JPH0285371U - - Google Patents

Info

Publication number
JPH0285371U
JPH0285371U JP16472888U JP16472888U JPH0285371U JP H0285371 U JPH0285371 U JP H0285371U JP 16472888 U JP16472888 U JP 16472888U JP 16472888 U JP16472888 U JP 16472888U JP H0285371 U JPH0285371 U JP H0285371U
Authority
JP
Japan
Prior art keywords
switching
transistor
time
circuit
transistors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16472888U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16472888U priority Critical patent/JPH0285371U/ja
Publication of JPH0285371U publication Critical patent/JPH0285371U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP16472888U 1988-12-19 1988-12-19 Pending JPH0285371U (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16472888U JPH0285371U (enrdf_load_html_response) 1988-12-19 1988-12-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16472888U JPH0285371U (enrdf_load_html_response) 1988-12-19 1988-12-19

Publications (1)

Publication Number Publication Date
JPH0285371U true JPH0285371U (enrdf_load_html_response) 1990-07-04

Family

ID=31450580

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16472888U Pending JPH0285371U (enrdf_load_html_response) 1988-12-19 1988-12-19

Country Status (1)

Country Link
JP (1) JPH0285371U (enrdf_load_html_response)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5684572A (en) * 1979-12-11 1981-07-09 Mitsubishi Electric Corp Measuring method for noise voltage of semiconductor device
JPS58111763A (ja) * 1981-12-25 1983-07-02 Fujitsu Ltd トランジスタ試験回路

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5684572A (en) * 1979-12-11 1981-07-09 Mitsubishi Electric Corp Measuring method for noise voltage of semiconductor device
JPS58111763A (ja) * 1981-12-25 1983-07-02 Fujitsu Ltd トランジスタ試験回路

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