JPH0260803U - - Google Patents
Info
- Publication number
- JPH0260803U JPH0260803U JP13924188U JP13924188U JPH0260803U JP H0260803 U JPH0260803 U JP H0260803U JP 13924188 U JP13924188 U JP 13924188U JP 13924188 U JP13924188 U JP 13924188U JP H0260803 U JPH0260803 U JP H0260803U
- Authority
- JP
- Japan
- Prior art keywords
- measured
- recess
- semicircular
- stand
- diameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims description 3
- 238000007796 conventional method Methods 0.000 description 1
Landscapes
- Length-Measuring Instruments Using Mechanical Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Description
第１図及び第２図は本考案による半円凹部直径
測定検査装置を示すための正面図及び平面図、第
３図及び第４図は本考案及び従来において用いら
れる被測定物を示す平面図及び側面図、第５図は
従来の検査装置を示すための平面図である。
１は被測定物、１ａ，１ｂは半円凹部、２ｂは
プローブ、３ａ，３ｂはオーバーピン、１０は台
、１４は凹部である。
1 and 2 are a front view and a plan view showing a semicircular recess diameter measurement and inspection device according to the present invention, and FIGS. 3 and 4 are plan views showing an object to be measured used in the present invention and in the conventional method. and a side view, and FIG. 5 is a plan view showing a conventional inspection device. 1 is an object to be measured, 1a and 1b are semicircular recesses, 2b is a probe, 3a and 3b are over pins, 10 is a stand, and 14 is a recess.
Claims (1)
，１ｂを有する被測定物１に対し、第１及び第２
のオーバーピン３ａ，３ｂを前記各半円凹部１ａ
，１ｂに接合させ、測定治具で各オーバーピン３
ａ，３ｂを介して各半円凹部１ａ，１ｂの径を測
定するようにした半円凹部直径測定検査装置にお
いて、前記被測定物１を載置するための本体１１
に設けられた台１０と、前記台１０に形成された
凹部１４と、前記測定治具を構成し前記本体１１
に固定されると共に上下動自在なプローブ２ｂを
有するダイヤルゲージ２とを備え、前記凹部１４
上に設けられた第１オーバーピン３ａ上に被測定
物１を載置し、この被測定物１上に設けられた第
２オーバーピン３ｂ上に前記プローブ２ｂを接触
させることによつて、各半円凹部１ａ，１ｂの径
を測定するようにしたことを特徴とする半円凹部
直径測定検査装置。 First and second semicircular recesses 1a to be measured on both sides
, 1b, the first and second
The over pins 3a, 3b are inserted into each of the semicircular recesses 1a.
, 1b, and each over pin 3 with a measuring jig.
In the semicircular recess diameter measurement and inspection device which measures the diameter of each semicircular recess 1a and 1b via a and 3b, a main body 11 on which the object to be measured 1 is placed;
A stand 10 provided in the stand 10 and a recess 14 formed in the stand 10 constitute the measuring jig and the main body 11.
a dial gauge 2 having a probe 2b fixed to the recess 14 and movable up and down;
By placing the object to be measured 1 on the first over pin 3a provided on the object to be measured 1 and bringing the probe 2b into contact with the second over pin 3b provided on the object to be measured 1, each A semicircular recess diameter measurement and inspection device characterized in that it measures the diameter of semicircular recesses 1a and 1b.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13924188U JPH0260803U (en) | 1988-10-27 | 1988-10-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13924188U JPH0260803U (en) | 1988-10-27 | 1988-10-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0260803U true JPH0260803U (en) | 1990-05-07 |
Family
ID=31402318
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13924188U Pending JPH0260803U (en) | 1988-10-27 | 1988-10-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0260803U (en) |
-
1988
- 1988-10-27 JP JP13924188U patent/JPH0260803U/ja active Pending