JPH0288607U - - Google Patents
Info
- Publication number
- JPH0288607U JPH0288607U JP17041088U JP17041088U JPH0288607U JP H0288607 U JPH0288607 U JP H0288607U JP 17041088 U JP17041088 U JP 17041088U JP 17041088 U JP17041088 U JP 17041088U JP H0288607 U JPH0288607 U JP H0288607U
- Authority
- JP
- Japan
- Prior art keywords
- ray
- slit
- rays
- diaphragm
- restrict
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 6
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17041088U JPH0288607U (fr) | 1988-12-28 | 1988-12-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17041088U JPH0288607U (fr) | 1988-12-28 | 1988-12-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0288607U true JPH0288607U (fr) | 1990-07-13 |
Family
ID=31461327
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17041088U Pending JPH0288607U (fr) | 1988-12-28 | 1988-12-28 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0288607U (fr) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006317440A (ja) * | 2005-05-10 | 2006-11-24 | General Electric Co <Ge> | コリメータのシステム、方法及び装置 |
JP2009212010A (ja) * | 2008-03-05 | 2009-09-17 | Nagaoka Univ Of Technology | 軟x線発生装置及び該軟x線発生装置を用いた除電装置 |
JP2009238600A (ja) * | 2008-03-27 | 2009-10-15 | Tohken Co Ltd | X線管用磁気シールド板 |
JP2015114132A (ja) * | 2013-12-09 | 2015-06-22 | キヤノン株式会社 | 放射線管及び放射線検査装置 |
KR20180111429A (ko) * | 2017-03-31 | 2018-10-11 | 세메스 주식회사 | X선 검사 장치 |
WO2023032286A1 (fr) * | 2021-08-31 | 2023-03-09 | 株式会社島津製作所 | Analyseur de fluorescence à rayons x et élément d'ouverture à rayons x |
-
1988
- 1988-12-28 JP JP17041088U patent/JPH0288607U/ja active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006317440A (ja) * | 2005-05-10 | 2006-11-24 | General Electric Co <Ge> | コリメータのシステム、方法及び装置 |
JP2009212010A (ja) * | 2008-03-05 | 2009-09-17 | Nagaoka Univ Of Technology | 軟x線発生装置及び該軟x線発生装置を用いた除電装置 |
JP2009238600A (ja) * | 2008-03-27 | 2009-10-15 | Tohken Co Ltd | X線管用磁気シールド板 |
JP2015114132A (ja) * | 2013-12-09 | 2015-06-22 | キヤノン株式会社 | 放射線管及び放射線検査装置 |
KR20180111429A (ko) * | 2017-03-31 | 2018-10-11 | 세메스 주식회사 | X선 검사 장치 |
JP2018173351A (ja) * | 2017-03-31 | 2018-11-08 | セメス株式会社Semes Co., Ltd. | X線検査装置 |
WO2023032286A1 (fr) * | 2021-08-31 | 2023-03-09 | 株式会社島津製作所 | Analyseur de fluorescence à rayons x et élément d'ouverture à rayons x |