JPH0288607U - - Google Patents

Info

Publication number
JPH0288607U
JPH0288607U JP17041088U JP17041088U JPH0288607U JP H0288607 U JPH0288607 U JP H0288607U JP 17041088 U JP17041088 U JP 17041088U JP 17041088 U JP17041088 U JP 17041088U JP H0288607 U JPH0288607 U JP H0288607U
Authority
JP
Japan
Prior art keywords
ray
slit
rays
diaphragm
restrict
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17041088U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP17041088U priority Critical patent/JPH0288607U/ja
Publication of JPH0288607U publication Critical patent/JPH0288607U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP17041088U 1988-12-28 1988-12-28 Pending JPH0288607U (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17041088U JPH0288607U (fr) 1988-12-28 1988-12-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17041088U JPH0288607U (fr) 1988-12-28 1988-12-28

Publications (1)

Publication Number Publication Date
JPH0288607U true JPH0288607U (fr) 1990-07-13

Family

ID=31461327

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17041088U Pending JPH0288607U (fr) 1988-12-28 1988-12-28

Country Status (1)

Country Link
JP (1) JPH0288607U (fr)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006317440A (ja) * 2005-05-10 2006-11-24 General Electric Co <Ge> コリメータのシステム、方法及び装置
JP2009212010A (ja) * 2008-03-05 2009-09-17 Nagaoka Univ Of Technology 軟x線発生装置及び該軟x線発生装置を用いた除電装置
JP2009238600A (ja) * 2008-03-27 2009-10-15 Tohken Co Ltd X線管用磁気シールド板
JP2015114132A (ja) * 2013-12-09 2015-06-22 キヤノン株式会社 放射線管及び放射線検査装置
KR20180111429A (ko) * 2017-03-31 2018-10-11 세메스 주식회사 X선 검사 장치
WO2023032286A1 (fr) * 2021-08-31 2023-03-09 株式会社島津製作所 Analyseur de fluorescence à rayons x et élément d'ouverture à rayons x

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006317440A (ja) * 2005-05-10 2006-11-24 General Electric Co <Ge> コリメータのシステム、方法及び装置
JP2009212010A (ja) * 2008-03-05 2009-09-17 Nagaoka Univ Of Technology 軟x線発生装置及び該軟x線発生装置を用いた除電装置
JP2009238600A (ja) * 2008-03-27 2009-10-15 Tohken Co Ltd X線管用磁気シールド板
JP2015114132A (ja) * 2013-12-09 2015-06-22 キヤノン株式会社 放射線管及び放射線検査装置
KR20180111429A (ko) * 2017-03-31 2018-10-11 세메스 주식회사 X선 검사 장치
JP2018173351A (ja) * 2017-03-31 2018-11-08 セメス株式会社Semes Co., Ltd. X線検査装置
WO2023032286A1 (fr) * 2021-08-31 2023-03-09 株式会社島津製作所 Analyseur de fluorescence à rayons x et élément d'ouverture à rayons x

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