JPH0285371U - - Google Patents
Info
- Publication number
- JPH0285371U JPH0285371U JP16472888U JP16472888U JPH0285371U JP H0285371 U JPH0285371 U JP H0285371U JP 16472888 U JP16472888 U JP 16472888U JP 16472888 U JP16472888 U JP 16472888U JP H0285371 U JPH0285371 U JP H0285371U
- Authority
- JP
- Japan
- Prior art keywords
- switching
- transistor
- time
- circuit
- transistors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16472888U JPH0285371U (enrdf_load_html_response) | 1988-12-19 | 1988-12-19 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16472888U JPH0285371U (enrdf_load_html_response) | 1988-12-19 | 1988-12-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0285371U true JPH0285371U (enrdf_load_html_response) | 1990-07-04 |
Family
ID=31450580
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16472888U Pending JPH0285371U (enrdf_load_html_response) | 1988-12-19 | 1988-12-19 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0285371U (enrdf_load_html_response) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5684572A (en) * | 1979-12-11 | 1981-07-09 | Mitsubishi Electric Corp | Measuring method for noise voltage of semiconductor device |
JPS58111763A (ja) * | 1981-12-25 | 1983-07-02 | Fujitsu Ltd | トランジスタ試験回路 |
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1988
- 1988-12-19 JP JP16472888U patent/JPH0285371U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5684572A (en) * | 1979-12-11 | 1981-07-09 | Mitsubishi Electric Corp | Measuring method for noise voltage of semiconductor device |
JPS58111763A (ja) * | 1981-12-25 | 1983-07-02 | Fujitsu Ltd | トランジスタ試験回路 |