JPH026270U - - Google Patents
Info
- Publication number
- JPH026270U JPH026270U JP8495588U JP8495588U JPH026270U JP H026270 U JPH026270 U JP H026270U JP 8495588 U JP8495588 U JP 8495588U JP 8495588 U JP8495588 U JP 8495588U JP H026270 U JPH026270 U JP H026270U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- circuit section
- voltage
- reverse
- current detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 9
- 238000001514 detection method Methods 0.000 claims description 3
- 230000003321 amplification Effects 0.000 claims 2
- 238000003199 nucleic acid amplification method Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 5
- 239000000700 radioactive tracer Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
第１図は、この考案の半導体素子測定装置の構
成を示すブロツク図、第２図は、上記測定装置の
具体的構成を示す回路図、第３図は、この考案の
半導体素子測定装置による電圧・電流波形図、第
４図は、従来のこの種の測定に用いられるカーブ
トレーサの外観図、第５図は、上記カーブトレー
サを用いて測定した場合の電圧・電流波形図であ
る。
１０……電圧印加部、１１……制御回路部、１
２……電流検出回路部、１３……基準電圧発生回
路部、１４……誤差増幅回路部、１５……電源回
路部、Ｓ……半導体素子。
FIG. 1 is a block diagram showing the configuration of the semiconductor device measuring device of this invention, FIG. 2 is a circuit diagram showing the specific configuration of the above measuring device, and FIG. 3 is a voltage diagram of the semiconductor device measuring device of this invention.・Current waveform diagram. FIG. 4 is an external view of a conventional curve tracer used for this type of measurement. FIG. 5 is a voltage/current waveform diagram when measured using the above-mentioned curve tracer. 10... Voltage application section, 11... Control circuit section, 1
2... Current detection circuit section, 13... Reference voltage generation circuit section, 14... Error amplifier circuit section, 15... Power supply circuit section, S... Semiconductor element.
Claims (1)
その半導体素子の逆方向特性を測定する半導体素
子測定装置において、前記半導体素子に直列に接
続した制御回路部と電流検出回路部とを有し、さ
らに、この電流検出回路部により検出した両端電
圧と、基準電圧発生回路部からの基準電圧とを比
較・増幅する誤差増幅回路部とを備え、この誤差
増幅回路部からの出力を前記制御回路部へ送出し
、前記半導体素子に流れる逆電流が所定値以上に
ならないよう定電流に制御することを特徴とする
半導体素子測定装置。 A semiconductor device measuring device that applies a reverse voltage to a semiconductor device from a voltage application unit to measure the reverse characteristics of the semiconductor device, comprising a control circuit unit and a current detection circuit unit connected in series to the semiconductor device, Furthermore, it includes an error amplification circuit section that compares and amplifies the voltage across both ends detected by the current detection circuit section and a reference voltage from the reference voltage generation circuit section, and outputs the output from the error amplification circuit section to the control circuit section. What is claimed is: 1. A semiconductor device measuring device, characterized in that the reverse current flowing through the semiconductor device is controlled to be constant so that the reverse current does not exceed a predetermined value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8495588U JPH026270U (en) | 1988-06-27 | 1988-06-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8495588U JPH026270U (en) | 1988-06-27 | 1988-06-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH026270U true JPH026270U (en) | 1990-01-16 |
Family
ID=31309636
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8495588U Pending JPH026270U (en) | 1988-06-27 | 1988-06-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH026270U (en) |
-
1988
- 1988-06-27 JP JP8495588U patent/JPH026270U/ja active Pending