JPH0291962A - Design changing method for semiconductor integrated circuit device - Google Patents

Design changing method for semiconductor integrated circuit device

Info

Publication number
JPH0291962A
JPH0291962A JP63242320A JP24232088A JPH0291962A JP H0291962 A JPH0291962 A JP H0291962A JP 63242320 A JP63242320 A JP 63242320A JP 24232088 A JP24232088 A JP 24232088A JP H0291962 A JPH0291962 A JP H0291962A
Authority
JP
Japan
Prior art keywords
cells
cell
layout
axis
design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63242320A
Other languages
Japanese (ja)
Other versions
JP2753001B2 (en
Inventor
Masami Murakata
村方 正美
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP63242320A priority Critical patent/JP2753001B2/en
Publication of JPH0291962A publication Critical patent/JPH0291962A/en
Application granted granted Critical
Publication of JP2753001B2 publication Critical patent/JP2753001B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To change the result of layout automatically with respect to design change by determining the arranging positions of additional cells at the minimum rectangle region which is constituted with the group of terminals in connecting relation with said cells. CONSTITUTION:The positions of terminals 21, 22 and 23 which are connected to signals in connecting relation with cells are obtained for every additional cell. Then the coordinates of the terminal points of a rectangle which is formed with the connecting terminals are obtained for every obtained signal, and corresponding sections 41-43 are obtained. When said operations are all finished for all the signals, sectors which include the terminal points of all the obtained signal at the at least one side are obtained on the X axis or the Y axis. The sector on the X axis obtained in this process is expanded on the Y axis, and a two-dimensional region is set. The length in the direction of the Y axis is made to be the longest section 51 which is held between the minimum value and the maximum value among the lower end point and the upper end point of the circumscribing rectangle of the connecting terminals for every signal. Whether the additional cell can be arranged or not within said region without moving the already arranged cell or not is judged.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は、半導体集積回路のレイアウト設計終了後に発
生するシステム変更に伴うレイアウト設計の変更に関す
る。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to changes in layout design accompanying system changes that occur after completion of layout design of a semiconductor integrated circuit.

(従来の技WI) 半導体集積回路のレイアウト設計には自動配置、配線シ
ステムが多く利用されている。レイアウト設計に用いる
回路は、論理的な動作の検証及び予想配線長によるタイ
ミング的な検証が行なわれており、レイアウト設計に対
してはここで得られた値から大きく外れないことが要求
される。
(Conventional Technique WI) Automatic placement and wiring systems are often used for layout design of semiconductor integrated circuits. Circuits used for layout design have undergone logical operation verification and timing verification using expected wiring lengths, and layout design is required to not deviate significantly from the values obtained here.

一方、レイアウト設計の終了した回路に対しては、設計
基準違反を起こしていないかあるいは前述の電気的な特
性が予測値を満たしているか等について検証が行なわれ
る。これら設計検証作業には一般に多くの計算機リソー
スを必要とする。
On the other hand, for the circuit whose layout design has been completed, verification is performed to check whether there are any violations of design standards or whether the above-mentioned electrical characteristics satisfy predicted values. These design verification tasks generally require a large amount of computer resources.

上述の設計検証作業により問題点が発見された場合には
、レイアウト結果の一部変更あるいは再レイアウトが余
儀なくされる場合がある。また、レイアウトの対象とな
る回路そのものの変更による回路素子の追加あるいは削
除によるレイアウト結果の変更が指示される場合がある
。実際の製品設計においては、システム設計後にレイア
ウト設計が開始するのではなく並行して進められる場合
が多く、このようなレイアウト設計後の設計変更は頻繁
に発生する可能性がある。この様な状況では、レイアウ
ト結果に対する検証結果への影響を最小限にとどめてシ
ステム側の設計変更をいかに効率よくレイアウトの変更
に反映させるかが重要となる。
If a problem is discovered during the design verification work described above, it may be necessary to partially change the layout result or re-layout. Further, there are cases where instructions are given to change the layout result by adding or deleting circuit elements by changing the circuit itself to be laid out. In actual product design, layout design is often not started after system design but is proceeded in parallel, and such design changes after layout design may occur frequently. In such a situation, it is important to minimize the influence on the verification results of the layout results and to efficiently reflect the design changes on the system side in the layout changes.

従来は、上記のような設計変更を行なう場合、グラフィ
ック、エディタによりインターラクティプに修正あるい
は変更を行なうか再度レイアウトをやり直すかのいずれ
かの方法がとられていた。
Conventionally, when making the above-mentioned design changes, either the interactive corrections or changes were made using graphics and editors, or the layout was redone.

前者の方法の場合、人手による修正のため多大の時間を
必要とし誤りが混入する恐れもある。一方、後者の場合
には多くの計算機リソースをかけて得られた検証結果が
無駄罠なってしまうという問題があった。この様なシス
テム変更に対応してレイアウト結果の変更を行なう場合
には、変更作業前の検証結果への影響を最小限に抑える
とともに、誤りの混入を防ぎ、工数の節約を計る必要が
あり、そのためKはこれらの作業を自動化する必要があ
るO (発明が解決しようとする課題) 上述のように、従来は設計変更を行なう場合グラフィッ
ク、エディタによるインターラクティプな修正、変更を
行なうか、再度レイアウトをやり直すかのいずれかの方
法がとられていたが、前者の場合、人手による修正のた
め多大の時間を必要とし誤りが混入する恐れがあった。
In the case of the former method, a large amount of time is required due to manual correction, and there is a risk that errors may be introduced. On the other hand, in the latter case, there is a problem in that the verification results obtained by spending a lot of computer resources are wasted. When changing the layout results in response to such system changes, it is necessary to minimize the impact on the verification results before making the changes, prevent errors from being introduced, and save man-hours. Therefore, it is necessary for K to automate these tasks. (Problem to be solved by the invention) As mentioned above, conventionally, when making design changes, it is necessary to make interactive corrections and changes using graphics and editors, or to re-layout. However, in the former case, manual corrections required a large amount of time and there was a risk of errors being introduced.

一方、後者の場合には多くの計算機リソースをかけて得
られた検証結果が無駄になってしまうという問題かあウ
 に〇 本発明は、上記のようにレイアウト設計終了後に発生す
る設計変更に対してレイアウト結果の変更を自動で行な
う手段を提供することを目的とする。
On the other hand, in the latter case, there is a problem that the verification results obtained by spending a lot of computer resources will be wasted. The purpose is to provide a means to automatically change the layout results.

本発明は、レイアウト設計の終了した回路に対して所望
の回路変更に対するレイアウトの変更、特にセルの追加
に関し、最適なセルの挿入位置の算出と追加およびセル
追加のための部分再レイアウトの処理方法を与える。
The present invention relates to layout changes for desired circuit changes to circuits for which layout design has been completed, in particular cell addition, and a method for calculating and adding an optimal cell insertion position and processing partial re-layout for cell addition. give.

即ち、本発明ではセルを追加するための領域として、当
該セルと接続関係のある端子群より構成される最小矩形
領域を設定する。そして既配置セルを移動する事なくセ
ルの追加が可能な場合には、当該領域内に当該セルを追
加する。当該領域内の既配置セルを移動する事なくセル
の追加は出来ないが領域の大きさとしては当該セルを収
容可能な場合には当該領域内の部分再レイアウトを行な
う。
That is, in the present invention, a minimum rectangular area consisting of a group of terminals having a connection relationship with the cell is set as an area for adding a cell. If a cell can be added without moving the already placed cells, the cell is added within the area. Although cells cannot be added without moving the already placed cells in the area, if the area is large enough to accommodate the cells, a partial re-layout of the area is performed.

この場合には、まず当該領域の境界条件つまり矩形領域
の境界に仮想的な端子を設定した後、領域内のセルをす
べて未配置化し、追加セルも含めて部分的な再レイアウ
トを実行する。当該領域に当該セルを収容出来ない場合
には、矩形領域の大きさを拡大して上記と同様の処理を
繰り返し実行する。
In this case, first, a virtual terminal is set at the boundary condition of the area, that is, at the boundary of the rectangular area, and then all cells in the area are made unplaced, and partial relayout is executed including additional cells. If the cell cannot be accommodated in the area, the size of the rectangular area is enlarged and the same process as above is repeated.

(作用) 本発明によれば、追加すべきセルの配置位置を当該セル
と接続関係のある端子群から構成される最小矩形領域と
するためレイアウト変更領域を最小限にとどめることが
でき、かつ追加したセルに関係する配線の長さも十分に
短く出来る。また、この手段により設定した領域内に当
該セルが配置出来ない場合には当該領域を拡大するが、
いずれの場合も当該セルと接続関係のある端子群から構
成される矩形領域内か最悪でもその周辺である。
(Operation) According to the present invention, since the placement position of a cell to be added is set to the minimum rectangular area consisting of a group of terminals connected to the cell, the layout change area can be kept to a minimum, and the layout change area can be kept to a minimum. The length of the wiring related to the cell can also be made sufficiently short. Also, if the cell cannot be placed within the area set by this means, the area will be enlarged.
In either case, the area is within a rectangular area made up of a group of terminals connected to the relevant cell, or at worst around the rectangular area.

以上のレイアウト変更処理はすべて自動で実行するため
Vcv!Aりの混入はなく、かつレイアウト結果の変更
箇所も最小限に抑えているために多大な計算時間をかけ
て得られた検証結果への影響を最小限に抑えることが出
来る。
All of the above layout change processing is executed automatically, so Vcv! Since there is no contamination by A, and changes in the layout results are kept to a minimum, the influence on the verification results obtained by spending a lot of calculation time can be minimized.

(実施例) 以下、第1図、第2図および第3図を参照して、本発明
の具体的な実施例について説明する。
(Example) Hereinafter, specific examples of the present invention will be described with reference to FIGS. 1, 2, and 3.

第1図は、設計変更処理手順を表わすフローチャートで
ある。
FIG. 1 is a flowchart showing the design change processing procedure.

まず、追加するセル毎に当該セルと接続関係のある信号
に対し接続する端子の位置を求める。第2図では21,
22.23が該当する端子である。
First, for each cell to be added, the position of the terminal connected to the signal connected to the cell is determined. In Figure 2, 21,
22 and 23 are the corresponding terminals.

次に1得られた各信号毎に接続する端子より構成される
矩形の端点の座標を求め第2図の41.42゜43で示
す様な対応する区間を求める。以上の操作がすべての信
号に対して終了したら、上で求めたすべての信号の少な
くとも一方の端点を含むような区間をX軸あるいはY軸
上で求める。以下では、端点のX座標で考える。
Next, for each signal obtained, the coordinates of the end points of the rectangle made up of the terminals to be connected are determined, and the corresponding section as shown at 41.42° 43 in FIG. 2 is determined. When the above operations are completed for all the signals, find a section on the X-axis or Y-axis that includes at least one end point of all the signals found above. In the following, we will consider the X coordinate of the end point.

まず、Xl51標の最も小さい端点を持つものから始め
て上述のようにすべての信号の少なくとも一方の端点を
含むような区間を求める。第2図では、まず31がX1
11標の最も小さい端点を含み、かつすべての信号の少
なくとも一方の端点を含む区間である。上記処理により
得られたX軸上の区間をY軸上へ展開し2次元の領域を
設定する。Y軸方向の長さは、上記処理で求めた各信号
毎に接続する端子の外接矩形の下端点、上端点の中で最
小値°と最大値で挾まれる最長区間とする。第2図では
、51が各信号毎に求めたY軸上の最長区間である。
First, starting from the one with the smallest endpoint of the Xl51 mark, a section including at least one endpoint of all the signals is found as described above. In Figure 2, 31 is X1
This section includes the smallest endpoints of the 11 markers and includes at least one endpoint of all signals. The section on the X-axis obtained by the above processing is expanded onto the Y-axis to set a two-dimensional area. The length in the Y-axis direction is the longest section sandwiched between the minimum value ° and the maximum value among the lower end point and the upper end point of the circumscribed rectangle of the terminal connected for each signal obtained in the above processing. In FIG. 2, 51 is the longest section on the Y axis determined for each signal.

次に1この領域内で既配置セルを移動する事なく追加セ
ルを配置可能かどうかの判定を行なう。
Next, it is determined whether additional cells can be placed within this area without moving the already placed cells.

既配置セルを移動する事なく追加セルを配置可能な場合
には、そこに当該セルを配置した後配線処理を施して処
理を終了する。既配置セルを移動する事なく追加セルを
配置する事は出来ないが、スペース的には追加セルを挿
入するのに十分な場合には、当該領域の境界条件を設定
し、既配置セルをすべて未配置状態にして当該領域内で
再レイアウトを行なう。このとき当該領域の境界条件は
、領域境界を横切るすべての信号に対応した仮想的な端
子を設定することによって求める。この様にして得られ
た境界条件のもとで、追加セルも含めて当該領域内で再
レイアウトを実行する。第3図にこの様子を示す。第3
図で71が矩形領域界上の仮想的な端子であり72は追
加セルと接続関係のある端子、81が境界条件を含んだ
再レイアウト対象領域である。
If an additional cell can be placed without moving the already placed cell, the cell is placed there, then wiring processing is performed, and the process is completed. It is not possible to place additional cells without moving the already placed cells, but if there is enough space to insert the additional cells, set the boundary conditions for the area and move all the already placed cells. Re-layout is performed within the area in an unplaced state. At this time, the boundary conditions of the region are determined by setting virtual terminals corresponding to all signals that cross the region boundary. Under the boundary conditions obtained in this manner, re-layout is executed within the area including the additional cells. Figure 3 shows this situation. Third
In the figure, 71 is a virtual terminal on the rectangular area boundary, 72 is a terminal connected to an additional cell, and 81 is a re-layout target area including boundary conditions.

スペース的にも追加セルを配置することが出来ない場合
には、再レイアウト対象領域を拡大して上記と同様の処
理を繰り返し実行する。再レイアウト対象領域の拡大は
、現在の矩形を構成するX軸上の区間を第2図の31区
間とすると、次の区間は図2の区間43の右端点を含む
区間32とする。その次は、区間42の右端点)42を
含む区間33とし、以下同様である。
If it is not possible to arrange additional cells due to space constraints, the relayout target area is enlarged and the same process as above is repeatedly executed. To enlarge the re-layout target area, if the section on the X-axis constituting the current rectangle is section 31 in FIG. 2, the next section is section 32 including the right end point of section 43 in FIG. The next section is section 33 that includes the right end point of section 42), and so on.

以上の実施例では、矩形領域を設定するための単位区間
として信号毎に接続する端子の端点ではさまれる区間と
して、それら区間内に含まれる端子の位置については考
慮していないが、詳細な処理を行なう場合には信号毎の
区間ではなく各端子の位置情報を用いてもよい。
In the above example, the unit section for setting the rectangular area is the section sandwiched between the end points of the terminals connected for each signal, and the positions of the terminals included in these sections are not considered, but the detailed processing In this case, the position information of each terminal may be used instead of the section for each signal.

〔発明の効果〕〔Effect of the invention〕

以上のように1本発明によれば、レイアウト設計終了後
罠発生した設計変更に対して、既設計部分の変更を行な
うことなく設計変更に伴うセル追加だけで済むか、ある
いは既設計部分の変更を最小限に抑えたレイアウト設計
の変更が可能である。このことは、設計済みのレイアウ
ト結果情報を最大限に活用することができることを表わ
しており、レイアウト結果の再検証Kかかる手間を少な
くすることが可能となる。
As described above, according to the present invention, in response to a design change that occurs after the completion of layout design, it is possible to suffice by simply adding cells due to the design change without changing the already designed part, or by changing the already designed part. It is possible to change the layout design with minimal impact. This means that the designed layout result information can be utilized to the fullest, and the effort required to re-verify the layout results can be reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は不発明の一実施例に係わる設計変更処理手順を
表わすフローチャート、第2図は本発明の一実施例によ
る矩形領域の設定方法および領域の拡大方法を説明する
ための図、第3図は再レイアウト対象領域の設定方法を
表わす図である。 11・・・半導体基盤、 21.22.23・・・追加セルと接続関係のある既配
置セルの端子、 31.32,33.34・・・矩形領域を構成するX軸
上の区間、 41142.43・・・各信号毎のX軸上の端点で挾ま
れる区間、 1・・・各信号毎に求めたY軸上の端点の最大区間1 1・・・矩形領域、 l・・・追加セルと接続関係のある端子、2・・・矩形
領域境界辺上を横切る信号に対する仮想的な端子、 1・・・再レイアウト対象領域IX。
FIG. 1 is a flowchart showing a design change processing procedure according to an embodiment of the invention, FIG. 2 is a diagram for explaining a method of setting a rectangular area and a method of enlarging the area according to an embodiment of the invention, and FIG. The figure shows a method for setting a re-layout target area. 11... Semiconductor substrate, 21.22.23... Terminals of already placed cells that have a connection relationship with additional cells, 31.32, 33.34... Section on the X-axis forming a rectangular area, 41142 .43...A section bounded by the end points on the X-axis for each signal, 1...Maximum section 1 of the end points on the Y-axis determined for each signal 1...Rectangular area, l... Terminals connected to additional cells, 2... Virtual terminals for signals crossing on rectangular area boundary sides, 1... Re-layout target area IX.

Claims (2)

【特許請求の範囲】[Claims] (1)半導体基板上に複数の論理セルを配置し各論理セ
ル間を配線することにより所望の回路を実現する半導体
集積回路装置を製造する際に、設計済みのレイアウト結
果に対して設計変更に対応したセルの追加を行なうにあ
たり、追加セルと接続関係のあるレイアウト済みのセル
端子の集合を求め、この集合の中から特殊信号に対する
端子を除き、すべての信号に対する端子を少なくとも各
1つは含むような最小矩形領域を構成し、当該領域内に
追加セルを配置することを特徴とする半導体集積回路装
置の設計変更方法。
(1) When manufacturing a semiconductor integrated circuit device that realizes a desired circuit by arranging multiple logic cells on a semiconductor substrate and wiring between each logic cell, design changes may be made to the already designed layout result. When adding a corresponding cell, find a set of laid out cell terminals that have a connection relationship with the added cell, and from this set, excluding terminals for special signals, include at least one terminal for each signal. 1. A method for changing the design of a semiconductor integrated circuit device, the method comprising: configuring a minimum rectangular area, and arranging additional cells within the area.
(2)既配置セルを移動させることなく追加セルを配置
することは出来ないが、既配置セルを移動させれば追加
セルを収容するスペースが確保出来る場合には、既配置
セルをすベて未配置化し、追加セルも含めて再レイアウ
トを行なうことを特徴とする請求項1記載の半導体集積
回路装置の設計変更方法。
(2) Although it is not possible to place additional cells without moving the already placed cells, if you can secure space to accommodate the additional cells by moving the already placed cells, all the already placed cells can be moved. 2. The method for changing the design of a semiconductor integrated circuit device according to claim 1, wherein the layout is carried out including unplaced cells and additional cells.
JP63242320A 1988-09-29 1988-09-29 Method of changing design of semiconductor integrated circuit device Expired - Fee Related JP2753001B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63242320A JP2753001B2 (en) 1988-09-29 1988-09-29 Method of changing design of semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63242320A JP2753001B2 (en) 1988-09-29 1988-09-29 Method of changing design of semiconductor integrated circuit device

Publications (2)

Publication Number Publication Date
JPH0291962A true JPH0291962A (en) 1990-03-30
JP2753001B2 JP2753001B2 (en) 1998-05-18

Family

ID=17087455

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2753001B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6591681B1 (en) * 2000-08-23 2003-07-15 Mitsubishi Denki Kabushiki Kaisha Nondestructive inspection apparatus for inspecting an internal defect in an object

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6591681B1 (en) * 2000-08-23 2003-07-15 Mitsubishi Denki Kabushiki Kaisha Nondestructive inspection apparatus for inspecting an internal defect in an object

Also Published As

Publication number Publication date
JP2753001B2 (en) 1998-05-18

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