JPH0272973U - - Google Patents

Info

Publication number
JPH0272973U
JPH0272973U JP15233188U JP15233188U JPH0272973U JP H0272973 U JPH0272973 U JP H0272973U JP 15233188 U JP15233188 U JP 15233188U JP 15233188 U JP15233188 U JP 15233188U JP H0272973 U JPH0272973 U JP H0272973U
Authority
JP
Japan
Prior art keywords
magnetization
demagnetization
flaw detection
magnetic particle
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15233188U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15233188U priority Critical patent/JPH0272973U/ja
Publication of JPH0272973U publication Critical patent/JPH0272973U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Description

【図面の簡単な説明】
第1図は、この考案の一実施例を示す一部欠截
平面図、第2図は、この考案の一実施例を示す一
部欠截正面図、第3図は、第1図中―断面図
である。 1…搬送コンベアー、2…磁粉液散布機構、3
…磁化機構、3a,3a′…左右コイル、3b,
3b′…上下コイル、3c…貫通コイル、4…検
査室、5…光電スイツチ。

Claims (1)

    【実用新案登録請求の範囲】
  1. 磁粉探傷装置の磁化工程において、一つのコイ
    ルを磁化と脱磁の両方に使用することを特徴とす
    る磁粉探傷装置における磁化脱磁装置。
JP15233188U 1988-11-21 1988-11-21 Pending JPH0272973U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15233188U JPH0272973U (ja) 1988-11-21 1988-11-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15233188U JPH0272973U (ja) 1988-11-21 1988-11-21

Publications (1)

Publication Number Publication Date
JPH0272973U true JPH0272973U (ja) 1990-06-04

Family

ID=31427158

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15233188U Pending JPH0272973U (ja) 1988-11-21 1988-11-21

Country Status (1)

Country Link
JP (1) JPH0272973U (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006337041A (ja) * 2005-05-31 2006-12-14 Uchihashi Estec Co Ltd 金属体の欠陥検出方法及びスキャニング式磁気検出器

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56117178A (en) * 1980-02-20 1981-09-14 Shimadzu Corp Metal detector
JPS61266943A (ja) * 1985-05-21 1986-11-26 Kobe Steel Ltd 鍛造部品の蛍光磁粉探傷における自動疵検出選別方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56117178A (en) * 1980-02-20 1981-09-14 Shimadzu Corp Metal detector
JPS61266943A (ja) * 1985-05-21 1986-11-26 Kobe Steel Ltd 鍛造部品の蛍光磁粉探傷における自動疵検出選別方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006337041A (ja) * 2005-05-31 2006-12-14 Uchihashi Estec Co Ltd 金属体の欠陥検出方法及びスキャニング式磁気検出器
JP4619864B2 (ja) * 2005-05-31 2011-01-26 双日マシナリー株式会社 金属体の欠陥検出方法及びスキャニング式磁気検出器

Similar Documents

Publication Publication Date Title
JPH0272973U (ja)
JPH02109280U (ja)
JPH0361592U (ja)
JPH0438556U (ja)
JPH01142805U (ja)
JPH0321778U (ja)
JPH0471176U (ja)
JPH01110374U (ja)
JPS61134007U (ja)
JPS6410759U (ja)
JPH0241175U (ja)
JPH0368054U (ja)
JPS6367918U (ja)
JPH02107084U (ja)
JPS62124557U (ja)
JPS61149822U (ja)
JPH0298875U (ja)
JPH01117750U (ja)
JPS6184887U (ja)
JPS61190046U (ja)
JPS61206865U (ja)
JPS61146710U (ja)
JPS6292404U (ja)
JPH01128245U (ja)
JPH032263U (ja)