JPH0267265U - - Google Patents
Info
- Publication number
- JPH0267265U JPH0267265U JP14706288U JP14706288U JPH0267265U JP H0267265 U JPH0267265 U JP H0267265U JP 14706288 U JP14706288 U JP 14706288U JP 14706288 U JP14706288 U JP 14706288U JP H0267265 U JPH0267265 U JP H0267265U
- Authority
- JP
- Japan
- Prior art keywords
- package
- probe
- fixing
- matches
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
- 238000005259 measurement Methods 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は本考案の一実施例のプローブの斜視図
、第２図は該一実施例のプローブの使用方法の説
明図、第３図は本考案の他の実施例のプローブの
裏面図、第４図は第３図のＥ―Ｅ線断面図、第５
図は該他の実施例の使用方法の説明図である。
１……プローブ、１ａ……測定ピン、１ｂ……
固定部、１ｃ……移動部、１ｄ……信号出力端子
、２……被測定部品、Ａ……装着の方向、Ｂ……
移動部のスライドする方向、３……プローブ、３
ａ……測定ピン、３ｂ……信号出力端子、４……
固定用の板、２……被測定部品、Ｃ……装置の方
向、Ｄ……固定用の板の挿入方向。
FIG. 1 is a perspective view of a probe according to an embodiment of the present invention, FIG. 2 is an explanatory diagram of how to use the probe according to the embodiment, and FIG. 3 is a back view of a probe according to another embodiment of the present invention. Figure 4 is a sectional view taken along line E-E in Figure 3, and Figure 5
The figure is an explanatory diagram of how to use this other embodiment. 1...Probe, 1a...Measurement pin, 1b...
Fixed part, 1c... Moving part, 1d... Signal output terminal, 2... Part to be measured, A... Mounting direction, B...
Direction in which the moving part slides, 3... Probe, 3
a...Measurement pin, 3b...Signal output terminal, 4...
Fixing plate, 2... Part to be measured, C... Direction of the device, D... Insertion direction of the fixing plate.
Claims (1)
配置に合わせた接触型の測定端子を有し、かつ該
パツケージとの固定を行なう摺動可能な固定機構
を有することを特徴とする表面実装部品測定用プ
ローブ。 A probe for measuring surface-mounted components, characterized in that it has a contact-type measurement terminal that matches the external lead arrangement of a surface-mounted semiconductor device package, and a slidable fixing mechanism for fixing the package to the package.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14706288U JPH0267265U (en) | 1988-11-10 | 1988-11-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14706288U JPH0267265U (en) | 1988-11-10 | 1988-11-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0267265U true JPH0267265U (en) | 1990-05-22 |
Family
ID=31417126
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14706288U Pending JPH0267265U (en) | 1988-11-10 | 1988-11-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0267265U (en) |
-
1988
- 1988-11-10 JP JP14706288U patent/JPH0267265U/ja active Pending
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