JPH027582U - - Google Patents

Info

Publication number
JPH027582U
JPH027582U JP8600188U JP8600188U JPH027582U JP H027582 U JPH027582 U JP H027582U JP 8600188 U JP8600188 U JP 8600188U JP 8600188 U JP8600188 U JP 8600188U JP H027582 U JPH027582 U JP H027582U
Authority
JP
Japan
Prior art keywords
current
group
under test
integrated circuits
circuits under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8600188U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8600188U priority Critical patent/JPH027582U/ja
Publication of JPH027582U publication Critical patent/JPH027582U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP8600188U 1988-06-28 1988-06-28 Pending JPH027582U (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8600188U JPH027582U (de) 1988-06-28 1988-06-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8600188U JPH027582U (de) 1988-06-28 1988-06-28

Publications (1)

Publication Number Publication Date
JPH027582U true JPH027582U (de) 1990-01-18

Family

ID=31310655

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8600188U Pending JPH027582U (de) 1988-06-28 1988-06-28

Country Status (1)

Country Link
JP (1) JPH027582U (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09262316A (ja) * 1996-10-21 1997-10-07 Mitsuharu Nozawa スイミングゴーグルのブリッジ構造
WO2007029463A1 (ja) * 2005-09-06 2007-03-15 Advantest Corporation 試験装置および試験方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09262316A (ja) * 1996-10-21 1997-10-07 Mitsuharu Nozawa スイミングゴーグルのブリッジ構造
WO2007029463A1 (ja) * 2005-09-06 2007-03-15 Advantest Corporation 試験装置および試験方法

Similar Documents

Publication Publication Date Title
EP0575061B1 (de) Verfahren zum Testen des Kontakts zwischen einem integrierten Baustein und einer Leiterplatte
JPH027582U (de)
AU7071594A (en) Process and device for testing an integrated circuit soldered on a board
CN207895312U (zh) 集便器快速检测装置
JP3281164B2 (ja) Ｉｃのインサーキットテスタによる足浮き検出方法
CN108227681A (zh) 集便器快速检测装置
CN1464358A (zh) 笔记本计算机电源自动测试方法
JPH025083U (de)
JPS5869273U (ja) 電気抵抗法による検査装置
JP2809278B2 (ja) 半導体集積装置
GB2236193A (en) Voltage indication apparatus
JPS6110214Y2 (de)
JPS6442470U (de)
JPH0212074A (ja) Ｉｃ試験装置における測定用電源装置
JPH0921846A (ja) 検査装置
JPH052869Y2 (de)
JPS60179976U (ja) ラツチアツプ特性測定装置
JPS6341783U (de)
JPH10123198A (ja) 回路基板検査装置
EP0012137A1 (de) Elektrischer Leitungs- und Kurzschlussprüfer
JPH0648441Y2 (ja) ラツチアツプ特性試験装置
GB2268277B (en) Improvements in or relating to electronic circuit test apparatus
JPS58138047U (ja) 熱電対の検査回路
JPS6466573A (en) Apparatus for measuring latch-up strength of ic
JPS62156868U (de)