JPH0255106U - - Google Patents
Info
- Publication number
- JPH0255106U JPH0255106U JP13437888U JP13437888U JPH0255106U JP H0255106 U JPH0255106 U JP H0255106U JP 13437888 U JP13437888 U JP 13437888U JP 13437888 U JP13437888 U JP 13437888U JP H0255106 U JPH0255106 U JP H0255106U
- Authority
- JP
- Japan
- Prior art keywords
- lead
- flat plate
- surface mount
- inspecting
- jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims description 3
- 238000005452 bending Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988134378U JPH0729638Y2 (ja) | 1988-10-14 | 1988-10-14 | 表面実装部品の検査用治具 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988134378U JPH0729638Y2 (ja) | 1988-10-14 | 1988-10-14 | 表面実装部品の検査用治具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0255106U true JPH0255106U (US07902200-20110308-C00004.png) | 1990-04-20 |
| JPH0729638Y2 JPH0729638Y2 (ja) | 1995-07-05 |
Family
ID=31393083
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988134378U Expired - Lifetime JPH0729638Y2 (ja) | 1988-10-14 | 1988-10-14 | 表面実装部品の検査用治具 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0729638Y2 (US07902200-20110308-C00004.png) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107328373A (zh) * | 2017-08-18 | 2017-11-07 | 深圳市伙伴科技有限公司 | 引脚平整度检测系统及方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59176155U (ja) * | 1983-05-12 | 1984-11-24 | ロ−ム株式会社 | 電子部品の検査具 |
| JPS6276529A (ja) * | 1985-09-27 | 1987-04-08 | Fuji Kikai Seizo Kk | フラツトパツク型ｉｃのリ−ド線曲がり検出方法 |
| JPS62274205A (ja) * | 1986-05-23 | 1987-11-28 | Hitachi Tokyo Electron Co Ltd | リ−ド平坦度検査方法および装置 |
-
1988
- 1988-10-14 JP JP1988134378U patent/JPH0729638Y2/ja not_active Expired - Lifetime
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59176155U (ja) * | 1983-05-12 | 1984-11-24 | ロ−ム株式会社 | 電子部品の検査具 |
| JPS6276529A (ja) * | 1985-09-27 | 1987-04-08 | Fuji Kikai Seizo Kk | フラツトパツク型ｉｃのリ−ド線曲がり検出方法 |
| JPS62274205A (ja) * | 1986-05-23 | 1987-11-28 | Hitachi Tokyo Electron Co Ltd | リ−ド平坦度検査方法および装置 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107328373A (zh) * | 2017-08-18 | 2017-11-07 | 深圳市伙伴科技有限公司 | 引脚平整度检测系统及方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0729638Y2 (ja) | 1995-07-05 |
