laser beam is controlled by calculating a reflected light amount ratio from the light amount of the sensor and comparing it with a reference value. 2. In the laser drilling apparatus according to claim 1, the object to be processed is a composite material of an insulator and a copper piece, a carbon dioxide laser oscillator is used as the laser oscillator, and the laser beam reflected from the copper layer is 1. A laser drilling device, wherein the laser beam is stopped being emitted when the value exceeds a reference value.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63244118A JPH0292482A (en) | 1988-09-30 | 1988-09-30 | Laser boring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63244118A JPH0292482A (en) | 1988-09-30 | 1988-09-30 | Laser boring device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0292482A true JPH0292482A (en) | 1990-04-03 |
Family
ID=17114030
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63244118A Pending JPH0292482A (en) | 1988-09-30 | 1988-09-30 | Laser boring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0292482A (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03124387A (en) * | 1989-10-04 | 1991-05-27 | Ishikawajima Harima Heavy Ind Co Ltd | Device for detecting penetration of worked hole for laser beam working |
US5155329A (en) * | 1990-01-08 | 1992-10-13 | Mitsubishi Jukogyo Kabushiki Kaisha | Monitoring method and system for laser beam welding |
JPH0825072A (en) * | 1994-07-07 | 1996-01-30 | Nec Corp | Device and method for monitoring welding state for laser welding machine |
US6215094B1 (en) * | 1993-10-01 | 2001-04-10 | Universitat Stuttgart | Process for determining the instantaneous penetration depth and a machining laser beam into a workpiece, and device for implementing this process |
EP0980737A4 (en) * | 1997-12-12 | 2002-07-31 | Matsushita Electric Ind Co Ltd | Laser machining method, laser machining device and control method of laser machining |
EP1161126A3 (en) * | 2000-06-02 | 2003-01-22 | Matsushita Electric Industrial Co., Ltd. | Laser processing method and equipment for printed circuit board |
JP2007283370A (en) * | 2006-04-18 | 2007-11-01 | Disco Abrasive Syst Ltd | Laser beam machining apparatus |
JP2008290117A (en) * | 2007-05-24 | 2008-12-04 | National Institute Of Advanced Industrial & Technology | Laser beam machining apparatus |
JP2013107089A (en) * | 2011-11-17 | 2013-06-06 | Fanuc Ltd | Laser beam machining system having auxiliary control unit |
US8829391B2 (en) | 2009-11-09 | 2014-09-09 | Canon Kabushiki Kaisha | Laser processing method |
-
1988
- 1988-09-30 JP JP63244118A patent/JPH0292482A/en active Pending
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03124387A (en) * | 1989-10-04 | 1991-05-27 | Ishikawajima Harima Heavy Ind Co Ltd | Device for detecting penetration of worked hole for laser beam working |
US5155329A (en) * | 1990-01-08 | 1992-10-13 | Mitsubishi Jukogyo Kabushiki Kaisha | Monitoring method and system for laser beam welding |
US6215094B1 (en) * | 1993-10-01 | 2001-04-10 | Universitat Stuttgart | Process for determining the instantaneous penetration depth and a machining laser beam into a workpiece, and device for implementing this process |
JPH0825072A (en) * | 1994-07-07 | 1996-01-30 | Nec Corp | Device and method for monitoring welding state for laser welding machine |
US6586703B2 (en) | 1997-12-12 | 2003-07-01 | Matsushita Electric Industrial Co., Ltd. | Laser machining method, laser machining apparatus, and its control method |
EP0980737A4 (en) * | 1997-12-12 | 2002-07-31 | Matsushita Electric Ind Co Ltd | Laser machining method, laser machining device and control method of laser machining |
US6441337B1 (en) | 1997-12-12 | 2002-08-27 | Matsushita Electric Industrial Co., Ltd. | Laser machining method, laser machining device and control method of laser machining |
US6694614B2 (en) | 2000-06-02 | 2004-02-24 | Matsushita Electric Industrial Co., Ltd. | Laser processing method and equipment for printed circuit board |
EP1161126A3 (en) * | 2000-06-02 | 2003-01-22 | Matsushita Electric Industrial Co., Ltd. | Laser processing method and equipment for printed circuit board |
KR100864067B1 (en) * | 2000-06-02 | 2008-10-16 | 마쯔시다덴기산교 가부시키가이샤 | Laser processing method and equipment for printed circuit board |
JP2007283370A (en) * | 2006-04-18 | 2007-11-01 | Disco Abrasive Syst Ltd | Laser beam machining apparatus |
JP2008290117A (en) * | 2007-05-24 | 2008-12-04 | National Institute Of Advanced Industrial & Technology | Laser beam machining apparatus |
US8829391B2 (en) | 2009-11-09 | 2014-09-09 | Canon Kabushiki Kaisha | Laser processing method |
JP2013107089A (en) * | 2011-11-17 | 2013-06-06 | Fanuc Ltd | Laser beam machining system having auxiliary control unit |
DE102012022056B4 (en) * | 2011-11-17 | 2014-04-03 | Fanuc Corporation | Laser processing system with an auxiliary control device |
US8890028B2 (en) | 2011-11-17 | 2014-11-18 | Fanuc Corporation | Laser processing system having auxiliary controller |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4504727A (en) | Laser drilling system utilizing photoacoustic feedback | |
US6399915B1 (en) | Method and apparatus for determining quality of welding at weld between working material pieces | |
US5026979A (en) | Method and apparatus for optically monitoring laser materials processing | |
JPH0292482A (en) | Laser boring device | |
US5408482A (en) | Apparatus for and method of controlling the output of a laser source | |
JP3530129B2 (en) | Laser processing apparatus and processing method | |
JP3257413B2 (en) | Laser processing apparatus and laser processing method | |
JP3259695B2 (en) | Laser processing apparatus and laser processing method | |
CA2038334A1 (en) | Apparatus and method for detecting the power level in single and multi-stripe integrated lasers | |
JPH03124387A (en) | Device for detecting penetration of worked hole for laser beam working | |
JP2747387B2 (en) | Laser processing equipment | |
US4949345A (en) | Method and apparatus for reducing the effect of random polarization on the power/energy output of lasers | |
JP2846150B2 (en) | Laser welding monitoring method and apparatus | |
JPH10193146A (en) | Method and device for detecting damage or the like of optical fiber in laser beam machine | |
JP3385218B2 (en) | Laser beam optical axis deviation detector | |
JP2858236B2 (en) | Laser processing equipment | |
JP2864005B2 (en) | Laser machining compensation system by detecting total pulse energy integration | |
US20040197098A1 (en) | Optical wireless transmission apparatus | |
JP3249003B2 (en) | Distance measuring device | |
JP2007029964A (en) | Laser beam machine | |
JPH11320155A (en) | Laser beam machining method, machining equipment, and work | |
JP3196467B2 (en) | Laser processing repair method and device | |
JPH11344417A (en) | Detecting method for fracture and incidence deviation of optical fiber and laser machining apparatus | |
JPH0825072A (en) | Device and method for monitoring welding state for laser welding machine | |
JPH0694080B2 (en) | Laser processing equipment |